Abstract
This paper introduces a vision-based on-line fabric inspection methodology for woven textile fabrics. The current procedure for the determination of fabric defects in the textile industry is performed by humans in the off-line stage. The proposed inspection system consists of hardware and software components. The hardware components consist of CCD array camera, a frame grabber, and appropriate illumination. The software routines capitalize on vertical and horizontal scanning algorithms to reduce the 2-D image into a stream of 1-D data. Next, wavelet transform is used to extract features that are characteristic of a particular defect. The signal-to-noise ratio (SNR) calculation based on the results of the wavelet transform is performed to measure any defects. Defect detection is carried out by employing SNR and scanning methods. Learning routines are called upon to optimize the wavelet coefficients. Test results from different types of defect and different styles of fabric demonstrate the effectiveness of the proposed inspection system.
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Kim, S., Vachtsevanos, G., Dorrity, J.L.: An intelligent approach to integration of textile processes. In: ASME 1996 Intl. Congress & Exposition, Atlanta, GA, pp. 73–79 (1996)
Vachtsevanos, G., Dorrity, J.L., Kumar, A., Kim, S.: Advanced application of statistical and fuzzy control to textile processes. IEEE Trans. on Industry Applications 30, 510–516 (1994)
Jasper, W.J., Garnier, S.J., Potlapalli, H.: Texture characterization and defect detection using adaptive wavelets. Optical Engineering 35, 3140–3149 (1996)
Brad, R.: Quality Assurance by Automated Defect Detection of Textile Fabrics. In: Proc. of XI-th Int. Symp. SINTES, Craiova Romania, vol. II, pp. 487–491 (2003)
Chan, C.H., Pang, G.: Fabric defect detection by Fourier analysis. IEEE Trans. Ind. Application 36, 1267–1276 (2000)
Mallat, S.: Wavelets for a vision. Proceedings of the IEEE 84, 604–614 (1996)
Strang, G., Nguyen, T.: Wavelets and filter banks. Wellesley-Cambridge Press, Cambridge (1996)
Masters, T.: Signal and Image Processing with Neural Networks. John Wiley and Sons, Inc., Chichester (1994)
Rioul, O., Vetterli, M.: Wavelet and Signal Processing. IEEE Signal Processing Magazine 8, 14–38 (1991)
Rao, S.S.: Optimization-Theory and Applications, pp. 292–300. John Wiley Sons, New York (1984)
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© 2005 Springer-Verlag Berlin Heidelberg
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Kim, S., Bae, H., Cheon, SP., Kim, KB. (2005). On-line Fabric-Defects Detection Based on Wavelet Analysis. In: Gervasi, O., et al. Computational Science and Its Applications – ICCSA 2005. ICCSA 2005. Lecture Notes in Computer Science, vol 3483. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11424925_112
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DOI: https://doi.org/10.1007/11424925_112
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-25863-6
Online ISBN: 978-3-540-32309-9
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