Coffee Lake H/S Platform System Memory Interface: Technical White Paper
Coffee Lake H/S Platform System Memory Interface: Technical White Paper
Memory Interface
Technical White Paper
January 2019
Revision 0.9
Intel Confidential
Contents
1 Introduction ..............................................................................................................6
1.1 Introduction ....................................................................................................... 6
1.2 Reference Documents .......................................................................................... 6
1.3 Terminology and Descriptions ............................................................................... 7
2 CFL-H Memory Interface White Paper ........................................................................ 9
2.1 CFL-H DDR4 SoDIMM 2DPC Daisy Chain NIL Guidelines ............................................ 9
2.2 CFL-H DDR4 SoDIMM 1DPC NIL Guidelines ........................................................... 15
2.3 CFL-H Mixed SoDIMM and Memory Down 2Rx8...................................................... 20
2.4 CFL-H DDR4 1R x16, T4 10L, Dual sided Memory Down Guidelines........................... 28
3 CFL-S Memory Interface White Paper ...................................................................... 34
3.1 CFL-S DDR4 SoDIMM 1DPC NIL Guidelines............................................................ 34
3.2 CFL-S DDR4 Mixed SODIMM and Memory Down x16 .............................................. 39
4 CFL-S/H VREF/DM/ODT Guidelines ......................................................................... 48
4.1 CFL-S and CFL-H System Memory ODT Signal Connectivity Details........................... 48
4.2 Memory Data Mask (DM) Signals Connectivity Details............................................. 48
4.3 CFL H and CFL S System Memory Reference Voltage (VREF) Guidelines .................... 49
5 Memory Interface Schematic Checklist .................................................................... 51
Figures
2-1 CFL-H DDR4 SoDIMM 2DPC Block Diagram .................................................................. 10
2-2 CFL-H DDR4 SoDIMM 2DPC Daisy Chain Placement ...................................................... 10
2-3 CFL-H DDR4 SoDIMM 2DPC Daisy Chain CTRL/Reset/Rcomp Signals Topology .................. 11
2-4 CFL-H DDR4 SoDIMM 2DPC Daisy Chain CMD/Alert/Strobe/Data Signals Topology ............ 11
2-5 CFL-H DDR4 SoDIMM 1DPC Block Diagram .................................................................. 16
2-6 CFL-H DDR4 SoDIMM 1DPC Block Placement ............................................................... 16
2-7 CFL-H DDR4 2Rx8 Memory Down Placement and Block Diagram..................................... 21
2-8 CFL-H DDR4 SODIMM Signals Topology....................................................................... 22
2-9 CFL-H DDR4 2Rx8 DDP Memory Down CLK/CKE/CMD/CTRL/Reset Signals Topologies........ 23
2-10CFL-H DDR4 2Rx8 DDP Memory Down DQ/DQS/RCOMP Signals ..................................... 23
2-11CFL-H DDR4 x16 T4 10L Dual sided Memory Down Placement and Block Diagram............. 29
2-12CFL-H DDR4 x16 T4 10L Dual sided Memory Down Strobe/Data/RCOMP Signal Topologies . 29
2-13CFL-H DDR4 x16 T4 10L Dual sided Memory Down CLK/CTRL/CKE/CMD/Reset Signal Topology
30
3-1 CFL-S DDR4 1DPC SoDIMM T3/4L Inline NIL Placement and Block Diagram...................... 35
3-2 CFL-S DDR4 SoDIMM 1DPC Signals Topology ............................................................... 35
3-3 CFL-S DDR4 SoDIMM 1DPC DDR Reset Topology .......................................................... 35
3-4 CFL-S DDR4 Mixed SODIMM and Memory Down x16 Placement and Block Diagram ........... 40
3-5 CFL-S DDR4 SODIMM Signals Topology ....................................................................... 40
3-6 CFL-S DDR4 1Rx16 Memory Down Strobe/Data/RCOMP Signal Topologies ....................... 40
3-7 CFL-S DDR4 1Rx16 Memory Down CLK/CTRL/CKE/CMD/Reset Signal Topology................. 41
4-1 CFL H/S DDR4 SO-DIMM VREF-CA Overview ................................................................ 49
4-2 CFL-H/S DDR4 x16 Memory Down VREF-CA Overview ................................................... 50
4-3 CFL-H DDR4 x8 Memory Down VREF-CA Overview........................................................ 50
Revision History
Document Revision
Description Revision Date
Number Number
§§
1 Introduction
1.1 Introduction
This Technical White Paper covers the Coffee Lake S and H the system memory
interface motherboard design recommendations for the following Non Plan of Record
(Non-POR), but support system memory interface configurations.
These recommendations have been developed to enable flexibility for board designers,
while reducing the risk of motherboard system memory interface related issues.
These recommendations are not fully simulated and they are not validated. As
a result, it is up to those that implement them to fully validate their own
design. The validation and risk are the sole responsibility of the customer.
Table 1-1. Non-POR System Memory Configurations Supported in this White Paper
DRAMs/
Memory Memory Channel PCB CPU Ball
Section CPU Connector
Type Speed Configuration Type/Layers Map
Placement
ECC/Non ECC
SoDIMM 2DPC ECC - T3/10L
Daisy Chain- Non
2.1 CFL-H DDR4 2133 Single Side Non ECC - 8L/
Topology Interleaved
T3
Both Channels
Mixed SODIMM
Interleaved/
and MD 2Rx8
2.3 CFL-H DDR4 2400 Single Side T3/10L Non
(8 DRAMS per Interleaved
channel)
Dual sided
2.4 CFL-H DDR4 2400 memory down Dual sided T4/10L Interleaved
1Rx16
Mixed SODIMM
Single Side/
2133/ and MD x16
3.2 CFL-S DDR4 Back-To- T3/8L Interleaved
2400 (4 DRAMS per Back
channel)
CFL S + CNL PCH PDG Coffee Lake S CNP Platform Design Guide 571264
DQSP[8],
ECC strobe N/A N/A N/A N/A
DQSN[8]
on package on package
RCOMP DDR_RCOMP[2:0] DDR_RCOMP[2:0] DDR_RCOMP[2:0]
Motherboard Layer Signal Transition Via Placement Locations. For SO-DIMM designs, this identifies
Via Count the PTH Via Placement Locations. For DRAM Down designs, this does not identify the total count of
micro-vias or buried vias on a signal.
Trace Width The trace widths are for reference. The controlling specification is the target trace impedance.
Diff Spacing Differential spacing between CK and CK# and between DQS and DQS#.
Group Spacing Minimum self spacing and spacing between signals within the same signal group.
