TDLS200 Tunable Diode Laser Gas Analyzer and its Application to Industrial Process

TDLS200 Tunable Diode Laser

Gas Analyzer and its Application
to Industrial Process
Kazuto Tamura *1 Tomoaki Nanko *2
Yukihiko Takamatsu *1 Junichi Matsuo *3
Yokogawa’s TDLS200 laser gas analyzer, which is based on tunable diode laser
spectroscopy, features high selectivity and long-term stability, and offers fast in-situ analysis
of even high-temperature or corrosive gases. This report introduces the measurement
principle of the TDLS200 and an example of real-time residual ammonia measurement in a
flue to control ammonia injection volume during the denitration and dust collection process.

INTRODUCTION INSTALLATION AND CONFIGURATION OF TDLS200

A
LASER GAS ANALYZER
laser gas analyzer employing the tunable diode laser
absorption spectroscopy (TDLAS) method has a feature Fi gur e 1 shows a n ex a m ple of i n s t a l lat ion a nd
capable of measuring the concentration of the sample gas conf iguration of the TDLS200 laser gas analyzer. The
with high selectivity for gas components and without contact TDLS200 has a launch unit and a detection unit that are
only by irradiating the gas sample with light from a tunable usually placed in a facing orientation on either side of the duct
diode laser. Thus fast and accurate in-situ measurements can (cross duct) through which process gas flows. The cross-duct
be performed in process lines under various measurement installation shown in Figure 1 can accommodate ducts up to
conditions. For example, measurements can be performed approximately 20 m wide.
at normal temperature and up to temperatures as high as
1500 °C, and in environments with fluctuating pressure. It Semiconductor laser Photodetector
Launch unit (Photo diode)
can also measure corrosive or highly hazardous gases. Use (Light emitter)
Optical path length Detection unit
(Light receiver)
of the accurate and highly responsive measurement signals Measuring
laser beam
produced by the analyzer for process control systems helps
improve yields, energy efficiency, and safety in various Mounting flange
(on both sides) Purge gas for preventing
industrial processes. A simple configuration without moving Process gas flow contamination of the optical
Optical axis alignment window (on both sides)
parts and components with limited lifespan ensures virtually (on both sides)

maintenance-free operation and management.

Yokogawa’s TDLS200 laser gas analyzer is a new type of Figure 1 Installation and Configuration Example
laser gas analyzer evolved for process measurement. Applying of the TDLS200 Laser Gas Analyzer
a measurement method based on the peak area integration
method, it eliminates errors caused by the presence of other Optical windows separate the interior of the analyzer
gases and pressure changes, which lead to measurement errors. from the process gas. The light from the semiconductor
It also enables accurate measurement of the concentration laser in the launch unit goes through the optical window, the
of gas components, even under simultaneous f luctuations process gas and the optical window of the detection unit and
in temperature and other factors. This paper provides an reaches the photodetector. The photodetector converts the
overview of the TDLS200 laser gas analyzer and describes its power of the received laser beam into an electrical signal. The
features and measurement principle, and introduces examples arithmetic circuit in the launch unit determines the absorption
of its applications. spectrum of the measured component, calculates the peak area
of the spectrum, converts it into component concentration, and
outputs it as a 4 to 20 mA analog signal.
The optical axis alignment part has a bellows structure
that allows easy angle adjust ment while maint ai ni ng
*1 Analytical Products Business Center,
airtightness essential for the industrial process. The connection
Industrial Automation Business Headquarters
*2 Quality Assurance Dept.,
of the launch unit and the detection unit via the optical
Industrial Automation Business Headquarters axis alignment part enables easy optical axis adjustment
*3 Laser Analysis Division, Yokogawa Corporation of America not only for regular installation configuration where the

51 Yokogawa Technical Report English Edition Vol.53 No.2 (2010) 113

TDLS200 Tunable Diode Laser Gas Analyzer and its Application to Industrial Process

two units are placed on both sides of the pipe as shown in 0.0025

Figure 1, but also for various types of installation like those

0.002
shown in Figure 2. This makes it possible to determine the

Absorbance [A.U.]
installation configuration that best suits the components to be 0.0015
measured and the application to ensure optimal conditions for
measurements. 0.001

