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ORCIDITC 1996: Washington, DC, USA
- Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. IEEE Computer Society 1996, ISBN 0-7803-3541-4
Session 1: Plenary
- Walden C. Rhines:
Emerging Technologies Drive Domain-Specific Solutions. 10 - Wojciech Maly:
New and Not-So-New Test Challenges of the Next Decade. 11
Session 2.0: Automatic Test Generation
- Peter Wohl, John A. Waicukauski:
Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates. 13-20 - Mitsuo Teramoto, Tomoo Fukazawa:
Test Pattern Generation for Circuits with Asynchronous Signals Based on Scan. 21-28 - M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor:
Accelerated Compact Test Set Generation for Three-State Circuits. 29-38 - Fulvio Corno
, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda:
Comparing Topological, Symbolic and GA-based ATPGs: An Experimental Approach. 39-47
Session 3.0: BIST: Architectures and Generation
- Yuejian Wu, Saman Adham:
BIST Fault Diagnosis in Scan-Based VLSI Environments. 48-57 - Pieter M. Trouborst:
LFSR Reseeding as a Component of Board Level BIST. 58-67 - Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici:
Using ILA Testing for BIST in FPGAs. 68-75 - Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian:
An Effective BIST Scheme for Datapaths. 76-85
Session 4.0: New Test Considerations for Mixed-Signal Devices
- Seiji Sasho, Teruhisa Sakata:
Four Multi Probing Test for 16 Bit DAC with Vertical Contact Probe Card. 86-91 - Keith Lofstrom:
A Demonstration IC for the P1149.4 Mixed-Signal Test Standard. 92-98 - Koji Asami:
Testing the Digital Modulation of PHS Devices. 99-103
Session 5.0: Topics in Test Hardware
- Barry D. Kulp:
Testing and Characterizing Jitter in 100BASE-TX and 155.52 Mbit/S ATM Devices with a 1 Gsample/s AWG in an ATE System. 104-111 - Kenji Isawa, Yoshihiro Hashimoto:
High-Speed IDDQ Measurement Circuit. 112-117 - Solomon Max:
Extending Calibration Intervals. 118-126 - Steven DeFoster, Dennis Karst, Matthew Peterson, Paul Sendelbach, Kirk Kottschade:
Manufacturing Test of Fiber Channel Communications Cards and Optical Subassemblies. 127-134
Session 6.0: Practical and Higher-Level Fault Simulation
- Bejoy G. Oomman, Wu-Tung Cheng, John A. Waicukauski:
A Universal Technique for Accelerating Simulation of Scan Test Patterns. 135-141 - Elizabeth M. Rudnick, Janak H. Patel, Irith Pomeranz:
On Potential Fault Detection in Sequential Circuits. 142-149 - Weiwei Mao, Ravi K. Gulati:
Improving Gate Level Fault Coverage by RTL Fault Grading. 150-159 - Sankaran Karthik, Mark Aitken, Glidden Martin, Srinivasu Pappula, Bob Stettler, Praveen Vishakantaiah, Manuel A. d'Abreu, Jacob A. Abraham:
Distributed Mixed Level Logic and Fault Simulation on the Pentium® Pro Microprocessor. 160-166
Session 7.0: BIST Pattern Generation
- Nur A. Touba, Edward J. McCluskey:
Altering a Pseudo-Random Bit Sequence for Scan-Based BIST. 167-175 - Mohammed F. AlShaibi, Charles R. Kime:
MFBIST: A BIST Method for Random Pattern Resistant Circuits. 176-185 - Nadime Zacharia, Janusz Rajski, Jerzy Tyszer, John A. Waicukauski:
Two-Dimensional Test Data Decompressor for Multiple Scan Designs. 186-194 - Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig:
Mixed-Mode BIST Using Embedded Processors. 195-204
Session 8.0: Testing of Asynchronous Circuits
- Marly Roncken, Eric Bruls:
Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. 205-214 - Marly Roncken, Emile H. L. Aarts, Wim F. J. Verhaegh:
Optimal Scan for Pipelined Testing: An Asynchronous Foundation. 215-224 - Volker Schöber, Thomas Kiel:
An Asynchronous Scan Path Concept for Micropipelines using the Bundled Data Convention. 225-231 - Montek Singh, Steven M. Nowick:
Synthesis-for-Initializability of Asynchronous Sequential Machines. 232-241
Session 9.0: Industry Impact: Screeninig, Test, and Measurement Breakthroughs
- Timothy R. Henry, Thomas Soo:
Burn-in Elimination of a High Volume Microprocessor Using IDDQ. 242-249 - Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown:
IDDQ and AC Scan: The War Against Unmodelled Defects. 250-258 - Alan W. Righter, Jerry M. Soden, Richard W. Beegle:
