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OmniScan MX2 PDF

Olympus OmniScan MX2 is the most successful portable and modular Phased Array test instrument produced by the company to date. It increases testing efficiencies, ensuring superior manual and advanced AUT application performance with faster setups, test cycles, and reporting. The second generation OmniScan offers a high acquisition rate and new powerful software features--in a portable, modular instrument.

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© © All Rights Reserved
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100% found this document useful (1 vote)
750 views12 pages

OmniScan MX2 PDF

Olympus OmniScan MX2 is the most successful portable and modular Phased Array test instrument produced by the company to date. It increases testing efficiencies, ensuring superior manual and advanced AUT application performance with faster setups, test cycles, and reporting. The second generation OmniScan offers a high acquisition rate and new powerful software features--in a portable, modular instrument.

Uploaded by

pokeboy19
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 12

PHASED ARRAY FLAW DETECTOR

OmniScan MX2

The Standard in Phased Array, Redefined


Bright, Large Size Screen
Fast, Intuitive Touch Screen
Interface
Advanced Weld Overlay
High-Capacity Data Storage
Fast File Transfer
920-218A-EN

The Standard in Phased Array, Redefined


The result of over 10 years of proven leadership in
modular NDT test platforms, the OmniScan MX
has been the most successful portable and modular
phased array test instrument produced by Olympus
to date, with thousands of units in use throughout
the world.

Building on a Solid Basis


This second generation OmniScan MX2 increases
testing efficiencies, ensuring superior manual and
advanced AUT application performance with faster
setups, test cycles, and reporting, in addition to universal compatibility with all phased array modules:
past, present and future. Designed for NDT phased
array leaders, this high-end, scalable platform delivers true next-generation NDT testing.
The OmniScan MX2 offers a high acquisition rate
and new powerful software featuresin a portable,
modular instrumentto efficiently perform manual
and automated inspections.

Faster Is Better!
Powerstart your day the right way with the
OmniScan MX2. The OmniScan MX2 simplifies
and speeds up the setup process with its new Weld
Overlay software feature, so you can start testing
immediately. Featuring the industry-standard Phased
Array User Interface with faster than ever performance, a bigger and brighter 10.4in. screen, new
and unique intuitive touch screen capabilities, and
faster data transfer, enabling you to get to your next
inspection quicker.

More Rugged than Ever


The OmniScan MX2 is now designed for IP66. It
is built to endure the drops, spills, and abuse that
typically occur in your most demanding inspection
environments.

More than an Instrument


A Solution Provider
The OmniScan MX2 is an important part of your inspection solution that can be combined with other
critical components to form a complete inspection system. Olympus offers a complete product
range which includes phased array probes, scanners, analysis software, and accessories, which are
integrated and packaged into rapidly deployable,
application-specific solution packages for quick
returns on your investment. In addition, Olympus
offers a high-quality calibration and repair service
worldwide that is backed by a team of phased array
application experts to ensure you get the support
you need.

www.olympus-ims.com

Life-Size OmniScan MX2

Touch Screen Interface


The revolutionary touch screen interface offers simple and quick navigation, enhanced
text input functions, and easier, faster cursor manipulation and gate setup.

Full-Screen Mode
The unique full-screen mode offers operators increased viewing comfort, in addition to better readability at a distance.
This feature can be used in both acquisition and analysis mode.

Bright 10.4 in. Screen

OmniScan MX

OmniScan MX2

OmniScan MX

Weld Overlay Wizard


The Weld Overlay Wizard facilitates the
creation of industry-standard weld overlays for analysis assistance and volumetric
flaw placement.
4

OmniScan MX2

50% larger screen

OmniScan MX
OmniScan MX2

100% brighter screen


www.olympus-ims.com

Modular Instrument
Backward Compatible. Forward Compatible.
An Evolving Platform for your Growing Needs.
Designed to secure both your current and future phased array investments, the OmniScan MX2 can house any Olympus phased array modulewhether the reliable, field-proven models currently available, or the
next-generation modules of the future. Its open architecture also supports
future software updates and phased array module upgrades with configurations from 16:64M to 32:128 to ensure that your platform evolves with
your testing needs, and that you get the most from your investment.

