PART 1 INTRODUCTION

1. Summary

2. Complete Appliance and Accessories

3. Specifications

YBD868 4. Measuring Range

Digital IC Tester 5. Function Summary

6. Maintenance

PART 2 OPERATING INTRODUCTION

1. Self-check

Operation Manual 2. Operating Introduction

3. Basic operation

4. Special Operation

5. Caution

6. Fault Detect

PART 3 LIST OF MEASURABLE DEVICES

PART 1 1) Complete Appliance and Accessories
INTRODUCTION
a. YBD868 digital IC tester 1pc
1. Summary b. Power cord 1pc
c. Operate manual 1pc
YBD868 digital IC tester is an universal apparatus with high d. Guarantee card 1pc
performance. The maximum pin number of DIP type IC that can be
tested is 40 pins. The test range has covered most of ICs and the result is 2) Specifications
stable and reliable with an easy operation. The basic functions of the a. Operating system: 16 key film keypad with dual tone announcing.
tester are as below: b. Display system: 6 digit LED display shows the model no. of
tested device and all kinds of function prompts;4 LED indicator
* Devices PASS/FAIL test show the working condition of the tester.
* Device model no. identification c. Power supply voltage: 220V±10%, 50Hz
* Device dynamic burn-in d. Power consumption: 12VA
* Device substitution query e. Operating temperature: 0℃~+40℃
f. Operating time: turn off for 5 minutes after one hour continuous
YBD868 digital IC tester uses advanced microprocessor and ICs running. For non-stop operating, please keep the supply voltage
produced by famous companies such as Intel, Motorola etc as main <230V, ambient temperature <25℃.
components. With supporting software and surrounding expansion g. Structure: Bench top, plastic chassis
system, this IC tester can completely simulate the comprehensive h. Dimension: 292x235x75 cm
functions of tested IC. It covers nearly all digital ICs with fixed output i. Weight: 2.0kg
and can be widely used in maintaining, testing all kinds of computers,
industrial automate instruments, large medical instruments, numerical 3) Test Range
control machines, peripheral of microcomputers, SPC exchanges, digital
instruments and apparatus, digital communication equipments, YBD868 contains a library of over 2000 devices, including
electronic relay protection equipments and other kinds of electronic following series
products. a) TTL54 series
b) TTL55 series
c) TTL74 series
d) TTL75 series
 e) CMOS14 series
f) CMOS40 series 5) Maintenance
g) CMOS45 series This tester should be kept out of wet, dust, direct sunlight, heating
h) Optocoupler series equipments and violent moving place. No hard press or knot of the
i) LED display series power cord. Don’t connect to the same power socket with
j) Universal RAM series temperature-controlled heating device, charged motor, or any other load
k) Universal SCM series over 2KW. The supply voltage should keep in 220V±10%, and regulated
l) Microprocessor peripheral series power supply is needed when necessary.
:
4) Function Summary Water must be kept out of the tester. Once water gets in, cut off the
power at once and overhaul the tester. Keep small things especially of
a) Devices PASS/FAIL test: When unaware of the device’s metal away from the tester to avoid their dropping-in through the
functionality, you just need to enter the model no. of the device ventilation holes. The tester should not be placed at an ambient higher
and insert the device into corresponding place of socket, and the than 50℃
tester would judge whether the device is functional.
In order to extend the life of ZIF socket, be gentle when
b) Device model no. identification: When unaware of the devices operating it. The pin of the tested IC shouldn’t be hardly bended, and no
model no., you just need to enter the pin number of the device piles of solder or copper cover on the pin.
and insert the device into corresponding place of socket, and the
tester would judge the model no. of the device.
PART 2
c) Device substitution query: Enter the model of the tested device,
OPERATING INTRODUCTION
press’ Substitution Query’ key and you will find if there is any
other device that has the same logic function.
1. Self Test
d) Device dynamic burn-in: When unsure of the dynamic stability of
tested device, you just need to enter the model of the device and The operating components of YBD 868 digital IC tester are showed as
insert the device into corresponding place of socket, press figure 1:
‘Dynamic Burn-in’ and the tester will run dynamic burn-in and
continuous test towards this device.
 tested device.
Display: Large-screen digital display
Status Indicator: 4 LED

Access the power cord into the socket in the rear panel. Put the plug into
power supply socket, turn on the power in the right part of the tester and
the red indicator lights, which shows the power has run in.