Minimum optical 24 to 14 inch 24-inch pipe 0.0005

path length concentric
36 inches reducer
Minimum optical
path length 0
36 inches
1.528 1.53 1.532 1.534 1.536 1.538
Wavelength [µm]

Minimum optical
path length
Figure 4 CO2 Absorption Spectrum
36-inch pipe 36 inches
36 to 14 inch
concentric
reducer
Component Selectivity of Tunable Diode Laser Spectroscopy
Minimum optical
path length
Figure 5 shows the absorption spectra for CO 2 and
36 inches
Restriction H 2O. A wavelength resolution of conventional spectrometers
for the infrared to near-infrared region is around 0.3 to
3 nm. This value is equivalent to or larger than the distance
Figure 2 TDLS200 Installation Configurations between absorption peaks of different gases (0.5 nm or less),
making it impossible to resolve gas absorption peaks. This
MEASUREMENT PRINCIPLE OF THE TDLS200
example explains the case measuring concentration of CO2
LASER GAS ANALYZER
in the presence of H 2O. A conventional spectrometer will be
The TDLS200 uses the TDLAS method to measure affected by H 2O spectrum interference. To reduce the effect
optical absorption spectra peculiar to molecules ranging from of interference, measures such as removing interfering gases
infrared to near-infrared due to vibration and rotation energy must be taken prior to measurement.
transition of molecules in the measured component through
a semiconductor laser with an extremely narrow spectral The distance between CO2 and H2O peaks is 0.5 nm or less
linewidth. The optical absorption spectra peculiar to major and cannot be resolved by conventional spectrometers

molecules such as O2, NH3, H2O, CO and CO2 are in the region 0.005

from infrared to near-infrared, and measurements of the 0.0045 CO

CO22
Absorbance [A.U.]

0.004 H 2O
amount of light absorbed (absorbance) at a specific wavelength
0.0035
make it possible to calculate the concentration of the measured 0.003
component. 0.0025
0.002
0.0015
Infrared and Near-infrared Absorption Spectra Due to
0.001
Molecule Vibration and Rotation 0.0005
Figure 3 shows an example of molecule vibration
1.533 1.5335 1.534 1.5345 1.535 1.5355
and rotation mode (1) while Figure 4 shows a typical CO 2
Wavelength [µm]
absorption spectrum in the infrared to the near-infrared range.
Molecules consisting of two or more atoms absorb light at Figure 5 CO2 and H2O Absorption Spectra
frequencies specific to the vibration and rotation modes of
stretching, scissoring, etc. as shown in Figure 3. The width In contrast, unlike low resolution spectrometers, the
of absorption band for CO 2 shown in Figure 4 is about TDLS200 uses a laser beam with an extremely narrow
10 nm and the spectral linewidth of each absorption peak is spectral linewidth emitted by the tunable diode laser, and its
approximately 0.05 nm. wavelength can be changed by adjusting laser temperature
and drive current. This makes it possible to measure a single
absorption peak among those in the absorption spectrum like
that shown in Figure 5. Thus, as shown in Figure 6, one
Symmetric Antisymmetric In-plane
absorption peak that is not affected by interfering gases can be
stretching stretching scissoring selected for measurement.
Since wavelength selectivity is high and measurements
are not affected by other interfering components, there is
no need to remove interfering gases prior to measurement,
In-plane Out-of-plane Out-of-plane allowing in-situ measurement of process gas.
rocking wagging twisting

Figure 3 Examples of Molecule Vibration and Rotation Modes

114 Yokogawa Technical Report English Edition Vol.53 No.2 (2010) 52

 TDLS200 Tunable Diode Laser Gas Analyzer and its Application to Industrial Process

CO2 absorption peaks not subject wavelength scanning signal. However, all of these methods
to interference with other gases
were greatly affected by changes in temperature, pressure
0.005
0.0045 CO
CO22 and coexisting gases. In contrast, the peak area integration
Absorbance [A.U.]

