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"Statistical Characterization of Off-State Stress Degradation in Planar ..."
Pablo Saraza-Canflanca et al. (2024)
- Pablo Saraza-Canflanca, Dishant Sangani, Javier Diaz-Fortuny
, Stanislav Tyaginov, Georges G. E. Gielen, Erik Bury, Ben Kaczer:
Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays. IRPS 2024: 8
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