Level: Fatigue Crack Propagation
Level: Fatigue Crack Propagation
LEVEL x
D. A. VIRKLER
B. M. HILLBERR Y
LL= P. K. GOEL
C* SCHOOL OFMECHANICAL ENGINEERING
PURDUE UNIVERSITY
C3 WEST LA FA YETTE, INDIA NA
APRIL 1978
j 78 07 31 001
AIR FORCE FLIGHT DYNAMICS LABORATORY
AIR FORCE WRIGHT AERONAUTICAL LABORATORIES
AIR FORCE SYSTEMS COMMAND
WRIGHT-PATTERSON AIR FORCE BASE, OHIO 45433
It
NOTICE
This report has been reviewed by the Information Office (01) and
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At NTIS, it will be available to the general public, including foreign
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1.1
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S AFFDXTOR-43 -7 8
PURFUNAL/%VERSITV
THES LXAFTTETCA INDIO FTGU 11
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we ncedo2024-at3 aluminumInlloy.
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lc nosbrma it utotre
eblisrbtotL
~ /
codutd
dinvstributiion,tfree-faretiger grackdipribugtion, thoes
pAramteratistial
Sit-ih NOtestsOIT
were
relct con73n amplTtON
on 202C4-T3 almiu
conducted
NLSSFE
alloy.
~(
crac prpgto
Ditibto deemiaio
I
prgams
was
nl~d
h-vralsA~,N0rte7o
werev d/N n l/W"h olwn
he generalized three-parameter gama distribution, and the generalized four-
parameter gamma distribution. From the experimental data, the distribution of
N as a function of crack length was best represented by the three-parameter
log-normal distribution.
Six growth rate calculation methods were investigated and the method which
introduced the least amount of error into the growth rate data was found to be
a modified secant method. Based on the distribution of da/dN, which varied
moderately as a function of crack length, replicate a vs. N data were predicted
This predicted data reproduced the mean behavior but not the variant behavior
of the actual a vs. N data.
I!
i.1
9,.
I
''1K
14
i-
I
_
___
i
TABLE OF CONTENTS
"SECTION PAGE
twft
TABLE OF CONTENTS (Cont'd)
SECTION PAGE
I vi
,L
I-
LIST OF TABLES
5
TABLE PAGE
XIV Comparison of Actual Cycle Count Data with Cycle Count Data
Predicted from Constant Variance da/dN Lines ............... 128
XVI Distribution Rankings for the Distribution of dN/da Data ,.. 139
vii
Fl
LIST OF TABLES
t STABLE PAGE
XIV Comparison of Actual Cycle Count Data with Cycle Count Data
Predicted from Constant Variance da/dN Lines ............... 128
XVI Distribution Rankings for the Distribution of dN/da Data ... 139
I vii
ii
LIST OF TABLES (Cont'd)
TABLE PAGE
Vill
I Ike
LIST OF ILLUSTRATIONS
FIGURE PAGE
ix
LIST OF ILLUSTRATIONS (Cont'd)
F IGURE PAGE
I
FA
LIST OF ILLUSTRATIONS (Cont'd)
"FIGURE PAGE
xi
LIST OF ILLUSTRATIONS (Cont'd)
F IGURE PAGE
xii
LIST OF ILLUSTRATIONS (Cont'd)
FIGURE PAGE
S78 Typical Fit of Skewed Right da/dN Data to the 2-Parameter Log
Normal Distribution .......................................... 171
xtii
LIST OF SYMBOLS
C2 closeness.
Xiv
I I
da/dN fatigue crack growth rate (in./cycle).
m slope.
XI
I
NLS log (base 10) scaled cycle count data used by the log-log
incremental polynomial methods.
NS scaled cycle count data used by the incremental polynomial
methods.
R R ratio.
SE
SS
standard deviation of the errors.
standard deviation of the standard deviations. I
SSRES residual sum of squares.
xvi
II
Sa
hypothesis acceptance level.
a
0 shape parameter in the log normal distributions.
r gamma function.
asa
Euler's constant (0.5772157).
I
LP
8+
change in applied load during the load cycle (lbs.).
Xvil
9 characteristic value of the 3-parameter Weibull distribution.
V degrees of freedom.
T Pi (3.141592654).
x random variable.
2
X chi-square test statistic.
ddigamma function.
Il
wl
i xviii
' t-
S~ SECTION I
! INTRODUCTION
be able to predict the life of a given design under expected service con-
knowledge about the metal fatigue phenomenon. The metal fatigue process,
gation behavior has been widely conducted for some time in an effort to
kunderstand metal fatigue more fully. The information obtained from crack
p
will exactly predict the actual life. Unfortunately, there are many vari-
ables which influence this prediction and some are not well understood.
One of the most important of these variables is how well the empirical
The raw data from a fatigue crack propagation test are the half
raw data focuses upon the fatigue crack growth rate as a functlon of an
applied stress intensity parameter, usually AK, the change of the stress
intensity during the load cycle. The fatigue crack growth rate is de-
fined as the rate of extension of the crack with respect to the number
interest is born out in the fact that the fatigue crack growth rate is
nearly independent of the geometry for the same stress intensity level
of loading [33. This allows crack growth behavior prediction based only
on the knowledge of the crack growth rate vs. the stress intensity level
of loading for a given material for any geometry chosen. Obviously, this
were accurate and reliable. These crack growth behavior predictions can
be used to predict the number of load cycles needed to grow a crack from
an initial crack length, a0 , to some nov crack length, ae, and the die-
i
amplitude loading crack growth rate behavior is used to predict variable
2I
~- . -,
R VS. N
REPLICATE CA TEST 17
DELTAP=
P 4.20 KIP
164 DATA POINTS
AD = 9.000 MM
R .2k)
x50.00-
CD
z,0.00-
LLU tI
cc
;20.00
xxxxxj -]x
Szo~0
Figure 1. Typical Raw Fatigue Crack Propagation Data
Ir
DR/ON VS. DELTA K PLOT
REPLICATE CA TEST 17
DELTA A = .20 MM CONSTANT
DELTA P = 4.20 KIP
lo"'--Pl'M:X = 5.25 KIP
136 DATA POINTS
R= .20
6j -
xx
(..) - x
_ x x1c
Ix
aM X 40
4 ~kx
10
&. 4
DR/ON VS. DELTR K PLOT
e- REPLICATE CA TEST 17
DELTA A = .20 MM CONSTANT
DELTA P = 4.20 KIP
l'"136 PMX DATA
= 5.25 KIP
POINTS
R =.20
6-
.32.
0L - x x
=10"- x x
~ x
C3 ,Ixc x
2x
Xj4_
4
I
growth rate from the raw a vs. N data. It has been suspected that the
the variance of the resulting growth rate vs. stress intensity parameter
data [2,5,673.
crack growth behavior has been experienced, thus hindering accurate life
crack growth data, variation due to the crack growth rate calculation
culation methods and attempt to find the method which introduces the
least amount of error into the growth rate vs. stress intensity parameter
of crack growth behavior will reduce the large amount of error currently
5
I
SECTION II
BACKGROUND
tions to the crack growth rate vs. stress intensity parameter data, nu-
merous equations of fatigue crack growth have been suggested [93. How-
ever, due to scatter in the data, it has been impossible to select which
equation is the most appropriate. Also, when the original crack growth
data are predicted from these equations, the correlation with the original
data is generally very poor [81. Due to the large amount of scatter in
the crack growth rate vs. stress intensity parameter data, investigators
by experimental inaccuracies [8j. It has been pointed out that the re-
8, 10].
__ _ _ _ _ _
considered on a microscopic scale [8]. Consequently, it is important to
to a new crack length, ai, there is a certain mean and variance associated
with the number of load cycles required for this amount of crack growth
I7
S- ~1
Ji
ii
t
[do
[ J/;
S~//
77
do //
I
,
A
IK dN
// AKK i
/
V /
[J
,AK, AK*
Distribution of da/dN
"ii
is also necessary to determine the distribution of the crack growth rate
present in the original a vs. N data. The density of the raw data (es-
sentially, the distance between 2 consecutive data points, Aa) and the
crack growth rate calculation method both contribute to the overall vari-
effect of both data density and the crack growth rate calculation method
Once the crack growth rate vs. stress intensity parameter data has
crack length for a given number of applied load cycles or, inversely, the
number of applied load cyclem for a given change in crack length. The
crack growth rate data and then compare the predicted a vs. N data with
and the fact that da/dN is an independent random variable to obtain a vs.
N stop by step. This method is discussed in detail in Section 7.3. Using
10
- .X n A ..- .. - - _'o
t"
SECTION III
OBJECTIVES OF INVESTI'SXTION
data.
parameter.
I I.?
| -1
SECTION IV
Numerous methods of calculating the crack growth rate from the raw
investigato all of these methods, six of the more important methods were
tangent line of the a vs. N curve at an average crack length, a', and
12
|U
ii
IID
I
I I I~m
S1-1 !
x
Icj
dl I
N, NII
j N(CYCLE COUNT)
1
13
The average crack length, a1 , is givn by
_a at- +2ai+l
- (I)
1 2 (1)
Similarly, the average cycle count, Ni, is given by
N +N
1 2 (2)
The slope of the line connecting the 2 adjacent data points, which is
da - (ai,+,a,) (3)
d-i (N +1 Nti
dN1 (N~+ N)
at a andN i.
the secant method so that the da/dN data coincides with the original a
vs. N data. The beginning and end points are assumed to be equal to the
2
+
at a and Ni for 1-2 to (n-1) wheae n is the number of data points in the
data set.
14
ii-
CD -
LL
xx
I
'-Jt
z A1 ......- ~ --
N-I I I
SI I I
iI II
S1 I1
SI I I
SI I
SN,_, N, N1 ,,
N (CYCLE COUNT)
r
Figure 6. Modified Secant Method
15
?
The last growth rate data point is given by
at a and N .
a n
then incremented by one data point and the curve fitting and evaluation
All of the data points have been used. Any odd number of data points
can be used for the incremented strip, although 7 points are usually
Initially the strip data points are scaled in the following manner.
where nS n
nstrip- - (9
(9)
"-
where nstrip is the number of data points in the strip. Note that C1 is
the center of the strip cycle count data and C'2 is the range of the strip 6
16
7
f N- U ,
C2 (1, K"
the strip cycle count data runs from -1 to +1. This insures that when
least squares curve fitting occurs, the scale of the data vill not in-
fluence the curve fitting, which is a constant danger when using least
After the curve fitting has been performed, the derivative of the
This evaluation takes into account the scaling that was performed prior
linear least squares, the fitted polynomial takes the following form:
r b1C, rb
a b - -.... A + IZ--N (12)
Lo C2 j L2
dN C2
17
Rj~t~4
XI
xx
t--
R j
I I I !
x-I
U x
I -,I
N N, N
N (CYCLE COUNT)
d
1f
S18 i -
AI.,N
Z4
U I
- II
i-,
.-,
CD
wzx -- N
~ I
C I I
- I
I
I ._
Nx N +time
N (CYCLE COUNT)
18
4.4 Quadratic 7-Point Incremental Polynomial Method
this method, the fitted polynomial is a second order curve. After fitting
by second order least squares, the fitted polynomial takes the following
form:
a b 0 + bN (14)
IS 2S
bC b C1 b 2b Cb
a0 C
a b- - +
2
-
C22o
2 C2
22
~
C
N(5 2
2 2
Taking the derivative of a with respect to N and evaluating at the mod-
point, Ni,
b 2bC (12b
.[a - ::") +H-N(6
dNIC2 C2 2,
on both the crack length and cycle count data. This method is essentially
the same as the linear incromental polynomial method except for the log
"19
i
t
4.4 Quadratic 7-Point Incremental Polynomial Method
this method, the fitted polynomial is a second order curve. After fitting
by second order least squares, the fitted polynomial takes the following
form:
a b + bN N 2 (14)
0 1S 2S
point, N1 ,
b 2b C [2b
dN C 2 2(16)
on both the crack length and cycle count data. This method is essentially
the same as the linear incremental polynomial method except for the log
19
b -bC rb
d 2 b N IC2
dNi C2
method except that the fitted polynomial is second order instead of firct
order.
The growth rate, da/dN, for this method, evaluated at the midpoint, Nit
2
is given by - [b 2 (l8Ni) 2b 2 ClogN- +b 2 C1]2
dN1 C2Ni
2b,2C 1 +2b21loic2
bl]
(20)
C2I
The derivation of this equation is shown in Appendix B.
20
I
SECTION V
i
STATISTICAL CONCEPTS
i-
gation and their use as tools in analyzing fatigue crack growth behavior
5.1 Histoarams
what the data looks like. Histograms are statistically derived pictures
I
of a data set. They give a rough idea of the shape of the density func-
tion of the data. They also five a rough estimate of the average value
is plotted against the limits of the classes [11]. This type of histogram
the frequency in each class by the total number of data points. The re-
lative frequencies are then plotted against the limits of the classes.
21
This is called a relative frequency histogram [12]. An example of a re-
quency histogram. This histogram shows the frequency of data less than or
class value to the largest class value. It frequently takes the form of
one. When the relative cumulative frequencies are plotted against the
5.2 Distributions
Once a rough idea of what the density function of the data looks like
based on the histograms, the next step is to try to fit the data to several
variables.
