Whats New PDF
Whats New PDF
What's New
in AWRDE 12
What's New in AWRDE 12
NI AWR Design Environment 12 Edition
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Patents
The NI AWR Design EnvironmentTM is covered by one or more of the following Patents:
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Table of Contents
NI AWR Design Environment (NI AWRDE) 12 What's New ...................................................................... 1–1
What's New Organization ............................................................................................................. 1–1
Major Feature Overview .............................................................................................................. 1–1
NI AWR Design Environment (NI AWRDE) ............................................................................ 1–1
Microwave Office/Analog Office (MWO/AO) .......................................................................... 1–1
Visual System Simulator (VSS) ............................................................................................. 1–2
NI AWR Design Environment (AWRDE) Features .................................................................................... 2–1
Operating System ....................................................................................................................... 2–1
Rich Text Box ............................................................................................................................ 2–1
Marker Defined Sweep Indexes on Measurements ............................................................................. 2–2
Equation Editing Auto-complete .................................................................................................... 2–4
Measurement Editor .................................................................................................................... 2–4
Output Files Update .................................................................................................................... 2–5
Measurements on User Folders ...................................................................................................... 2–6
Inference Snapping and Auto Wiring .............................................................................................. 2–6
Expanded MDIF File Support ........................................................................................................ 2–7
Measurement Stepped Colors Improvements .................................................................................... 2–7
Simulator Options Updated to Use Grids ......................................................................................... 2–8
Options Display Improvements ...................................................................................................... 2–9
Minor Improvements ................................................................................................................. 2–10
API ................................................................................................................................ 2–10
DRC ............................................................................................................................... 2–11
Equations ........................................................................................................................ 2–11
Graphs ............................................................................................................................ 2–12
Licensing ......................................................................................................................... 2–14
Printing ........................................................................................................................... 2–14
Project Import .................................................................................................................. 2–14
Scripting .......................................................................................................................... 2–14
Symbol Editor .................................................................................................................. 2–14
User Interface ................................................................................................................... 2–15
Microwave Office/Analog Office (MWO/AO) Features ............................................................................. 3–1
Swept Load Pull File Support ........................................................................................................ 3–1
Simulation Load Pull Improvements ............................................................................................... 3–1
STAN Wizard ............................................................................................................................ 3–2
APLAC Simulator Improvements .................................................................................................. 3–3
Remote EM Simulation ................................................................................................................ 3–4
Insitu Currents and Antenna Patterns .............................................................................................. 3–4
3D EM Extraction ....................................................................................................................... 3–6
Analyst Speed Improvements ........................................................................................................ 3–7
Layout Line Types Can Match Substrate Definitions .......................................................................... 3–7
Via Fills .................................................................................................................................... 3–7
Layout Polygon Point Editing ........................................................................................................ 3–9
User Defined Layer Fill Patterns .................................................................................................. 3–10
Design Workshop 2000 Integration ............................................................................................... 3–11
Chamfer/Fillet Layer Modifier ..................................................................................................... 3–11
Negative Thickness Support for AXIEM and Analyst ....................................................................... 3–12
AXIEM Anisotropic Support ....................................................................................................... 3–13
New AXIEM Mesh Clean-Up Option ............................................................................................ 3–14
Antenna Output Files ................................................................................................................. 3–15
• “NI AWR Design Environment (AWRDE) Features” - Common improvements to all products.
• “Microwave Office/Analog Office (MWO/AO) Features” - Microwave Office®/Analog Office® (MWO/AO)-specific
improvements.
• “Visual System Simulator (VSS) Features” - Visual System SimulatorTM (VSS)-specific improvements.
• “Migration Issues” - Migration issues from previous versions to the current version.
Features listed in this document may also include links to videos or reference examples included in the AWRDE
installation. Examples are listed by file name, for example: filename.emp. To find an example in the AWRDE, choose
File > Open Example and type the example name.
• “Simulation Load Pull Improvements”: Updated utility to simulate load pull swept over multiple dimensions.
• “STAN Wizard”: Added a Wizard for integration with the STAN nonlinear stability analysis tools.
• “APLAC Simulator Improvements”: Improved circuit simulation for faster and more robust simulations.
• “Remote EM Simulation”: Added the ability to simulate AXIEM and Analyst EM structures on a remote computer.
• “Insitu Currents and Antenna Patterns”: Visualize EM currents or antenna patterns, including the effects on the circuitry
connected to the EM structures.
• “3D EM Extraction”: Added 3D EM including Analyst extraction.
• “Analyst Speed Improvements”: Improved Analyst simulator for faster simulations.
• “Layout Line Types Can Match Substrate Definitions”: Distributed models can now change their substrate definition
after a layout line type is changed.
• “Via Fills”: Added a command to fill selected shapes with vias or other shapes.
• “Layout Polygon Point Editing”: Added a layout capability for adding or removing points on polygons or paths.
• “User Defined Layer Fill Patterns”: Added a capability in layout setup to define your own fill patterns.
• “Design Workshop 2000 Integration”: Integration to run LVS and DRC using the Design Workshop 2000 tools.
• “Chamfer/Fillet Layer Modifier”: Added a shape modifier that can modify corners of geometry with a chamfer or
fillet.
• “Negative Thickness Support for AXIEM and Analyst”: Simplified setup of AXIEM and Analyst.
• “AXIEM Anisotropic Support”: The AXIEM EM simulator now supports uni-axial anisotropic dielectric materials.
• “New AXIEM Mesh Clean-Up Option”: Added an AXIEM option to help clean up small geometry features.
• “Antenna Output Files”: Simulation-based files specifically designed for use with VSS and the corresponding antenna
blocks can now be generated.
• “Analyst Run One More AMR Sequence”: Added a command to run one more AMR sequence from a previously
completed Analyst simulation.
• “Analyst Low Frequency (DC) Extrapolation”: The Analyst 3D EM simulator now supports a mode for extrapolating
to frequencies below the minimum solved frequency settings.
• “3D Editor Improvements”: Added capabilities in the 3D Editor to enable more efficient manipulation of 3D geometry.
• “New EM3D_SURF_CONCERNS Annotation for Analyst”: Added an annotation to help find locations in geometry
that might cause meshing problems.
• “EM Layout”: Added an easy way to change the 3D view angle in 3D EM layouts.
• “Explicit Ground and Balanced Ports on Subcircuits”: Expanded explicit ground and balanced port configurations for
substrates to be any port count subcircuits.
• “Transmission Lines Add Surface Roughness and Magnetic Properties”: Expanded some transmission line models to
be able to simulate dielectric surface roughness and magnetic materials.
• “Thermal Node Identifier”: Added a new element to identify any thermal nodes of elements.
Operating System
AWRDE 12 does not support Microsoft® Windows XP®, Windows® Server 2003, Windows Server 2008, or
Windows Vista®.