Module Compatibility

OmniScan MX2

OMNI-M-PA1664M
OMNI-M-PA1664
OMNI-M-PA16128
OMNI-M-PA16128PR

OMNI-M-PA32128
OMNI-M-PA32128PR
OMNI-M-PA3232
OMNI-M-UT
OMNI-M-ECT/ECA

OmniScan MX

Software Compatibility

MXU-3.X1
MXU-2.X setup and data file
TomoView 2.9R71, 2

1. Older versions are not compatible with the OmniScan MX2.


2. Data file compatibility, no data acquisition.

16:64 PA M

16:64 PA
16:128 PA

32:32 PA
32:128 PA

Setting Up for Success


Touch Screen
The bright 10.4 in. screen with its revolutionary touch screen interface offers simple and quick navigation, enhanced text input functions,
and easier, faster cursor navigation and gate setup.

Menu Selection and Parameter Settings

Gate Selection and Movement

In Gate mode, tap and hold on a gate to move the gate to a new position.

Tap once on the screen to quickly navigate through menus, sub-menus and parameters.

Zooming and Panning

In Cursor mode, tap once on a cursor to select it. Double-tap on a position to move the cursor to the desired location.

Text and Value Input

The touch screens zooming functions can be used to zoom in on a specific area. In
Zoom mode, tap, hold, and drag to create a selection rectangle, and then release to
zoom in on the area.

In Zoom mode, swipe to pan the window contents.


6

Double-tap on a parameter to bring up the keyboard or keypad on which


values can be entered.

www.olympus-ims.com

Setup
Group Wizard for All Essential Parameters:
Material selection, with a database for shear and longitudinal
velocities, and configuration of components for flat or curved
surfaces.
Group copy Wizard for fast creation of symmetrical two-probe
inspections.
Wedge selection from a database of Olympus wedges.
Auto probe detection.
Scanner configuration with offsets, skews, and probe positions.
Wizard guidance for phased array, conventional UT, and
TOFD channels.
Detailed interactive illustrated help menu for every step in the
Wizard.
Weld Overlay and RayTracing.

Scan plan adjustment using the focal law configuration wizard.

Setup Speed
OmniScan MX
OmniScan MX2

50% faster

S-Scan and A-Scan Display Refresh Rate


OmniScan MX
OmniScan MX2

300% better
UT parameter adjustment using the touch screen software keypad.

Calibration
Code-Compliant Calibration
The Calibration Wizards ensure that every focal law in every
group is the direct equivalent of a single-channel conventional
flaw detector.

Calibration Wizards
Calibration Wizards guide the user step-by-step through
Velocity, Wedge Delay, Sensitivity, TCG, DAC, and DGS
calibrations.
Enable experimental or theoretical sensitivity and TCG
curves based on 2, 3, or all beams for a real or interpolated
calibration.
Simple, easy-to-use interface that enables all focal laws to be
visualized simultaneously for a particular calibration task.
Interactive help menu with detailed graphics and definitions,
which is available in each step of the Wizard.

Sensitivity calibration for a defined section in a sectorial scan.

Sensitivity calibration for all beams in a sectorial scan.


7

Acquisition
A scan menu for quick and easy configuration of inspection
parameters for manual, one-line, raster, and helicoidal scans.
Encoder configuration for clock, and one- or two-axis
inspections.
C-scan configuration for amplitude and position C-scans, and
display setup.
Data storage options for full A-scans, S-scans, and/or C-scans.
Preconfigured display layouts for easy inspection preparation.
PRF auto adjustments for optimized, maximum speed, or
manually-controlled settings.
Data storage options for flash card or USB media devices.
Real-time data acquisition displays, with the ability to rewrite
data in both scan directions when using an encoder.
Easy-to-use interface with mechanized or semi-automated
scanner systems, and simple wheel encoders.