After power on, the apparatus has the following response

* A treble sound prompts.
* 4 LED indicators turn on.
* One second later, the light of the display runs out and 3 of the
indicators turn off, only the 5V Power indicator lights.
* The tester runs into the self-test status. 1) The functions of the keys on the panel are showed as figure 2.
* If no problem happens during self-test, 2 treble sound prompt and the a) 0-9 are numeric keys which are used to entering the IC number or
display shows: PLEASE the number of pins.
* If self-test not available, 2 bass sound prompt and the display shows:
1-value or 2-value. b) ‘Substitution Query’ is a function key. After at least 3 digits have
been entered, this function would be available.
NOTE: No IC is inserted to the ZIF socket when turn on the power.
c) “PASS/FAIL Verifying” is a function key. Once is a number
2. Operating Introduction entered, you should enter at least 3 digit of number to make the
key available. If you press this key before entering any model,
Panel Introduction: including the keypad and the ZIF socket for the no., the device will be verified against the number already stored
 internally. This function can be used to test some more devices There for, only after entering new numbers the internal storage
with same model number. When turning on the power or reset will be changed.
the tester, the storage of the internal number will clear, and then
the model number is 000. 3. Basic operation (7400 as an example)

d) ‘Number Identifying’ key is a function key. This key is available NOTE: Only numeric information of model no. of the devices is needed
only if the tester is under the status of PLEASE, PASS, FAIL or when entering the numbers, manufacturer’s prefixes and suffixes should
000000. It would become unavailable once any number is be omitted. For example, only 7400 should be entered for all following
entered. ICs: N74LS00N, N74S00N, 74ALS00N, etc

e) ‘Fault Detect + 12V’ key is a multi-function key. Pressing this 1) Turn on the power: No IC or any other metal short-circuit wire
key before entering any number will bring the tester into the inserted on the ZIF socket when turning on the power. Or the tester will
status of Fault Detect. And if you press this key after entering at consider the self-test fail; PLEASE is displayed when self-test runs
least 3 digits of numbers, the tester would automatically switch okay.
the power supply voltage to the tested device from +5V to +12V.
The state of +12V will just be held for one test. Every time you a
+12V is needed for testing devices, you should press this key.

