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"Multiple test set generation method for LFSR-based BIST."

Youhua Shi, Zhe Zhang (2003)

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DOI: 10.1145/1119772.1119962

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/aspdac/ShiZ03
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  - https://dblp.org/rec/conf/aspdac/ShiZ03
Youhua Shi, Zhe Zhang:
Multiple test set generation method for LFSR-based BIST. ASP-DAC 2003: 863-868

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