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"International, intra-national and inter-firm knowledge diffusion and ..."

Keun Lee, Minho Yoon (2010)

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DOI: 10.1080/09537325.2010.488059

access: closed

type: Journal Article

metadata version: 2020-10-08

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Keun Lee, Minho Yoon:
International, intra-national and inter-firm knowledge diffusion and technological catch-up: the USA, Japan, Korea and Taiwan in the memory chip industry. Technol. Anal. Strateg. Manag. 22(5): 553-570 (2010)

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