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"Accurate characterization of random process variations using a robust ..."

Mesut Meterelliyoz et al. (2010)

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DOI: 10.1109/ISSCC.2010.5433991

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Mesut Meterelliyoz, Ashish Goel, Jaydeep P. Kulkarni, Kaushik Roy:
Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit. ISSCC 2010: 186-187

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