To add a rich text box, choose Draw > Rich Text or click the Text Box button on the Graph toolbar.
• Different text box shapes, including a callout tail to point to a specific location.
• Options to easily change text font, size, color, attribute, alignment, bullets, and indenting.
• Options to change the background color, including a transparent background.
• Control of the text box border.
Additional Information:
You can now use that marker as the sweep index on another measurement, such as an S-parameter measurement.
The result of this setup is that after the swept simulation runs, you can move the marker on the IV graph and the S-parameter
result at that bias displays on the other graph.
Additional Information:
Additional Information:
Measurement Editor
The Measurement Editor (right-click any simulation document and choose Edit All Measurements) allows editing of groups
of measurements.
The Measurement Editor functions similarly to the Variable Browser and has capabilities that include:
Additional Information:
Improvements include:
• The ability to use the measurement options to control any swept variables.
• For NPORTF types (network parameters), if there is more than one swept variable, the file type is automatically the
MDIF format, so all sweeps are captured in the file.
• For NPORTF types (network parameters), you no longer need to specify if noise parameter are included. The AWRDE
detects active versus passive networks to determine if they should be included or not.
• The file can be automatically loaded into the project after it is created.
• The Simulator and Configuration options are identical to setting up measurements, making them more familiar and
easily understood.
• Added a new output file type to write data to a MATLAB *.mat file from an AWRDE measurement. For more
information, see “Write Measurement Data to MATLAB File: MATLAB”.
• Added a new output file type to antenna data from EM simulations that can be used in VSS, see “Antenna Blocks Can
Use Simulated Antenna Patterns”.
Additional Information:
Additional Information:
If you Shift-click when you add an element, a wire is automatically added in place of any inference line. This automatic
connection of two nodes speeds the creation of a schematic or system diagram.
Additional Information:
Additional Information:
Additional Information:
• Display of the complete list of options for a simulator type in one location; no more shared options pages. Previously
for circuit simulators, options might be displayed on multiple pages.
• Options can display as primary or secondary, allowing viewing of the most important options.
• Option values changed from default settings display in bold, making them easily identifiable.
• Easy reset of all options or only selected options to their default values.
• Brief option descriptions display in the dialog box, eliminating the need for a Help page.
• Groups of options can now use the project defaults when setting document options. Previously, either all options or
no options used project defaults..
• A new Reset Selected button resets only the selected options to their defaults. You can also select a group of options
to reset the entire group to defaults.
Minor Improvements
AWRDE 12 includes the following minor new features, enhancements, and user interface changes:
API
• Added a new method to access trace values of a measurement, including the ability to get parametric sweep values.
Previously, you could access the data with an x-values collection, but the access was different for S-parameter
measurements versus time measurements. The new TraceValues read-only property of a measurement is a much easier
and cleaner way of accessing the points on a trace. For more information, see “Reading Graph Values”.
• Changing the grounding style of EM ports through the API now updates the port correctly to reflect the new grounding
state.
• All graph API calls to set color now work properly.
• Added ability to flatten cells through the API through the drawing objects collection.
• Changing the name of a drawing layer through the API no longer changes the name of the drawing layer in the LPF.
• Manually selecting shapes and then using the API to select and delete shapes no longer causes a crash.
• Looping through layout cell objects in the API when the cell is in edit mode and the cell edits are not saved no longer
causes a crash.
• The MWOffice.ControlBars.Add and MWOffice.ControlBars.Remove are removed from the API.
• Added API access to the collection of installed PDKs (the list under File > New With Library). The new collection is
available from: MWOffice.AvailableProcessLibraries.
• Implemented the API functions for setting the sweep minimum and sweep maximum on Smith charts.
• Amended the API to copy saved data sets along with EM structures to match UI functionality.
• Added the ability to remove output equation documents in the API.
• Added the ability to lock and unlock EM documents through the API.
• Added API access to simulate arbitrary 3D EM structures.
• Added API access to the default iNet route widths.
DRC
DRC errors generated from 'distance' rules like MINWIDTH, SEPARATION, OVERLAP, and EXTENSION can now
be merged by adding the rule "MERGE_DISTANCE_ERRORS 1" anywhere in the DRC rule file. This is especially
helpful when errors occur between curved objects such as round via holes, or filleted structures in high-voltage processes.
Equations
• A new equation function find_pv(val, e_series) finds the nearest preferred value (standard component
value) to 'val'. 'e_series' may be 3,6,12,24,48,96, or 192.
A new equation function mov_avg(x,n) calculates the moving average of the vector x using a window size of
2*n+1.
Added support for complex numbers for equation functions find_index() and find_index_range().
A new equation function generates circles on a complex graph (Smith or Polar): circle(radius, ctr_re,
ctr_im, num_pts), num_pts between 2 and 1000.
• Using passed down parameters no longer sometimes leaves graphs with dimmed traces.
• Renaming an output equation document now synchronizes the change to any equations that reference the output
equation document name.
• Added an assign_array() equation function that allows assigning to individual values in an array.
Graphs
• Tabular graphs now support sorting. Click on the column headers to toggle between no sort, ascending, and descending.
• The command name for accessing graph Options dialog boxes changed from Properties to Options for consistency
with other AWRDE commands. To access graph options, right-click in a graph window and choose Options.
• In the Add/Modify Measurement dialog box, you can now directly edit the value for measurement parameters that are
represented in edit boxes with up/down arrows, such as port numbers on S-parameters. This does not apply to harmonic
indexes.
• Graph options are now accessible by right-clicking the graph name in the Project Browser and choosing Options.
• and Add Yield Goal options are added to graph legend context menus. These commands open
Add Optimization Goal
the New Optimization Goal or New Yield Goal dialog boxes with the corresponding measurement selected.
• The Add/Modify Measurement dialog box now displays the total number of sweeps above swept variable control
settings.
• Removed the Auto Interval option from the Symbol section of the Graph Options dialog box Traces tab. This option
applied to all traces on the graph and could not be controlled per trace. Instead, the symbol Interval and Size options
can be set to zero, which means 'auto interval'. This setting is per trace.
• If a measurement has a non-default Legend Data Name or Legend Measurement Name, these names are now retained
when the graph is duplicated as a different type.
• Marker searches are now allowed with markers on output equation measurements in Smith charts and Polar plots.
• The visibility of frozen graph traces is improved.
• When opening an old project in a newer version, marker labels no longer mistakenly display with a "_" character
instead of "m".
• The zoom data command on a graph now works properly with an x-axis using a log scale.
• When closing and opening projects, if a graph contains an optimization goal and a line marker, regular markers are
no longer lost.
• Measurements using "All Sources" now properly display the traces as configured in the Graph Options dialog box.
• When duplicating a graph using the "All Sources" measurement source, the formatting of the original graph is now
preserved.
• Line markers no longer temporarily disappear when right-clicking in a graph.
Licensing
• The 3D Editor can now open from the AWRDE with only the ANA-001 front-end license.