Minimum spacing between signals from the following different signal groups:
1. CLK-CTRL, CLK-CKE, CLK-CMD, CLK-Reset CTRL-CKE, CTRL-CMD, CTRL-Reset, CKE-CMD,
Group to Group CKE-Reset.
Spacing 2. CLK-Strobe, CLK-Data, CTRL-Strobe, CTRL-Data, CKE-Strobe, CKE-Data, CMD-Strobe, CMD-
Data, Reset-Strobe, Reset-Data.
3. Minimum spacing between bytes with different channels.
1. Minimum spacing between strobe and data group signals within the same byte.
Byte Spacing
2. Minimum spacing between bytes within the same channel.
Table 1-3. CFL-H System Memory Interface Guideline Terminology and Descriptions
(Sheet 2 of 2)
CFL-H CFL-S
DDR to Other
The minimum spacing requirement for DDR to other signal/interfaces is 25 mils.
Interfaces/Signals
Impedance numbers are calculated according to the stack-up layers thickness, the material
DDR Trace conductivity, traces spacing, width, dielectric constant and thickness.
impedance The controlling specification is the target trace impedance. It is allowed to change
and trace the signal trace width within design tolerance.
geometries It is strictly not recommended to reduce spacing between signals. Any spacing reduction can cause
to performance degradation.
Total length refers to the signal trace length calculated from Processor die pad to each DRAM ball or
Total maximum
each DIMM connector pin, which include Processor inner PKG trace length, Break-out, Main and
length
Break-in trace segments of each DRAM.
§§
Processor CFL-H
Channels 1 and 2
ECC DIMMs:
RC-D(1Rx8),RC-G(2Rx8),RC-F(2Rx8),RC-H(2Rx8)
SO-DIMM Raw-Card Types
Non-ECC DIMMs:
RC-A(1Rx8), RC-B (2Rx8),RC-E (2Rx8),RC-C(1Rx16)
ECC - 10L/T3
PCB Layers/Type(1)
Non ECC - 8L/T3
Strobe/Data/CTRL/CLK/CKE/CMD = PKG+BO1+BO2+M+BI
Total Maximum Length
RCOMP = M
Notes:
1. Type 3 (T3)= PCB with zero build-up layers using Plated Through-hole (PTH) Vias with no Micro-vias.
Refer “Stack-Up and PCB Considerations” chapter for more details in this document.
2. Non-Interleave = The processor is optimized for a side-by-side ball map and placement of the DRAM
memory down devices or DIMM Side-by-Side (inline) placement. Each memory channel’s signals are
grouped together on one side of the processor packages.
Interleave = The processor is optimized for a back-to-back ball map and placement of the DIMMs. Each
memory channel’s signals are grouped together on front or back side of the processor packages.
3. The DRAM Device ODT Capability can be enabled or disabled for reads and writes depending on the system
memory interface margins. Enabling the DRAM device ODT increases the memory interface power and
improves signal integrity/margins, while disabling the DRAM device ODT decreases the memory interface
power but degrades signal integrity/margins. For ODT implementation recommendation for this topology,
refer to Table 4-1.
CFL H
DDR1_CMD DDR0_CMD
DDR0_CKP[1:0] DDR0_CKP[3:2] DDR1_CKP[3:2] DDR1_CKP[1:0] DDR_RESET
DDR1_DQ DDR0_DQ
DDR0_CKN[1:0] DDR0_CKN[3:2] DDR1_CKN[3:2] DDR1_CKN[1:0]
DDR1_ECC DDR0_ECC
DDR0_CKE[1:0] DDR0_CKE[3:2] DDR1_CKE[3:2] DDR1_CKE[1:0]
DDR1_DQS DDR0_DQS
DDR0_CS[1:0] DDR0_CS[3:2] DDR1_CS[3:2] DDR1_CS[1:0]
DDR0_ODT[1:0] DDR0_ODT[3:2] DDR1_ODT[3:2] DDR1_ODT[1:0]
Channel 0, SO‐DIMM 1, Rank 2:3
BOTTOM
Channel 0, SO‐DIMM 0, Rank 0:1
TOP
Channel 1, SO‐DIMM 1, Rank 2:3
BOTTOM
Channel 1, SO‐DIMM 0, Rank 0:1
TOPTOP
CFL Non‐Interleave
Ch A Ch B
Ch A SoDIMM0 Ch B SoDIMM0
Ch A SoDIMM1 Ch B SoDIMM1
Figure 2-3. CFL-H DDR4 SoDIMM 2DPC Daisy Chain CTRL/Reset/Rcomp Signals Topology
R
RCOMP M
VDDQ
R1
R2
Reset BO1 BO2 M BI
C1
Figure 2-4. CFL-H DDR4 SoDIMM 2DPC Daisy Chain CMD/Alert/Strobe/Data Signals
Topology
DIMM0 DIMM1
CFL‐H
BI BI
CMD,
DIMM0 DIMM1
Strobe,
Data,
ECC
Alert
BI BI
BO2 BO2
BO1 M S2S
a b
Table 2-2. CFL-H DDR4 SoDIMM 2DPC Daisy Chain Signal Routing Guidelines
(Sheet 1 of 2)
Target
Minimum Trace Spacing Maximum Length
Impedance
(mils) (mils)
(Ω)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Group to Group
Notes
Breakout [1,2]
C(uF)
Signal
Byte [1]/[2]
Single Ended
Group
Tolerance
[1]/[2]
Region
Group
Total
(%)
Diff
Diff
BO1 MS VSS/VCC 1 3 3.5 8 8/ 400
[1] 600
CLK BO2 SL VSS 0 3 3 8 8/ 450 1,2,
5000 3,6
Channel 0 M SL VSS 0 3.5 88 ±10 3.5 12 12/
Table 2-2. CFL-H DDR4 SoDIMM 2DPC Daisy Chain Signal Routing Guidelines
(Sheet 2 of 2)
Target
Minimum Trace Spacing Maximum Length
Impedance
(mils) (mils)
(Ω)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Group to Group
Notes
C(uF)
Breakout [1,2]
Signal
Byte [1]/[2]
Single Ended
Group
Tolerance
[1]/[2]
Region
Group
Total
(%)
Diff
Diff
BO1 MS VSS 1 3 3.5 /10 4/25 200
[1] 450
Strobe BO2 SL VSS 0 3 3 /10 5/25 350
1,2,
M SL VSS 0 5.5 75 ±10 3.5 /25 12/25 5000 3,4,
Ch1 5,6
[0] BI MS VSS 1 4 4 /25 5/25 85
Notes:
1. The Channel A CLK/CTRL/CKE/CMD/Alert signals all must route on the same inner layer together. The Channel B CLK/CTRL/CKE/
CMD/Alert signals all must route on the same inner layer together. The Channel A and Channel B Strobe/Data signals of the same
byte must route on the same inner layer together.