0.004 H 2O
0.0035 method is theoretically not affected by changes in coexisting
gas components and spectrum area remains constant. And the
0.003
0.0025
0.002
0.0015
spectrum area changes linearly with pressure changes in principle.
0.001
0.0005
As shown in Table 1, the effect of temperature, pressure
and coexisting gas components on the peak height method
1.533 1.5335 1.534 1.5345 1.535 1.5355
Wavelength [µm] and the 2f method are nonlinear, which makes compensation
0.002
0.0018 Select only single
difficult when more than one of these factors are involved.
0.0016 CO2 peak not subject
Since the peak area integration method per mits linear
Absorbance [A.U.]

0.0014 to interference
0.0012
0.001
with other gases
compensation for gas pressure changes and non-linear
0.0008
0.0006
compensation for gas temperature changes, it ensures accurate
0.0004
0.0002
compensation.
0
10 20 30 40 50 60 70 80 90 100 110 120 130 140 150
Data no.
0.014

Absorbance [A.U.]
0.012
Figure 6 Absorption Spectrum Measured Using TDLS200 296 K
0.01 396 K
0.008 496 K
Measurements of Component Concentration Using Peak 0.006
Area Integration Method 0.004

The TDLS200 is capable of measuring an accurate 0.002

spectrum without being affected by interfering components 0

50 100 150 200 250 300
by sweeping the oscillation wavelength of the semiconductor Data no.
(a) Absorption spectrum when temperature changes
laser around a single absorption peak of the component to be
measured. 0.014
0.5 atm
Absorbance [A.U.]

Although an absor ption spectr um obtained by the 0.012

0.01 1 atm
TDLS200 isolates it from interfering components, the shape 0.008
1.5 atm
of the spectrum varies depending on the broadening effect 0.006

caused by the following factors: gas temperature, gas pressure, 0.004

0.002
coexisting gas components. Therefore measurements subject
0
to such environmental changes require compensation. 50 100 150 200 250 300
Data no.
Figure 7 shows the changes of a 0.76 µm-band single (b) Absorption spectrum when pressure changes
absorption spectrum of O2 with a 10% O2 concentration caused
0.014
by temperature changes, pressure changes and inclusion of 10% O2 in CO2
0.012
CO2, N2 or He as background gases respectively. 10% O2 in N2
Absorbance [A.U.]

0.01 10% O2 in He
The TDLS200 sweeps a wavelength using a semiconductor
0.008
laser and measure absorption spectra, and calculate component
0.006
concentration from the spectrum area employing the peak
area integration method. Table 1 shows a comparison of the 0.004

influence of each factor on the peak area integration, peak 0.002

height and 2f methods (2). 0

1 8 15 22 29 36 43 50 57 64 71 78 85 92 99 106 113 120 127 134 141 148
Data no.

Table 1 Factors Affecting Spectra (c) Absorption spectrum when other gas is mixed
and Comparison of their Effects
Factors causing Peak area integration Peak height method / Figure 7 Changes in Absorption Spectra Caused by
changes method 2f method Temperature, Pressure, and Coexisting Gasses
Gas temperature Nonlinear Nonlinear
Gas pressure Linear Nonlinear EXAMPLES OF INDUSTRIAL APPLICATIONS
Coexisting gas … MEASUREMENTS OF RESIDUAL NH3
No effect Nonlinear
components
CONCENTRATION IN FLUE GAS

Conventional methods used so far include the peak The TDLS200, thanks to its capability of fast in-situ
height method that calculates the concentration of measured measurement in actual processes, can be applied to high-speed
components from the peak height of absorption spectra, and control where signals indicating component concentration
the 2f method that calculates the concentration of the measured measurements essential for management are directly delivered
component from the P-P (Peak to Peak) value of the waveform to process control systems, and can be applied to real-time
generated by the frequency doubling modulation from a management of process states as well. The TDLS200 can thus

53 Yokogawa Technical Report English Edition Vol.53 No.2 (2010) 115

TDLS200 Tunable Diode Laser Gas Analyzer and its Application to Industrial Process

help improve various industrial processes. In this section, we Figure 10 shows the changes in NH3 injection volume and
will introduce measurements of residual NH3 concentration in measurement values of TDSL200 in the case where denitration
flue gas. Note that optimum combustion control applications equipment for improving the efficiency of the dust collector
have been reported in another Yokogawa technical report (3). and preventing corrosion is not equipped with; TDSL200 is
Please refer to that report for details. installed at point A in Figure 9.
Ammonia (NH3) gas is injected into flue gas to remove
NOx (denitration), increase the efficiency of a dust collector and 16 12