22
.12W0
C3
, L- .0900
I---
-J
, .0600 -
bc
p0300-
!11
! ~~0.0000
.200 .2400 N (CYCLES)
.sw .2000 .1oo0 .32,o
(X1O 6)
23
L
I
RELRTIVE
CUMULRTIVE FREQUENCY HISTOGRRM
REPLICATE CR TESTS.
N CLASS SIZE = 4771
A = 49.80 MM
60 DATA POINTS
R =.20
C3
S2J
LJJ
LU-
1.00-
LLJ
-J
.200
0.000A
Mm0"' '."2M
N (CYCL.ES) ()(1 )
24
The two parameters of the two-parameter normal distribution are the
estimated value.
s. R, - (24)
r 2
25
variables [5,61. Essentially, the two-parameter log normal distribution
states that the Iogi0 of the random variable X, i.e., log1 0 x, is normally
distributed.
p, the scale parameter, and 0, the shape parameter. Tho density function
-X> 0
The estimates for p and 0 are computed by using the following *qua-
tions [14]
n
E lolOgoli
i- 1 (27)
n n 21
E (logloix
E- -. )2
il 1 (28)
n
equations (13,14].
S. E. , - 4 n (29)
.. "Zn2 (30)
orthogonality (13).
26
the two-parameter and the three-parameter log normal distributions to the
tribution.
are j, the scale parameter, 0, the shape parameter, and the terminus, T,
which is the location parameter. The density function for the three-para-
methods used to obtain the value of the location parameter are presented
in Section 5.3.
Once the location parameter, T, has been estimated, g and are easti-
n 2
i l
[og1 )
~ 1-0 x -
,, (33)
n
To obtain the standard errors of the estimates and the covariance
values, the covariance matrix for the three-parameter log normal distribu-
by (161
27
(34)
V CV 2{(0+ 1)GXP(i) -1] 2 iex{p[ ] 34
where
( :(35)
The standard errors of the estimates are given by the diagonal terms and
the covariances between the estimates are given by the off-diagonal terms
location parameter as one of its three parameters and thus the difficulty
of its estimation arises. Two basic methods were used to estimate the
Thus, two sets of Weibull parameters and their associated equations will be
presented.
meter, the Weibull sLope, B, which is the shape yarameter, and the expected
minimum value of X) .0, which is the location parameter. The density func-
28/ 4
S B (.Xo/ B- ex (36)
In the method of estimating the location parameter used with this set of
tribution include b, the scale parameter, c, the shape parameter, and the
b 0 - (37)
c B (38)
- X (39)
The density function for the second set of parameters is given by [19]
obtain the standard errors of the estimates obtained by the method re-
ferred to above and the covariance values, the covariance matrix for the
V - v 1 (41)
where
29
b c 1
T2.. 2(l'y) 2 t FII 1 2]_:
c r (42)
b.2
tion.
estimates and the covariances between the estimates are obtained from the
same terms in the covariance matrix as outlined above for the three-para-
Due to the nature of the fatigue crack propagation process, two im-
portant assumptions can be made. The first assumption, called the in-
creasing failure rate assumption, states that b- -use the crack growth
the initial crack length only. If these two assumptions are made, then
30
Generalized Four-Parameter Gamma Distribution. The four parameters
meter, T, the power parameter, o', the scale parameter, b, and the shape/
c - ga (43)
is given by [21]
f(X)- 01 1 1 (44)
bs 0 f(g) b Z 0
g~
roe of the cstimates and the covariances between the estimates the covari-
[13,21,22)
v n
V-1 (45)
where
U 2
2Q-4 rQj4)
31
- --
The standard errors of the estimates are given by the diagonal terms
and the covariances between the estimates are given by the off-diagonal
g
bg r (g) [ 1bL1 J) b
g T- I (47)
The three parameters are estimated using the same method used for the
covariances are found by using the covariance matrix for the generalized
equal to one.
&a zero 124]. From this, it is assumed that the location parameter, y,
is thus 123]
X >0
"f(X) a L . exp - ) (49)
(s) b b 0
bar
I
32
The standard errors of the estimates are given by the diagonal terms
and the covariances between the estimates are given by the off-diagonal
f b >)0 (47)
bg r (g) b g >
The three parameters are estimated using the same method used for the
covariances are found by using the covariance matrix for the generalize..
equal to one.
is thus [23]
r ae> (49)
(9
f() b1 I(,S) 'b T 0
g >
32
The three parameters are estimated using the same method used for the
covariances are found by using the 3 by 3 submatrix for b, 8, and & from
bgr(g)
rbg *
The two parameters are estimated using the same method used for the gener-
ances are found by using the 3 by 3 submatrix used for the generalized
to a proper fitting of the data to the two, three, and four-parameter die-
tributions, two different parameter estimation methods were used (14, 25].
The first method, a graphical method, was selected for its simplicity
[17, 18, 26, 27]. The second method, the method of maximum likelihood
This method was the first of the two methods attempted, due mainly to
its simplicity in use [17, 18]. This method was tried with both the
33
000 ME
_I~~qgJ
. ..........-.... ..........- ' -~~~~~~~~~~~~~~
.......
. . -.... ---
... ---
. . .,. . . -
ouh that the reouictno plot of dita follow# A 14uaiflif Ithe (f1,1i
the other twv parameters are medisraphtiolly, film foily Ohm pura'
Y * 0~l(5.) (II)
K uot
Wore O(M) to th. equation for Otw standard niormal pUolpoliiiy *bej1p 9'ir
to Ftion by (Cil
wheor
u !',)
7( (5k)
Is C,
three-parameter log normal distribution and the three-parameter Weibull
such that the resulting plot of data follows a straight line [17,181.
the other two parameters are made graphically. Since only three para-
meters can be estimated graphically, this limits the use of this method
yields a straight line for data that follows a three-parameter log normal
Y G(z) (51)
where G(z) is the equation for the standard normal probability scale which
is iven by [11)
z1 2
C(Z) exp 02) dx (53)
where
z - F(Xc) (54)
is the value of the data corrected for the value of the location parameter
Xc x- 0 (55)
34
-~- -- f
r
Y In In (-() (56)
X - In (xc) (57)
yields a straight line for data that follows the three-parameter Weibull
distribution [17,181.
For both of these plots, F(X) corresponds to the median ranks which
Xc
Fx()( - 1 ! n (58)
To determine the value of the location parameter such that the re-
some variable must be used. For the graphical method, the variable to be
minimized is the curvature of a second order curve fit using least squares,
thereby assuring a straight line. One of the fastest and most efficient
[26]. Smethod
In the Golden Section search method, the value of the curvature (the
not to exist is excluded from the rest of the search. This process is
repeated until the area remaining to be searched is less than some toler-
ance level. The value of the location parameter in this area is then
taken as the estimated value of the location parameter. A schematic re-
35
L I I -
- I mX III I-
"I
LU
I II I
.-
c'JI
I"I I.
I I-
-
I.} I j:I
I I-I_.
I I I _ _ >
T (LOCATION PARAMETER)
IF Be(X,)> Be,(X 2)
THEN X, BECOMES Xm!N
IF B,(XI) = B2 (X2 )
THEN Xe BECOMES Xmnx
AND X, BECOMES XmjN
H = 0.618033989
36
i
After the griphical method was perfected and usqd, the need for a
This led to the use of the Maximum Likelihood Estimators method to statis-
tion used in this investigation for the three-parameter log normal distri-
bution is [15]
-c n
L(b,c,,r) a n(In c - clnb) + (c - 1) E ln(Xi-?) - b" (X1-1') (62)
i-I imi
Note that the maxium likelihood equation is a function of all three para-
meters whereas for the three-parameter log normal distribution, the maximum
37
J
equation is to reduce the computing time, and thus the cost, of the maxi-
32]
(65)
n rnrbg)
Ji b
out the scale parameter, b. The resulting three parameter maximum likeli-
(66)
- a InF(g)
where the estimation of the scale parameter is given by [13]
38
n
bai / (67)
parameter is 13]
n n
(21,30,32]
J ul=
ln(Xi) gn ln(b0 ) (0
( 70 )
" ~n
-t n lnr(g)
The resulting two parameter maximum likelihood equation for the Senor-
39
_______________________________________________________________
bn E (X1)J (72)
Jii
parameter is (13]
- n lne(g)
where the estimation of the scale paramiter is given by [13)
na
b (Xi (74)
JI"
that converged on the local maximum, and not the global maximum. The
method used to achieve this requires the use of an interior point penalty
function which prevents the value of each of the parameters from reaching
40
r is an iteration variable, and
8
0 ).
9 is a small positive number (-
(76)
+ (c - -+)+ (10- c - +)-
+ (w
-1 +- (100
+ )1 (77)
+ +
()T - + + (xC- . r )-T]
+ (T' 4 c+ - e+ -1 + (xain T- +)
(79)
41
I
rhe objective function for the two-partmeter gamma distribution using
setting
The maximization of the objective function has been done by many non-
linear routines [191. However, the Hooke-Jeoves pattern search method [33]
and was therefore utilized in maximizing the objective functions for the
tribution and the two, three, and four-parameter Saim distributions [15].
tions heve been estimated, the distribution which the date follows the
42
method which is used many times to find out how well data fits a certain
have been proposed (121, but three of the more reliable and widely used
goodness of fit tests have been selected as criteria for the selection of
the "best" distribution. These three goodness of fit tests are regres-
5.4.a Regression
set of given data plotted on certain axes (341. In the case of fitting
lows that particular distribution, then the data will follow a straight
performod on this plotted data, it can be determined how close the data
does fit a straight line. This then provides a measure of the goodz-ess
a plot of the data with the X axis as a log 1 0 scale and the Y axis as a
normal probability scale (Section 5.3.a) will follow a straight line '18].
43
iL
C-
cz
9-4
60.0-
G:
/ /
/ x
"CO20
r-=
A= .8133
.0986
f
z 10.0- // = .91810
cc8 x
/ xA
44i
zero. A typical plot for the two-paramster log normal distribution is
Both the plots for the three-parameter log normal distribution and
shown in Figure 13 and a typical plot for the three-parameter Weibull dis-
linear scale and the Y axis is a gamma probability scale. The equation
PH(Z) -1-
r(&) j t -lce dt (83)
0
where
z - F(Xc) (84)
c
where F(X) is the cumulative density function of the corrected data whicb
is given by equation (58). Equation (83) was solved iteratively for H(z)
bution plot also requires the X axis to be a linear scale and the Y axis
tion plot is shown in Figure 16. In each of the above plots, the data
are plotted on the X axis against the corresponding median ranks on the
Y axis.
Linear regression uses linear least squares which uses the matrix
approach to linear regression to fit a best fit straight line to the data
45
2-PRRRMETER
LOG NORMRL DISTRIBUTION PLOT
99 .g_ REPLICRTE qR TESTS.
Z - R = 4-980 MM
J 68 ORATVPINTS
o:: R ).20 ,
0l 98.0- /
/x
- x
-1J 90.0-
SC13.
cc 60.0-
S/0.
i//
c.
C310.0-
C32.0- .. A = .94330
(J R= .9003
N (CYCLES)
r
t4
2-PARRMETER
LOG NORMRL DISTRIBUTION PLOT
REPLICATE tA TESTS.
=- 491 80 MM
68 ORTVPOINTS
CK R #.20
0~98.0 /
/x
I- x
- 90.0
ar-
C3A = .9530
0: .oZ = .0901
3 . R = .94330
cc. / Xx
'= 0 S .4092
SA
.0- / S.E. (U) = .00363
/- B =.00089S
cc _.1 / S.E. (9) =.000152
:::/ = 29.836
C. 0.1-/
N (CYCLES)
t4
3-PRRRMETER
LOG NORMRL DISTRIBUTION PLOT
.9-9 REPLICATE CA TESTS. /
=49. 80 MM
S"J 68 DATA POINTS
Lj- R =.20
0_ 98.0- /
_x
Q_
CC 60.0-
a: so.o-
, A = .9633
Z =.0593
= .98257
C3.-
oo
0 AT = 200844
CC x S.E. (T2 = 81.77
A U = 4.7294
2.0-
20 S.E. (U) .72900
,.., = .018307/
cc(z S.E. (6) =.026869
/ SLOPE 6.734
2 10 2
N (CYCLES)-TAU HAT
47
3-PRRRMETER
WEIBULL DISTRIBUTION PLOT
99.s- REPLICRTE CR TESTS. ,
sg~~~o 68A DRTR
= 49.80
PI MM
INTS i
R :.2o0
- //
70.0
I50.0- S x
c- / x A= .9533
x S/.92634
(1. /
-x / T = 220968
1.0- // S.E. (T) =10120.0
"L I ~/ / B = '0848
/ S.E. (B) 21180
// C 2.0649
S.E. (C) 2.5563
10 2 SLOPE = 1.3013
0. -I i I a I
10 10 2
N (CYCLES)-TAU HRT
48
a- 9s.o- /X/ x
-90.0-
X/
A= .9378
a:: Z = .0633
- S70.0 / R = .97 140 i
* 0.. A
* C 50.0-
0.0 SE(A T = 213396
S.E. (T) =10277.0
El: B^ = 7238.4
!: e~o-S.E. (8 = 2427.7
AG = 6.0467
/ S.E.SLOPE
'GI = 3.3663"
=4.8401
0.1- SLv L 1
S-6=0.0 -30.0 0.0 M000.0 60000.0
DEV. OF (N-TAU HRT) FROM THE MEAN
49
2-PRRRMETER
GAMMR DISTRIBUTION PLOT
99.9- REPLICATE CA TESTS.