2. The Maximum Breakout Length = BO1+BO2 [1] or BO1+(BO2a + BO2b) [2], where specified
3. Signals, while routed on inner PCB layers must be ground referenced with solid ground floods on both sides.
4. The Strobe and Data Group Signals within the same byte must route together for their entire route from CPU Ball to DIMM Pin.
5. DQ Bit Swapping is allowed within the same byte, and Byte Swapping is allowed within the same channel. Utilizing this capability
enables a modified SO-DIMM pin map and places common SO-DIMM pins in overlapping positions on the top and bottom layers
of the motherboard. It also reduces the Data and Strobe signal T-Topology Break-In (BI) segment lengths, it helps eliminate
serpentine routing, and creates more room for ground vias next to every Data and Strobe signal transition via in the SO-DIMM
pin field area.
6. Clock (CLK and CLK#) and Strobe (DQS and DQS#) differential signal swapping within a pair is not allowed. Also, differential
clock pair to clock pair swapping within a channel is not allowed.
7. Capacitor C1 is a defensive design and should have NO STUFF by default.
8. Impedance numbers are for reference only, it is calculating according to the stackup layers thickness, the material conductivity,
traces spacing and width. The recommendation is to follow stackup and traces geometries.
1,2
DQS[X] - DQS#[X], where X = 0 to 7 -5 5
Strobe
1,2
CK/CK#[1:0] - DQS/DQS#[X], where X = 0 to 7 -1500 2500
Notes:
1. Length Matching = CPU Die to SO-DIMM Pin (PKG + BO1 + BO2 + M + BI, PKG + BO1 +BO2a + BO2b + M
+ BI); where a conversion factor of 0.9 must be used on Micro-Strip Segments to convert Micro-Strip lengths
to Strip-Line equivalent lengths.
2. To help facilitate and check the Length and Matching relationships on a design, refer to the Memory Automated
Trace Length Calculator (# 568458). Refer Table 1-2.
3. Byte[0] = DQ[7:0], DQS/DQS#[0], Byte[1] = DQ[15:8], DQS/DQS#[1], Byte[2] = DQ[23:16], DQS/
DQS#[2], Byte[3] = DQ[31:24], DQS/DQS#[3], Byte[4] = DQ[39:32], DQS/DQS#[4], Byte[5] = DQ[47:40],
DQS/DQS#[5], Byte[6] = DQ[55:48], DQS/DQS#[6], Byte[7] = DQ[63:56], DQS/DQS#[7].
Processor CFL-H
Channels 1 and 2
ECC DIMMs:
RC-D(1Rx8),RC-G(2Rx8)
SO-DIMM Raw-Card Types
Non-ECC DIMMs:
RC-A(1Rx8), RC-E (2Rx8),RC-C(1Rx16)
ECC - 10L/T3
PCB Layers/Type(1)
Non ECC - 8L/T3
Strobe/Data/CTRL/CLK/CKE/CMD = PKG+BO1+BO2+M+BI
Total Maximum Length
RCOMP = M
Notes:
1. Type 3 (T3)= PCB with zero build-up layers using Plated Through-hole (PTH) Vias with no Micro-vias.
Refer “Stack-Up and PCB Considerations” chapter for more details in this document.
2. Non-Interleave = The processor is optimized for a side-by-side ball map and placement of the DRAM
memory down devices or DIMM Side-by-Side (inline) placement. Each memory channel’s signals are
grouped together on one side of the processor packages.
Interleave = The processor is optimized for a back-to-back ball map and placement of the DIMMs. Each
memory channel’s signals are grouped together on front or back side of the processor packages.
3. The DRAM Device ODT Capability can be enabled or disabled for reads and writes depending on the system
memory interface margins. Enabling the DRAM device ODT increases the memory interface power and
improves signal integrity/margins, while disabling the DRAM device ODT decreases the memory interface
power but degrades signal integrity/margins. For ODT implementation recommendation for this topology,
refer to Table 4-1.
CFL‐H
DDR0_CKP[1:0] DDR1_CKP[1:0]
DDR0_CKN[1:0] DDR1_CKN[1:0]
DDR0_CKE[1:0] DDR1_CKE[1:0] DDR_RESET
DDR0_CS[1:0] DDR1_CS[1:0]
DDR0_ODT[1:0] DDR1_ODT[1:0]
DDR0_CMD DDR1_CMD
DDR0_DQ DDR1_DQ
DDR0_DQS DDR1_DQS
DDR0_ALERT DDR1_ALERT
Channel 0, SO‐DIMM, Rank 0:1
Channel 1, SO‐DIMM, Rank 0:1
For CFL H DDR4 SoDIMM 1DPC Signal Topology, refer to Figure 4-7, “CFL-H DDR4
SoDIMM 2DPC Signals Topology” in CFL-H PDG.
Table 2-5. CFL-H DDR4 SoDIMM 1DPC Signal Routing Guidelines (Sheet 1 of 2)
Target
Minimum Trace Spacing Maximum Length
Impedance
(mils) (mils)
(Ω)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Group to Group
Notes
Breakout [1,2]
C(uF)
Signal
Byte [1]/[2]
Single Ended
Group
Tolerance
[1]/[2]
Region
Group
Total
(%)
Diff
Diff
BO1 MS VSS/VCC 1 3 3.5 8 8/10 400
[1] 500
CLK BO2 SL VSS 0 3 3 8 8/10 200 1,2,
4600 3,6
Channel 0 M SL VSS 0 3.5 88 ±10 3.5 16 16/25
Table 2-5. CFL-H DDR4 SoDIMM 1DPC Signal Routing Guidelines (Sheet 2 of 2)
Target
Minimum Trace Spacing Maximum Length
Impedance
(mils) (mils)
(Ω)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Group to Group
Notes
Breakout [1,2]
C(uF)
Signal
Byte [1]/[2]
Single Ended
Group
Tolerance
[1]/[2]
Region
Group
Total
(%)
Diff
Diff
BO1 MS VSS 1 3 3.5 /10 4/25 300
[1] 450
Data BO2 SL VSS 0 3 4.5 /10 5/25 350 1,2,
Ch1 Byte 4600 3,4,
5,8
[0] M SL VSS 0 3.5 50 ±10 8 /25 16/25
RCOMP
M MS VSS 2 12-15 20 25/25 500 121
[0]
RCOMP
M MS VSS 2 12-15 20 25/25 500 75
[1]
RCOMP
M MS VSS 2 12-15 20 25/25 500 100
[2]
Notes:
1. The Channel A CLK/CTRL/CKE/CMD/Strobe/Data signals all must route on the same inner layer together and they must not route
on the same inner layer or an adjacent layer, as any of the Channel B CLK/CTRL/CKE/CMD/Strobe/Data signals. The Channel B
CLK/CTRL/CKE/CMD/Strobe/Data signals all must route on the same inner layer together and they must not route on the same
inner layer or an adjacent layer as any of the Channel A CLK/CTRL/CKE/CMD/Strobe/Data signals.