Top: Data acquisition


displaying TOFD.
Right: Data acquisition
displaying two phased
array channels and
TOFD.

Pulse Repetition Frequency (PRF)


OmniScan MX

40% better

OmniScan MX2

Saving Inspection Data File to USB (speed)


OmniScan MX

Up to 400% better

OmniScan MX2

Maximum File Size (Mb)


OmniScan MX

160 Mb

OmniScan MX2

300 Mb

Analysis
An extensive display menu for preconfigured multigroup and
multiprobe inspection layouts.
Data, reference, and measurement cursors for defect sizing
and reporting.
Extensive Readings database for trigonometry, flaw statistics on
axes, volumetric position information, code-based acceptance
criteria, corrosion mapping statistics, etc.
All Readings are available online, or off-line when full A-scans
are saved in data files.
Linked displays for interactive analysis on A-scans, B-scans,
S-scans, and C-scans for multigroup and multiprobe
inspections.
Optimized preconfigured layouts for quick and simple length,
depth, and height sizing of flaws for code-based or non-codebased inspections.
Interactive off-line gate repositioning.

Weld inspection
display showing the
position of indications
in the RayTracing
display.

Flawless Data Management


An SD Card is used to store data for easy transfer to a computer.
The SD card can also be inserted and removed without having
to reboot the unit. In addition, data can be transferred to external media using the USB 2.0 port. The OmniScan MX2 provides
data transfer speeds up to 400% faster than the OmniScan MX
(depending on the device used).

www.olympus-ims.com

Reporting

11-01-13 10:20

OmniScan Report

The OmniScan MX2 is designed to inspect, analyze and generate


reports directly on the instrument, or off-line on a computer.
The reports created on the OmniScan include an indication
table that can be customized with additional readings and
comments specific to each indication.
A high resolution image of the current display is included in
the report when selected.
The auto-generated report contains relevant parameters for the
instrument, software, calibration, UT parameters, phased array
parameters, scanner setup, and flaw reporting.
Up to eight readings from the original setup can be displayed
using the touch screens simple toggle operations.
Reports are stored and viewed on the instrument, and can also
be saved as HTML documents for use on a computer.
Reports are fully customizable and come with several
preconfigured templates.

Report Date

Report Version
MXU - 3.0B4T12
OmniScan Serial
#
OMNI-

2011 / 01 / 11
OmniScan Type
N/A

File Name
PV200steph2.opd
Module Type
EQUX251C AMP12
7

Inspection Date
2010 / 12 / 20
Module Serial #
OMNI- 2037

Inspection Version

Indicatio
n # Scan
1
109.00
mm

Group 1

Gate
I
A
B
TCG Point Numbe
r
1
2
3

Start (Half Path)


11.70 mm
Scale Factor
12
Gain
40.35 dB
Index Offset
-21.50 mm
Start
0.00 mm
7.00 mm
72.71 mm
Position (Half Path)
0.00 mm
11.98 mm
17.88 mm

Calculator
Element Qty. Used
16
Start Angle
70.00

First Element
1
Stop Angle
N/A

Range (Half Path)


61.40 mm
Video Filter
Off
Mode
PE (Pulse-Echo)
Skew
90.0
Width
11.00 mm
15.00 mm
11.00 mm