SECANT METHOD
DELTA A = .20 MM
68 DATA POINTS
,A-6- A = 22.10 MM //
99.0- R .20 /
- 98.0-
C1'
LU1
. 96.0- x/
a_.. 90.0-
-J 70.0-
rm60.0 o 8 8
CL Z .0710
CC R .98864
C:: A = 6.163=103
A 3
ix' S.E. (B = 1.047x10
/ x AG z 2.S36x10l
/x S.E. (G) = 4.313
/SLOPE = 2.902x1
0 .1-Il I I
i 0i
so
Ltl Ae~- .- . - ,
of fit statistic, called the coefficient of multiple determination, R
can be calculated. The value of R2 is always between zero and one. The
~ closer the value of R2 is to one, the closer the fit of the data is to a
22
straight line. Therefore, by comparing the values of R for each of the
This value of R2 can be corrected for the slope of the least squares
the data to the straight line. This corrected value of R2 is called the
SAppendix C.
it
2) counts the number of data points in each interval (called the ob-
served frequencies),
"2
The test statistic, X , is a measure of how close the observed frequencies
i; are to the expected frequencies, and t us how close the data follows the
f . ... . ...
... . . ... . I . .. . . . . . .. . . I-.... . . I [" .. . . .. . ,_ -5--
2 k (o -et) 2
The lover the value of the chi-square statistic, the closer the ob-
served frequencies match the expected frequencies and thus the closer the
can not be compared between distributions that do not have the same number
square statistic for distributions not having the same number of distribu-
tion parameters is not constant [131. Therefore, the tail area of the
A' AaX1 u
/2 exp(-u) du (86)
gration. The .alue of A is always becween zero and rmne, with A equal to
... .ig a perfect fit. The lover the value of the chi--.quare statistic,
the higher the value of the tail ares, all other thln,' There-
follows the closest is thi one which has the highest value of A.
Sdegrees 2
of freedom, y2 [121, where
S~a
v k -n - (87)
52
Acceptance of the proposed distribution as the distribution which the data
2 2
Xb : (88)
wit the acceptance level to test ac-V
The tail area, A, may be compared with ac-
A 2: c (89)
a
The end points for the classes for the two and three-parameter normal
ent numbers of equiprobable intervals [35). The end points for the equi-
probable intervals for the three-parameter Weibull distribution were
given by [19]
- + - (90)
The end points for the equiprobable intervals for the two, three, and
-1 +() 1/ I
where F. is the inverse cumulative density function for the generalized
9
four-parameter gamma distribution.
culates the sample cumulative density function and compares it with the
&53
functions [11. The test statistic, Z, is a measure of how close the two
cumulative density functions are and thus how close the data follows the
density function, and thus the closer the data follows the given distribu-
the data follows the closest is the one which has the lowest value of the
in HII' Tp H a
m'] I m I a lli mIN le me i
54
SECTION VI
DNDDPG,
CGRDDP, and
tion of the aN/Aa variable computed from the input a vs. N data which is
four distributions and computes a goodness of fit statistic for the com-
55
It uses the graphical method, including the Golden Section search method,
to estimate the location parameter for both the three-parameter log normal
This program produces output which includes the input a vs. N data,
the computed a vs. N data, some of the test conditions, some of the in-
table for each distribution. The plots generated by this program are a
of the N (cycle count) variable from a set of replicate cycle count data
at one crack length level. Identical load and test conditions are re-
quired for the replicate data. This program fits the data to six distri-
56
* distribution and the two-parameter log normal distribution. Three good-
Snoess of fit criteria are calculated for the comparison of the distribu-
This program produces output which includes the input replicate cycle
count data, the test conditions, some of the internal program parameters,
meter gamma distribution, for which only the estimated distribution para-
meters and the goodness of fit criteria are printed. It also prints a
based on the goodness of fit criteria. The plots generated by this pro-
gram are the original cycle count data plot, a relative frequency histo-
tion of the crack growth rate (da/dN) variable from a set of replicate
da/dN data at one crack length level. This da/dN data is calculated by
the DADNCP program (Section 7.2). Identical load and test conditions are
57
This program is nearly identical to the CCDDP program (Section 6.2),
using the same distributions, the same parameter estimation method, the
same goodness of fit criteria, and having nearly the same output. The
count. Thus the required input is different and some of the output is
shown in Appendix F.
of the AN/Aa variable from a set of replicate da/dN data et one crack
length level. The da/dN data used is the same as that used by the CGRDDP
This program is based on the CGRDDP program. One main difference be-
tween them is that the input da/dN data is inverted to create the vari-
able AN/a. The second main difference is the assumption that for the
parameter (Section 5.2.3). Along with the change in variable, there are
is shown in Appendix G.
58
SECTION VII
diction Program, or AVNPRD. Several others not mentioned here were used
2) reject certain selectable data points and use the secant method,
and
new a vs. N data, reject certain salectable data points, and then
59
Further documentation of this program is shown in Appendix H. I
For each of these methods, the calculated da/dN data is integrated back
into estimated a vs. N data, which is compared with the original a vs. N
errors, the da/dN calculation method which results in the lowest error
can be selected.
The required input for this program is a set of constant &a a vs. N
data. This program produces output which includes the input a vs. N data,
the test conditions, da/dN vs. 6K and actual cycle count data vs. esti-
mated cycle count data for each da/dN calculation method, and a summary
of the errors from each method with the resulting "best" da/dN calculation
This program, called AVNPRD, predicts a vs. N data from the distri-
60
with the original a vs. N data, The required input to the MM1wLdg. @A
This program produces output which inuludeo the tees *endLSImep the j
predicted a vs, X data, and a plot of all of the prodiseed a vs. 0 date,
; Ie|
"f !
AI
4
[I
with the original a vs. N data. The required input is the knowledge of
grovth rate at each crack length using a random number generator and the
of a vs. N data. These predicted sets of a vs. N data are then compared
This program produces output which includes the test conditions, the
predicted a vs. N data, and a plot of all of the predicted a vs. N data.
16.
L-
SECTION VIII
N data have recently been generated at Purdue University for center crack
specimens of 2024-T3 aluminum alloy [37]. From this set of data, there
data points, were collected after the crack had grown through the region
for analysis is shown in Figure 17. This large amount of data was col-
state growth rate as well as establishing the steady state growth rate
for the next test [37,38,39]. From this set of test results, there are
tests, the crack length was monitored and measured with a 100X micro-
and the digital traverse. In collecting the data, the microscope was
62
6.000-
Ri
OLUL TEST 13
5.000-
" 4.000-
9-D
C.,
' 3.00o0
-.J
w
2.000-
63
growth rate). When the crack had grown this increment as observed with
the cross hair in the microscope, the printer was activated with the push
Irtton and the crack length and number of cycles were printed. The re-
sultir, data are very dense and appear to be fairly accurate. This large
the variable &N/Aa which was calculated by the secant method. This was
Program (Golden), or DNDDPC (Section 6.1), were run on each of the data
vets. The distributions were ranked from 1 to 4 (1 being the best) based
averaged over all of the tests and the results are shown in Table 1. The
the fit of the AN/Ia data to the three-paramter log normal distribution
Baged on these results and the use of the DBLTCP and DNDDIFG program,
64
- I I SW!
Table I
"Distribution of Wt4/6a
'I !6
k.. T - - ". . --
PRRAMETER
3*-
AG NCRMRL DISTRIBUTION PLOT
POST OLUL TEST 21
DELTA A = .05 MM CONSTANT
79 DATA POINTS
R= .20/
iL
"0 1
0-
c 50.0- ixi
I
C320.0-
S/ Figure 18. LO
lit of the SN/aa Data to the 6 = 2266
66I
2) Include the other four dist-ibutions in the analysis of
DELTCP program and changing the AN calculation method for each of the
data sets. Once the AN/Aa data was calculated for each data set, it was
smoothing effect in reducing the amount of data scatter and thus the data
variance.
67
KI
fable II
2-PRRRMETER
LOG NORMAL
LOGNORRL0.'444 0.1273
3-PARAMETER0
WEIBULL 0.871 O.'4185
II Go
i!
St
8.3 Life Prediction Using Estimated Distribution Parameters
The next step in the analysis was to see if the estimated distri-
bution parameters could be used for life prediction. Using the mean of
the &N/aa data (for the two-parameter normal distribution) and the over-
all change in crack leogth (af-ao), the final cycle count, Nf, was pre-
dicted and compared with the observed value of Nf for each set of data
and then averaged over all the data sets. The results are shown in Table
III. From the "a:latively low amount of error, it is evident that etatis-
Table III
l 1.011l 2.93
* to determine the affect of the size of 4a. This was done by using the
k ~694
rejecting certain successive data points (i.e. every i out of 2, every 2
DNDDPC program was then run on each different aa set of data for each of
the data sets. Also, several tests at the same load conditions were com-
bined to give a large amount of data and then &a was increased as do-
scribed above. The results are shown in Figure 19 and Table IV. From
these results, it is obvious that the larger 4a is, the smaller the re-
70
.46S00 -
POST OLUL DATA
-. 37b -
0
I-00
L.L
i "i
h-
10 0
z
. : 7SO
0.0000
0 .I0= .0700} . 14O0 .2100 .em .35M0
DELTA A (MM)
.71
Table IV
Effect of Increasing 6a
72
SECTION IX
EXPERIWNTAL INVESTIGATION
I
In an effort to answer the investigation objectives, it became
data (Section 8), it became increasingly clear that any experimental in-
dent that replicate tests under identical load and environmental condi-
loading should be used rather than constant AK (load shad) loading since
it would be much easier to control and replicate and also give a range of
tests using the same lot of the same material were conducted. To obtain
da/dN S 5 x 105 in./cycle) and keep the teoting time within reason,
it was found that AP should be 4200 lbs. It was also determined to use
i
S an R ratio of 0.2 to stay well out of the compression region.
73
A preliminary theoretical investigation was conducted to determine
where the data was to be taken. It was found that to get the desired
range of growth rates, the data would have to be taken over at least
40.0 un. It was determined that steady state conditions would not exist
effort to reduce data error as much as possible and still obtain a rea-
growth rate would be too fast to operate the optical system and the
printer at the end of the test for the load levels chosen, A& would be
increased to 0.40 - and finally to 0.80 mm. The number of data points
sive data points were rejected (to find the effect of increasing Aa), -
0 - 9.00 .
- 49.80 mm.
Rt a 0.20
a- 5250 lbs.
i ~74 744
**. SPECIMEN - CENTER CRACKED PRNEL
7.a . 5,1 NIP Ct&II1FNT
M m m ,Am_&m
,-,. - - _- -- -- - -
,. / m ,,
-- IN an "offs
II~lM "Iwo
SiN~wluII~p''
O ollO....... ..
SIh Inl
0199 Fri
I
1> a
Sr&i~u g
IO e& llr 1!
iwS) N '
| I
1I
'" @ 9g Pau i
i .00 SPECIMEN - CENTER CRRCKED PRNEL
SPm= 5.25 KIP CONSTRNT
AP =4.20 KIP CONSTANT
R = .20 CONSTRNT
(49.8 M R 8 11
7 DATA MOINTS
(4'.2 M")
2R~.0
DAA ONT
AM,
(36.2 Mvii
{g~o I)I
R xxxxXXxx
(9.0 Wv)j
0.00
0.0000 .0600 .1000 .1600 .2M0 .2600
N (CYCLES) X10
X1O
I 75
i
9.2 Test Specimen
The test specimens used in this investigation were 0.100 inch thick
observation of the crack tip during crack growth measurement. The lot of
specimens was numbered in order as they were taken out of the shipping
The fixture plate holes were drilled and reamed to the desired dimen-
sions. The stress raiser shown in detail in Figure 2L was machined with
an electro-discharge machine.
scribed at the stress raiser and a silica gel desiccant was applied at
'zhe stress raiser. The entire expected crack path was then sealed with
oscilloscope was used co *itor the feedback signal (load) and the output
rect load levels aid sinusoidal loading. A digital cycle counter was used
to count the number of 3ppliad load cycles. Crack growth was monitored
76
6mm
Ila~
Thickness 0 .1000
Z2:5d .25d
i Figure 21.
~77
Test Sp*cmCtiM
rigidly mounted on a horizontal and vertical digital traversing system.
the traverse system. Both the digital traverse and cycle counter outputs
printer. The printer printed both the crack length and the cumulative I
cycle count by the operation of a push button. A strobe light synchro- I
nized with the feedback signal was triggered at the point in the load
cycle when the crack was most fully open to illuminate the crack tip.
ences [37,38,39].
tion, care was taken to control as many other variables as possible. All
0.27. of the desired load using the test machine's amplitude meaeurement
system. To prevent any effects from the order in which the specimens
were run, the specimens were randomized using a computar program which
utilized a random number generator. The tests were run in the random
78 I
6--
Crack initiation starting at the stress raiser was performed
starting at 6P - 15000 lbs. and shedding the load 107. no sooner than
every 0.5 ma (12.5 times the change in plastic zone radius due to the
load shed) to the desired test load level. Fatigue cycling was done
the testing machine at high loads) and then at 20 hz. To make certain
that no load effects were present in the data, the test load level was
reached 1.0 mm before data acquisition (58 times the change in plastic
zone radius due to the last load shed). The load level was held constant
All tests were started at the same init'ai crack length (2a - 18.00 am).
for each test and discrete data points were taken as determined by the
Lest program. Data were actually taken by advancing the optical system
crosshair in the stereo microscope. The amount of error in the data ac-
error results from the random error in measuring the cycle count and the
crack length.
