


default search action
SPLC 2021: Leicester, UK
- Mohammad Reza Mousavi, Pierre-Yves Schobbens:
SPLC '21: 25th ACM International Systems and Software Product Line Conference, Leicester, United Kindom, September 6-11, 2021, Volume B. ACM 2021, ISBN 978-1-4503-8470-4 - Sophie Fortz
:
LIFTS: learning featured transition systems. 1-6 - Sofia Ananieva:
Consistent management of variability in space and time. 7-12 - Edilton Lima dos Santos
:
STARS: software technology for adaptable and reusable systems. 13-17 - Kevin Feichtinger
:
A flexible approach for transforming variability models. 18-23 - Maurice H. ter Beek, Franco Mazzanti, Ferruccio Damiani, Luca Paolini
, Giordano Scarso, Michele Valfrè, Michael Lienhardt:
Static analysis and family-based model checking of featured transition systems with VMC. 24-27 - Johan Martinson
, Herman Jansson, Mukelabai Mukelabai, Thorsten Berger, Alexandre Bergel, Truong Ho-Quang:
HAnS: IDE-based editing support for embedded feature annotations. 28-31 - Alessandro Fantechi, Stefania Gnesi, Samuele Livi, Laura Semini:
A spaCy-based tool for extracting variability from NL requirements. 32-35 - Mathieu Acher, Gilles Perrouin, Maxime Cordy:
BURST: a benchmarking platform for uniform random sampling techniques. 36-40 - Tobias Pett, Sebastian Krieter, Thomas Thüm, Malte Lochau, Ina Schaefer:
AutoSMP: an evaluation platform for sampling algorithms. 41-44 - Gökhan Kahraman, Loek Cleophas:
Automated derivation of variants in manufacturing systems design. 45-50 - Joaquín Ballesteros, Lidia Fuentes:
Transfer learning for multiobjective optimization algorithms supporting dynamic software product lines. 51-59 - Marcus Pinnecke:
Product-lining the elinvar wealthtech microservice platform. 60-68 - Kevin Feichtinger
, Rick Rabiser
:
How flexible must a transformation approach for variability models and custom variability representations be? 69-72 - Chico Sundermann, Tobias Heß, Dominik Engelhardt, Rahel Arens, Johannes Herschel, Kevin Jedelhauser, Benedikt Jutz
, Sebastian Krieter, Ina Schaefer:
Integration of UVL in FeatureIDE. 73-79 - David Romero
, José A. Galindo, José Miguel Horcas
, David Benavides:
A first prototype of a new repository for feature model exchange and knowledge sharing. 80-85 - Hao Xu, Souheib Baarir, Tewfik Ziadi, Lom-Messan Hillah, Siham Essodaigui, Yves Bossu:
Optimisation for the product configuration system of Renault: towards an integration of symmetries. 86-90 - Johann Mortara
, Xhevahire Tërnava, Philippe Collet, Anne-Marie Pinna-Dery:
Extending the identification of object-oriented variability implementations using usage relationships. 91-98 - David Morais Ferreira
, Vasil L. Tenev, Martin Becker:
Product-line analysis cookbook: a classification system for complex analysis toolchains. 99-104 - Kristof Meixner, Kevin Feichtinger
, Rick Rabiser
, Stefan Biffl:
A reusable set of real-world product line case studies for comparing variability models in research and practice. 105-112 - Elias Kuiter
, Jacob Krüger, Gunter Saake:
Iterative development and changing requirements: drivers of variability in an industrial system for veterinary anesthesia. 113-122 - Hafiyyan Sayyid Fadhlillah
, Kevin Feichtinger
, Lisa Sonnleithner, Rick Rabiser
, Alois Zoitl:
Towards heterogeneous multi-dimensional variability modeling in cyber-physical production systems. 123-129

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.