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"Vertical GaN FinFET with Small form Factor and High Reliability for ..."

Hyeon-Tak Kwak et al. (2024)

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DOI: 10.1109/ICTC62082.2024.10827337

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-28

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Hyeon-Tak Kwak, Hyun-Woo Lee, Donghan Kim, Jaewon Park, Hoe-Min Kwak, Sung-Bum Bae, Hyung-Seok Lee:
Vertical GaN FinFET with Small form Factor and High Reliability for Implementation of 6G Communication. ICTC 2024: 1473-1474

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