Max. PRF
35
Pretrig.
0.00 s
Wave Type
Shear
C-scan time resoluti
on
10.0 ns

Type
PA
Rectification
FW
Sound Velocity
3240.0 m/s

Threshold
20.00 %
50.00 %
30.00 %

The RayT

racing is

Angle Resolution
N/A

Resolution
1.0
Focal Depth
12.00 mm

Group
2

Channel
55.00

A%
67.7 %

DA^
5.60 mm

ViA^
-1.77 mm

VsA^
109.00
mm

A%
67.7 %

DA^
5.60 mm

U(m -r)
6.84 mm

Averaging Factor
1
Filter
None 0.50 - 19.00
MHz
Pulse Width
100.00 ns

S(m -r)
33.00 mm

Synchro.
Pulse
Pulse
Pulse

Gain
0.0 dB
1.2 dB
5.0 dB

Last Element
32

Inspection Data
Data File Name
File####

Index
-11.63
mm

Commen
ts
-

Setup
A:70.00 Sk:090 L:001
Beam Delay
22.1 us
Scale Type
Compression
Voltage
40 (Low)
Scan Offset
-81.00 mm

Save Mode

MXU - 3.0B4T10
Calibration Due
2011/8/12

Technicia

only a grap

hical repre

n Nam

Wave Type
Technicia
Shear
n Sign
atur
Contrac

tor

sentation

________

of the read

ings appr
oved

by the oper

ator.

________

________
Materia
________
l Velocity
________
________
3240.0

e
m/s
________
Law Configu
________
ration
________
________
Linear
________
________

________

________

________

________

________

________

________

Date

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

________

____

________

________

________
____

____

________

________

________

________

________

____

________

________

Page 1 sur 9
Page 9 sur

OmniScan Data Analysis and Reporting with TomoView


TomoView is the perfect PC-based companion to
the OmniScan family of instruments, and seamlessly
imports OmniScan files for advanced processing and
analysis in TomoView.
Displays volume-corrected views; views are fully
customizable and come with several preconfigured
templates.
Corrects potential operator errors in acquisition
parameters (incorrect skews, index offsets, etc.) by
reading back raw acquisition data without altering
original data.
Imports and merges several OmniScan data files. For
simplified interpretation, merges several groups into
one.

TomoView offers advanced post-processing of OmniScan


data. Illustrated here: weld overlay, multiple sector scans,
multibeam C-scans, and merging of Ascans with Top and
End views (the latter with rebound display).

Advanced Inspection Tools


TomoView offers advanced inspection tools to simulate,
test, and prepare setups for the OmniScan.
2D matrix
Pitch-and-catch, tandem
Advanced focusing

Advanced Analysis Tools


The TOFD Manager performs TOFD calibration,
lateral wave straightening, lateral wave removal, and
the synthetic aperture focusing technique (SAFT).
C-Scan Merge: Merges C-scans based on minimum
or maximum amplitude, or time-of-flight (TOF).
Signal-to-noise ratio (SNR): On a C-scan, this tool
calculates and displays areas in which SNR is above
and/or below a certain threshold.

2-D TRL phased array probe


(multiple-line scan).

Reporting
Creating a report in TomoView takes just a few clicks.
Defects can be added into the indication-table database,
the indication table can be customized with additional
readings, and you can add comments specific to each
indication.

Indication table built from composite inspection data.

Typical Applications
Girth Weld Inspection
The OmniScan PA is at the heart of the Olympus manual and
semiautomated circumferential weld inspection solutions developed
for the oil and gas industry. These phased array systems are certified
to inspect tubes in compliance with ASME, API, and other code criteria. They offer superior inspection speed and detection, and facilitate
the interpretation of indications.

Pressure Vessel Weld Inspection


A complete inspection of pressure vessel welds can be performed in a
single scan using an OmniScan PA and a motorized scanner such as
the WeldROVER. By combining TOFD and PA in a single inspection
pass, a significant reduction in inspection time can be achieved as
compared with conventional raster scanning or radiography. Furthermore, inspection results are available immediately, enabling you to
detect problems with welding equipment and fix them right away.

Weld Inspection of Small-Diameter Pipes


When coupled with the COBRA manual scanner, the OmniScan flaw
detector is capable of inspecting standard pipes ranging from 0.84in.
OD to 4.5in.OD. With its very slim design, this manual scanner is
capable of inspecting pipes in areas with limited access. Adjacent
obstructions such as piping, supports, and structures can be as close
as 12mm (0.5in.).