79
By using the test machine's amplitude measurement system which com-
pares a known input signal with the feedback signal (applied load), the
of the crack tip vith the microscope crosshair. This alignmnent process
location, and 3j comparison of the two locations to see if they are iden-
tical. If they are, then the printer button is pushed and a data point
is taken.
To determine how well the observer's eye performs this alignment pro-
coss, the following test was devised. A crack was initiated and the cy-
cling was stopped when the observer determined that the crack had reached
careful to always approach the crack tip from the same direction to pre-
error of the original data point was then calculated in terms of the
80
- .
XE -0.001414 mm.
SE a 0.001390 um.
where
XE is the mean of the errors,
that the larger Aa is, the smaller the average experimental error is.
I
81
Il
Table V
0.20 0.1
0.40 0.36
0.80 0.17
82
1I
ii
fI
!~
1*
i8
are shown in Figure 22. Using these data, an analysis was performed to
10.1 Distribution of N
as a function of crack length. The replicate N data used was readily ob-
tained from the original replicate a vs. N data. Typical replicate cycle
count data are shown in Figure 23. The distribution of the replicate
cycle count data was determined at each crack length level through the
use of the CCDDP program (Section 6.2). At each crack length level, this
for the six distributions and then compared the goodness of fit criteria
cellent fit to the cycle count data due to it's power parameter (Section
im
5.2.e). The distribution parameters, goodness of fit criteria, and the
distribution rankingse were then combined over all of the crack length
levels.
83
S...w.. . .i - -.
REPLICPTE R VS. N DRT:
164 DRTR POINTS PER TEST
68 REPLICATE TESTS
DELTA P = 4.20 KIP
P MAX = 5.25 KIP
50.00- O = 9.00 MM
R .20 . .....
i ,s--X40.00-.'!i
z mm-.-: ..
,
z 30.00
CC
20.00-
10.00 1I LI
0.0000 .0650 .1300 .1950 .2600 .3250
N (CYCLES] )XIOX 1
o8-
P VS. N
37.00- REPLICRTE CR TESTS.
DELTR P = 4.20 KIP
68 DATA POINTS
no= 9.000 MM
R =.20
36.8-
36.60 -
Z 34
CD
LJJ
-j
_.1_S36.20 - ~X
U:036.20" x NM( xx
--- x x x
36.00-
S~~~~36.80-j=- i
.2= S. .e26= .M
am ..
N (CYCLES) (X1O 6)
I
& S~85,
The distribution parameters of the cycle count data as a function of
crack length were plotted for each of the six distributions and are shown
j
in Figures 24 through 29. The distribution parameters are normalized so
that their minimum and maximum values are equal to zero and one, re-
the actual values of the distribution parameters but are intended to re-
The goodness of fit criteria for each distribution were averaged over
all of the crack length levels. These results are shown in Table VI. For
these goodness of fit criteria, the best fit of the data to a distribution
relationships,
fit
an understanding of which distributions provide the best
over all of the crack length levels. By convention, the lower tht value
of the distribution ranking, the better the fit of the data to the given
distribution. The mean rank and it's standard deviation for each of the
The 3-parameter log normal distribution provided the best fit frr the
ranking value, the low Kolmogorov-Smirnov test statistic value, and the
very large number of times it was selected as the best distribution. The
3-parameter gamma distribution provided the next best fit, while the 2-
a 86
t
2-PRRAMETER
NORMRL OISTRIBUTION
NORMALIZED PARAMETER VALUES
DELTAP = 4.20 KIP X - MU HRT
P MRX = 6.25 KIP + - SIGMRI HRT
RO = 9.00 MM
NORTR = 68
R = .20
Sl~oo-
LU
Li
I-j
I-
W."
* j J1$O
C3 +
LLA 400-
871
2-PRRRMETER
LOG NORMRL DISTRIBUTION
NORMRLIZED PRRAMETER VRLUES
DELTA P = 1.20 KIP X - MU HAT
P MAX = .25 KIP +- BETR HAT
A0 = 9.00 MM
NDATA = 68
Cl) 1..20
r.I
c,-
z-
I--
CM
0 4.
$-* x
1
x.00
-o.Oo 10.00 20.00 30.00 50.00
A (CRACK LENGTH IN MM)
88
low*
3-PRRRMETER
LOG NORMAL DISTRIBUTION
NORMALIZED PARAMETER VALUES
DELTAP = 4.20 KIP -TRU HAT
PMAX = 5.25 KIP - MU HAT
RO= 9.00 MM + - BETS HAT
NDATA = 68
R + S1oo-
.20
cc
0- +
X:
z 4" X
X
C
0.3000.4004
+
+ +
LU 444.
.200-
IL 89
3-PRRFIMETER
WEIBULL OISTRIBUTION
NORMALIZED
DELTIA P"= 4.20 PARAMETER
KIP VALUES
4b - TAU HAT
P MAX = 5.25 KIP X - B HAT
RO = 9.00 MM +- C HAT
NDATA = 68
x
AJJ
+
CLi
"c +
Cc
0I
- +
It
LIJ * --x +
III
90
3-PRRRMETER
GRMM DOISTRIBUTIiON
NORMALIZED PARAMETER VALUES
DELTA P = 4.20 KIP , - TRUHIT
P MAX = 5.25 KIP X - B HAT
AO = 9.QO MM + - G HAT
NDRTR = 68
u 1 .000 R= .20
w ~4+
x +
C3
400
91
iRPM
GENERALIZED 4-PARRMETER
GAMMA DISTRIBUTION
NORMALIZED PARAMETER VALUES
DELTA P = q.20 KIP 0 - TRU HAT
F MAX = 5.25 KIP - ALPHA HAT
RO = 9.00 MM X- B HAT
NDRTR = 68+ - 6 HAT
R= .20 +
LUJ
C-. +x
Ci)
co
4D +
xI
92
-T
Table VI
S2-PARRMETER
2-PANRAMETR 0.8842 0.0857 0.95799
LOG NORMAL
3-PARRMETER
L-PARAM 0.8694 0.0699 0.98223
LOG NORMAL
3-PARAMETER
-PRAETE 0.8340 0.0882 0.93658
WEIBULL
GENERALIZED
4-PARAMETER 0.8075 0.0722
GAMMA
93
Table VII
NUMBER OF
STANDARD TIMES BEST
DISTRIBUTION MEAN DEVIATION DISTRIBUTION
3-PARAMETER
3-PARAM 1.221 0.5882 137
LOG NORMAL______I
94
GAMA
I-I
tied for the third best fit for the data. The 2-parameter normal distri-
rate calculation method introduced the least amount of error into the
da/dN data. This was to be done by integrating the da/dN data calculated
by each crack growth rate calculation method back into a vs. N data and
then calculating the error between the new a vs. N data and the original
a vs. N data.
The DADNCP program (Section 7.2) was run on each of the 68 original
a vs. N data sets. This program calculates the da/dN vs. 6K data, into-
grates the da/dN data back into a vs. N data using Simpson's one-third
rule and the trapezoidal rule, and then calculates a step by step average
incremntal error, as outlined by Frank and Fisher [2), for each of the
six da/dN calculation methods. The da/dN calculation method which re-
best da/dN calculation method for that data set. The logl0 da/dN vs.
logl 0 AK data are plotted for each of the da/dN calculation methods and
The average incremental error from each da/dN calculation method was
averaged over all of the data sets and the number of time each d4/d4
calculation method was selected as the beet method was computed. These
results are shown in Table VIII. The modified secant method had the lowest
modified secant method and the secant method were both selected as best
95
4
IjJ
0-. UK
z
3
cr. x4xk Xx
X~X
S~x
1I0
ERROR =Ve
I-REPLICATE CA TEST 68
VELTAR = .20 MM CONISTRNT
=-- P z 4.20 KIP
10 PMAX = 5.25 KIP
,137 DRTA POINTS
ER ..20 R= 2 9
$ -
Zia
I 7.10 1. 30 60 2.
10 -
ERROR =2.49 Y
97
DR/ON VS. DELTA K PLOT
LINEAR 7-OIlNT INCREMENTAL POLYNOMIRL METHOD
_REPLICATE CA TEST 68
DELTA A = .20 MM CONSTANT
DELTA P = 4.20 KIP
o PMRX = 5.25 KIP
131 DATA POINTS
R .20
6
3
LI=I
U-1
U
Cr.
0 1
r~ -
*7.0 DELTAK
10.0 (KS-SQA
13.0 ERROOT
16.0 IN
20.0 a.0
*DELTA K I(KSI-SQUARE ROOT IN)
98
DR/DN VS. DELTR X PLOT
QUADRATIC ?-POINT INCREMENTAL .YNOMIAL METHMO
REPLICATE CA TEST 68
DELTA A = .20 MM CONSTANT
DELTA P = 4.20 KIP
PMRX = 5.2S KIP
"131 DATA POlINTS
R = .20
6 -
(-j
=IQ~
99
DR/ON VS. DELTR K PLOT
LINERR LOS-LOG 7-POINT INCREHENTRL FOLYNOMIRL METHOD
REPLICATE CA TEST 68
DELTA A = .20 MM CONSTRNT 2
u.J
C-
=10 -
elQ:
2 -
x
x
R = .992196
ERROR = 8.78%
100
DR/ON VS. DELTR K PLOT
OUARTIC LOG-LOG 7-POINT INCREMENTAL POLYNOMIAL METHOD
2- REPLICATE CA TEST 68
DELTA A = .20 MM CONSTANT
DELTA P = 4.20 KIP
PMAX = 5.26 KIP
131 DATA POINTS
R = .20
U S-)
S 1
x
R% .998314
13'.0ERROR z 6.30%.
16.0 20.0 5.0
DELTA K (KSI-SQUARE ROOT IN)
101
Table VIII
MODIFIED 2.58 51
SECANT METHOD
LINEAR
7-POINT INCREMENTAL 6.96 0
POLYNOMiAL METHOD
QUADRATIC
7-POINT INCREMENTAL 6.83 0
POLYNOMIAL METHOD
LINEAR LOG-LOG
7-POINT INCREMENTAL 9.41 0
POLYNOMIAL METHOD
QUADRATIC LOG-LOG
7-POINT INCREMENTAL 6.65 0
POLYNOMIAL METHOD
102 j
methods, with the modified secant method selected three times as often
as the secant method. From these results, it can be stated that the
modified secant method introduces the lowest amount of error into the
da/dN as a function of 6K. The first set of da/dN data selected for
analysis was da/dN data calculated by the secant method, with the anti-
the modified secant method and the quadratic 7-point incremental poly-
nomial method. Data were selected from the first two da/dN calculation
widespread use. The combined data from each of these three methods are
The steps of analysis for the distribution of da/dN are very similar
to the steps of analysis used for the distribution of N. First, the re-
plicate da/dN data used was obtained from the da/dN vs. 6K data generated
by the DADNCP vrogram (Section 7.2) using the secant method. Typical re-
plicate da/dN data are shown in Figure 39. The distribution of the re-
plicate da/dN data was determined at each AK level through the use of the
the distribution parameters and goodaess of fit crit -is for the six dis-
tributions and then compared the goodne i of fit crite. . between the dif-
103
REPLICPTE DR/DN VS. DELTR K DRTR
SECRNT METHOD
2
136 DATR POINTS PER TEST
68 REPLICATE TESTS
10 DELTA P = 4.20 KIP
P MAX = 5.25 KIP
AO =9.00 MM
R =.20
LU
-J 10
I z
5 "1
L. ,
a.),.:
7.0 10.0 13.0 16.0 20.0 25.C
DELTA K (KSI-SQURRE ROOT IN)
10-
rI
REPLICRTE DR/DN VS. DELTR K DRTR
MODIFIED SECANT METHOD
2
137 DATA POINTS PER TEST
68 REPLICATE TESTS
DELTA P = 4.20 KIP
P MAX = 5.25 KIP
AOD 9.00 MM
R: .20
LUJ
-_J 2
z 10_
I ,".,,.*.f
I.'":.-
0-05
i 105
REPLICRTE DR/DN VS. DELTR K DATR
QUADRATIC 7-POINT INCREMENTAL POLYNOMIAL METHOD
2
131 DATA POINTS PER TEST
68 REPLICATE TESTS
10"- DELTA P = 4.20 KIP
P MAX = 5.2S KIP
AO =9.00 MM
5 -R =.20
LU
_J 2 -
z 0
ITI
Z -s
106
R VS. OR/ON
REPLICATE CR TESTS.
SERCNT
DLAP METHOD
4.20 KIP :
DELTA A = .20 MM
68 DATA POTNTS
RO = 9.OOL MM
.O- R= .20
z
Cr.]