f) ‘Dynamic Burn-in’ is a function key which only available after

entering at least 3 digits of numbers. Even for the devices with
same model, you should enter the model number every time.
This is different from PASS/FAIL Verifying. 2) PASS/FAIL Verifying:
* Press 7,4,0,0, ‘7400’ will be on the display.
g) ‘Number Clearing’ is a operate key. Press this key and then you * Confirm, and then insert the 74LS00 chips’ nick of tested device align
can re-enter the number of tested device. It's worth noting that, with the left of the ZIF socket and lock (as showed in Figure 3).
pressing this key only means the user is allowed to re-enter the * Press ‘PASS/FAIL Verifying’ key.
model or do some other operation, instead of clear the stored a) If the display shows PASS, and at the same time a treble sound
number internal. For example, after entering 7400, you press this occurs with the green LED indicator turns on, it means the logic
key, and the display will show 000000. But the tester still treat function of the device is in good condition.
current model as 7400 and can test the performance of 7400. b) If the display shows FAIL, and at the same time a bass sound
 occurs with the red LED indicator turns on, it means the function library of the tester, the tester will display OEE with a bass
of the device is unavailable. sound prompt. When running Number Identifying, the entered
* It may take a long time to test large storage capacity RAM. numbers of pins should be in double digits. For example, if the
numbers of pins is eight, you have to enter 08. You can enter the
3) Device Dynamic Burn-in number continuously. For example, you can enter 16 right after
* Press 7,4,0,0, ‘7400’ will be on the display. entering 15. But be attention, the tester doesn’t accept the
* Insert 74LS00 into ZIF socket and lock, then press ‘Dynamic Burn-in’. entering numbers begin with 5 or above.
The tester will start dynamic burn-in and continuous test the 74LS00 c) If the tested device is EPROM or EEPROM, the tester cannot
in the ZIF socket immediately. At this time, the keyboard is perform Number Identifying.
unavailable and the burn-in length would be on user’s decision. If the
user wants to quit the state of Dynamic Burn-in, he only needs to 5) Device Substitution Query
unlock the ZIF socket. With this operation, the tester would show * Enter the model of original device,say,’7400’, then press ‘Substitution
FAIL, and the keyboard become available, Query’.
* When in the state of Dynamic Burn-in, user can heat the tested device a) If there is substituted model in the library, the display would
with external heating source (say, electric iron), to observe the show the model number, say, 7403. The model number will
temperature characteristic of the tested device. change every time you press ‘Substitution Query’ until all the
* You have to enter model number every time when changing the models have been shown up and display shows NODVCE.
devices even with the same number for burn-in. b) If there is no substituted model in the storage, the display shows
NODVCE.
4) Device Number Identifying: c) NOTE: The tester considers the devices with the same logical
* Insert the 74LS00 into ZIF socket and lock, and press ‘Number function and the same input output pin array to be the devices
Identifying’ key, the display shows P, asking the user to enter the that can be substituted. With no other detailed parameters, the
number of pins of the tested device. For example, if the device has 14 substitution should be used with caution.
pins, you can press ‘14’, and the display shows ‘P14’.
* Press ‘Number Identifying’ key. 4. Special Operation
a) If the tested device is functional, and its model is in the library of
the tester, the display will directly show the model number of the 1) When running PASS/FAIL Verifying and Dynamic Burn-in, after the
tested device (say, 7400), and green LED turns on, with a treble first time you press ‘PASS/FAIL Verifying’ or ‘Dynamic Burn-in’ key,
sound prompt. there might be 3 special situations as below:
b) If the tested device has been broken, or the model is not in the a) The display shows ‘1-2’ with a long treble sound prompt, which
means the user should align the first pin of tested device with the
second pin of the ZIF socket and insert the tested device into ZIF
socket and lock. Then the user can press ‘PASS/FAIL Verifying’ or
‘Dynamic Burn-in’ key again. For example: To test the performance
of LM324, press 3-2-4, and the display shows 324, then press
‘PASS/FAIL Identifying’ or ‘Dynamic Burn-in’ key and the display
would show 1-2 with a long treble sound prompt.. align the first pin
of tested device with the second pin of the ZIF socket and insert the
tested device into ZIF socket and lock well, then press ‘PASS/FAIL
Verifying’ or ‘Dynamic Burn-in’ key again. See Figure 4.