Manual and Semi-Automated Corrosion Mapping


The OmniScan PA with the HydroFORM scanner is designed to offer
the best inspection solution for detecting wall-thickness reductions
resulting from corrosion, abrasion, and erosion. In addition, this
system detects mid-wall damage, such as hydrogen-induced blistering
or manufacturing-induced laminations, and easily differentiates these
anomalies from loss of wall thickness.
In this application, phased array ultrasound technology offers superior
inspection speed, data point density, and detection.

Composite Inspection
Parts made of laminate composite materials pose an inspection challenge due to their various shapes and thicknesses.
Olympus offers complete solutions for the inspection of carbon
fiber reinforced polymer structures. These solutions are based on the
OmniScan flaw detector, the GLIDER scanner, and dedicated probes
and wedges designed for CFRP flat panel and radius inspection.

10

www.olympus-ims.com

OmniScan MX2 Specifications


Phased Array Module Specifications (Applies to OMNI-M-PA16128*)

OmniScan MX2 Mainframe Specifications


Overall dimensions
(W x H x D)

325 mm x 235 mm x 130 mm


(12.8 in. x 9.3 in. x 5.1 in.)

Overall dimensions
(W x H x D)

244mm x 182mm x 57mm


(9.6 in. x 7.1 in. x 2.1 in.)

Weight

5 kg (11 lb), including module and one battery

Weight

1.2 kg (2.6 lb)

Data Storage

Connectors

1 OmniScan connector for phased array probes


2 BNC connectors for UT probes

Storage devices

SDHC card, most standard USB storage devices,


or fast Ethernet

Number of focal laws

256

Data file size

300 MB

Probe recognition

Automatic probe recognition

USB ports

Aperture

16 elements

Speaker out

Yes

Number of elements

128 elements

Video output

Video out (SVGA)

Pulser

Ethernet

10/100 Mbps

Voltage

40 V or 80 V per element

Pulse width

Adjustable from 30 ns to 500 ns, resolution of 2.5ns

Encoder

2-axis encoder line (quadrature, up, down, or


clock/direction)

Pulse shape

Negative square wave

Output impedance

Less than 25

Digital input

4 digital TTL inputs, 5 V

Digital output

4 digital TTL outputs, 5 V, 15 mA

Receiver

Acquisition on/off
switch

Remote acquisition enabled TTL, 5 V

Power output line

5 V, 500 mA power output line


(short-circuit protected)

Alarms

3 TTL, 5 V, 15 mA

Scan type

Sectorial and linear

Analog output

2 analog outputs (12 bits) 5 V in 10 k

Group quantity

Up to 8

Pace input

5 V TTL pace input

Active elements

16*

Elements

128

Pulser/Receiver

I/O Ports

I/O Lines

Gain

0dB to 74 dB, maximum input signal 1.32Vp-p

Input impedance

75

System bandwidth

0.75MHz to 18 MHz (3 dB)

Beamforming

Display
Display size

26.4 cm (10.4 in.) (diagonal)

Data Acquisition

Resolution

800 pixelsx600 pixels

Digitizing frequency

100 MHz (10 bits)

Brightness

700 cd/m2

Maximum pulsing rate

Up to 10 kHz (C-scan)

Number of colors

16 million

Data Processing

Type

TFT LCD

Number of data points

Up to 8,000

Real-time averaging

2, 4, 8, 16

Power Supply
Battery type

Smart Li-ion battery

Rectifier

RF, full wave, halfwave +, halfwave

Number of batteries

1 or 2 (battery chamber accommodates two


hot-swappable batteries)

Filtering

Low-pass (adjusted to probe frequency), digital filtering


(bandwidth, frequency range)

Battery life

Minimum 6 hours with two batteries

Video filtering

Smoothing (adjusted to probe frequency range)