CD
Z25.20-
! 25.0oo
S2Q5. -OADN(O"R/CYCLEJwXio.4)
107
r
criteria, and the distribution rankings were then combined over all of
the K levels.
length (essentially AK) were plotted for each of the six distributions
and are shown in Figures 40 through 45. The distribution parameters are
over all of the AK levels. These results are shown in Table IX. From
the 4K levels and again the mean rank and Its standard deviation for
each of the distributions and the number of times each distribution was
shown in Table X.
in providing a fit for the da/dN data. There were no significant differ-
ences between the means of any of the five distributions, espeqially con-
sidering the high values of standard deviation about the mean. The 3-
parameter Sama distribution did have a slightly lower mean than the
other distributions and it also had the lowest value of the Kolmogorov-
the beat distribution slightly more often than the other four distribu-
tions, but again there were no significant differences between the five
gaSs= distribution provides a better fit for the da/dN data than the other
108
!
2-PQRRMETER
NORMRL DI STRIBUTION
i.eoo - NORMAL IZED PA.RAERN.VLUES
II.TA P:.26.
5= 4.e KIP
KIP X - MU HA:T
kOTA A= M M88 + - SIGMA HIT
.ooo- i x, ,eo
Cr..
.800-
a-
o_
.I~o + x,+4
.+ .
4
+ .9
Z: .400 4
0.000-+
109
2-PRRRMETER
LOG NORMAL DISTRIBUTION
NORMALIZED PARAMETER VRLUES
.8 K.IIP .. X -MU HAT
PAR R =.20K M +-BETA HRT
1O =g9.M MN
S1.000- NORTA
= .= 68 +l .
R: .20k+
Li
a-
to +
V-4.
+
.. . . . .+
.800O0 + S.0 + 600
4 +
Li ~I0+ +*
0::0 +*4t.4.4.
0.0.00
0.0 10.00 20.00 ~.0 '00 00
A (CRACK LENGTH IN MM)".
Figure 41. 2-Parameter loog Normal Distribution Parameters
of da/dN Data as a Function of Crack Length
110
3-P;PRRRMETER
LOG NORMRL DISTRIBUTION
NORMALIZED PARRMETER VALUES
SCA~NT THEM
P
DELTAP0 1MKIP
r MAX .ez5.K0- TAU HAT
%LIAA .20MH
.9.00 MM _ -MU
X HAT
NORTA 68HAT
c1.o0 w R= X20 +
a- . +
++ 4
i~ r ew + **+
+. ++
0. 07 r e+. *+
i. r + +
M+ oL+ + +
-+
+i +
4.
.200-
3
+ N
+o~ M
+C~&LNT~
da/d
Lo4lra
3-Paramete
+f D+aa uci
111 +
+
itriuinPaaitr
fCakLnt
3-PRRRMETER
'- WEIBULL DISTRIBUTION
NORMALIZED PARAMETER VALUES
DElTA P "(L
6K~r,,,;''-
= 4.eO TRU
T HAT t
L .A
20 "" X HAT :
11= 9 .06 im,
A
NOWTA = B +- C HRT
LU +x
x
cc~q + +A.* AA
z +. +
(:3+ + , x
+ +. X46
++ ,}* 42+ + ++
i 112
- - 3-PARRMETER
GRMMR DISTRIBUTION
NORMALIZED PARPHETER
IZ&TA: F = 4.eO KIP
VALUES
- 4b -' HT .
R0T = H -M
AI M X - 8 HRT
OM.TR = 68
,.00= .20
R + T
LU
cc .800 + + .4"
.C.
S++ 4
t- 4
++ +
CO +
4+ + *XX
v,
0 +4 + + *+
l .400 ++
z~~
- .: + x x .
CC (CRKLxHI M
Fiu+ 44 -aaee sn Dsrbto aatr
odad
+ D+t asaVnt XnofCakln
113 W
--.-.-.--- ~ - + W---
& a
c .800- + +
0-
e.. ,= ..
+ + *+ + 4
+x v
+,+ + x
""- + xt, .x
+ X +114
I-I
IJ
Table IX
2-PARAMETER
2-PNRAM 0.9011 0.0779 0.97647
LOG NORMAL
3-PARAMETER
3-PNRAM 0.8442 0.0834 0.96966
* LOG NORMAL
3-FRRAMETER
*REIBU R 0.8474 0.0777 0.95942
WEIBULL
GENERALIZED
4-PARAMETER 0.7946 0.0726
GAMMA
115i
Table X
NUMBER OF
DISTRIBUTION MERN STANDARD
DEVIATION TIMES BEST
DISTRIBUTION
116
___ _ --
___ IIIIII
I four distributions, but its performance relative to the other d7stribu-
tions is not strong at all. Due to this poor performance by the da/dN
tion 6.3) as described in Section 10.3. The AVNPRD program (Section 7.3)
data sets were predicted. These data sets are shown in Figure 46.
To obtain the variance of this predicted data, the CCDDP program (Sec-
tion 6.2) was run at 14 crack length levels of the predicted data. The
rankings were then combined over all of the crack length levels run.
length obtained for the other four distributions are shown in Figures 47
through 50. The average goodness of fit criteria for the four distribu-
tions for the predicted data are shown in Table XI. The distrioution
rankings results for the four distributions for this data are shown in
Table XII.
117
SI " ' 1 I I
PREDICTED
REPLICRTE R VS. N DATA
60.00- SECANT METHOD
137 DATA POINTS PER TEST
68 REPLICATE TESTS
DELTA P = 4.20 KIP
50.00-
OELTR A = .20 MM
MMKIP
PAO MAX 9=.005.25
SR =.20
.1
1" 40.00-
z 30.00
LUJ
20.00-
--
10.00-
0.00- 1
0.0000 .0650 .1300 .1950 .2600 .3250
N (CYCLES) (X1O 6)
1 1
118J
I'--_i4
k
2-PRRRMETER
NORMRL DISTRIBUTION
NORMALIZED PARAMETER VALUES
DELTA P = 4.20 KIP X - MU HAT
P MAX = 5.25 KIP + - 6IGMHRT
RO = 9.00 MM
NDATA = 68
1.000- R= .20
*,- ,+ x
cr. .800--+ . + X
a-. +- -
I--
= x i
EDx
3 x
Z .200 x
+ XI
i 119
Ii
2-PRRRMETER
LOG NORMAL DISTRIBUTION
NORMALIZED PARRMETER VALUES
DELTA P = 4.20 KIP X - MU HAT
P MAX = 5.26 KIP + - BETA HAT
PO = 9.00
NOATA = 68 MM
to 1.000- R :.,,20 xx
xx
LU
LU x
x
az x
0- x
xx
xi
+ x
LI
-J 00
+i
La
0.0001 113
0.00 10.00 20.00 3O.00 40.00 60.00
R (CRACK LENGTH IN MM)
N!
4.d
I Figure 48. 2-Parameter Log Normal Distribution Parameters
Io : 8as a Function of Crack Lengt~h for Cycle Count
S~~Dat~a Preditel~d from t~he DistribuItion of da/adY
120
3-PARAMETER
LOG NORMRL DISTRIBUTION
NORMALIZED PARRtMETER VALUES
DELTA P = 4.20 KIP 0 TRU 'HAT
MRX = 5.26 KIP X- MU HT
O = 9.00 MM + BETR HAT
NOATR = 68
R q20x ~x --
xxx
1.10 x
x
xx
x
x
tt
C3
Aw -
Ro-
111 ~ 2
ENT~ 4 50.00tloe
0.00.
I i21
3-PRRRMETER
WEIBULL D1ISTR IBUTION
NORMALIZED PRRRMETER VRLUES
DELTA P = 4.20 KIP ,b - TAU HAT
P MAX = 5.25 KIP X - B HRT
AO = 9.00 MM + - C HAT
NDATA = 68
R= .20
x
t"- +
+4.
+
L X X
+. x
x x
X+ x x
. ++
Zx
So x
(1) +
u.400- X
1%4.
.j
Z.200-
-= A ~ EA i
0.000
0.00 l'"" 0
"I (CRRCLENG -N. .MM)".
3L-PRRRMETER
LOG NORMRL 0.8828 0.0730 0.98515
I
-i
123
Table XII
NUMBER OF
STANDARD TIMES BEST
I DISTRIBUTION MEAN DEVIATION DISTRIBUTIN
2-PARAMETER
S~LOG LOGPNORMALR
NORMAL 1.214 0.5789 12
3-PARAMETER
SLOG NORML.286 0.6112 0
3-PARAMETER
3.857 0.5345 0
WEIBULL
12L
~!
i 124
The 2-parameter log normal distribution provided the best fit for the
parameter Weibull distribution provided the worst fit for the data of
The next step in the analysis was the comparison of the distributions
of N between the actual cycle count data and the cycle count data pre-
dicted from the distribution of da/dN. The mean and standard deviation
of both distributions at the crack length levels used above were computed
and the resultc are shown in Table X111. At every crack length level,
there was no significant difference between the means but there waL a
cycle count data is much smaller than the standard deviation of the actual
predicted replicate cycle count data. The mean and + 1, 2, and 3 sigma
values of da/dN at each crack length level were obtained from the distri-
bution of da/dN. Using these 7 lines of da/dN data, a vs. N data was
predicted. The results are shown in Figure 51. A comparison between the
actual cycle count mean and + 1, 2, and 3 sigma values and the cycle
count values predicted from the mean and + 1, 2, and 3 sigma da/dN lines
data from the distribution of da/dN using the method described in Section
7.2 yields low error in predicting mean crack propagation behavior, but
125
Table XIII
126
PREDICTED A VS. N DATA
80.00- SECANT METHOD
137 DATA PMINTS PER TEST
DELTA P = 4.20 KIP
DELTA A = .20 MM
P MAX = 6.25 KIP
0.00- RO 9.00 MH
R= .20
CD
= 30.00 I
10.00
0.0000 low A AM
N (CYCLES) (XIO )3
127
*{
Table XIV
Comparison of Actual Cycle Count Data vith Cycle Count Data Predicted
1 from Constant Variance 4./dN Lines .- ,t.
-2 S.IGM'A 1,58
41941
4e33 SIMA20341
awon
1,28
II
of the distribution of N.
-I
10.5 Inverse Growth Rate
Due to the failure of the da/d14 data to fit any of the given distri-
butions satisfactorily, it was decided that the growth rate variable war-
of the data was N while the independent variable was a (i.e. N was mea-
nice fit to the 3-paramster log normal distribution, it was strongly sus-
pected that changes in the dependent variable, AN, would also provide a
the same analysis used for da/dN. The first part of this analysis was to
using the DADNCP program (Section 7.2). Typical replicate dN/da data are
shown in Figure 52. The distribution of the replicate dN/da data was
determined at each AK level through the use of the DNDDP program (Section
meters and goodness of fit criteria for six distributions and than com-
129
R VS. DELTR N/DELTR R
21.80- RELICRTE CR TESTS.
SECFINT METHOD
OELTA P = 4.20 KIP
DELTA A = .20 MM
68 DRTA P3INTS
no = 9.000 MM
1.60- R .20
A.X
1-
:- 21.0-
_J
x 3)OM xx x
,..0 21 .00-
CX I
20.80
.01000 100 .2000 .p000
130
distribution was assumed to be zero by this program, thus reducing these
and the distribution rankings were then combined over all of the AK levels.
length were plotted for each of the six distributions and are shown in
The goodness of fit criteria for each distribution were averaged over
all of the 4K levels. These results are shown in Table XV. From these
the AK levels and the mean rank and its standard deviation for each of
the distributions and the number of times each distribution was selected
|I
as the best distribution were calculated. These results are shown in
Table XVI.
The 3-parameter log normal distribution provided the best fit for the
it was selected as the best distribution. The 2-parameter log normal and
the 3-parameter Weibull distribution tied for the second best fit for the
dN/da data, both having roughly the same distribution ranking and
Kolmogorov-Smirnov test statistic value and the same number of tims it was
131
2-PRRPIIETER
NORIML DISTRIB''TION
1.2,oo- NORMALIZEDSECANT
PRRRMETER
METHOD VRLUES
DELTA F = 4.20 KIP
P IA = 5.26 KIt
DELTA A = .20 MM
X - MU HRT
+ - SiGMA HAT
AO =9.M0 MM
tNATA = 68
iU
LUJ
i O 1.800- x
=.=
x
a:
I- x
Q.600 *X
cz .200
4 -
-'J 400
Z .200 -,
0.000 '
0.00 10.00 20.00 30.00 40.00 60.00
A (CRACK LENGTH IN MM)
13i
I
132
I
t
2-PRRRMETER
LOG NORMRL DISTRI['JTION
NORMRLIZED PARRQ TER VRLUES
.ELTA
P = 4.eO KIP
F MAX a 5.26 KIP X - MU HAT
0.T"A = .20MM + - BETA HAT
AO = 9.00 "N
u'~~
.0)- NIATA .20
f=x = 68 +
I .m .-
x
"c- .8W 41
to' *A + "+
+" +
400 4+
%+
+
cc- + + +
O:::+
+
+
+N + +
++ +
*
+ +
+,,+
- -9
, o0.
% + * 4.
4- .