High Resolution IDDQ Characterization and Testing - Practical Issues. 259-268 - Kazuyuki Ozaki, Hidenori Sekiguchi, Shinichi Wakana, Yoshiro Goto, Yasutoshi Umehara, Jun Matsumoto:
Novel Optical Probing System with Submicron Spatial Resolution for Internal Diagnosis of VLSI Circuits. 269-275
Session 10.0: Fault Simulation and Diagnosis of Delay Faults
- Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal:
An Exact Non-Enumerative Fault Simulator for Path-Delay Faults. 276-285 - Patrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez:
A Diagnostic ATPG for Delay Faults Based on Genetic Algorithms. 286-293 - Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs:
Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis. 294-302
Session 11.0: Memory Test: Design for Testability
- Piero Olivo, Marcello Dalpasso:
Self-Learning Signature Analysis for Non-Volatile Memory Testing. 303-308 - Anne Meixner, Jash Banik:
Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. 309-318 - Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe:
A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. 319-324
Session 12.0: Board Test Challenges and Solutions
- Christophe Vaucher, Louis Balme:
Analog/Digital Testing of Loaded Boards Without Dedicated Test Points. 325-332 - Mick Tegethoff, Kenneth P. Parker, Ken Lee:
Opens Board Test Coverage: When is 99% Really 40%? 333-339 - D. Eugene Wedge, Tom Conner:
A Roadmap for Boundary-Scan Test Reuse. 340-346
Session 13.0: Delay-Fault Testing 1
- Harry Hengster, Uwe Sparmann, Bernd Becker, Sudhakar M. Reddy:
Local Transformations and Robust Dependent Path Delay. 347-356 - Irith Pomeranz, Sudhakar M. Reddy:
On Cancelling the Effects of Logic Sharing for Improved Path Delay Fault Testability. 357-366 - Jonathan T.-Y. Chang, Edward J. McCluskey:
Detecting Delay Flaws by Very-Low-Voltage Testing. 367-376
Session 14.0: Microprocessor Test
- Francis Pichon:
Testability Features for a Submicron Voice-coder ASIC. 377-385 - Hugo Cheung, Sandeep K. Gupta:
A BIST Methodology for Comprehensive Testing of RAM with Reduced Heat Dissipation. 386-395 - Wayne M. Needham, Naga Gollakota:
DFT Strategy for Intel Microprocessors. 396-399
Session 15.0: An Evolving Mixed-Signal Boundary-Scan Standard
- Lee Whetsel:
Proposal to Simplify Development of a Mixed-Signal Test Standard. 400-409 - Robert J. Russell:
A Method of Extending an 1149.1 Bus for Mixed-Signal Testing. 410-416 - Keith Lofstrom:
Early Capture for Boundary Scan Timing Measurements. 417-422
Session 16.0: Delay-Fault Testing 2
- Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar:
Identification and Test Generation for Primitive Faults. 423-432 - G. M. Luong, D. M. H. Walker:
Test Generation for Global Delay Faults. 433-442 - Dimitrios Karayiannis, Spyros Tragoudas:
ATPD: An Automatic Test Pattern Generator for Path Delay Faults. 443-452
Session 17.0: Software for New Test Strategies
- Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima:
Scan Design Oriented Test Technique for VLSI's Using ATE. 453-460 - Klaus Helmreich, G. Reinwardt:
Virtual Test of Noise and Jitter Parameters. 461-470 - Yuhai Ma, Wanchun Shi:
A Novel Approach to the Analysis of VLSI Device Test Programs. 471-480
Session 18.0: Innovations in Current Testing
- James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan:
Digital Integrated Circuit Testing using Transient Signal Analysis. 481-490 - Jos van Sas, Urbain Swerts, Marc Darquennes:
Towards an Effective IDDQ Test Vector Selection and Application Methodology. 491-500 - Theo J. Powell, James R. Pair, Bernard G. Carbajal III:
Correlating Defects to Functional and IDDQ Tests. 501-510
Session 19.0: Mixed-Signal DFT and Fault Simulation
- Thomas Olbrich, Jordi Pérez, Ian Andrew Grout, Andrew Mark David Richardson, Carles Ferrer:
Defect-Oriented vs. Schematic-Level Based Fault Simulation for Mixed-Signal ICs. 511-520 - Giri Devarayanadurg, Prashant Goteti, Mani Soma:
Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs. 521-527 - Evan M. Hawrysh, Gordon W. Roberts:
An Integration of Memory-Based Analog Signal Generation into Current DFT Architectures. 528-537