Environmental Specifications

Data Visualization

Operating temperature
range

0C to 45C; 0C to 35C with 32:128 PA


(32F to 113F; 32F to 95F with 32:128 PA)

A-scan refresh rate

Storage temperature
range

20C to 60C (4F to 140F) with batteries


20C to 70C (4F to 158F) without batteries

Data Synchronization
On internal clock

1 Hz to 10 kHz

On encoder

On 1 or 2 axes

Relative humidity

0% to 85% noncondensing
No air intake; designed for IP66

Shockproof rating

Drop tested according to MIL-STD-810G 516.6

Real time: 60 Hz

Programmable Time-Corrected Gain (TCG)


Number of points

16 (1 TCG curve per channel for focal laws)

Alarms
Number of alarms

Conditions

Any logical combination of gates

Analog outputs
2
* Models 16:16, 16:16M, 16:64, 16:64M, 32:32, and 32:128 also available.

Compatible with the Following Inspection Codes:


The OmniScan MX2 is compatible with standard industry inspection codes, including, but not limited to:
ASME Section V, Article 4
All ASME phased array code cases
ASTM E2700-09
ASTM 2591
ASTM E2491-06

AWS
API 1104 and API RP2X
CEN EN 583-6
BSI BS7706
and more

11

Global Presence, Local Assistance


Olympus has an extensive network of direct sales branches and representatives located in many industrial regions around the world.
Answers to your questions on products, applications, training, and technologies are just one phone call or e-mail away from our dedicated
staff members.

Customer Service
Olympus is committed to providing the best technical support and after-sales service to reliably meet your needs in a prompt and supportive fashion. Our professionally staffed service centers are dedicated to helping customers with repair or calibration throughout the life cycle
of equipment.

Olympus NDT Training Academy

Phased Array Testing Field Guide

The unique Olympus NDT Training Academy offers comprehensive courses in phased array technology and applications. Courses
range from a two-day Introduction to Phased Array program
to a two-week, in-depth LevelII Phased Array course. In all
cases, students experience practical training using the portable
OmniScan phased array unit.

Olympus new Phased Array Testing


field guide is a convenient resource for
customers and anyone else interested in
phased array technology. It is designed
to be an easy-to follow introduction to
ultrasonic phased array testing, both for
newcomers and more experienced users
who wish to review the basic principles.
This guide begins by explaining what
phased array testing is and how it works,
outlines some considerations for selecting probes and instruments, and concludes with further reference information
and a phased array glossary.

Phased Array Testing


Basic Theory for
ions
Industrial Applicat

Courses are currently being offered at the training facilities of


participating companies, in addition to customer-determined
locations worldwide. Customized courses can also be arranged.

s
NDT Field Guide

This free field guide can be obtained


from your local sales representative.

Understanding Phased Array Technology


Poster
g

understandin

Types of
Probes

Phased array unit

Acquisition unit

Angle Beam

Incident wave front

Probe elements

Basic Concepts

Pulses
Trigger

lled excitation (amplitude


elements
testing is the computer-contro
of multiple piezocomposite such as
array ultrasonic
feature of phased
probe. The excitation modifying beam parameters
The distinguishing
elements in a multielement
of dynamically
by means of constructive
from
and delay) of individual ultrasonic beam with the possibilityTo generate a beam in phase
Similarly, the echo by
through software.
different times.
can generate a focused
received
and focal spot size elements are pulsed at slightly
time shift. The echoes
angle, focal distance,
with a computable is an A-scan that emphasizes the
various active transducer
sum
transducer elements
interference, the
piece.
point hits the variousbeing summed together. The resulting
points in the test
the desired focal
time-shifted before and attenuates echoes from other
each element are
desired focal point
response from the

ws
Examples of focal la

Flaw

Emitting

Transmitting
delays

Receiving

Receiving delays
and sum

Reflected wave front


Echo signals

Flaw

are used with a


Angle beam probes
wedge to transmit
removable or integrated
into
or longitudinal wave
a refracted shear
a wide
are designed for
a test piece. They
to
and can be used
range of applications
skew
beam angle or the
vary the refracted
on the wedge
of the beam, depending
probe face is acoustically
orientation. The
material.
matched to the wedge