b) The display showing VCC-numbers with a long treble sound

prompt means the tested device is a special VCC pin devices. The
position of the VCC pin is the number the display shows. At this
time the user should align the first pin of tested device with the
second pin of the ZIF socket and insert the tested device into ZIF
socket and lock. Then connect the VCC to the pin number of the
device the display shows with a jumping wire as shown in figure 5. c) Display shows OU-number with a long treble sound prompt,
Press ‘PASS/FAIL Verifying’ or ‘Dynamic Burn-in’ key again. means the tested device should be inserted into ‘Special Device
Testing Board’. At this time, user should connect ‘Special Device
Testing Board’ to 40 pins ZIF socket and insert the tested device
into the corresponding socket shown in the display. Then press
 ‘PASS/FAIL Identifying’ or ‘Dynamic Burn-in’ key again. short-circuited wire on the ZIF socket. Otherwise the tester would
judge self-test fail.
For example, to test PASS/FAIL of 8255, when display shows OU-1
with a long treble sound prompts, connect ‘Special Device Testing 3) Ignore the letter or any other symbol when entering the model
Board’ to 40 pins ZIF socket and put the tested device into the number. For example, for model number 74LS123, only 74123 need
second socket in the Special Device Testing Board(as shown in to be entered; for 4N30, only 430 is needed; TLP521-4, entering
Figure 6), then press ‘PASS/FAIL Verifying’ or ‘Dynamic Burn-in’ 5214 is okay. For some kinds of reasons, the models of some devices
key again. which need to be entered would be different from their actual model.
For example, for MC14013 you should enter 4013; for MC14510
For the above 3 special situations, the tester prompts only once for you should enter 4510.For more details you can read the list of the
each. You can press ‘PASS/FAIL Verifying’ key directly when measurable devices.
testing several devices with same model number.
4) Number Clearing: when the user notices that he has entered a wrong
d) When running PASS/FAIL Verifying or Dynamic Burn-in, the model number, press ‘Number Clearing’ key, the display would show
supplied voltage for tested device is 5V. If you want to test in 12V, 000000, the user can re-enter the model or do some other operations.
press ‘Fault Detect + 12V’ key after entering the model number. When the user run the tester into Number Identifying state, only after
Then press ‘PASS/FAIL Verifying’ or ‘Dynamic Burn-in’ key, and entering a two digit numbers of pins and press ’model cancel’ twice
the tester will test or burn-in the device with +12V. But this is continuously, the tester can quit the state of Number Identifying.
available only once. You still have to repeat the procedure of ‘Enter 5) When in the state of Number Identifying, if the model number of the
model number’—‘Press Fault Detect +12V key’—‘ Press tested device has been confirmed, the number is only used for
PASS/FAIL Verifying key’ every time you change the tested device. showing on the display and has not been saved into the storage of the
For devices that can be tested in +12V only, the tester will turn the tester. If the user wants to perform PASS/FAIL Verifying or Dynamic
voltage into +12V automatically. For devices that can be tested in Burn-in, he still needs to enter the model number through keyboard
+5V only, the tester fixes on the voltage of +5V and will not accept again.
+12V even the user choose +12V. 6) If the user wants to test devices with the same model number, he only
needs to enter the model number once and press ‘PASS/FAIL
5. Caution: Verifying’ every time he changes the devices.
7) If the display shows OEE with a bass sound prompt after entering the
1) Please refer to chapter ‘Maintenance’ when operating the tester. model and pressing ‘PASS/FAIL Verifying’ key, it means the device
2) When turn on the power, there should be no IC or any other is not in the library of tester.
8) Generally speaking, if all devices are tested faulty when testing batch 4. When performing the PASS/FAIL Verifying, the result is not stable.
devices, it is most probably because of poor contact of the ZIF a) Poor contact of the tested device. Check and insert it into the ZIF
socket or malfunction of the tester. socket again then lock.
9) When operating with keyboard, a treble sound responded by the tester b) Poor stability of the tested device.
shows validity of your operation. A bass sound shows invalidity and
misoperation. No misoperation would damage the tester. If any other problem besides the above mentioned ones occurs, please
10) When place the tested device, please pay attention to the direction contact our company or the dealer. Free service can be provided by our
the pins align, or misjudge would occur. This situation won’t do company in the warranty period.
harm to tested device generally but there is still possibility of
damage to the device. None of above situations may damage the PART 3
tester. LIST OF MEASURABLE COMPONENTS
11) Please wait for more than 5 seconds before restarting after the tester
is turned off. Or the tester may be unable to reset.
12) The nick of the IC should align the left side of the ZIF socket. 1. CMOS40 Series

