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ORCID"A new degradation model and lifetime extrapolation technique for lightly ..."
R. Dreesen et al. (2001)
- R. Dreesen, Kris Croes, Jean Manca
, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken:
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectron. Reliab. 41(3): 437-443 (2001)
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