FD = 15

140

120

FD = 15

Delay (ns)

100

PA probe

Time delay [ns]

PA probe

Delay (ns)
Angle steering

and depth scanning


Delay values (left) a 32-element linear
for
principles (right)
at 15-mm, 30-mm,
array probe focusing
waves.
and 60-mm longitudinal

FD = 30
80

FD = 30

60

FD = 60

FD = 60

40

20

Incident wave front


0

Incident wave front

Illustration of beam

Illustration of beam

16

12

20

24

Integrated Wedge

32

28

Element number

steering

focusing

Scanning Patterns

ing
real-time array
Dynamic depth focus
(DDF) is a programmable,

Sectorial scanning

or angular
(also called azimuthal range for a
a sweep
With sectorial scanning
is moved through
sweep
scanning), the beam using the same elements; other
a constant
scanning,
angular
is performed at
With electronic
specific focal depth, focal depths may be added. The
This
elements; scanning
a group of active
probe length (aperture).
ranges with different
the phased array
different values.
transducer performing
angle and along
sectors may have
If
a conventional ultrasonic
or shear-wave inspection.
is equivalent to
for different
corrosion mapping
a raster scan for
laws compensate
is used, the focal
an angled wedge
the wedge.
time delays inside

nning
Electronic linear sca
is multiplexed across
a single focal law

delay,
Dynamic depth focusingaccomplished by modifying the DDF
ption
as a function of time.
response-on-rece
of each element
created by
gain, and excitation
same focal range
focal laws for the
beams at the receiving
replaces multiple
distance
with separate focused
changes the focal
the emitted beam
DDF dynamically
significantly
stage. In other words,to the phased array probe. DDF
as the signal returns field and signal-to-noise ratio.
of
increases the depth

an angle beam probe


This variation of
into the probe
integrates the wedge
fixed
configuration is
housing. The wedge
overall dimensions.
but offers smaller

Pulse-echo

Reception
Emission

Delay (ns)

Near Wall

PA probe
t0

Active group

t1

16

t2

128

t3

tn

Acquisition time

Scanning direction

Acquisition without

Acquisition with

DDF

is specifically designed
The near wall probe
zone at probe ends
to minimize the dead
between the last
by reducing the distance external edge of
and the
available element
for
probe type is useful
the housing. This
and corner inspections,
composite radius
requiring close contact
or any application
wedge.
to a wall using a 0

DDF

Immersion

Sectorial scanning
Electronic linear

scanning

for
of shapes and sizes
are made in a variety
Phased array probes A few types are illustrated here:
different applications.

es
Phased Array Prob

Web Based Tutorial

one of
applications. Thus,
probes for industrial
used phased array
the most commonly is the active probe aperture.
Linear arrays are
the following formula:
of linear arrays
length is given by
the important features
e
probe length. Aperture
(A) is the total active
The active aperture
PA probe
A = (n 1) p + e
of elements in the
of
where n = Number
between the centers
Wpassive
p = Elementary pitchdistance
two adjacent elements a single piezocomposite
of
e = Element widthwidth
value is e < /2)
element (a practical
adjacent elements
g = Gap between
p

=v
f

n=8

Dual 1.5-D

Dual linear

Variable angle

Skewing

Internal focus

Annular

Concave

Convex

70

60
45

where = Wavelength
velocity
v = Material sound
f = Frequency

2-D array

1.5-D array

Linear

70
60
45

70
70

The tutorial offered by Olympus


provides a basic introduction to
the main theories used to make our
instruments. These tutorials also
present typical applications pertaining to the various markets in which
Olympus instruments are used.

