default search action

combined dblp search
author search
venue search
publication search

ask others

"Barrier Height Stability and Reverse Leakage Mechanisms in Ni/Ga2O3 (001) ..."

Wenshen Li et al. (2019)

> Home

Details and statistics

DOI: 10.1109/DRC46940.2019.9046433

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/drc/LiNHJX19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/drc/LiNHJX19
Wenshen Li, Kazuki Nornoto, Zongyang Hu, Debdeep Jena, Huili Grace Xing:
Barrier Height Stability and Reverse Leakage Mechanisms in Ni/Ga2O3 (001) Schottky Barrier Diodes. DRC 2019: 159-160

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.

Note: This service is not intended for secure transactions such as banking, social media, email, or purchasing. Use at your own risk. We assume no liability whatsoever for broken pages.

Pfad - The Proxy pFad of © 2024 Garber Painting. All rights reserved.