2. The Maximum Breakout Length = BO1+BO2 [1] or BO1+(BO2a + BO2b) [2], where specified.
3. Signals, while routed on inner PCB layers must be ground referenced with solid ground floods on both sides.
4. The Strobe and Data Group Signals within the same byte must route together for their entire route from CPU Ball to DIMM Pin.
5. DQ Bit Swapping is allowed within the same byte, and Byte Swapping is allowed within the same channel. Utilizing this capability
enables a modified SO-DIMM pin map and places common SO-DIMM pins in overlapping positions on the top and bottom layers
of the motherboard. It also reduces the Data and Strobe signal T-Topology Break-In (BI) segment lengths, it helps eliminate
serpentine routing, and creates more room for ground vias next to every Data and Strobe signal transition via in the SO-DIMM
pin field area.
6. Clock (CLK and CLK#) and Strobe (DQS and DQS#) differential signal swapping within a pair is not allowed. Also differential
clock pair to clock pair swapping within a channel is not allowed.
7. Capacitor C1 is a defensive design and should be NO STUFF by default.
8. DQ and DQS signals must route at the same layer and have same width.
Table 2-6. CFL-H DDR4 SO-DIMM 1DPC Length and Matching Guidelines
Length Matching (mils)
Signal
Rule Details Notes
Group
Minimum Maximum
1,2
CMD (max - min) 0 200
CMD
1,2
CK/CK#[1:0] - CMD -500 500
Notes:
1. Length Matching = CPU Die to SO-DIMM Pin (PKG + BO1 + BO2 + M + BI, PKG + BO1 +BO2a + BO2b + M
+ BI); where a conversion factor of 0.9 must be used on Micro-Strip Segments to convert Micro-Strip lengths
to Strip-Line equivalent lengths.
2. To help facilitate and check the Length and Matching relationships on a design, refer the Automated Trace
Length Calculator Tools #568458.
3. Byte[0] = DQ[7:0], DQS/DQS#[0], Byte[1] = DQ[15:8], DQS/DQS#[1], Byte[2] = DQ[23:16], DQS/
DQS#[2], Byte[3] = DQ[31:24], DQS/DQS#[3], Byte[4] = DQ[39:32], DQS/DQS#[4], Byte[5] = DQ[47:40],
DQS/DQS#[5], Byte[6] = DQ[55:48], DQS/DQS#[6], Byte[7] = DQ[63:56], DQS/DQS#[7].
Processor CFL-H
Channels 1 and 2
SODIMM and DRAMs module placement Single side Top layer placement
SoDIMM Channel:
Strobe/Data/CTRL/CLK/CKE/CMD = PKG+A+B+C+D
RCOMP = M
Memory Down Channel:
Total Maximum Length Strobe/Data = PKG+BO1+BO2+M+BI1
Reset = PKG+BO1+BO2+M+BI1+BI2
CLK = PKG+BO1+BO2+M1+M2+BI1+BI2
CTRL/CKE/CMD= PKG+BO1+BO2+M+BI1+BI2
RCOMP = M
Notes:
1. SDP: Single Die Package, DDP: Dual Die Package.
2. No mixed vendor support within a channel or channel to channel and No mixed memory DRAM down type
support (SDP, DDP) within a channel or channel to channel.
3. Type 3 (T3)= PCB with zero build-up layers using Plated Through-hole (PTH) Vias with no Micro-vias.
Refer “Stack-Up and PCB Considerations” chapter for more details in this document.
4. Non-Interleave = The processor is optimized for a side-by-side ball map and placement of the DRAM
memory down devices or DIMM Side-by-Side (inline) placement. Each memory channel’s signals are
grouped together on one side of the processor packages.
Interleave = The processor is optimized for a back-to-back ball map and placement of the DIMMs. Each
memory channel’s signals are grouped together on front or back side of the processor packages.
5. The DRAM Device ODT Capability can be enabled or disabled to read and write depending on the system
memory interface margins. Enabling the DRAM device ODT increases the memory interface power and
improves signal integrity/margins, while disabling the DRAM device ODT decreases the memory interface
power but degrades signal integrity/margins. For ODT implementation recommendation for this topology,
refer to Table 4-1.
Figure 2-7. CFL-H DDR4 2Rx8 Memory Down Placement and Block Diagram
Figure 2-9. CFL-H DDR4 2Rx8 DDP Memory Down CLK/CKE/CMD/CTRL/Reset Signals
Topologies
Notes:
1. The alert signal must be routed in the opposite direction to the address/command bus. Example: The alert
signal must first connect to the last device that the address/command bus is connected to.
2. DRAM_RST CAP should have no stuffed.
Figure 2-10. CFL-H DDR4 2Rx8 DDP Memory Down DQ/DQS/RCOMP Signals
CFL‐H
DRAM
Strobe, BO1 BO2 M BI1
Data
R
RCOMP M
For CFL H DDR4 Mixed SoDIMM and Memory Down 2Rx8 -SoDIMM Routing Guidelines,
refer to Table 2-5.
For CFL H DDR4 Mixed SoDIMM and Memory Down 2Rx8 -SoDIMM Length and Matching
Guidelines, refer to Table 2-6.
