IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Analog Circuits and Their Application Technologies
Comprehensive Analysis of Read Fluctuations in ReRAM CiM by Using Fluctuation Pattern Classifier
Ayumu YAMADAZhiyuan HUANGNaoko MISAWAChihiro MATSUIKen TAKEUCHI
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JOURNAL FREE ACCESS

2024 Volume E107.C Issue 10 Pages 416-425

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Abstract

In this work, fluctuation patterns of ReRAM current are classified automatically by proposed fluctuation pattern classifier (FPC). FPC is trained with artificially created dataset to overcome the difficulties of measured current signals, including the annotation cost and imbalanced data amount. Using FPC, fluctuation occurrence under different write conditions is analyzed for both HRS and LRS current. Based on the measurement and classification results, physical models of fluctuations are established.

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© 2024 The Institute of Electronics, Information and Communication Engineers
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