+*
+
0.000
0.00 10.00 20.00 30.00 '90.00 50.00
R (CRACK LENGTH IN MM)
133
0 IR W
I
3-PRRRMETER
,.. NORMAL DISTRIBUTION
1' ,Q iRALIZEDsmwRI
PARAMETER
ME'T VALUES
MFLTA: P = 4.20 KIP
.20 qi
OELT - TAU HAT
OELT A = M11
FO = 9.00 .20 M X - MU HAT
uW1T. = 6 + - BETA HAT
x
LaJ
W + x
_ 800" w 0 +
+
z +
+
0- ,"+
.6W + + +
+
I.-.
o3 # + +
fO0- + + 4+ +*
+ +
++ .+
C~r. x(+ ,+
" -,
~++. 4,
+ x. ,..-+ 4
x +++
o.00
,& .,
+ + IV ") " I . . I i"
4 4A iF
0.00 10.00 20.00 30.00 '40.00 60.00
A (CRACK LENGTH IN MM)
134
3-PRAPMETER
F NWEIBULL DISTRIBUTION
NORMALIZEDPR.:ETEER VALUES
i" ',DeTA P = 4.20 1K1
OrT P. Kpi:- TAU HAT
:.1 .0 " X B HAT
"A= W + "C HAT
u i.ooo- R .- .4p8+ *
xxx +
cci
.81)- *X+
.x x x
; Kx ++
+++
+
x.x_* *+ _ +~+4 +. 4. + 4+
X +& +
-3 '" + +
.200 x + +
-j+*
F.igure 56. 3-Paramet~er Welbull Disetribut:ion Paramet~ers
of dEi/da Date as a lvnction of Crick Length
I135
' 1~
2-PRRRMETER
GRMMR DISTRIBUTION
NORMALIZED PRS ER VALUES
D&,TA P = 4.20 KW " T-
I TA
W Kr )6.2--8 HAT
I=AFl = 68 ~CATHAT.
000 - R =x20
S.
+ +.
LUJ
Sao- +
z X
+ +;.x
S.00
+444.+
M- _.~ + X+w
~ .0-,"x + + + "=
x --
+xXx xx + +4 + +
' + + +-,+ + ,,
.qO0~ '+
+4 +'
+Ax +. i + + .+
x.,, I x +" + _++*
-+
.+ ++
S~~++!I $
+4.-+
.0 0
01.00 1O,.00 20.00
(CRACK LENGTH3Q.00q
1N MM) 000
136
GENERRLIZED 3-PRRRMETER
GAMMR DISTRIBUTION
1.o- NORMALIZED PARAMETER VALUES
:' " "46 "- B H RTT
NWnA z 68 + - G HAT.
++
S++ x
+ x
CL 0 % + + "":'-
+ +
-.I + + *+ 4A
++
+ +
+4 + +,, ,
-A ++ x ++
+ + 4 ++
+
"+
+
*jP +
xx;:
+ '
+ .+
:::
+"
+
ma+-+
__~~~~~~ . - "m- ,i ~| +x ~ IN+.;Er
~ II1 t dilH OI! i ilIlle I,,J II
137 1
Table XV
2-PRRAMETER
NORMAL 0.8383 0.0992 0.94912
2-PARRMETER 0.7
LOG NORMAL 0.9011 0.0779 0.97647
3-PARAMETER
0.8409 0.0790 0.95477
WEIBULL
GENERALIZED
3-PARAMETER 0.7507 0.0800
GAMMA
1I
138
= =u i
Table XVI.
-NUMBER F
STARNRO . TIMES BM.I
DISTRIBUTION MEAN DEVIATION DIVTRIBUTIdN
2-PARAMETER
LO
OML 2.610 1.2363 28
LOG NORMAL
3-PRARMETER 1.860
LOG NORMRL 0.8621 6
139
I
provided the fourth beat fit and the 2-parameter normal distribution pro-
The next step of the analysis was to see if the improved fit of the
.4Na
XdaM to a distribution would improve the prediction of a vs. N data
from the distribution of dN/da. The AVNPIRD program (Section 7.3) was
slightly modified for the dN/da variable and run on the dN/da distribution
The CCDDP program (Section 6.2) was run at a few crack length levels
criteria, and the distribution ranki,,gs were then combined over all of the
could not provide a fit for the dN/da data. The distribution parameters
-are shown in Figures 60 through 64. The average goodness of fit criteria
for the fiv, distributions for the predicted data are shown in Table XVII.
The distribution rankings results for the five distributions fr ,this data
The 3-parameter log normal distribution provided the best fit for the
The next step in the analysis waR the comparison of the distributionq
of N between the actual cycle count data and the cycle count data predicted
140
x 40.00 '.
Cm
LU30
z . 001
S20.00-
10.00-
0.00- . .
0.U000 .0650 .1300 -IWO .26W .3260
N (CYCLES) (X1O 8)
So
zJ .40x0
So2wX - x
142
-
2-PRRRMETER
LOG NORMRL DISTRIBUTION ..
KIP
P = 4.20 PRRRMETER-
NORMALIZED
S-D-ELTAl VALUES HPT
":X-MU
1.000- .20 xx
L& xx
xx
L x
x
E5
Boo
+ x.-
.n
C3
_J+ x4
+
+ +
D+
+
14,
ligre 1.2-Parameter LOS *o001 Digtrtbutioo parm~ear
as a Function of Crack Unksth for Cycle Count
Data ft.4Lted from tbe Distribution of UW/da
~~7i
3-PRRRMETER
LOG NORMRL DIlSTRIBUTION
I
NORMALIZED PARAMETER VALUES
DELTRA = 4.20 KIP 0 -- TRU HAT
P MAX = S.25 KIP X - MU HRT
RO = 9.00 mm + - BETA HAT
NDRTA = 68
R
.- 4.20 x
I-
w
U) * x
C x
Z .400
S~X +
++ + +x + '
to.
+
"L144
3-PRRAMETER
WEIBULL DISTRIBUTION
NORMRLIZED PARAMETER VRLUES
DELTA P = 4.20 KIP - TRU HAT 4
P MAX = S.25 KIP X - B HAT
RO = 9.00 MM + - C HAT
NDATA = 68
R.:00-
R .20 #-
LU
LU +.
x
+3+
I.
+
i: 4 X x
x +
0: x 0 +I
C3'4
-9
I-,,- x e
0.2000
4
.. I1 I - I + II ..
0. D0.00
000O (CRRCK LENGTH0.00
IN WA] '40.00 60.00
j 143
3-PHRFMETER
GRMMA DISTRIBUTION
1.2oo- NORMRLIZEO FRRRMETER VRLUES
DELTA P = 4.20 KIPF - TRU HAT
P MAX = 5.25 KIP X - B HAT
A' = 9.00 MM + - G HPT
NORTR = 68
S1.o000 R .20 x + +.+... .
L,
X:
ci.800-
Q~. x
+ 4b
00 0
C3 6000
Nj
-.
J +
ci"
Z .200
+
+
x X XX
x x x
0.0004 x -- T
0.00 10.00 20.00 30.00 40.00 60.00
A (CRACK LENGTH IN MM)
146
AL!=| II II I I I I I I I l| i
Table XVII
Average Goodness of Fit Criteria for the Distribution of Cycle
Count Data Predicted from the Distribution of dN/da
3-PARAMETER
3-PNRAMALE 0.9319 0.0567 0.99169
LOG NORMAL
[
3-PARAMETER
GAMMA
GAMMA 0.20-40 C.Y44t93 0.85993
147
II
Table XVIII
NUMBER OF
STRNORRO TIMES BEST
DISTRIBUTION MERN DEVIRTION DISTRIBUTI1ON
2-PARAMETER
OML
LO 2.S71 0.9376 2
3-PARAMETER
G1MMA
AMA2.857
2.52
1.i(.J j 2
148
from the distribution of dN/da. The mean and atandard deviation of both
distributions at the crack length levels used above were computed and the
results are shown in Table XIX. At every crack length level., there was
no significant difference between the means but there was a very signifi-
In every case, the standard deviation of the predicted cycle count data
wamuch smaller that, the standard deviation of the actual cycle count
data.
Just as for the data predicted from the distribution of da/dN, a vs.
N data were predicted from the mean and + 1, 2, and 3 sigma dN/da lines.
The results are shown in Figure 65. A comparison between the actual cycle
count mean and + 1, 2, and 3 sigma values and the cycie count values pre-
dicted from the mean and + 1, 2, and 3 sigma dN/da lines at a single crack
vs. N data from the distribution of dN/da using the method describad in
L Section 7.3 yields low error in predicting mean crack propagation behavior,
but yields high error in predicting crack ropagation behavior at the ex-
14
C
FI
SZ49
Table XIX
MEANSTAtIDFO DEUIATIMf
CRACK LEM C
(M) AC1L. PREDICTED ACTUAL PREDICTED
I
i
I--=
CD
Z 30.00-
-J
CC, 20.00-
0.00
151
.s - -...
Table XX
152
SECTION XI
DISCUSS ION
place and many interesting observations were made. Some of these have
investigation was much different than first anticipated. The most sur-
prising event that took place in almost every test was the sudden changes
In the magnitude of the crack growth rate. Both sudden increases in the
growth rate, as if the crack had just come upon "ome unusually weak alum-
inum, and sudden decreases in the growth rate, as if the crack was exper-
One of the more outstanding examples of this type 'f behavior is shown in
Figure 66.
material with many smaller areas located in a random fashion which char-
majority of the material. The size of these small areas seems to vary
have a very large effect on the overall smoothness of an a vs. N data set
153
R VS. N
50.00 REPLICATE CA TEST 49
DELTA P = 4.20 KIP
164 DATA POINTS
Ac 9.000 MM
R- .20
60.00-
CD
Z 30.00 -
LU
-J
Nr-
0.00-
154
and on the total amount of scatter, especially in the growth rate data.
The average growth rate also seemed to vary somewhat from test to
test, with some tests running slow throughout the whole test, while
other tests ran fairly fast throughout the whole test. This phenomenon
is the cause of the outlying data sets in Figure 22. As also noted by
of the test during the slow growth rates leads to most of the variation
growth rate equations often used to describe its behavior and does so
11.2 Distribution of N
The conclusion stating that the cycle count data follows a 3-parameter
log normal distribution can be considered very strong. The only occur-
rences where this was not so was at short crack lengths where the need
for the location parameter used in the 3-parameter log normal distribu-
quite a bit at short crack lengths but ten,, to follow smooth curves after
mean crack propagation behavior does follow smooth growth rate equations.
The same smooth shape of the location prameter in the last four distribu-
j 155
curves define au area where crack propagation will never occur. In other
words, the number of load cycles needed to reach a given crack length
will never be less than the estimate of the location parameter at that
crack length. This is shown in Figure 67. On this plot, crack propaga-
tion data will never occur to the left of the location parameter line.
Note from Figure 26 that the scale parameter, a, tends to remain constant
for the increase of N with increasing crack length. From Figure 24, note
half of the computer time used to obtain all of the distribution para-
Table VI. Many times the distribution rankings implied by one goodness
terion and often three different distribution rankings were implied by the
three goodness of fit criteria. In other words, the goodness of fit cri-
R , tended to be very sensitive to the scales of the plot and the slope
of the linear least squares line. Thus, the closeness was rarely used
156
-E .m-.-- -- -
I
II
160.00- REPLICRTE R VS. N DPTR
I 164 DATA POINTS PER
68 REPLICATE TESTS
DELTR P = 4.20 KIP
TEST
io
z / . .t~.:. /*
~I--
iz30.00- I "'
-J /
I /
'
CC)
20.00-
I "
10.00-
10.00
S0.00 - I I i
0.0000 .0650 .1300 .1950 ,2600 .3250
N (CYCLES) (X1O 6)
157
unless the slopes were approximately the same between the different dis-
distributions that provided fairly equal fits to the data. Thus, the chi-
square goodness of fit criterion was used only when there were fairly
4 large differences between the distributions. The Kolmogorov-Smirnov
goodness of fit test provided a fairly reliable and sensitive test and
the 3-parameter log normal distribution provided a reliable tight fit for
the cycle count data as shown in Figure 70. The 3-parameter gamma dis-
tribution did surprisingly well and although it was not selected as the
the 3-parameter log normal distribution. The 2-parameter log normal dis-
tribution did not do well due to the lack of a location parameter. For
work alright, but the shape of the density function did not match the data
provided a very poor fit for the cycle count data and should not be in-
Of the six da/dN calculation methods selected, both the secant method
and the modified secant method contributed low amounts of error into the
da/dN data as shown in Table VIII. The modified secant method calculated
da/dN data which could be integrated back closer to the original a vs. N
data than the secant method could, perhaps because it calculates da/dN
158
2-PRRRMETER
NORMRL DISTRIBUTION PLOT
REFLICRTE CR TESTS.
1 = 38.20MM /
CL 96.0x
]R 60 DATA POINTS
R .20/
//
-
I-I ~-x
-j 90.0-
90.0-
8o-
M = 4.9649
C,/ x AC=201
02.0
.02S.3' S.E. (U
C/ x
/ Am = 16701
CC /S.E. (T) = 1429.4
E /
S/ SLOPE =5.3u10"
S 0.1- I I I
-60000.0 -30000.0 0.0 30000.0 60000.0
DEVIRTION OF N FROM THE MERN
I 159
2-PPRRMETER
LOG NORMRL DISTRIBUTION PLOT
5_s.s REPLICRTE CR TESTS.