Table 2-8. CFL-H DDR4 Mixed SoDIMM and Memory Down 2Rx8 - Memory Down Routing
Guideline (Sheet 1 of 3)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
C(uF)
Signal
Byte [1 and
Tolerance
Breakout
Group to
Group[1
Region
and 2]
Group
Single
Ended
Group
Total
(%)
Diff
Diff
2]
BO1 MS VSS 1 3 3.5 3.5 3.5 450
800
BO2 SL VSS 0 3.5 4 16 16 700
4.5/
M2 SL VSS 0 5/5.5 16 16 1000
4 (R1) 36
[1st] (C1)
0.0033
6000 1,2,3,
CLK BI1 SL VSS 8 3 3.5 16 16 150 (C1-No
[Last] stuff) 7,8
10300
(C2) 0.01
BI2 SL VSS 0 4.5 85 ±10 4.5 16 16 700
T3 MS VSS 1 3 3.5 16 16 50
T3 MS VSS 1 3 3.5 16 50
4.5
M SL VSS 0 5.5/7 40 ±10 / 16
5.5 [1st]
6000
CMD 36 1,2,3
BI1 MS VSS 8 3 3.5 16 150 [Last]
10300
T3 MS VSS 1 3 3.5 16 50
Table 2-8. CFL-H DDR4 Mixed SoDIMM and Memory Down 2Rx8 - Memory Down Routing
Guideline (Sheet 2 of 3)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
C(uF)
Signal
Byte [1 and
Tolerance
Breakout
Group to
Group[1
Region
and 2]
Group
Single
Ended
Group
Total
(%)
Diff
Diff
2]
BO1 MS VSS 1 3 3.5 3.5 450
800
BO2 SL VSS 0 3.5 4 16 700
4.5
M SL VSS 0 5.5/7 40 ±10 / 16
5.5 [1st] (R1
connecte
6000
Alert d to 1,2,3
BI1 MS VSS 8 3 3.5 16 150 [Last] VDDQ)
10300 50
T3 MS VSS 1 3 3.5 16 50
1,2,4,5
Data 4.5 4500 ,6,9
M SL VSS 0 4/4.5 50 ±10 / 16 25
5.5
RCOMP MS/
M VSS 4 12-15 13 13 500 500 121
[0] SL
RCOMP MS/
M VSS 4 12-15 13 13 500 500 121
[1] SL
RCOMP MS/
M VSS 4 12-15 13 13 500 500 100
[2] SL
Table 2-8. CFL-H DDR4 Mixed SoDIMM and Memory Down 2Rx8 - Memory Down Routing
Guideline (Sheet 3 of 3)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
C(uF)
Signal
Byte [1 and
Tolerance
Breakout
Group to
Group[1
Region
and 2]
Group
Single
Ended
Group
Total
(%)
Diff
Diff
2]
Notes:
1. Avoid any parallel routing between two adjacent layers.
2. Signals, while routed on inner PCB layers must be ground referenced with solid ground floods on both sides.
3. Use individual termination resistors (R1) for each signal. Do not use Rpacks.
4. For Option #1 (Single Rank) configuration there are only 8 DRAM Devices connected to each CMD Group Signal and only 1
DRAM Device connected to each Strobe/Data Group Signal. For these designs DRAM Devices [15:8] and their corresponding
BI1 routing segments need to be removed for each CMD Group Signal and the second DRAM Device and corresponding BI
routing segment needs to be removed for each Strobe/Data Group Signal.
5. The Strobe and Data Group Signals within the same byte must always route together on the same layers for their entire
route.
6. DQ Bit Swapping is allowed within the same byte, and Byte Swapping is allowed within the same channel.
7. Clock (CLK and CLK#) and Strobe (DQS and DQS#) differential signal swapping within a pair is not allowed.
8. Capacitor C1 is a defensive design and should be NO STUFF by default.
9. DQ and DQS signals must route at the same layer and have same width.
Table 2-9. CFL-H DDR4 2Rx8 DDP Memory Down Length Matching Guidelines
(Sheet 1 of 2)
Length Matching (mils)
Signal
Rule Details Notes
Group
Minimum Maximum
BI (max-min) 0 0 2,6
Data
DQ (Byte[X]) - DQS/DQS#[X], where X = 0 to 7 -20 20 1,2,3
Table 2-9. CFL-H DDR4 2Rx8 DDP Memory Down Length Matching Guidelines
(Sheet 2 of 2)
Notes:
1. Length Matching = CPU Die to DRAM Ball of every DRAM Device (CLK =
PKG+BO1+BO2+M1+M2+BI1+BI2, CTRL/CKE/CMD = PKG+BO1+BO2+M+BI1+BI2, Strobe/Data =
PKG+BO1+BO2+M+BI1); where a conversion factor of 0.9 must be used on Micro-Strip Segments to
convert Micro-Strip lengths to Strip-Line equivalent lengths.
2. To facilitate and check the Length and Matching relationships on a design, refer to the Automated Trace
Lengths Calculator (ATLC #568458). Refer Table 1-2
3. Byte[0] = DQ[7:0], DQS/DQS#[0], Byte[1] = DQ[15:8], DQS/DQS#[1], Byte[2] = DQ[23:16], DQS/
DQS#[2], Byte[3] = DQ[31:24], DQS/DQS#[3], Byte[4] = DQ[39:32], DQS/DQS#[4], Byte[5] =
DQ[47:40], DQS/DQS#[5], Byte[6] = DQ[55:48], DQS/DQS#[6], Byte[7] = DQ[63:56], DQS/DQS#[7]
4. The delta between CLK signals to CMD/CTRL/CKE, between DRAMs should be kept < 20 mils. Example:
|DRAM[x] (CK[i]-Addr[j]) - DRAM[y](CK[i]-Addr[j])| < 20 mils.
5. This matching rule refer to all BI (Break-ins) sections that routed within each signal. Example: ADDR[0]
BI1 should be equal in all DRAMs. ADDR[1] BI1 should be equal in all DRAMs. ADDR[0] BI1 may not be
equal to ADDR[1] BI1.
6. DQ - BI should be matched within all bytes and not only within byte (max-min=0). DQ[63..0] BI section
should be equal. DQS - BI should be matched within all bytes and not only within bytes (max-
min=0).DQS[7..0][P/N] BI section should be equal. DQ and DQS BI does not need to be matched. Can
allow 50 mils difference. DQS-DQ<=50 mils.
Processor CFL-H
Channels 1 and 2
SODIMM and DRAMS module placement Dual sided board. Each Channel is placed on a different side. Each
channel is Daisy Chain single sided
Notes:
1. SDP: Single Die Package, DDP: Dual Die Package.
2. No mixed vendor support within a channel or channel to channel and No mixed memory DRAM down type
support (SDP, DDP) within a channel or channel to channel.
3. Type 4 (T4) (1-x-1+) = PCB with one build-up layer and two layers of Micro-vias.
Type 4 (T4) (2-x-2+) = PCB with two build-up layer and three layers of Micro-vias.
Refer “Stack-Up and PCB Considerations” chapter for more details.
4. Non-Interleave = The processor is optimized for a side-by-side ball map and placement of the DRAM memory
down devices or DIMM Side-By-Side (inline) placement. Each memory channel’s signals are grouped together
on one side of the processor packages.