• APLAC linear simulation is now included in all MWO-1XX license features.
• (Port parameter) data file options are now accessible with a VSS-only license. Specifically, you can now change the
Consider Passive for Noise Simulation setting on a data file, and get different results.
Printing
• Print preview now properly displays any tables used with Window in Window in another document.
Project Import
Cleaned up the project import feature to not overwrite options set in the main project. Previously, importing a project
set the project level settings for the Job Scheduler.
Scripting
It is now easier to use a VB script (.bas file) from another script by adding '#Uses "<ScriptName.bas>" to the top of your
script to refer to the other script (note the ' before the # sign). Preface the ScriptName with a '*' to refer to a Global script,
for example '#Uses "*MyScript.bas"
Symbol Editor
• The Export command is now enabled on individual symbols in the Project Browser.
• The Export Circuit Symbols command is now disabled from the Symbols node of the Project Browser if there are no
project symbols.
• The Export Circuit Symbols dialog box now displays the total number of symbols to be exported.
• The option to save a symbol in the AWRDE 6.5 format is removed.
• Modifying a custom symbol file no longer moves the symbol in the schematic in which it is used.
• The Symbol Editor no longer loses edits if an error message is issued when closing the Symbol Editor window.
• Coordinate entry (using the Tab or Space Bar keys) when drawing shapes now functions in non-layout views such as
schematic and Symbol Editor. In these views, one grid size is equal to 100.
User Interface
• A new Multi-column option on the Project Options dialog box Schematics/Diagrams tab allows parameters displayed
on schematics or system diagrams to use multiple columns if more than 10 parameters are visible.
• Data files in the Project Browser use new icons to indicate the type of data the files contain.
• Netlists, Global Definitions, and Output Equations documents can now be duplicated using drag and drop, Ctrl + D,
and right-click context menu operations.
• New Enable All Equations, Disable All Equations, and Toggle Enable All Equations context commands are available to
control the state of all equations in a document. To access these commands, right-click an Output Equations document.
• If a Global Definitions or Output Equations document contains no enabled equations or elements, its Project Browser
icon displays dimmed (similar to a graph icon in the Project Browser).
• The consistency and usability of Project Browser context (right-click) menus is improved:
• The order of items is now more consistent among types.
• Open Project Item, Expand All, and Collapse All commands now only display when you Shift-right-click the node.
• Cut,Copy, and Paste commands now only display when you Shift-right-click the node.
• Rename, Duplicate, and Delete commands are no longer appended with the item type (for example, Rename Schematic
is now simply Rename ).
• New options for adding a measurement to an optimization or yield goal are available by right-clicking the measurement
on a graph.
• The Add Switch View command for creating a new schematic with the correct syntax for generating switch views is
now available by right-clicking a schematic. You can type the name of the view after the "/" character in the New
Schematic dialog box that displays.
• Horizontal scrolling by tilting the mouse wheel (if hardware supported) is available.
• Pushing into and popping out of subcircuits on a 5-button mouse by using the "forward" and "backward" buttons is
supported. Press the forward button while hovering over a subcircuit to push into it and press the backward button to
pop out of any subcircuit.
• You can now rename the default Global Definitions document.
• Long messages in the Status Window no longer occasionally cause crashes.
• The project archive capability now works for any file set to read only.
• The Project archiving capability is improved to better find all PDK file locations for the archive.
• Further improved on the time it takes to open projects that use many dynamic parameters.
• You can now use the keyboard in the Add/Modify Measurement dialog box after changing the Complex Modifier.
• Using pan commands in a window with an embedded "window in window" view no longer blanks the window after
many pans.
• Toolbar shortcuts to call scripts that are auto-migrated from a previous version now function.
• Dialog boxes that report errors about models are no longer hidden behind the main workspace.
• Dynamic parameters now maintain their values when using the Replace Selected Element > Preserve Parameters command.
• Schematics, system diagrams, and EM structures now support user attributes. A User Attributes tab on the Options
dialog box allows for editing attributes along with API access via the 'Properties' collection.
• Further enhanced the ability to change frequency lists without needing to click the Apply button. This now works when
defining a single point or deleting values from the list.
• Circular schematic references are no longer created by copy and paste operations.
• Adding focus back to an MDI window (not floating) after selecting a floating window now functions correctly.
Previously, menus, toolbars, and hotkeys might not function correctly when selecting the MDI window.
• Improved how schematics using "window in window" copy and paste into other applications.
• The child window in a "window in window" configuration no longer appears to move when the parent window zoom
or size is changed.
• The vertical scroll bar for the simulation information in the Data Set Properties dialog box now displays.
• Improved selecting optimization goals on graphs when they overlap and one is disabled.
• 3D EM parts no longer display in the Add Element dialog box when the library is installed locally.
• The Project Browser now refreshes immediately when changing a schematic to linked.
• Tabular graph properties are now accessible via right-click (context) menus in the Project Browser.
Additional Information:
• Example: Swept_Load_Pull_Measurements.emp
Additional Information:
STAN Wizard
A new Stability Analysis Wizard is available in the Project Browser Wizards node. This wizard guides you through the
steps needed to analyze the stability of the selected circuit using the STAN stability analysis. You must have the STAN
software installed to run this wizard.
Additional Information:
• All of the APLAC simulators (linear, harmonic balance, transient, AC and noise) are significantly faster when using
tuning, yield and optimization. Up to 50x speed improvement is possible with these simulators in the listed modes of
operation.
• APLAC can now calculate internal branch values, such as performing a dynamic load line analysis internal to the
transistor parasitics.
• In previous versions, sometimes too many quantities were solved for, regardless of the measurements that existed for
those schematics. Now, much better profiling of the measurements determines which quantities are needed. This results
in more efficient simulations when using APLAC circuit simulators.
• More robust solvers that dynamically switch modes of solving when numerical problem arise.
• Better support for frequency-dependent models to work in transient. One advantage is that in some cases, transient
can be used to help harmonic balance convergence. This allows for more accurate model extractions as well as results
caching to speed up subsequent simulations.
Additional Information:
Remote EM Simulation
You can now set up a remote simulation server and submit EM (AXIEM and Analyst) jobs to it. After configuring your
remote network, you can specify how you want your EM simulation to run using the options shown in the following
figure.
Additional Information:
• Documentation: “Utilizing Remote Computing” and “Job Scheduler Admin Dialog Box: General Settings Tab ”.
For example, consider a 64-patch antenna array as shown in the following figure, magnified on a few of the elements.
AXIEM or Analyst is used to simulate the characteristics of the array. The excitation schematic consists of a power
dividing network, phase shifters, and attenuators which have been parameterized to steer the radiation pattern to a specified
direction with a specified amplitude taper. The result is that you can view the antenna characteristics via
measurements/annotations given the current state of the excitation circuit. For example, the radiation pattern in the
following figure is a result of an excitation circuit steered to bore-sight (Theta = 0 deg).