4000 4001 4002 4006 4007 4008 4009

6. Fault Detect
4009 4010 4011 4012 4013 4014 4016

4017 4018 4019 4020 4021 4022 4023

Turn on the power
4024 4025 4026 4027 4028 4029 4030
1) There is no any response of the tester and the indicator doesn’t turn
4032 4033 4034 4035 4038 4040 4041
on. This means there is something wrong with the power input. Say,
4042 4043 4044 4047 4048 4049 4050
broken power cord, power failure, broken power switch or any other
4051 4052 4053 4054 4055 4056 4060
reasons.
4061 4063 4066 4067 4068 4069 4070
2) The display shows irregularly with no any sound prompt. It means the
4071 4072 4073 4075 4076 4077 4078
main system is not working. The failure might be: It’s less than 5
4081 4082 4085 4086 4089 4093 4094
seconds after the tester has been turned off and has not reset yet.
4095 4096 4097 4098 4099 40101 40102
3) There is sound prompt but fail when self-test. The failure might be:
40103 40106 40107 40109 40110 40147 40160
a) IC or any other short-circuited wire is on the ZIF socket.
40161 40162 40163 40174 40175 40192 40193
b) Press ‘Fault Detect’ key and the display shows AUCHP--, press
40194 40195
‘6’ and the display and LED all turn on. Or else it means there is
some problem with the display system.
2. CMOS MC140 Series 118 723 5121 270 271 272 273

For MC140 Series, enter the numbers corresponding to that of 40 274 275 276 277 017 075 703

series. For example, MC14013 is regarded as 4013, MC140195 as 631 535 068 815 835 845 618

40195, etc. 551 505 515 570 715 716 890

850 855 860 865 230 231 255

3．CMOS45 Series 119 571 4N25 4N26 4N27 4N28 4N35

4N36 4N37 4N29 4N30 4N31 4N32 4N33

4501 4502 4503 4504 4506 4508 4510 4N38

4511 4512 4513 4514 4515 4516 4518

4519 4520 4522 4526 4527 4528 4529 6．TTL74\54 Series

4530 4531 4532 4537 4538 4539 4541

4543 4544 4547 4551 4555 4556 4558 74/5400 74/5401 74/5402 74/5403 74/5404 74/5405 74/5406

4559 4560 4561 4572 4581 4582 4584 74/5407 74/5408 74/5409 74/5410 74/5411 74/5412 74/5413

4585 4599 74/5414 74/5415 74/5416 74/5417 74/5418 74/5419 74/5420

74/5421 74/5422 74/5423 74/5424 74/5425 74/5426 74/5427

4．CMOS MC Series 74/5428 74/5430 74/5431 74/5432 74/5433 74/5434 74/5435

74/5437 74/5438 74/5439 74/5440 74/5441 74/5442 74/5443

For MC145 series, please refer to MC140 series, that is MC14510 is 74/5444 74/5445 74/5446 74/5447 74/5448 74/5449 74/5450

regarded as 4510. 74/5451 74/5453 74/5454 74/5455 74/5460 74/5463 74/5464

74/5465 74/5468 74/5469 74/5470 74/5472 74/5473 74/5474

5．Optocoupler Series 74/5475 74/5476 74/5477 74/5478 74/5480 74/5436 74/5458

74/5482 74/5483 74/5485 74/5486 74/5489 74/5490 74/5491

507 5072 5073 617 627 637 521-1 74/5492 74/5493 74/5494 74/5495 74/5496 74/54100 74/54104

521-2 521-3 521-4 621 622 624 36 74/54105 74/54107 74/54109 74/54110 74/54111 74/54112 74/54113

817 827 837 847 810 812 818 74/54114 74/54116 74/54121 74/54122 74/54123 74/54125 74/54126

504 880 885 066 074 829 504 74/54128 74/54131 74/54132 74/54133 74/54134 74/54135 74/54136

614 714 509 519 532 632 503 74/54137 74/54138 74/54139 74/54140 74/54141 74/54142 74/54145

613 713 508 531 027 034 836 74/54147 74/54148 74/54150 74/54151 74/54152 74/54153 74/54154

212 825 830 831 836 026 210 74/54155 74/54156 74/54157 74/54158 74/54159 74/54160 74/54161