Interleave = The processor is optimized for a back-to-back ball map and placement of the DIMMs. Each
memory channel’s signals are grouped together on front or back side of the processor packages.
5. The DRAM Device ODT Capability can be enabled or disabled to read and write depending on the system
memory interface margins. Enabling the DRAM device ODT increases the memory interface power and
improves signal integrity/margins, while disabling the DRAM device ODT decreases the memory interface
power but degrades signal integrity/margins. For ODT implementation recommendation for this topology.
Refer to Table 4-1.
Figure 2-11. CFL-H DDR4 x16 T4 10L Dual sided Memory Down Placement and Block
Diagram
Figure 2-12. CFL-H DDR4 x16 T4 10L Dual sided Memory Down Strobe/Data/RCOMP Signal
Topologies
Figure 2-13. CFL-H DDR4 x16 T4 10L Dual sided Memory Down CLK/CTRL/CKE/CMD/Reset
Signal Topology
Notes:
1. The alert signal must be routed in the opposite direction to the address/command bus. Example: The alert
signal must first connect to the last device that the address/command bus is connected to.
2. DRAM_RST C1 capacitor should not be installed.
3. For SDP, BG1 should be left open.
4. For DDP, BG1 should be connected to the DRAM.
Table 2-11. CFL-H DDR4 x16 T4 10L Dual sided Memory Down Routing Guideline
(Sheet 1 of 2)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
C(uF)
Signal
Byte [1 and
Tolerance
Group[1
Group to
Region
Group
and 2]
Ended
Group
Single
Total
(%)
Diff
Diff
2]
BO1 SL VSS 0 3 3 6 6 450
M1 SL VSS 0 4 72 ±10 4 16 16
(R1) 36
(C1)
M2 SL VSS 0 4 4 16 16 1000 [1st] 0.0033
6000 1,2,3,
CLK (C1-no
[Last] 7,8
stuff)
BI1 SL VSS 8 3 3 16 16 120 8000 (C2)
0.01
BI2 SL VSS 0 3 86 ±10 5 16 16 700
1,2,4,5
Data M SL VSS 0 2.5 48 ±10 6 16 25 4500 ,6,9,10
Table 2-11. CFL-H DDR4 x16 T4 10L Dual sided Memory Down Routing Guideline
(Sheet 2 of 2)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
C(uF)
Signal
Byte [1 and
Tolerance
Group[1
Group to
Region
and 2]
Group
Ended
Group
Single
Total
(%)
Diff
Diff
2]
BO1 SL VSS 0 2.5 6 16 25 600
Notes:
1. Avoid any parallel routing between two adjacent layers.
2. Signals, while routed on inner PCB layers must be ground referenced with solid ground floods on both sides.
3. Use individual termination resistors (R1) for each signal. Do not use Rpacks.
4. For Option #1 (Single Rank) configuration, there are only 8 DRAM Devices connected to each CMD Group Signal and only
1 DRAM Device connected to each Strobe/Data Group Signal. For these designs DRAM Devices [15:8] and their
corresponding BI1 routing segments need to be removed for each CMD Group Signal and the second DRAM Device and
corresponding BI routing segment needs to be removed for each Strobe/Data Group Signal.
5. The Strobe and Data Group Signals within the same byte must always route together on the same layers for their entire
route.
6. DQ Bit Swapping is allowed within the same byte, and Byte Swapping is allowed within the same channel.
7. Clock (CLK and CLK#) and Strobe (DQS and DQS#) differential signal swapping within a pair is not allowed.
8. Capacitor C1 is a defensive design and should be NO STUFF by default.
9. DQ and DQS signals must route at the same layer and have same width.
10. Route 2 adjacent bytes to same DRAM device - like DRAM0 (BYTE0,1) DRAM1 (BYTE 2,3), for better VREF training per
DRAM device.
11. Impedance numbers are for reference only, it is calculating according to the stackup layers thickness, the material
conductivity, traces spacing and width. The recommendation is to follow stackup and traces geometries.
12. For DDP BG[1] should be connected.
Table 2-12. CFL-H DDR4 x16 T4 10L, Dual sided Memory Down Length Matching Guidelines
BI (max-min) 0 0 2,6
Data
DQ (Byte[X]) - DQS/DQS#[X], where X = 0 to 7 -20 20 1,2,3
Notes:
1. Length Matching = CPU Die to DRAM Ball of every DRAM Device (CLK =
PKG+BO1+BO2+M1+M2+BI1+BI2, CTRL/CKE/CMD = PKG+BO1+BO2+M+BI1+BI2, Strobe/Data =
PKG+BO1+BO2+M+BI1); where a conversion factor of 0.9 must be used on Micro-Strip Segments to
convert Micro-Strip lengths to Strip-Line equivalent lengths.
2. To facilitate and check the Length and Matching relationships on a design, refer to Automated Trace
Length Calculator (# 568458).
3. Byte[0] = DQ[7:0], DQS/DQS#[0], Byte[1] = DQ[15:8], DQS/DQS#[1], Byte[2] = DQ[23:16], DQS/
DQS#[2], Byte[3] = DQ[31:24], DQS/DQS#[3], Byte[4] = DQ[39:32], DQS/DQS#[4], Byte[5] =
DQ[47:40], DQS/DQS#[5], Byte[6] = DQ[55:48], DQS/DQS#[6], Byte[7] = DQ[63:56], DQS/DQS#[7]
4. The delta between CLK signals to CMD/CTRL/CKE, between DRAMs should be kept < 20 mils. Example:
|DRAM[x] (CK[i]-Addr[j]) - DRAM[y](CK[i]-Addr[j])| < 20 mils.
5. This matching rule refer to all Break-ins (BI) sections that routed within each signal. Example:ADDR[0]
BI1 should be equal in all DRAMs. ADDR[1] BI1 should be equal in all DRAMs. ADDR[0] BI1 may not be
equal to ADDR[1] BI1.
6. DQ - BI should be matched within all bytes and not only within byte (max-min=0). DQ[63..0] BI section
should be equal. DQS - BI should be matched within all bytes and not only within bytes (max-min=0).
DQS[7..0][P/N] BI section should be equal. DQ and DQS BI does not need to be matched. Can allow 50
mils difference. DQS-DQ<=50 mils.
§§
Processor CFL-S
Channels 1 and 2
Strobe/Data/CTRL/CLK/CKE/CMD = PKG+A+B+C+D+E
Total Maximum Length
Reset = PKG+A+B+C+D+E+F
Notes:
1. Type 3 (T3)= PCB with zero build-up layers using Plated Through-hole (PTH) Vias with no Micro-vias.
Refer “Stack-Up and PCB Considerations” chapter for more details in this document.