RA=38.20 tiM
Lj 68/DPTS POINTS
IS/ - .20
Li/ x
rI
F- I
- 0.0-
cck
_j-
,v 50.0
:z
""0 = .9790
c- "Z = .0793
]z 100 /R = .95118
/x
v/x = 6.380S
w
1 .o .E. (U = .00355
6.-Wx A^ =.000655
,.-cz S.E. (B) =.000146
_J"mSLOPE = 30.662
S0.1
N (CYCLES)}
I-i
160
3-PRRRMETE -
LOG NORMRL DISTRIBUITION PLOT
99.9- REPLICRTE CR TESTS. /
z R = 38.20Mt /
Lj 6b DRTI POINTE /
9C.
980 R=2
'-/
CC R= .9664
Z = .0609
zl 10.0 163
20.0-
z A
CC XS.E. -T 85.92
K/ .E O 4.7197[
U S2- 1oo = .77266
853 2
B =.016310
CS.E. (B) =.026363
SLOPE 7.143
N (CYCLES)-TRU HAT
-----.
161
3-PRRRMETER
WEIBULL DISTRIBUTION PLOT
999 REPLICATE CA TESTS.
A = 38.20 MM
9.0- 68 DATA POINTS
.20
90.0R
/
70.0-
LU 60.0-
C-)
S/ x R= .9098
c .c 7 xZ .0803
x R = .93932
/
/ A
_jx T =207836
0
1.0. 6.E. (TI = 7505.7
0- / B- 37085
/0.5 S.E. () = 19332
SE AC = 2.0614
/.E. (C) = 2.3206
SLOPE = 1.2771
0.1- 1 I I i
uS2 10 2 6 10'
N (CYCLES)-TRU HAT
162
3-PRRRMETER
GRMMR DISTRIBUTION PLOT
99.9- REPLICATE CA TESTS.
R = 38.20 Mm /
68 DRTA POINTS
R .20 1
99.5-x
z/
/x
C 95.0-/
99.0-
U= X/ .06.02
n 95.0--2
c/x
CC: Z= .0642
@ 70t.0-R .97401
~Cr60.0- 4 199349
CD:8 6458.1
SG= 6.4069 H
S.E. (G) =.:32
SLOPE =b.3,10"
L .
16
163
,
dota at the original crack length levels instead of between the original
which could be inLes~ated b,' cven close to the original a vs. N data.
This it. no doubt due to thea 3-oo-.,Lng effact of these methods which tends
to reduce the sudden changes 'i growth rates. This is shown in Figu-e 38
where the number of extreme da/dN data points for the quadratic 7-point
da/dN data points for either the secant method of the modified secant
where the incremental polynomial method data Aullow a narrow band .line
while the recant method and modified secant method data folloa a more
broad band line. Note also from Figures 32 through 35 ch3 waviness of
the data shorinr. the large chnpges in growth rate noticed during data ac-
quisition.
If crack propagation data iVee always very smooth data, then the in-
into the da/dN data. But as stated pMeviously, the sudden changes in
growth rate are inherent in the crack pio.pazation process, and any attempt
at modifying these changes will distort thl resulting data and prevent it
7-point versaou. and the quedratielo$-lao 7-p0int-vrsU 'db the best job,
point version does a very poor Job 09 sbovp in Figure 34 and Table VIII.
The use of the tog-log transformation failed to give any improvemont over
164
aa
the original a vs. N data. The use of the second order polynomial fit
mation.
da/dN. Each of the distributions provided roughly the same qu lity of fit
for the data, with the 3-parameter gamma distribution doing a Olightly
when the da/dN data was skewed lefe, as shown in Figure 73, syhtric, as
When the data was either skewed left or symmetric, the 2-parameter
normal distribution provided the best fit. for the da/dN data, as shown in
Figures 76 and 77. When tbq data wa,sApwd righ, either o e. log nor-
gamma distribution provided a fit for the da/dN data. Typical fits of the
skewed right da/dfl 8ate tb 'th$e f6ur disttibtrtions ', in Figures
78 through 81. Due to the large variations in the da/dR data, each of the
165
RELATIVE
FREQUENCY HISTOGRAM
.r40- REPLICATE CA TESTS.
SECMT METHO
DR/ON CLRAS SIZE = 6.8174104 R = .20
DELTAP = 4.2 KIP A: 9.10 MM
68 DATA POINTS DELTA A = .Mo MM
>- ASMc
11
I-
GemJ
,L i
0.o0oo 0.0m .o
166
Fo
RELRTIVE
FREQUENCY HI STOGRRM
REPLICATE CA TESTS.
SECANT METHOD
OR/ON CLASS SIZE = 1.4.440 R = .20
DELTA F = 1.20 KIP A - 11.50 MM
68 DATA POINTS DELTA A = .20 MM
.2000 -
C--
>-.1 0-
Lu
L-
I-
0.01o
167 '
RELRTIVE
FREQUENCY HISTOGRRM
REPLICATE CR TESTS.
SECANT METHD
DR/ON CLASS SIZE = 1.278xO R = .20
OELTR F = 4.20 KIP R = 34.10 MM
68 DATA POINTS DELTR A .20 MM
>- .100
II Lii
O
-AJ
c.~0
zz
.or
-04 -- - -
Zi =.04
/~ =R .951759
pSECIWT MtTMO
DOELTA AR= .20 MM/7
68DATA P13INTS
o~1*.o .20
X/1X
Cso-./L
CO
Iftlre
7. ypial o St t7 i &a/40 Dosto
the 2.?armater Notus iDstributiou
170
2-PPR iETER
LOG NORMRL DISTRIBUTION PLOT
99.9-REP-LCRITC, ;TEM..
K A:I: 34.0
to mm:
a ge.o- aRA,.i
it =20 /
/x.-,
/X
- 80.0 t . .
oa-
CZ. .0616
C3 2.-A
.97
10.0- R .98632
: I'--/X
xA :-4.871
2.0/ S.E. (UA 1.276x10
.1-._ . -,/ A" 8 I -
DR/ON (IN/CYCLE)
171
I
3-PRRRMETER
LOG NORMAL DISTRIBUTION PLOT
REPLICRTE CR TESTS.
SSECANT
U DELTA A METHOD
= .20 MM
i n,, A068DATA POINTS
= 34.10 MM
SLLJ /X
n. 98.o- R = .20
-j
-J 90.0-
I::.
a-
ca
Z = .0662
o~ =.o.99085
C320.0-
r A
z 10.0 "T = 3.764il0
c::
I,.-- S.E. = 4.373i1O=
/(/X- :-5.0
to-
JS.E.
/
,* *"
=
-
.696,10-'
.2
S/ S..A) = 2.9S1O710e
ac 9 S.E. (i) = 2.92iDte
::SLOPE = 6.21599
w
: 0.I*~- - ,1 ORI (NC .LE.(UHR= 6.26969l
; 2 S ~104
t OR/D)N ( IN/CYCLE]-TRU HRT
172
3-PRRRMETER
WEIBULL DISTRIBUTION PLOT
99.9- REPLICRTE CR TESTS.
99.0-SECANT METHOD
9.0 DELTA A = .20 MM //X
68 OATR POINTS
90.0- A = 34.10 MM
R = .20
70.0-
z
WJ 60.01
Lj 30.0-
a-
/x
c_- 5.0-
fl -Jx
/"xI=.g3 R .063
x R= .94181
x T = 7.229,10
c 1.o-c S.E. fJ = 9.290x10
x10 -
B = 7.00SA
o -S.E.(B = 4.080%10
/
AC
A
= 1.961
S.E. CC) = 1.S05
SLOPE = 1.23502
0.1- 1 I
10 2 S 10 S5 2
OR/ON (IN/CYCLE)-TRU HAT
173
3-PRRRMETER
GRMMR DISTRIBUTION PLOT
999_ :YPLICRTE CR TESTS.
SECWT METHOD
4
DELTA A = .20 MM
68 DATA POINTS /
A=34.10 MM /
99.- R= .20 /
/
99.0-1
i... / x
L) 9.0 :
LAJ
goA .9992
c Zz .0/61
CC=
70.O0 6.610
Y: Z6- .06.
AT = 1.439x10'
q /.. a = 1.47Sm1O
.0 S.E. f
= 4.570z10 7"
G =4.898
A
S.E.S (G) =2.280
w
/ SLOPE 2.499410s
0.1 1 i .
O
6.0,1O
-. 0.0 61.010 i.e-iO
DEV. OF (OR/DN-TRU HRT) FROM THE MERN
174
function shapes.
lot of variation in the shape parameter (the pluses) and the location para-
moter (the diamonds). The variation of the shape parameter reflects the
changes in the amount of variance and the shape of the data. The variation
the skewness goes from right to left, the estimate of the location para-
meter decreases rapidly. Also, from Figure 45, it can 'he seen that there
are many occurrences %-here the estimate of & was not equal to one, thus
gama distribution when analyzing da/dN data so that a wide range of den-
The results of the prediction of replicate a vs. N data from the dis-
Figure 46 with Figure 22, it becomes apparent that the variance of the
predicted a vs. N data is much less than the variance of the actual a vs.
N data. However, the mean of the predicted a vs. N data is very close to
the mean of the actual a vs. N data. The implication of this is that
175
I
growth rates. However, the independence of growth rates is assumed in
resulting in very smooth a vs. N data. This smooth a vs. N data lack&
the areas of sudden fast and slow growth rates discussed in Section 11.1
many smooth a vs. N lines of the same mean behavior results in the Teduc-
When the distrihution of the cycle count data predicted from the
S, tended to approach its upper global limit. The 2-parameter log normal
distribution provided the best fit for this date because the location
with the distribution of the actual cycle count data, as shown in Table
XIII, it can again be seen how the mean of the predicted cycle count data
is very close to the mean of the actual cycle count data while the stan-
dard deviation of the predicted cycle count data is much loes than the
When a vs. N data are predicted from constant variance da/dN lines,
the spread of the predicted data is much wider than the spread of the
actual data, as shown in Table XIV. This occurs because either all very
slow or very fact growth rate da:t is used at the + 3 sigma da/dN lines,
thus causing either a very lonE or very short number of cycles. The
176
actual data, however, rarely has any growth rates on the order of + 3
sigma, and even more rarely has repeated growth rates on the order of + 3
sigma. On the average, actual data tend to have repeated growth rates
within + I s igma.
Froe Figure 51, it can be seen that the constant variance lines tend
to get further apart when going from left to right, indicating that the
data over the fit provided for the da/dN data was obtained. The 3-par-
mater log normal distribution was able to provide the best fit for the
dN/da data without serious competition from the other four distributions.
an adequate fit for the dN/da data. The fit provided by those distribu-
values were estimated for the location parameter (from - 1.6 x 10"1 to
4.9 x 10S) and the absolute value of the estimate of the location pare-
177
__ I
zero as acaumed in equation 48 (Section 5.2.0). Thus, this assumption
The value of the location parameter of the 3-parameter log normal dis-
skewed left and symmetric dN/da data was present as well as skewed right
dN/da data. This was expected since the simple inversion of the da/dN
variable does nothing to change the skewness of the density function of
the data. The only effect of this inversion is to change the direction
of the skewness and to alter the shape of the density function slightly.
1.
A histogram of typical symmetric dN/da data is shown in Figure 82 and
plots of the fit of the dN/da data to each of the distributions are shown
data. Again, due to the large variation in the dN/da data, each of the
meter again for the dN/da data, as shown in the plots of the distribution
of dN/da does not remove these variations from the data, although it does
reverse the basic trend of the mean as shown by comparing Figure 40 with
I cats a vs. Ndata did not change the predicted data noticeably. As au&-
1 178
I
I
S~RELRTIVE i
FREQUENCY HI STOGRRM :
.24W- REPLICATE CA TESTS.
SECANIT METH-OD -
ON/DR CLASS SIZE = 10644 R = .20- -.
DELTR P = 4.20 KIP A = 21.10 mm
68 DATA POINTS DELTA A =.20 MM
LLJ .O600
>- I
LU
IiI
0.00w ---
.100oo .100
OELTR N/DELTA A ICYCL /IN) (Y10 0)
S. . . " , . . . .
2-PRRRMETER
NORMFIL DISTRIBUTION PLOT
, 999REPLICATE CR TESTS.
SECANT METHOD
LU
U DELTA R = .20 MM
88 DRTA POINTS
cc A = 21.10 MM
LU - .
.. 96.0 R= .20 /X
/x
-X
90.0-
r 80.0-
CIO
cr. Z= .0131
C3 20 .0 -/ 10.0- R .9.98'457
. . 1
, 0-0
c:P co0 // 1.63SX10' IT322
0
2.0- / S.Em (0) = 3.94'f.10'
/A 3
cc S.E. (0) = 2.783x0
ZD 0.1- /SLOPE = 2.8065iO
.....
18
2-PRRRMETER
LOG NORMRL DISTRIBUTION PLOT
0.;-
Z
REPLICATE CA TESTS.
6~~ECA~NT NETHOD
JOELTRA = .20 MM
S fDlATAR POINTS "
A 21.10 MM /
EL R .20
-J 90.0-
: (:80.0-
0-
r.C60.0-
z
xi
- A 9530
S20.0 -.
w Z= .0821
10 R .98859
CC
o I-e = 5.205
2.0- / S.E. A(O 1.060.10"
B-
AB- 7.636x1
CC / S.E. (8) = 1.300
SLOPE = 10.45911
_ S0.1
1I I
' 181
3-PRRRMETER
LOG NORMRL DISTRIBUTION PLOT
REPLICATE CA TESTS.,,,,
S $ECWT MEITMD/
DELTAR = .20 MM
T P INTS SDATA680
S-- A = 21.10 MM
C o R .20 ,
1_j
- 90.0-
dr.