Volume of injected ammonia [kg/h]

Volume of injected ammonia
prevent corrosion. Excess NH3 injection increases the running

TDLS indicated value [ppm]

14 10

costs and the amount of residual NH3, resulting in generation 12 8

of foul odors. Therefore, the amount of NH3 in the exhaust gas

10 6
must be measured, controlled and monitored. For example,
8 4
the exhaust gas denitration equipment for a large combustion
furnace uses the DeNOx SCR (selective catalytic reduction) 6
TDLS indicated value
2

process, where NOx is reduced to N2 and H2O by NH3 injection 4 0

11:00 11:30 12:00 12:30 13:00 13:30 14:00 14:30 15:00
and selective reduction catalysis, and residual NH3 concentration Time
(ppm level) in the flue gasses is measured online. 12 10

Volume of injected ammonia [kg/h]

Conventional NH3 meters that use indirect NOx measuring Volume of injected ammonia

TDLS indicated value [ppm]

10 8
methods such as the chemiluminescence detection and ion
8 6
electrode method have slow response and require sample
line equipment involving heated pipes to prevent NH 3 6 4

adhesion and large maintenance costs depending on such a 4 2

TDLS indicated value
complex measurement system. On the other hand, as shown 2 0
13:14 Boiler stoppage 14:32 Boiler restart
in Figure 8, the TDLS200 is installed directly into process 0 -2
lines and measures NH 3 , which substantially improves 12:00 12:30 13:00 13:30 14:00 14:30 15:00 15:30 16:00
Time
responsiveness and maintainability. In addition, the highly
responsive NH3 concentration signals can be employed in NH3 Figure 10 NH3 Injection Volume and Changes
injection control to optimize NH3 injection. in Measured Values of TDLS200

Control of NH3
injection volume
FIC CONCLUSION
NOx
This paper has presented an overview of the TDLS200
NH3 injection
laser gas analyzer and described its features, measurement
Denitration principle, and applications. The high component selectivity,
equipment
DeNOx fast response and ease of maintenance achieved by this
SCR High-speed
measurement technology and product assure its application in a broad range
TDLS200 of residual NH3
of industrial processes. These include not only use in the NH3
measurement applications introduced in this paper, but also in
Figure 8 Use of TDLS200 in Denitration Equipment for measurements of CO and O2 in optimum combustion control,
Measurement and Injection Control of NH3 measurements of minute amounts of water in electrolytic
plants, etc. We expect the TDSL200 to greatly contribute to
Figure 9 shows an installation location examples of the the preservation of the environment and reduction of running
TDLS200 in an exhaust gas denitration process of a boiler. costs through its applications to process control not limited to
monitoring.

REFERENCES
Examples of TDLS200 (1) The Chemical Society of Japan compiled by, The Fifth Series of
installation location
Experimental Chemistry Vol. 9 Spectroscopy and Diffraction I,
Economizer Maruzen Co. Ltd., 2005 in Japanese
(2) Masayuki Satou, “New type of laser gas analyzer technology and
Point of NH3 injection its application to industrial processes,” Instrumentation Control
Denitration A
equipment Point of NH3 injection Engineering, Vol. 52, No. 2, 2009, pp. 73-76 in Japanese
(When denitration equipment
is not provided) B (3) Yoshitaka Yuki, Akihiro Murata, “Optimum Combustion Control by
C
Air Dust TDLS200 Tunable Diode Laser Gas Analyzer,” Yokogawa Technical
heater collector Report English Edition, Vol. 53, No. 1, 2010, pp. 19-22

* TDLS is a trademark of Yokogawa Electric Corporation.

Figure 9 Installation location examples of TDLS200
in exhaust gas denitration process of a boiler

116 Yokogawa Technical Report English Edition Vol.53 No.2 (2010) 54