Abstract
We present a new image-based process for measuring the bidirectional reflectance of homogeneous surfaces rapidly, completely, and accurately. For simple sample shapes (spheres and cylinders) the method requires only a digital camera and a stable light source. Adding a 3D scanner allows a wide class of curved near-convex objects to be measured. With measurements for a variety of materials from paints to human skin, we demonstrate the new method’y to achieve high resolution and accuracy over a large domain of illumination and reflection directions. We verify our measurements by tests of internal consistency and by comparison against measurements made using a gonioreflectomter.
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References
Standard practice for angle resolved optical scatter measurements on specular or diffuse surfaces. ASTM Standard E 1392–1396.
A. Cader and J. Jankowski. Reflection of ultraviolet radiation from different skin types. Health Physics, 74(2): 169–172, February 1998.
Raymond J. Castonguay. New generation high-speed high-resolution hemispherical scat-terometer. In John C. Stover, editor, SPIE Proceedings, volume 1995, pages 152–165, July 1993.
J. H. Chandler and C. J. Padfield. Automated digital photogrammetry on a shoestring. Pho-togrammetric Record, 15(88):545–559, 1996.
J. Fan and I. Gijbels. Local Polynomial Modeling and Its Applications. Chapman and Hall, London, 1996.
Sing-Choong Foo. A gonioreflectometer for measuring the bidirectional reflectance of material for use in illumination computation. Master’s thesis, Cornell University, 1997.
C. S. Fraser, M. R. Shortis, and G. Ganci. Multi-sensor system self-calibration. In Video-metrics IV, pages 2–18. SPIE, October 1995.
A. Glassner, editor. An Introduction to Ray Tracing. Academic Press, London, 1989.
Steven J. Gortler, Radek Grzeszczuk, Richard Szeliski, and Michael F. Cohen. The lumi-graph. In Computer Graphics (SIGGRAPH’ 96 Proceedings), pages 43–54, August 1996.
Anat Grynberg and Greg Ward. A new tool for reflectometry. Monograph 161, Lawrence Berkeley Laboratory, July 1990.
Pat Hanrahan and Wolfgang Krueger. Reflection from layered surfaces due to subsurface scattering. In Computer Graphics (SIGGRAPH’ 93 Proceedings), pages 165–174, August 1993.
Ziad R. Hatab, John R. McNeil, and S. Sohail H. Naqvi. Sixteen-megabit dynamic random access memory trench depth characterization using two-dimensional diffraction analysis. Journal of Vacuum Science and Technology B, 13(2): 174–181, March/April 1995.
Xiao D. He, Kenneth E. Torrance, Francois X. Sillion, and Donald P. Greenberg. A comprehensive physical model for light reflection. Computer Graphics (SIGGRAPH’ 91 Proceedings), 25(4): 175–186, July 1991.
Katsushi Ikeuchi and Kosuke Sato. Determining reflectance properties of an object using range and brightness image. IEEE Transactions on Pattern Analysis and Machine Intelligence, 13(11):1139–1153, 1991.
Konrad F. Karner, Heinz Mayer, and Michael Gervautz. An image based measurement system for anisotropic reflection. Computer Graphics Forum (Eurographics’ 96 Proceedings), 15(3): 119–128, August 1996.
Eric P. F. Lafortune, Sing-Choong Foo, Kenneth E. Torrance, and Donald P. Greenberg. Non-linear approximation of reflectance functions. In Computer Graphics (SIGGRAPH’ 97 Proceedings), pages 117–126, August 1997.
Rong Lu, Jan J. Koenderink, and Astrid M. L. Kappers. Optical properties (bidirectional reflectance distribution functions) of velvet. Applied Optics, 37(25):5974–5984, September 1998.
Stephen R. Marschner. Inverse Rendering for Computer Graphics. PhD thesis, Cornell University, 1998.
F. E. Nicodemus, J. C. Richmond, J. J. Hsia, I. W. Ginsberg, and T. Limperis. Geometric considerations and nomenclature for reflectance. Monograph 160, National Bureau of Standards (US), October 1977.
Yoichi Sato, Mark D. Wheeler, and Katsushi Ikeuchi. Object shape and reflectance modeling from observation. In Computer Graphics (SIGGRAPH’ 97 Proceedings), pages 379–387, August 1997.
K. E. Torrance and E. M. Sparrow. Off-specular peaks in the directional distribution of reflected thermal radiation. Transactions of the ASME, 88:223–230, May 1966.
K. E. Torrance and E. M. Sparrow. Theory for off-specular reflection from roughened surfaces. Journal of Optical Society of America, 57(9): 1105–1114, 1967.
Gregory J. Ward. Measuring and modeling anisotropic reflection. Computer Graphics (SIGGRAPH’ 92 Proceedings), 26(2):265–272, July 1992.
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Marschner, S.R., Westin, S.H., Lafortune, E.P.F., Torrance, K.E., Greenberg, D.P. (1999). Image-Based BRDF Measurement Including Human Skin. In: Lischinski, D., Larson, G.W. (eds) Rendering Techniques’ 99. EGSR 1999. Eurographics. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6809-7_13
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DOI: https://doi.org/10.1007/978-3-7091-6809-7_13
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