Modification of the parameters of the excitation circuit to steer the radiation direction to Theta = 45 deg, Phi = 135 deg
modifies the phase of each element resulting in the following radiation pattern.
Note that the resulting radiation pattern is calculated without re-simulating the EM structure, so the tuning on the excitation
parameters occurs in near real time.
Additional Information:
• Documentation: “In-situ Measurements and Annotations”, “3D Antenna Pattern from Circuit Excitation:
ANTENNA_CKT_3D”
• Examples: InSitu_Polarization_Diversity.emp, Patch_Array_Antenna.emp, TRW_Star_Mixer.emp
3D EM Extraction
You can now use the AWRDE extraction process of automatically creating EM simulation documents from schematic
layout for 3D EM simulators (specifically the Analyst simulator).
Additional Information:
Additional Information:
Via Fills
You can now draw a shape and choose Draw > Add Shapes > Via Fill to fill the shape with vias or any other shapes defined
in a cell library. The Draw > Add Shapes > Via Fence command surrounds a shape with vias. For example, the following
3D layout shows a simple line with a bend and a top shape indicating a top ground flood area.
Selecting the top ground shapes and running the Via Fill command displays a Via Fill dialog box to configure the via
fill.
After running the command, the shapes are filled with the selected vias.
Additional Information:
For example, when double-clicking a rectangle in layout to edit the shape, you can only stretch one of the four edges to
change the rectangle shape.
Using the new Edit Points command, you can add a new point on the rectangle, for example on the upper left side of the
rectangle, as shown in the following figure.
When you double-click the shape to enter point editing mode, there are more controls to edit the shape.
Additional Information:
Additional Information:
Additional Information:
When viewing the EM mapping for the "Copper layer", you can see that the metal is extruding downwards from the
assigned layer of 2.
Additional Information:
NOTE: This anisotropic behavior only specifies the dielectric materials in the layered structure. Anisotropic behavior
for conductors is for future implementation.
Additional Information:
• Documentation: “Element Options-(EM) ENCLOSURE Properties Dialog Box: Material Defs. Tab”.
• Example: FilterOnAnisotropicLayer.emp
Additional Information:
• Documentation: “Write E-Field Radiation Pattern to File: AntPat_EF” and “Write Total Power Radiation Pattern to
File: AntPat_TPwrF”.
• Example: FilterOnAnisotropicLayer.emp
Additional Information:
Additional Information:
3D Editor Improvements
The 3D Editor includes the following improvements:
The text displays "c-1" (concern 1 that corresponds with information in the Status Window).
There are two areas that control the zoom. The first is the bounding box of the actual geometry. These are noted by the
transparent boxes in the diagram. The second is any area in the window that is outside of the geometry bounding box.
These are noted with the remaining boxes along the outside of the window.
Additional Information:
The default symbols are updated to support this enhancement. The Explicit ground node setting displays the new ground
node with a ground symbol next to the node.
The Balanced ports setting displays the positive and negative terminals for each port in the subcircuit.
It is important to understand how these settings affect the performance of your subcircuit.
Additional Information:
Additional Information:
• Documentation: “General Multilayer Conducting Substrate Coupled Lines (FEM Quasi-Static): GFMCLIN”.
Additional Information:
Minor Improvements
MWO/AO version 12 includes the following minor new features, enhancements, and user interface changes.
Nonlinear Stability
Analyst
• The geometry of the Ball Grid Array (BGA) 3D EM element is corrected. A previous miscalculation of ball dimensions
resulted in a slightly shorter ball.
• Simulations can now be set up to converge on both phase and magnitude of S-parameter results.
3D Layout Editor
• The 3D Layout Editor no longer allows negative values for dielectric constants.
• All DXF now imports properly in the 3D Layout Editor.
• The Layout Editor no longer crashes after pressing the middle mouse button for rotation.
• Changing a material for an extruded face no longer causes a crash in the 3D Layout Editor.
3Di Import
• 3Di import now supports mirrored components.
• Net names in 3Di files are no longer limited to 28 characters.
Data Files
• Generalized MDIF files now support active device noise parameter support. With this addition, the Generalized MDIF
file format should be used instead of the legacy MDIF file format. It is better in all aspects.
• Generalized MDIF files now support normalization impedances other than 50 ohms.
• Added support for integer VARs in Generalized MDIF data files.
• The sort order settings for MDIF files now also apply to Generalized MDIF files.
• When importing data files with names that contain illegal characters, a Suppress similar messages for the rest of the
session option is now available. If you are importing many files with similar issues, you can skip this dialog box after
its first display.
• Load pull text files issues upon copy and paste in the AWRDE are resolved, and file extensions are also maintained
upon export.
EM Layout
• You can now draw a route directly in EM layout by choosing Draw > Draw Route. This command allows you to draw
complex routes (and easily change layers and insert vias) in EM layout.
• EM geometry comparison is improved when determining if a structure needs to resimulate. Slight changes in how the
geometry is defined, such as the addition or subtraction of a collinear point on a polygon, no longer cause unnecessary
resimulation.
• The Analyst Preview Geometry view now displays the rules-simplified geometry in both 2D and 3D views.
• An Undo/Redo of pasting a shape with a port attached to it no longer causes a crash due to improper removal/addition
of EM port.
• Cut planes now function better when cutting shapes that contain holes.
• Path editing in EM layout for AXIEM and Analyst is updated to honor path end style settings.
• AXIEM ports now consistently de-embed properly when copied from a different port configuration and then changed.
• Meshing an AXIEM structure no longer sometimes changes the color of the shape.
• Fixed an issue with port locations when using hierarchy for Analyst documents where ports at the same x,y location
but different z location did not work right when used as a subcircuit.
• Editing ports in a hierarchical Analyst structure in the subcircuit now properly updates in the top level structure.
• When copying and pasting a shape with a port, the port is also copied and now the port number is incremented.
• When extraction is used with hierarchical layouts, the positive/negative layer merge now occurs for lower levels of
hierarchy.
• EM ports now consistently display properly in the 3D view of the EM layout.
• Design Rule Checking (DRC) now runs from EM layouts.
• Analyst ports no longer incorrectly display outside of the bounding box of the structure when viewing in 3D.
• Scale factors of dielectric layers no longer make 3D layouts draw improperly in the Z dimension.
• The flatten shape command is now available for EM layouts.
• The EM Port Properties dialog box must now be closed before the EM Preview Geometry window can be closed to
prevent a crash.
• From a 3D EM Layout View, choose View > Visual > Show EM Port Labels to control the visibility of the ports. Choose
View > Visual > Show EM Layer Labels to control the visibility layer labels. These labels line up with the EM layers when
viewing a side view of the EM structure.
Layout
• When using multi-technology designs, exporting layout now includes all levels of hierarchy using the export mapping
in each LPF defined for each level of hierarchy.