XA= .A769
Lm .0693
0 20.0-.95
182
*2 j _____ ____4
I
3-PARAMETER I
0_"_.'J
33.0- /
/X/
- 10.0-
co /x A= .9813
S5.0 Z = .0690
Ot x R = .96606
j= 7.999110S
= 1.0- S.E. ( = 2.438x10"
0." A = 9.377104'4
S.E. (B = 3.S66x10
AC = 2.7S2
S.E. (C) = 1.265
SLOPE = 1.70414
0.1-
101 2 5 102
DELTA N/DELTA A (CYCLES/IN)-TRU HAT
183
2-PRRRMETER
GRMMR DISTRIBUTION PLOT
999_ REPLICATE CA TESTS.
SECANT METHOD
DELTA A = .20 MM
68 DATA POINTS
99.5- A = 21.10 MM /
99.- R .20 /
U-- 96.0- j
LL 90.0- /'
-- .0-
760.0-
S60.0 = .9911
aZ .0693
x" 2 .0-. ctR = .99281 I
xA r^ = 6.485x10
31
S.E. (5) = 1.101x1O:
/'x ^G = 2.5212101
x S.E. (G) = 4.287
.SLOFE = 2.802O40
I 'I I ]
-80000.0 -40000.0 0.0 40000.0 S0000.0
DEVIATION OF ON/OR FROM THE MEAN
II
not in which variable is used to predict the data but rather in the
When the cycle count data was predicted from the dN/da distribution
parameters, the 3-parameter log normal distribution provided the best fit
for the data as the estimates of the location parameter were all at anti-
estimate of the location parameter was near)y always equal to zero. The
use of this location parameter significantly improves the fit of the pre-
Again, the values of i assumed maximum global values in both gaumna distri-
the predicted cycle count data. When the distribution of predicted cycle
count data was compared again to the distribution of actual cycle count
data, the mean data was almost exactly predicted while the predicted 1
standard deviation was again much less than the actual standard deviation,
The a vs. N data predicted from constant variance dN/da lines almost
I
exactly reproduced a similar plot made from constant variance da/d14 lines,
as seen by comparing Figura 51 with Figure 65. Thus, the dN/da data seems f
to support the conclusion that the cycle count data fits the 3-parameter
.I I
?285
SECTION XII 4
CONCLIS IONS
as follows:
into the da/dN data of the six growth rate calculation methods
and 11.6).
186
1
SECTION XIII
the crack propagation process has not been determined. Only a minute
valuable for use in the prediction of a vs. N data from the dis-
1mood
5) A more reliable and accurate mehod of establishing the distrL-
il
Ii
i Ii
11t1i
r I
tt
APPENDIX A
The fitted polynomial equation for the linear log-log 7-point incre-
a o + b, NLS (A-1)
log N- C
"NL 10c 1 (A-2)
2
where C1 and C2 are given by the scaling equstions (equations 7 and 8,
olog 10 N - C
los10 a - b + b, . 2 12 .' (A-3)
L C2
Solving for a,
b + bI log
lI N-C
- I
a a 10 o C22
b C b log10 N
b . -
+...
0 C2 C2
- 10
bo C (1o10 N) C
- 10 2 I0
b C b
- 10 2N (A-4)
189
Taking the derivative of a with respect to N and evaluating at the mid-
point, Ni, j
b C b
da o C bl C2
10 N, 2 (A-5)
~2
190
-4
APPENDIX B
The fitted polynomial equation for the quadratic log-log 7-point in-
NIS
+l I
0l910 N - C1lo189 0 N C1 _12
lo a b +b +-b-c (B-2)
Og 01 a 0 1 C2 .j C2
Letting
uU - 1Ogl -NC I
(-3)
C2
dU . I (1-4)
dN N ln(10) C2
Then
log10 a - b0 + bI U + b2 U2 (B-5)
Solving for a,
b + b1 U + b U2
a - 10 (1-6)
191
d-.10 b0 *.d b1U .'o b!.U2
dU dU 1B
where
d
101
o
bU
10
b2 ' bU
10
b 2 U2 "
2b Un(10)
i
dU LL 2
(B-8)
b U2 b U
+ 10 .10 b in(
1 )
Then
bI U b 2 V2
b
La 10
do
10 -10 in(10) L 2 b 2.U + b (B-9).
2
b'0 b1 U bU
2 (b-1l) I
C 10 2 Ub ) 2(2b
10 10
C2 (1) L 2 N I(I)C
2b 2 loMg - 2b 2 C1 b
C-+
2(5+)
402.-
APfPNDX C
DERIVATION OF C2
R is given by 34]
R. R"
-1-I S(C-I)
TCSS(C1
Where SSRES is the residual sum of squares and TCSS is the total corrected
sum of squares. Since SSRIS and TCSS are wasured in the vertical direc-
tion, it was desirable to correct them so that their direction is normal
m- J/K (C-2)
Where J is the side of a triangle along the least squares line and K is
the side of the triangle perpendicular to the least squares line. From
basic geometry,
12 . j2 + K 2 (C-3)
I- (. K)2 +
K2 (2 + (C-4)
()
193
2
Solving for K
.2
K2
K (C-5)C-6
,2/'
Solving for the correction of the slope,
Plugging this into equation C-1 to obtain R corrected for the slope,
called C
C2 "R 2
(K 2 / 2
) (C-7)2
SSlES-: 1
"1- 1 - (C-8)
p 1
I2
IA
194.
t I7
APINDIX D
DNDDPG DOCUM141ATION
program (DNWDPG) reads in the desired Aa vs. AN data and calls subroutine
DELTA to re-create the original a vs. N data. The program flow is then
data sets and theu calculates the histogram frequencies for each constant
A&a data set. The program flow is then transferred to subroutine STPLOT
routines.
2. WBLhn -.
3. WGSCAL
4. LESCAL
5. INISC
6. ODSCAL
1. DOPIDt
2. RF
3. L00PIX
4. WBLLT
1. RIM
2. RITPA,
.1. LSTSQR
2. R.ANK
3. OUTLIR
4. NWMTAB
5. SIPSN
6. MMAR
7. MIAXI
Prof. B. M. Hllberry
School of Mechaneal Engineering
Purdue University
West Lafayette, Indiana 47907
Phone (317) 494-1600 " - "
It
1W1
,r-
. .. , ... . .; .: :
APPENDIX 3
tion subprogram. The main program (CCDDP) reads in the desired replicate
cycle count data and writes it by calling subroutine RITDAT. The program
gram frequencies for the data. The program flow is then passed to sub-
A. Subroutines
1. MUILN
I
2. lILEW
3. MIZG
4. HLZGG
{I 5. IHl
1. 7W
2. 7W
3. FG
4. FOG
197
_ _
_ _II_
II. Statistical Parameters Subroutines
1. NRSTAT
2. WBSTAT
3. G16TAT
A. Subroutines
1. CHISQR
2. KOLSHR
3. NRMCS
4. WBLCS
5. GAMCS
1. FNMR
2. FWUL
3. FGAM
1. RITPAR
2. RrITUS
3. PAROUT
V. Plotting Routines
1. AVNPLT
F
2. HISPLT
3. MUMPT
4. LOGPLT
5. WELPLT
6. GAMPLT
198
B. Supporting Plotting Subroutines
1. ODAXIS
2. LGOAIS
3. ,MAXIS
4. SCINOT
VI. Scaling Subroutines
1. MICL
2. WBLSCL
3. GAMSCL
4. LGSCAL
S. LNSCAL
6. INLNSC
7. ODSCAL
8. SCALEL
VII. Stress Intensity Calculation Routines
A. Subroutine
1. DELTAK
B. Function Subprogram
1. FAB
VIII. General Purpose Statistical Routines
A. Subroutines
1. NRWfAB
2. OUTMIR
B. Function Subprogram
1. PNORM
2. FGAMMA
199
IJ
3. FPSI . .
4. FTRIGM
6. FG(
I: ~8. FGHNEG
9. FSER.- . - .
10. F'FRAC
1. TABIL.
2. INrHAV
3. INTrERP - "
4. INVINT
5. LSTSQR
6. INVMAT
7. RANK
8. MANCHA
9. INITR - ..
10. ITOR
11. LOG
12. MAXR
13. MAXI
J
D-
APNDIX
t
CGRDDP DOCIUfWTATION
This program consists of a main program, 50 subroutines, and 17 func-
(Appendix E) and only, the main program (CORDMP) and 3 subroutines are
changed. These 3 subroutines are;
1. CLASS,
2. STPLOr, and
3. RITDAT.
This program requires an input of replicate growth rate data and has the
sameOut-put as the CCDDP program. Subroutines DELTAK, ?TOR, and MAXI and
function subprogram FAB need not be loaded for this program. A listing
D).
201
APPENDIX C
DNWDP DOCUMNTATI.N
changed are;
1. CLASS,
2. STflOT,
3. lUG,
4. MZGG,
5. O1TAT ,
6. GAMCS,
7. RITDAT,
8. RITPAR, and
S. GA ) ,LT.
1. FG,
2. FOG, and
3. FOAM.
This program requires an input of replicate grovth rate data and has the
sam output a the COPIDD program. Subroutine 1WMAT need not be loded
202;
for this program. A listing of this program can be obtained
from
Professor B. M. H411berry (Appendix D)..-
.
203L
APPNDIX H
D6LTCP DOCUMENTATION
This program consists of a main program and 5 subroutinas. The main
program (DELTCP) reads in the desired a vs. N data and calls the proper
1. RHOCV,
2. STRIP, and I
3. DELTA.
The main program then calls ssbroutine RITDAT to write the 4a vs. AN
(Appendix D).
______
204
S1
APPENDIX I
DADNCP DOCtU3NTATION
This program consists of a main program, 22 subrouttines,
1. DADN I
2. SECANT ... .
3. HOD9KC I
4. STRIP
5. EVAL ..
1. DELTA
2. I1Ml GR c '",'....--i
1. RMTAT
2. RtITRIB
i 3. U|IULT
1. AVIWLT
2. LOWL
I. I ...
_ .Scalift Subroutiti.
1. LOSCAL
- --V , -Stress Intensity Calcudlatias lodtines
VI CasalPupoeSubroutine s
1. llx
2. ZUITI
- 3. CHICK
4. ITOR
S. KMf
6. LOG
7. UJTSQR
(Appendix D).
206
AVNPRD DOC1DINTATION
tion subprograms. The main program (AVNPRD) reads in the desired distri-
1. RNIG4
II. Inverse Distriution Subroutines
1. INVDIS
2. INWRBJ
3. IW21N
"4. I3LN..
5. INYVIL
* 6. INWCAN
2. 8ICAMT. - ..
3. MDS&C
4. STRIP
IV. Output Subroutine
1. IITDAT
207
V. Plotting Subroutine
1. AVNPLT
1. MrAB
B. Function Subprograms
~1. Film
2. FCA)MA
3. FINGAM
4. FOM
5. FOMINT
6. FGHMG
7. FSER
8. FFYAC
1. TAJIRL
2. IYrHAV
3. IwR.RP
4. INVIWT
(Appendix 0).
to
S.r |
APPENDIX K
- - . 112 -26.
J.14
21
3.18
4 -25 44. 130
6112
62. 31
209
REFENCES
_ _ . ... .. . _ _ _
210
_ __I Hl
.Walpole,
12. gulneert
R.andS.Scientists,
and Myers, Macmillan
R. H., Probabilit and Statistics
Publishing Co., Inc., 1972.
1r
20. Lienhard, J. H. and Meyer, P. L., "A Physical Basis for the
Generalized Gama Distribution," Quarterly of Applied Mathematics,
Volume 25, 1967, pp. 330-334.
22. Parr, V. B. and Webster, J. T., "A Method for Discriminating Between
Failure Density Functione used in Reliability Predictions,"
Technometrics, Volume 7, 1965, pp. 1-10.
211
24. iehbko, C. ., AA lotaydastonm to Computer-Aded -eOaan,P Prentice-
Hall, Inc., 1968.
27. Wilk, (. B., GOanadesikan, R., and Hayett, 14. J., "Probability
Plots for the Gems Distribution," Tachnometrics, Volume 4, 1962,
pp. 1-20.
35. Dahiya, R. C. and Garland, J., "Pearson Chi-Squared Test of Fit vith
Random Intervals," Biometrika, Volume 59, 1972, pp. 147-153.
38. Hillberry, B. M., Alsos, W. X., and Skat, A. C. Jr., "The Fatigue
Crack Propagation Delay Behavior in 2024-T3 Aluminum Alloy Due to
Single Overload/Underload Sequences," AFFDL-TR-75-96, Air Force
Flight Dynamics Laboratory, Wright-Patterson Air Force Base, Ohio,
1976.
212
||,
40. Virkler, D. A., Hillberry, B. M., and Goal, P. K., "An Investigation
of the Statistical Distribution of Fatigue Crack Propagation Data,"
ASTH Meeting on Fracture Mechanics, Norfolk, Va., March 1977,
21