Session 20.0: DFT: Inching Forward with Partial-Scan Design
- Vamsi Boppana, W. Kent Fuchs:
Partial Scan Design Based on State Transition Modeling. 538-547 - Dong Xiang, Janak H. Patel:
A Global Algorithm for the Partial Scan Design Problem Using Circuit State Information. 548-557 - Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda:
Partial Scan Flip Flop Selection for Simulation-Based Sequential ATPGs. 558-564
Session 21.0: Test Languages and Tools
- Anthony Taylor, Gregory A. Maston:
Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms. 565-570 - Naim Ben-Hamida, Khaled Saab, David Marche, Bozena Kaminska, Guy Quesnel:
LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits. 571-580 - Ilene Burnstein, Taratip Suwannasart, C. Robert Carlson:
Developing a Testing Maturity Model for Software Test Process Evaluation and Improvement. 581-589
Session 22.0: Application of SPC to IC Design, Manufacturing and Test
- Von-Kyoung Kim, Mick Tegethoff, Tom Chen:
ASIC Yield Estimation at Early Design Cycle. 590-594 - Daniel P. Core:
Risk Assessment Sampling Plans for Non-Standard (Maverick) Material. 595-604 - Jos van der Peet, Ger van Boxem:
SPC on the IC-Production Test Process. 605-610
Session 23.0: New Techniques for Realistic Faults
- David B. Lavo, Tracy Larrabee, Brian Chess:
Beyond the Byzantine Generals: Unexpected Behaviour and Bridging Fault Diagnosis. 611-619 - F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira:
Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. 620-628 - Li-C. Wang, M. Ray Mercer, Thomas W. Williams:
Using Target Faults To Detect Non-Tartget Defects. 629-638
Session 24.0: Design-for-Testability Inspirations
- Sandeep Bhatia, Tushar Gheewala, Prab Varma:
A Unifying Methodology for Intellectual Property and Custom Logic Testing. 639-648 - Nagesh Tamarapalli, Janusz Rajski:
Constructive Multi-Phase Test Point Insertion for Scan-Based BIST. 649-658 - Robert B. Norwood, Edward J. McCluskey:
Orthogonal Scan: Low-Overhead Scan for Data Paths. 659-668
Session 25.0: High Frequency and Timing in ATE
- Kazunori Chihara, Takashi Sekino, Koji Sasaki:
An Application of Photoconductive Switch for High-Speed Testing. 669-676 - Hideaki Imada, Kenichi Fujisaki, Toshimi Ohsawa, Masaru Tsuto:
Generation Technique of 500MHz Ultra-High Speed Algorithmic Pattern. 677-684 - Michael G. Davis:
The Effect of Periof Generation Techniques on Period Resolution and Waveform Jitter in VLSI Test Systems. 685-690
Session 26.0: Topics in Test Engineering
- Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell:
Analysis and Detection of Timing Failures in an Experimental Test Chip. 691-700 - David Potts, Roger Griesmer:
A Unique Methodology for At-Speed Test of cDSPTM and ASIC Devices. 701-707 - Ralf Stoffels:
Cost Effective Frequency Measurement for Production Testing. 708-716
Session 27.0: System Test: Practical Aspects, Partitioning and Simulation
- Wuudiann Ke:
Backplane Interconnect Test in a Boundary-Scan Environment. 717-724 - Yves Le Traon, Ghassan Al Hayek, Chantal Robach:
Testability-Oriented Hardware/Software Partitioning. 725-731 - Pablo Sanchez, Isabel Hidalgo:
System Level Fault Simulation. 732-740
Session 28.0: Test Synthesis Solutions
- Tom Eberle, Robert McVay, Chris Meyers, Jason Moore:
ASIC BIST Synthesis: A VHDL Approach. 741-750 - James Beausang, Chris Ellingham, Markus Robinson:
Integrating Scan into Hierarchical Synthesis Methodologies. 751-756 - Vishwani D. Agrawal, Ronald D. Blanton, Maurizio Damiani:
Synthesis of Self-Testing Finite State Machines from High-Level Specifications. 757-766
Session 29.0: Advanced Fault Modelling Techniques
- Yuyun Liao, D. M. H. Walker:
Fault Coverage Analysis for Physically-Based CMOS Bridging Faults at Different Power Supply Voltages. 767-775 - Michael J. Ohletz:
Realistic-Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits. 776-785 - Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly:
IDDQ Test: Sensitivity Analysis of Scaling. 786-792
Session 30.0: Test Economic Issues
- Hiromu Fujioka, Koji Nakamae, Akio Higashi:
Effects of Multi-Product, Small-Sized Production of LSIs Packaged in Various Packages on the Final Test Process Efficiency and Cost. 793-799 - Felix Frayman, Mick Tegethoff, Brenton White:
Issues in Optimizing the Test Process - A Telecom Case Study. 800-808 - Matthew Boutin, Peter Dziel:
Application of Boundary Scan in a Fault Tolerant Computer System. 809-817
Session 31.0: MCM Test: Methods and Applications
- Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian:
Optimal Multiple Chain Relay Testing Scheme for MCMs on Large Area Substrates. 818-827 - Andrew Flint:
Three Different MCMs, Three Different Test Strategies. 828-833 - Edward P. Sayre:
MCM Compute Node Thermal Failure - Design or Test Problem? 834-838
Session D1.0: Design Validation: Methodologies and Case Studies
- Carl Pixley, Noel R. Strader, William C. Bruce, Jaehong Park, Matt Kaufmann, Kurt Shultz, Michael Burns, Jainendra Kumar, Jun Yuan, Janet Nguyen:
Commercial Design Verification: Methodology and Tools. 839-848 - Marc E. Levitt:
Formal Verification of the UltraSPARCTM Family of Processors via ATPG Methods. 849-856 - Neeta Ganguly, Magdy S. Abadir, Manish Pandey:
PowerPCTM Array Verification Methodology using Formal Techniques. 857-864
Session D2.0: Hybrid Validation and Test Techniques
- Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, Uwe Gläser:
An ATPG-Based Framework for Verifying Sequential Equivalence. 865-874 - Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Hoskote:
A Unified Framework for Design Validation and Manufacturing Test. 875-884 - Ghassan Al Hayek, Chantal Robach:
From Specification Validation to Hardware Testing: A Unified Method. 885-893
Session D3.0: Design Validation: From System Specification to Process Effects
- Duncan Clarke, Insup Lee:
Testing-Based Analysis of Real-Time System Models. 894-903 - Irith Pomeranz, Nirmal R. Saxena, Richard Reeve, Paritosh Kulkarni, Yan A. Li:
Generation of Test Cases for Hardware Design Verification of a Super-Scalar Fetch Processor. 904-913 - Melvin A. Breuer, Sandeep K. Gupta:
Process-Aggravated Noise (PAN): New Validation and Test Problems. 914-923
Session L1: Unpowered Opens Testing
- Kenneth P. Parker:
Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. 924 - Ted T. Turner:
Capacitive Leadframe Testing. 925 - Jack Ferguson:
High Fault Coverage of In-Circuit IC Pin Faults with a Vectorless Test Technique Using Parasitic Transistors. 926 - Joe Wrinn:
Two New Techniques for Identifying Opens on Printed Circuit Boards: Analog Junction Test, and Radio Frequency Induction Test. 927 - Anthony J. Suto:
Analog AC Harmonic Method for Detecting Solder Opens. 928 - Stig Oresjo:
Unpowered Opens Test with X-Ray Laminography. 929
Session L2: Practical Aspects of IC Diagnosis & Failure Analysis: A Walk Through the Process
- David P. Vallett:
An Overview of CMOS VLSI Failure Analysis and the Importance of Test and Diagnostics. 930 - Robert C. Aitken:
Modelling the Unmodellable: Algorithmic Fault Diagnosis. 931 - Keith Baker, Jos van Beers:
Shmoo Plots - the Black Art of IC Test. 932-933 - Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena:
Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. 934 - Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson:
IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. 935 - Donald Staab:
Practical Issues of Failure Diagnosis and Analysis in a Fast Cycle Time Environment. 936
Panel 1: Why Do We Talk about DFT When the Problem is Bad Design and Bad CAD Tools?
- William R. Simpson:
The Key to Concurrent Engineering is Design Tools. 937
Panel 2: Asynchronous Design: Nightmare or Opportunity?
- Stephen B. Furber:
The Return of Asynchronous Logic. 938 - Marly Roncken:
Asynchronous Design: Working the Fast Lane. 939
Panel 5: DFT for Embedded Cores
- Rochit Rajsuman:
Challenge of the 90's: Testing CoreWareTM Based ASICs. 940
Panel 6: What Are the Next Generation Test Methodologies for Board and System Test?
- Peter Dziel:
The Need for Complete System Level Test Standardization. 941
Panel 7: Will I-DDQ Testing Leak Away in Deep Sub-Micron Technology?
- Manoj Sachdev:
Deep Sub-micron IDDQ Test Options. 942
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