• Disassociating a cell associated with a named port object no longer results in a program crash.
• GDSII export now skips any paths with a single vertex (essentially a zero length polyline). In this case, the geometry
is good but could cause some DRC engines to find an error.
• Bounding boxes of subcircuits that use a global data model (such as SSUB) now properly update as changes are made
to the global element.
• Renaming a variable in a global definitions document that is used on a pcell to define its layout now refreshes the
layout being drawn.
• Selecting shapes in layout after changing layer visibility settings no longer selects in a region where a previously
visible shape was located.
• The text label for a pCell now draws properly when changing the layout zoom level.
• Changing the font size (typically smaller font) of layout polygon text no longer occasionally causes a crash.
• Improved the performance of layout when using subcircuits many times.
• Layout snapping now picks a face over an area pin when it could use either and they are both the same distance from
the other connection point.
• A parameterized layout cell no longer reads the wrong LPF when copied and pasted into a document with a different
LPF.
• Improved layout snapping when working with area pins.
• Added a new Curve option for drawing routes with curved bends to force the bend radius to stay fixed. Previously in
tight areas, the bend radius could shrink to make the layout fit. The same situation with the new option, the curves
become square. Choose Options > Layout Options to display the Layout Options dialog box, then click the iNet tab and
select Curve in the Default Bend Style section.
• When opening a project, if an LPF used by one or more schematics is missing, a dialog box now displays to allow
you to choose a different LPF for that schematic. You can also select Use this LPF for all schematics that used
<old_lpf_name> to change multiple schematics at once.
• The Layout Create Mosaic command now functions with pcells not assigned to a schematic element.
• It is no longer sometimes difficult to snap to the edge of a shape in layout that is not a parameterized cell or artwork
cell (sometimes called a dump shape) when using the non-default LPF for the schematic.
• Layout export now supports both layout grouping and vector instances.
• Improved layout rendering for vectored instances of subcircuits that are grouped. Previously they could disappear
from layout.
• The state of the "Freeze" shape property now properly displays when selecting multiple layout objects and viewing
shape properties.
• Improved the quality of the snap point detection when shapes have overlapping edges.
• Improved the layout Edit in Place capability when using multiple technologies.
• Fixed a rounding error in the origin of circles in DXF artwork cell libraries that could cause shapes to shift slightly.
• Added support for MTEXT objects in DXF file import.
• Copying path layout objects from schematic layout to DXF cells no longer changes the end style of the path.
• Moving a layout element that includes text now correctly moves the text and no longer leaves shadows of the text in
the layout.
• With a pcell attached to a 0 port component, opening the Properties dialog box and then canceling, and then
drag-stretching the pcell no longer ignores the first stretch.
• Collections of layout objects, specifically iNETs, now support 45-degree rotation.
• iNets created with 45-degree angles now draw correctly upon rotation.
• Copying an iNet and pasting with the option to flatten the shapes on paste now retains the iNet vias.
• The mosaic operation now properly supports negative values for the offset parameters when the GDSII file is exported.
• DXF file export now adds to the file the color used to draw in the AWRDE.
• Improved reading DXF libraries so that if a cell instance exists but is empty, it still imports to avoid a missing cell
error message.
• When exporting DXF layout from a project that contains multiple LPFs, if a subcircuit is encountered which uses a
different LPF than the top level layout, the export checks for a DXF export map with the same name as the selected
map on the top level layout. If no map with that name exists, that subcircuit layout is skipped from export, and a note
is added to the layout export log file. Export of GDSII or Gerber using multiple LPFs is not supported; only subcircuits
that use the same LPF as the top level layout are exported to these file types.
• CPW models layout no longer sometimes creates bad layers. CPW models by default add a negative layer for the
spacing to the metal. Previously if the line type in the LPF also specified the negative layer a bad layer might result.
• Enhanced reading LPFs such that if node order of a STRUCT defined item changes, the layout connectivity updates.
• The MRINDSBR, MRINDSBR2, MRINDSBR spiral inductor model's layouts now properly draw differently when
changing the BrMode parameter.
• Improved the synchronization between layout parameterized cells that get information from model blocks (such as a
substrate model) when the model block is copied and pasted.
• Improved how EM mapping is assigned in the STACKUP block for choosing LPFs and EM mapping tables. Some
circumstances could previously cause these settings to be blank.
• Multiple File Export Mappings can now be edited when a new drawing layer is edited.
• The Connectivity Checker no longer gives a false positive when using an artwork cell that contains multiple ports with
same port number.
Measurements
• Nonlinear noise measurements are simplified to eliminate having two similar measurements for each quantity. In
previous versions, many measurements had a second measurement suffixed with "_F" to put the swept noise frequency
on the x-axis of the measurement. This change simplifies the list of measurements and makes them easier to use. See
“Nonlinear Noise Measurements with Noise Frequency on the X-Axis” for details on issues migrating from earlier
versions to V12 if using the "_F" measurements.
• Increased the precision in the output file of the YldToXML measurement.
• When setting up a favorite measurement from a simulation document that is an annotation, the Add/Modify Measurement
dialog box no longer displays.
• Improved APLAC simulations to work properly when the element ID starts with a number.
• Circle measurements on a Smith chart no loner need an x-axis setting. This allows selection of individual frequencies
for circles from the Add/Modify Measurement dialog box.
Models
The following model changes apply to APLAC simulators only:
• DYN_VCCS now properly supports the use of built-in variable "_PI" in the equation that defines the source.
• A warning now displays if the length of a bondwire segment is less than six times its diameter, helping to prevent
geometries where the assumptions under which the model operates are violated.
• Updated CPW X-models to simulate properly with APLAC simulators after the tables are filled if there is no EM
license.
• The value of an enumerated parameter (selected from a list) is prevented from being set to an invalid value when
viewing parameters and selecting multiple items but not changing the values.
• The NL_AMP2 model now properly supports the S12 parameter settings.
Netlists
• Subcircuit instances of HPICE native netlists now display the alpha-numeric pin names that are specified in the
SUBCKT definition in the netlist.
• Vector instance information is now included in AWR netlist format when schematics are exported in this format.
Schematic Editor
• Updates ensure that parameters are read only after a model is swapped with a different model.
• Explicit ground node is now supported for subcircuits that utilize the PORT_NAME element.
• Performing operations on a schematic when the Tuner is open and elements with dynamic parameters are used no
longer causes performance issues.
• Subcircuit port numbers now draw with a size proportional to the symbol size, making port numbers easier to see in
large subcircuits.
• Schematics and system diagrams are updated to further ensure model nodes are on grid even after a Rotate or Flip
operation when grid snap is off.
• Enhanced working with "Window in Window" views of the same document (for example, a layout view is added to
the same named schematic).
Shape Modifiers
• The Boolean and Offset shape modifiers now include an option to make a copy of the shapes and then perform the
operation.
