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"A channel-sharable built-in self-test scheme for multi-channel DRAMs."
Kuan-Te Wu et al. (2018)
- Kuan-Te Wu, Jin-Fu Li, Chih-Yen Lo, Jenn-Shiang Lai, Ding-Ming Kwai, Yung-Fa Chou:
A channel-sharable built-in self-test scheme for multi-channel DRAMs. ASP-DAC 2018: 245-250
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