111 112 113 114 115 116 117 74/54162 74/54163 74/54164 74/54165 74/54166 74/54167 74/54168
74/54169 74/54170 74/54173 74/54174 74/54175 74/54176 74/54177 7．TT75/55 Series
74/54178 74/54179 74/54180 74/54181 74/54182 74/54183 74/54184

74/54185 74/54189 74/54190 74/54191 74/54192 74/54193 74/54194 75/55113 75/55121 75/55122 75/55123 75/55124 75/55125 75/55127

74/54195 74/54196 74/54197 74/54198 74/584199 74/54230 74/54231 128 129 136 138 151 153 158

74/54237 74/54238 74/54240 74/54241 74/54242 74/54243 74/54244 159 160 172 173 174 175 176

74/54245 74/54246 74/54247 74/54248 74/54249 74/54251 74/54253 177 178 183 189 270 401 402

74/54255 74/54256 74/54257 74/54258 74/54259 74/54260 74/54261 403 404 411 412 413 414 416

74/54265 74/54266 74/54273 74/54274 74/54276 74/54278 74/54279 417 418 419 430 431 432 433

74/54280 74/54283 74/54284 74/54285 74/54289 74/54290 74/54293 434 437 446 447 448 449 450

74/54295 74/54298 74/54299 74/54319 74/54322 74/54323 74/54347 451 452 453 454 470 471 472

74/54348 74/54350 74/54351 74/54352 74/54353 74/54354 74/54356 473 474 497 498

74/54363 74/54364 74/54365 74/54366 74/54367 74/54368 74/54373

74/54374 74/54375 74/54376 74/54377 74/54378 74/54379 74/54381 8．LED Display Series
74/54382 74/54386 74/54388 74/54390 74/54393 74/54395 74/54396

74/54398 74/54399 74/54425 74/54426 74/54440 74/54441 74/54442 0.5 Common Anode (001) Common cathode (002)
74/54443 74/54444 74/54447 74/54465 74/54466 745/4467 74/54468 0.3 Common Anode (003) Common cathode (004)
74/54490 74/54518 74/54519 74/54520 74/54521 745/4522 74/54533 0.7 Common Anode (005) Common cathode (006)
74/54534 74/54537 74/54538 74/54539 74/54540 74/54541 74/54543

74/54544 74/54545 74/54563 74/54564 74/54568 74/54569 74/54573 9．Universal RAM Series
74/54574 74/54575 74/54576 74/54577 74/54580 74/54588 74/54589

74/54590 74/54594 74/54597 74/54604 74/54605 74/54620 74/54621 2114 2016 6116 6264 62256
74/54622 74/54623 74/54639 74/54640 74/54641 74/54642 74/54644

74/54645 74/54646 74/54647 74/54648 74/54651 74/54652 74/54653 10．Microprocessor Peripheral Series
74/54654 74/54655 74/54656 74/54657 74/54658 74/54659 74/54664

74/54665 74/54668 74/54669 74/54670 74/54674 74/54675 74/54676 8155 8156 8255 8253 8259 8212 8282

74/54677 74/54678 74/54679 74/54680 74/54700 74/54730 74/54731 8283 8216 8816 8243 8226 8205 8286

74/54734 74/54795 74/54796 074/54797 74/54798 74/54804 74/54805 8287 6820 6821 6880 6888 6887 6889

74/54821 74/54822 74/54823 74/54824 74/54825 74/54826 74/54841 6810 6520 8254 8279 6840 Z80CTC(802)

74/54842 74/54843 74/54844 74/54845 74/54846 74/54990 74/54991

74/54992 745/4993 74/54994 74/54995 74/54996

11．Universal SCM Series

8031 8032 8051 8052 8048 8039 8035

8049 8751

12．Others

2002 2003 2004 3486 3487 2631 2632

2633 1831 1908 339 393 555 556

324 22100 2802 2803 2804 2902(324) 8T26(826)

MC1413(2003) MC1416(2004) MC14160(40106)

MC14161(40161) MC14162(40162) MC14163(40163)

MC14189(75189)