• The manner in which Stretch Area and Boolean modifiers work in combination on designs with subcircuits is improved.
• Copying and pasting shape modifiers to different layout views (EM, schematic, artwork cells) is now properly supported
if those views support those modifiers.
• Added an option to the Environment Options dialog box Layout tab to allow setting the default Snap to Adjacent option
on cell faces. Previously this option defaulted as selected. For some design flows, snapping may not be desired. Some
layout features (such as parameterized layout or Layout Modifiers) however, auto-snap the layout together. Starting
the design with this option cleared (off) prevents unwanted auto-snapping from occurring.
• Shape modifiers now function better when layer order is changed in the LPF files. Previously, changing the layer order
could change how the shape modifiers worked.
• Shape modifiers now honor the layers in the LPF assigned to the current schematic when using multiple LPFs.
• The Stretch Area shape modifier no longer skips some shapes or vertices in an EM structure placed as a SUBCKT in
a schematic.
Simulation - Analyst
• The BODY count between exported SAT and SRF files now matches.
• For Analyst, geometry simplification rules are run at each level of hierarchy so that different technologies can use
their inherent rules.
• Analyst EM structures now run shape pre-processing rules at each level of hierarchy to allow different rules for each
type of technology used in the simulation.
• When using hierarchical Analyst structures, a warning instead of an error is now issued when a lower level document
has port reference plane shifts. Use caution with this approach, as the reference plane shifts from the lower level are
not used and could change the overall structure being simulated.
• Added phase of the S-parameters as an AMR convergence goal in Analyst.
• Turned off the display of Analyst mesh options per shape because they are not saved in the project and are not intended
to be set this way.
• Fixed the STACKUP user interface to allow Er and Ur values to be less than 1, since this condition is support by the
Analyst 3D EM simulator.
• Improved error messages when a port is on a conducting material, when at lower frequencies the conductivity is out
of the acceptable ranges for simulation.
• The material of shapes in multiple levels of EM structure hierarchy in Analyst structures no longer sometimes changes
incorrectly.
• The new Analyst Refine Solution feature now functions properly.
Simulation - APLAC
• Increased accuracy in HB analysis when using Inexact-Newton.
• Poor convergence in HB no longer results in an error when performing LSSS analysis or nonlinear noise analysis.
• Transient initial state now solves correctly, including when DC and TRAN topologies are different.
• The Sparse solver now switches from APLAC to KUNDERT Sparse if LU-factorization fails and Sparse solver
auto-selection is enabled.
• NDF switches to Kundert Sparse if APLAC Sparse fails.
• A new convolution algorithm is included.
• Transient extraction of data files is cached on disk.
• Voltage change of thermal nodes is computed like the change of voltage nodes in the HB analysis.
• Element currents are no longer missing if the external pins of the model are shorted.
• Noise results are no longer occasionally wrong when using APLAC simulators along with extraction simulations.
• When an annotation fails to converge at some sweep point, the annotation now displays a "?" character instead of a
value of 0.
• APLAC now issues an error if PHASE or PHASE2 elements are used in transient simulations, since those elements
are non-causal.
• The NEG2 block now properly handles negation in noise simulations with the APLAC simulator.
• APLAC now resimulates when changing the Max displayed time option which controls how much data to plot on a
graph.
• The APLAC simulator no longer crashes when trying to measure the node voltage of the substrate node of the VBIC
model.
• The GPROBE2 element now correctly works with yield analysis.
• Output files from the APLAC simulator for S-parameters now correctly produce noise parameter data.
• Updated APLAC transient to properly produce eye diagram measurements using a PRBS source.
• Sweeping _TEMPK now works with the APLAC simulators.
• Interpolation problems when using the X_PARAM block are resolved.
• APLAC simulators now support models that access model block parameters that have been added dynamically.
• APLAC now supports swept device multiplicity parameters.
Simulation - AXIEM
• Fixed some antenna patterns in AXIEM for the PPC measurement to prevent inverting their values.
• After simulating a parameterized AXIEM structure, changing the frequency list no longer issues an incorrect error
about not being able to extrapolate the data.
• AXIEM now functions better when simulating very low loss structures (super conductors). Previously, the minimum
conductance at ports could get incorrect values (set in the AXIEM options).
• AXIEM now re-uses mesh from a previous data set if the only changes to the EM structure are addition/deletion of
frequencies or a change in the AFS option. The mesh is not re-used if there are any AXIEM solver options changes.
• AXIEM now functions better when calculating Green's functions and running out of memory.
• When using AFS and sweeping geometry for an AXIEM structure currents now display correctly.
• Improved the accuracy of AXIEM; iterative and direct solvers give consistent answers.
• Using the EM_CURRENT annotation and opening the 3D view of the EM structure before simulation no longer causes
a crash.
• Entering data for AXIEM AFS band limiting is now more user friendly.
• Live results now function when simulating multiple EM documents from the Project Browser.
• AXIEM autoports are improved when determining the optimal de-embedding distance.
• Storing AXIEM simulation results in data sets when adding frequencies now displays correctly at first simulation.
• Improved the AXIEM mesher to better handle cases where shapes overlap.
• Improved the DIAGNOSE_MESH annotation for AXIEM so it properly displays the problem geometry that is causing
meshing problems.
• AXIEM now issues an error instead of crashing when finding specific problems with ports.
• AXIEM now more robustly handles ill-formed shapes, which have two of the same internal points.
• The AXIEM mesher is significantly improved.
• Improved the AXIEM connectivity mesh to avoid using similar colors for different nets. Also, running the annotation
a second time now uses a new set of colors.
• Fixed an issue with ports locations for AXIEM in some rare cases when connected near a via.
• Updated the AXIEM mesher to function better when metal overlaps are found and there is no EM mapping for some
overlapped shapes. The original issue was described as not meshing when finding tuning dots.
• The AXIEM mesher now functions better with multiple overlapping shapes.
• General meshing improvements now help eliminate high aspect ratio facets in AXIEM.
• Improved the algorithm for assigning ports to shapes after shapes are processed by geometry simplification rules.
Simulation - EMSight
• When adding higher frequencies to EMSight, the mesh now updates and prompts a new simulation.
• A problem with EMSight AFS that resulted in errors in simulation using saved results from MWOffice v7.0x is
corrected.
• EMSight no longer crashes when viewing the EM_E_FIELD annotation and then changing the simulation frequencies.
• EMSight no longer crashes when shapes are outside the Enclosure.
• EMSight no longer simulates if setting up an anisotropic dielectric material.
Simulation - Linear
• Current simulation results now display when the schematic contains an EM subcircuit that is also used as a subcircuit
in another schematic with different frequencies.
• Sweeping through values of a generalized MDIF file now correctly increases the sweep values.
• Measurements such as C_SRC that took a long time to run when used on large MDIF data files are corrected.
