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"Comparison between Random and Pseudo-Random Generation for BIST of Delay, ..."

Patrick Girard et al. (2000)

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DOI: 10.1109/OLT.2000.856623

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/iolts/GirardLPV00
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Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. IOLTW 2000: 121-126

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