2. Non-Interleave = The processor is optimized for a side-by-side ball map and placement of the DRAM
memory down devices or DIMM Side-by-Side (inline) placement. Each memory channel’s signals are
grouped together on one side of the processor packages.
Interleave = The processor is optimized for a back-to-back ball map and placement of the DIMMs. Each
memory channel’s signals are grouped together on front or back side of the processor packages.
3. The DRAM Device ODT Capability can be enabled or disabled for reads and writes depending on the system
memory interface margins. Enabling the DRAM device ODT increases the memory interface power and
improves signal integrity/margins while disabling the DRAM device ODT decreases the memory interface
power but degrades signal integrity/margins. For ODT implementation recommendation for this topology,
refer to Table 4-1.
Figure 3-1. CFL-S DDR4 1DPC SoDIMM T3/4L Inline NIL Placement and Block Diagram
CFL S
DDR0_CLK[1:0] DDR1_CLK[1:0]
DDR0_CS[1:0] DDR1_CS[1:0]
DDR0_CKE[1:0] DDR1_CKE[1:0]
DDR0_ODT[1:0] DDR1_ODT[1:0]
DDR0_CMD DDR1_CMD
DDR0_Alert DDR1_Alert
DDR0_DQ DDR1_DQ
DDR0_DQS DDR1_DQS
Ch A SO‐DIMM Ch B SO‐DIMM
CHx
CFL‐S DIMM0
CLK, CTRL, A B C D E
CMD, Alert,
Data, Strobe
CH0 CH1
DIMM0 DIMM0
VDDQ
CFL‐S R1 E E
R2
DDR Reset A B C D F
C1
MB Layer Route
Impedance (Ω) (mils)
Length
Trace Width
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
Signal
Byte [1 and
Tolerance
Group to
Group[1
Region
and 2]
Group
Ended
Group
Single
Total
[%]
Diff
Diff
2]
VSS/
A 1 0 3.5 4 4.5 4.5 25
VCC
VSS/
B 1,4 0/1 3.5 4 6.5 6.5 75
VCC
VSS/ 1,2,3,
CLK C 1,4 1/0 3.5 4 15.5 15.5 400 5000
VCC 4
VSS/
D 1,4 0/1 8 62 ±15 5 20 20
VCC
VSS/
E 1 0/1 8 62 ±15 5 20 20 1000
VCC
VSS/
A 1 0 3.5 4.5 4.5 100
VCC
VSS/
B 1,4 0/1 3.5 6.5 6.5 150
VCC
VSS/ 2,5,6,
CTRL/CKE C 1,4 1/0 3.5 8.5 8.5 150 5000
VCC 7,8,9
VSS/
D 1,4 0/1 6.5 40 ±15 9.5 9.5
VCC
VSS/
E 1 0/1 6.5 40 ±15 8.5 8.5 1000
VCC
VSS/
A 1 0 3.5 4.5 4.5 100
VCC
VSS/
B 1,4 0/1 3.5 6.5 6.5 150
VCC
VSS/ 2,6,7,
CMD/Alert C 1,4 1/0 3.5 8.5 8.5 150 5000
VCC 9,10
VSS/
D 1,4 0/1 8.5 35 ±15 6.5 5.5
VCC
VSS/
E 1 0/1 6.5 40 ±15 8.5 8.5 750
VCC
4.5/
A 1 VSS 0 3.5 4 15 75
15
6.5/
B 1,4 VSS 0/1 3.5 4 15 150
15
10.5 2,6,7,
C 1,4 VSS 1/0 3.5 4 18.5 / 375 11,12
Strobe 5000 ,13,
18.5
14
15.5
D 1,4 VSS 0/1 6.5 62 ±15 5 18.5 /
18.5
MB Layer Route
Impedance (Ω) (mils)
Length
Trace Width
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
Signal
Byte [1 and
Tolerance
Group to
Group[1
Region
Group
and 2]
Ended
Group
Single
Total
[%]
Diff
Diff
2]
4.5/
A 1 VSS 0 3.5 4.5 15 75
15
6.5/
B 1,4 VSS 0/1 3.5 6.5 15 150
15
10.5 2,6,7,
C 1,4 VSS 1/0 3.5 10.5 18.5 / 375 11,12
Data 5000 ,13,
18.5
14
15.5
D 1,4 VSS 0/1 6.5 40 ±15 18.5 18.5 /
18.5
VSS/
A 1,4 0/1 3.5 4.5 75
VCC
VSS/
B 1,4 0/1 3.5 6.5 200
VCC
(R1)
VSS/ 470
C 1,4 0/1 3.5 8.5
VCC
(R2)
Reset 8000 15,16
VSS/ 0
D 1,4 0/1 4 8.5
VCC
(C1)
VSS/ 0.1
E 1,4 0/1 4 8.5
VCC
VSS/
F 1,4 0/1 4 8.5
VCC
Notes:
1. In a One DIMM per Channel memory layout implementation, designers must either route the DIMM0 specific Clock (CK/
CK#[1:0]) signals or the DIMM1 specific Clock(CK/CK#[3:2]) signals to the single DIMM within a channel. Make sure the
DIMM Clock specific signals not routed to the single DIMM are test pointed on the motherboard and left as no connects.
2. For every transition, signal via the processor break-out regions, a ground via must be placed a maximum of one grid
distance away. If needed, it is acceptable to share a ground via between two transition signal vias.
3. The trace widths in these segments are for reference ONLY. The controlling specification is the trace impedance.
4. Strongly recommend that designs increase the Isolation Spacing in the Break Out Regions A, B, and C as much as possible
and get to the Main Segment Region D as quickly as possible.
5. In a One DIMM per Channel memory layout implementation, designers must route the Control signals associated with the
specific DIMM Clocks routed to the single DIMM within a channel (CS#/CKE/ODT[1:0] to CK/CK#[1:0], CS#/CKE/ODT[3:2]
to CK/CK#[3:2]). Make sure the DIMM specific Control signals not routed to the single DIMM are test pointed on the
motherboard and left as no connects.
6. The trace widths in these segments are for reference ONLY. The controlling specification is the trace impedance.
7. Strongly recommend that designs increase the Spacing in the Break Out Regions A, B, and C as much as possible and get
to the Main Segment Region D as quickly as possible.
8. If needed a minimum Control to Control trace spacing of 10 mils and a minimum Control to Command/address isolation
spacing of 10.25 mils are allowed for Region D but for no more than 300 mils maximum.
9. Region E must utilize three track routing with only two near aggressors. If needed, a minimum trace spacing of 4.5 mils is
allowed in Region E but the total combined length of reduced trace spacing must be less than 100 mils maximum.