• In certain cases with the hierarchy, schematics now simulate only once and the traces being plotted display normally.
User Interface
• Explicit ground node is now supported for subcircuits that utilize the PORT_NAME element.
• You can now export a document that is a Switch View.
Wizards
• The Load_Pull no longer uses text data files to save settings from the previous simulation. All settings are saved in,
and read from the load pull template schematic.
• The Load Pull now supports canceling simulation after simulation is started.
• The Load Pull now disallows frequency sweeps set by the SWPFRQ block.
• The Symbol Wizard now properly uses shapes from 3D components in Analyst 3D EM documents.
• The Symbol Wizard no longer appears to hang when copies of shapes in an EM document do not change simulation,
but slow down operations that need to iterate over all of the shapes.
• Fixed the Symbol Wizard generator to better handle shapes that are very small that can cause other shapes to be
missing.
• In the Create New Process tool, you can now type many digits into the Er column without needing to first resize the
column.
• The Create New Process wizard no longer creates line types with spaces in the names. This supports synchronizing
line types to substrate names.
• You can create user-defined defaults for the Create New Process tool by adding a file named New_Process_Defaults.xpf
(it is an .xpf file saved from the New Process Wizard) into AppDataUser folder (located by choosing Help > Show
Files/Directories).
You will know a block supports both modes by viewing the ports. The ports will indicate they support both input and
output signals, as shown by the splitter block shown below.
SPLITTER
ID=S1
LOSS=
SIGTYP=Power
NOUT=2
NOISE=Auto
1 2
The BPORT_DIR annotation can help you visualize which direction the ports are configured based on the system diagram
connectivity. Please see BPORT_DIR for details.
In addition, the RF filter blocks in the Filters > Bandpass, Filters > Bandstop, Filters > Highpass, and Filters > Lowpass
categories are also bi-directional.
Additional Information:
Additional Information:
• Documentation: KCLUTTER .
• WLAN 802.11ac library, which is based on the NI WLAN RF Toolkit, was updated with a new, streamlined installer
that now supports multiple versions of AWRDE.
• Added support for the Bluetooth wireless standard. The VSS implementation uses the NI Bluetooth RF Toolkit and
allows the use of the same signal generator and/or analyzer functionality that is implemented in NI test and measurement
hardware equipment
• LTE library: Added downlink test model (E-TM) waveforms defined in TS36.141 specification document. E-TM
waveforms are created using the NI LTE RF Toolkit and support various configuration options.
Additional Information:
• Documentation: PHARRAY_ANT .
Additional Information:
Minor Improvements
AWR Visual System Simulator (VSS) 12 includes the following minor new features, enhancements, and user interface
changes.
• ANTENNA This block replaces the RX_ANTENNA and TX_ANTENNA blocks, which are still available in the
_Obsolete > RF Blocks > Antennas category.
• RFSW_BASEBALL This block implements a 4 port 2-way baseball switch.
• RFSW_CROSSOVER This block implements a 4 port 2-way crossover switch.
• RFSW_DIR This is a helper block for use when building T/R modules.
• SIGDIR This is a helper block for explicitly setting the direction of bi-directional ports.
• BPORT_DIR Annotation that displays the direction to which bi-directional ports have been resolved.
• F_node Displays the simulation frequency in RF Budget Analysis simulations.
Libraries
When generating XML library definitions for system diagrams, you can specify a schematic diagram name as a SUBFILE
such that when you add the block to a system diagram, the schematic also referenced will be added as a schematic.
Measurements
• The RFB measurement options for the Frequency Display expanded from Absolute Frequencies to Absolute End Point
Frequencies and Absolute Start Point Frequencies.
• M_PROBE can now be used on the ports of aggregate blocks such as RFSW_1nST.
• C_PHS_NOISE and C_IPHS_NOISE now will display the phase noise information at the To test point if there is any
phase noise information available, regardless of the From test point. Previously if the From test point was not on a
signal path, for example if it was on an LO path, phase noise information would not be displayed if the To test point
were one or more blocks after a mixer.
• C_HDRM now utilizes the smallest IP1dB within a subcircuit when computing the headroom for an entire subcircuit.
• The behaviour of the "Peak-hold" option in the VSS time domain spectrum measurements has been updated to advance
the spectrum snapshots similar to the way the spectrum is advanced for cumulative or averaged spectrum measurements.
Previously it advanced by the samples per symbol, which could cause AWRDE to become unresponsive if the samples
per symbol were small, such as 1 or 2.
• A situation where an RFB measurement referring to a VSA block would display the reference input frequency instead
of the expected measured frequency has been fixed.
• The RFI measurements have been updated to accommodate some round-off error in frequencies when selecting
components within a specified frequency band.
• VSS measurements referencing a M_PROBE no longer generate data after the M_PROBE is deleted.
• A situation where VSS WVFM measurements would fall out of synchronization while tuning has been fixed.
• Fixed the SIGPWR annotation to work on closed feedback loops.
• A new Use VBW/NAVG option determines whether the VBW or NAVG setting is used by default in spectrum based
measurements. If set to 'Auto' the measurements by default determine the settings from the signal characteristics.
• Colors of graph traces with RFI measurements no longer change after M_PROBE is moved.
• Fixed graph markers to work properly to display relative to a reference marker when using RFB type of measurements.
• The PWR_MTR measurement now properly displays the DC power output of NL_S and NL_F, previously it treated
the DC power output values of NL_S and NL_F as voltage and converted it to power.
Simulation
• The VSS SWPVAR block no longer needs its input port connected to sweep TD simulations.
• Most VSS Time Domain simulations can now be used with optimization and yield analysis without having to specify
a simulation stop time.
• Time domain annotations no longer generate an error when running a time domain simulation on a system diagram
containing a VNA block that sweeps frequency. Note that in projects from previous versions of VSS where this error
occurred you will need to open the properties of each time domain measurement that refers to the VNA block and
choose OK to update the measurement's settings.
• VSS now properly pauses its time domain simulation when the Pause is selected and time domain multi-core support
is enabled.
• When impedance mismatch modeling was disabled, LIN_S would fail to identify certain S parameter combinations
as belonging to a passive circuit. This resulted in LIN_S generating too low a value of noise at the output of the block.
This has been corrected.
• Fixed a crash when running a time domain system simulation a second time quickly after the first has finished. There
was an issue with multithreading that has been resolved.
• When a system diagram referred to a data file such as a Text Data File or a Touchstone data file, and there was an
up-to-date data set for that system diagram, making a change to the data file or options for the data file would not
result in the system diagrams resimulating. This has been fixed.
• Fixed a case where the wrong propagated signal power is produced in a COMBINER. Changed to check for inputs
that have the same CW frequencies as the primary input, if found their input signal info is added together.
