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"Innovative Practices on In-System Test and Reliability of Memories."

S. Bandyopadhyay et al. (2019)

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DOI: 10.1109/VTS.2019.8758675

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-15

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  dblp key:
  - conf/vts/BandyopadhyayMH19
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  - https://dblp.org/rec/conf/vts/BandyopadhyayMH19
S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan:
Innovative Practices on In-System Test and Reliability of Memories. VTS 2019: 1

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