n
Time-Corrected Gai

60

60

70

45

45

70

60

60

45

45

70
70
70

60

60

45

45

60

70
45

70
70

60
45

60
45

60
45

of the part with


the whole volume
In order to cover
be calibrated for
focal law has to
consistency, each
time-correctedbeam spread. This
with a
attenuation and
can be performed
gain (TCG) calibration several identical reflectors
having
depths.
calibration block
holes) at different
(for example, side-drilled
is moved back
scan, the probe
reflector. The
Using a sectorial
each beam hits each
(DAC) and
and forth so that
signal is recorded
focal law.
amplitude of each
one TCG curve per
used to construct
70

70
60
45

to create
curves 70(DAC) used
Distance-amplitudegain (TCG)
the time-corrected

60

45

2-D and 1.5-D Arrays


arrays have multiple

Two-dimensional
to allow electronic
strips of linear arrays
in both probe
focusing and steering
have the same number
axes. 2-D arrays
dimensions,
of elements in both
probes with
whereas 1.5-D identifies
of
of uneven numbers
any combination
can be used for
elements. The probes
or
focusing capability
achieving optimal
area without probe
to cover a defined
movement.

70
70

60

60

are designed to
Immersion probes
wedge or in an
be used with a water
is
when the test part
immersion tank
immersed. The water
partially or wholly
line.
couplant and delay
acts as a uniform
are longitudinal-wave
Immersion probes
be set up for refracted
probes that can
under water.
shear-wave inspection
are mostly intended
Immersion probes
for automated inspections.

45

45

As
individual TCG curve.its
focal law has one
regardless of
is completed, each
signal amplitude,
in depth detected
Once the TCG calibration will always yield the same
A defect at 3 mm
and
a reflector
that detected it.
a consequence,
it were at 10 mm
part and of the beam the same signal amplitude as if
position inside the
will provide
70

60

45 degrees
with an angle of
detected at 60 degrees.
45

60

45

s
Dual Array
can
two 1.5-D array probes

Two linear or
a roof-angled wedge
be positioned on
is
probe. The probe
with a transmitting
equivalent for
paired with a receiving
in noisy materials
optimal performance
steel. This configuration
such as austenitic
equivalent to a dualis a phased-array
and
conventional UT
element probe in
the power-generation
is widely used in
industry.

To support the growing NDT


community, Olympus has
published the Understanding
Phased Array Technology poster. This poster was designed by
field experts to present phased
array inspection technology in
a concise and clearly illustrated
manner.
This free poster can be obtained
from your local sales representative, or directly from our
website.

Defect Positioning
demy
Olympus NDT Training Aca
is available from

RA
PA

Phased array training


professional companies.
.com
Visit www.olympus-ims

DA
SA
Top

B0

Bottom

45
T1

Top

are essential to quickly


real-time readings
probe location.
For manual inspections,
geometry and/or
respect to the part

m
www.olympus-ims.co

position the reflected

signal source with

the user to accurately


SA readings allow
an inspection.
RA, PA, DA, and
in real time during
position the defect
in gate A
to the indication
RA: Reference point
in gate A
face to the indication
PA: Probe front
A
indication in gate
DA: Depth of the
in gate A
length to the indication
SA: Sound-path

rray technology
The leader in phased a

decade

for more than a

All rights reserved.


by Olympus NDT.
Copyright 20062009
Poster_PA_EN_200906
920-172A_EN -

is ISO 9001 and 14001 certified.

48 Woerd Avenue, Waltham, MA 02453, USA, Tel.: (1) 781-419-3900


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505, boul. du Parc-Technologique, Qubec (Qubec) G1P 4S9, Tel.: (1) 418-872-1155
1109 78 Ave, Edmonton (Alberta) T6P 1L8

www.olympus-ims.com
info@olympusNDT.com

OmniScan_MX2_EN_201105 Printed in the USA Copyright 2011 by Olympus NDT.


*All specifications are subject to change without notice.
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