• Several Time Domain simulation issues with the generation of noise by linear RF blocks have been fixed. These
include the improper scaling of noise to be added by the block when T was not 290 K, the noise generated being
improperly calculated from |VV| instead of |VV.real()|, and adjustment of the Y matrix when impedance mismatch
modeling is disabled to more closely match RF Budget Analysis and RF Inspector results.
• RF Inspector now attempts to consolidate signals from the same source after it has been split and then recombined via
blocks such as the quadrature hybrids.
• In RF Inspector, when a mixer has multiple frequency components at the LO, the mixer now identifies the frequency
component with the largest power as the 'primary' LO signal, and uses that component to generate the Signal components
at the output of the mixer. Output components due to the other LO frequency components are treated as interference
or distortion.
• The algorithm used by RF Budget Analysis simulations when choosing which path to follow when there are multiple
paths to choose from has been improved.
• Fixed an issue where not all graphs would update for VSS when updating to a specific dataset.
• Fixed an issue with VSS data sets where graph traces do not dim when simulator is running and a circuit parameter
is changed.
• In the VSS mixers, if PIN is left empty and the propagated input power level is very low, a PIN value of 10 dB below
IP1dB will be used instead of the propagated input power level.
• Adding support for P1dB, IP3, IP2 to the NL_F block.
• In case of a multi tone LO source, updated the mixer blocks to detect the LO tone with the highest power.
• RF_PID and RF_CNTRLR now properly their initial control value so a controlled block such as LVGA can use that
value to estimate the propagated signal power.
• MIXER_F now supports up to 11th order spurs as stated in the online help.
User Interface
• The buttons for PORTDIN and PORTDOUT in the System Diagram toolbar are replaced with drop-downs offering
choices for PORT_SRC/PORTDIN and PORT/PORTDOUT.
• You can now re-open closed VSS System Simulator Output windows by selecting a system diagram that has opened
a System Simulator Output window and choosing View > Simulator Output Window from the main menu.
Wizards
• Improved undo and redo commands to properly delete and restore columns in the RF Budget Wizard.
• Fixed a crash that could happen when using the RFP RF Planning Tool to generate system diagrams and graphs without
a VSS license.
• Fixed an issue where if the RFP RF Planning Tool wizard is used to generate graph and then inspected tone properties
from an RFI measurement without closing the RFP wizard, you would not be able to close the RFI dialog box until
the wizard was closed.
This method is similar to adding measurements to a graph where you fill in the data source and the measurement string.
Old API methods will now issue an error; you need to convert any scripts to use the new methods.
In V12, we were able to remove the "_F" measurements by adding a new control named NLNOISEto the counterpart
measurement to control how to display the swept noise frequency as shown below.
If you were using an "_F" measurement in previous version, those measurements are changed to the new measurement.
You will need to manually change the NLNOISE to the Use for x-axis to get the same x-axis as in previous versions.
NOTE: Ensure that your Windows® Explorer program is set to show hidden and system files.
Files in Appdatacommon
The migration of Appdatacommon is triggered based on the existence of the mwoffice.ini file in the Appdatacommon
folder for the newly installed version.
The path to each PDK is stored in the mwoffice.ini file and is available for any user of that computer. The installation
location of foundry libraries is typically version-independent; the default installation locations are not dependent on the
AWRDE version. These paths are used when opening a project using a PDK or by choosing File > New with Library.
All additional files and directories at this location are not copied since they should not be used with the new version of
the software.
Files in Appdatauser
The migration of Appdatauser is triggered based on the existence of the user.ini file in the Appdatauser folder for the
newly installed version. If there is an existing user.ini file, no files/folder are migrated. No existing files or folders are
overwritten.
• All .ini files located at the top level directory of Appdatauser, including user.ini. The user.ini file contains environment
settings, custom layout modes, and other environment defaults.
• All XML files located at the top level directory of Appdatauser. This includes:
• customizations.xml - contains your hotkey settings.
• UICustomizations.xml - contains your menu settings. You can always reset the menus to the AWRDE 12 defaults.
• UIDockingLayout.xml - contains settings for how different windows are docked in the AWRDE.
• UIToolBarLayout.xml - contains your toolbar settings. You can always reset the toolbars to the AWRDE 12 defaults.
• materialdefs.xml - There are several preset materials such as FR4, alumina, and GaAs available in the EM interface.
If you modify these settings, the changes are stored in materialdefs.xml.
• These directories:
• scripts - Global (available in any project) Visual Basic scripts.
• models/model64 - Custom models used in the AWRDE.
• cells/cells64 - Custom cells used in the AWRDE.
• symbols - Custom symbol files created in the AWRDE.
• em_models - User-filled X-Model tables.
• XML - XML libraries installed in the default location.
All additional files and directories in this location are not copied since they should not be used with the new version of
the software.
• TARGET: Users who have local XML libraries (anything outside of the NI AWR web library)
• Many users either choose to install a local copy of the XML libraries or add to the default installation with other
vendor-specific XML libraries. The default location is the <Appdatauser> folder. If your XML is in this location it
can be migrated automatically (see “Files Automatically Migrated ”).
• Starting in V11, the correct location for these libraries is :\Users\UserName\AppData\Local\AWR\Design
Environment\11.0\XML. There are top level folders for 3D EM Elements, Circuit Elements and System Blocks. Any
XML file located in these top level directories is automatically used in the AWRDE WITHOUT the need to edit files
in the installation folders.
The best way to migrate these libraries is to open your current lib.xml and sys_lib.xml files in the Library folder of
your old installation and search for any paths you added to this library (perhaps compare with v11). Find those libraries
and move the top level XML file to the directory listed above to break the cycle of needing to edit these install XML
files.
Other Concerns
Model Compatibility
• TARGET: Designers
• When model changes are identified, the project can use a model compatibility flag. When you open an old project in
a newer version of the AWRDE, the simulation results from the previous version do not change. You can change the
model compatibility setting to see simulation results with the old and new model implementation. A dialog box similar
to the following displays when you open your design in a newer version if there are models with a compatibility setting
in your design.
You can switch between model versions in the Circuit Options dialog box by choosing Options > Default Circuit Options,
then clicking the AWR Sim tab, clicking the Show Secondary button, and then selecting the desired modeling version
from Model compatibility version.
• When you install AWRDE 12, both versions will run. Uninstalling any version may result in registry problems;
therefore, when you uninstall, NI AWR recommends that you also repair your active installation. One way to repair
your installation is to open the Control Panel and double-click Add or Remove Programs. In the Add or Remove Programs
dialog box, find your AWRDE installation and click on the Click here for support information link to open the Support
Info dialog box, then click the Repair button.
Redirection
• TARGET: Users of any type of file redirection (changing the default locations for any of the folders used by the
AWRDE)
• In networked environments, some users may choose to change the default location for certain files.
• Complete information on redirection is available in the AWRDE Installation Guide under "Configuring Program File
Locations". If you use this capability, ensure that you make the same changes in AWRDE 12 that you set up for
AWRDE V11.