10. Region E must utilize three track routing with only two near aggressors. If needed a minimum trace spacing of 4.5 mils is
allowed in Region E but the total combined length of reduced trace spacing must be less than 100 mils maximum.
11. For platforms that donot support ECC the DQS[8], DQS#8 and DQ[71:64] pins must be left as no connect at the processor
side.
12. Data bit swapping within a byte lane in the same channel is allowed.
13. Regions E must utilize 2 track routing with only 1 near aggressor.
14. The Signal/Trace Reference can be power or ground but they must maintain the same reference and not cross any plane
splits.
15. Capacitor C1 is a defensive design and should have NO STUFF by default.
16. Impedance numbers are for reference only, it is calculated according to the stackup layers thickness. The material
conductivity, traces spacing and width. The recommendation is to follow stackup and traces geometries.
1,2
DQS[X] - DQS#[X], where X = 0 to 7 -5 5
Strobe
1,2
CK/CK#[1:0] - DQS/DQS#[X], where X = 0 to 7 -1000 500
Notes:
1. Length Matching = CPU Die to SO-DIMM Pin (PKG+A+B+C+D+E); where a conversion factor of 0.9 must
be used on Micro-Strip Segments to convert Micro-Strip lengths to Strip-Line equivalent lengths. Keep the
signal Die to SODIMM Total Lengths for each signal, as short as possible.
2. To help facilitate and check the Length and Matching relationships on a design, refer to the Automated
Trace Length Calculator (# 568458). Refer Table 1-2.
3. Byte[0] = DQ[7:0], DQS/DQS#[0], Byte[1] = DQ[15:8], DQS/DQS#[1], Byte[2] = DQ[23:16], DQS/
DQS#[2], Byte[3] = DQ[31:24], DQS/DQS#[3], Byte[4] = DQ[39:32], DQS/DQS#[4], Byte[5] =
DQ[47:40], DQS/DQS#[5], Byte[6] = DQ[55:48], DQS/DQS#[6], Byte[7] = DQ[63:56], DQS/DQS#[7]
Processor CFL-H
Channels 2
SoDIMM Channel:
Strobe/Data/CTRL/CLK/CKE/CMD = PKG+A+B+C+D
RCOMP = M
Total Maximum Length Memory Down Channel:
Strobe/Data = PKG+BO1+BO2+M+BI1+BI2
CTRL/CLK/CKE/CMD = PKG+BO1+BO2+M+BI1+BI2+BI3
RCOMP = M
Notes:
1. Type 3 (T3)= PCB with zero build-up layers using Plated Through-hole (PTH) Vias with no Micro-vias.
Refer “Stack-Up and PCB Considerations” chapter for more details in this document.
2. Non-Interleave = The processor is optimized for a side-by-side ball map and placement of the DRAM
memory down devices or DIMM Side-by-Side (inline) placement. Each memory channel’s signals are
grouped together on one side of the processor packages.
Interleave = The processor is optimized for a back-to-back ball map and placement of the DIMMs. Each
memory channel’s signals are grouped together on front or back side of the processor packages.
3. The DRAM Device ODT Capability can be enabled or disabled for reads and writes depending on the system
memory interface margins. Enabling the DRAM device ODT increases the memory interface power and
improves signal integrity/margins, while disabling the DRAM device ODT decreases the memory interface
power but degrades signal integrity/margins. For ODT implementation recommendation for this topology.
Refer to Table 4-1.
4. SDP: Single Die Package, DDP: Dual Die Package.
5. No mixed vendor support within a channel or channel to channel and No mixed memory DRAM down type
support (SDP, DDP) within a channel or channel to channel.
Figure 3-4. CFL-S DDR4 Mixed SODIMM and Memory Down x16 Placement and Block
Diagram
CFL S
Ch B
Ch B CLK/CTRL/
Data Bytes CKE/CMD/
Alert
Channel B SO‐DIMM
Ch A Data Bytes
Ch A CLK/CTRL/CKE/CMD/Alert
CHx DIMM0
CFL‐S
CLK, CTRL, A B C D
CMD, Alert,
Data, Strobe
Figure 3-6. CFL-S DDR4 1Rx16 Memory Down Strobe/Data/RCOMP Signal Topologies
CFL‐S
R
RCOMP M
Notes:
1. The alert signal must be routed in the opposite direction to the address/command bus. Example: The alert
signal must first connect to the last device that the address/command bus is connected to.
2. DRAM_RST CAP should have no stuff.
Table 3-5. CFL-S DDR4 Mixed SODIMM and Memory down x16 - SODIMM Routing
Guidelines (Sheet 1 of 3)
Target Minimum Trace Spacing Maximum (mils)
MB Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
Group[1/2]
Signal
Byte [1/2]
Tolerance
Group to
Region
Group
Ended
Group
Single
Total
[%]
Diff
Diff
D MS VSS/VCC 1 4 4 15 15 200
Table 3-5. CFL-S DDR4 Mixed SODIMM and Memory down x16 - SODIMM Routing
Guidelines (Sheet 2 of 3)
Target Minimum Trace Spacing Maximum (mils)
MB Layer Route
Impedance (Ω) (mils)
Length
Trace Width
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
Group[1/2]
Signal
Byte [1/2]
Tolerance
Group to
Region
Group
Ended
Group
Single
Total
[%]
Diff
Diff
A MS/SL VSS/VCC 0 4 4 4 A≤ 300
B ≤ 600
A+B ≤
B SL VSS/VCC 0/1 3.5 4 4 650
2,5,6,
CTRL/CKE 4800 7,8,9
16/
C SL VSS/VCC 0/1 6 39 ±10 12
25
D MS VSS/VCC 1 4 6 12 200
D MS VSS/VCC 1 4 6 12 200
D MS VSS/VCC 1 4 12 200
10/
D MS VSS 1 4 4 /16 85
16
10/
D MS VSS 1 4 10 /16 85
16
Table 3-5. CFL-S DDR4 Mixed SODIMM and Memory down x16 - SODIMM Routing
Guidelines (Sheet 3 of 3)
Target Minimum Trace Spacing Maximum (mils)
MB Layer Route
Impedance (Ω) (mils)
Length
Trace Width
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
Group[1/2]
Signal
Byte [1/2]
Tolerance
Group to
Region
Group
Ended
Group
Single
Total
[%]
Diff
Diff
Notes:
1. In a One DIMM per Channel memory layout implementation, designers must either route the DIMM0 specific Clock (CK/
CK#[1:0]) signals or the DIMM1 specific Clock(CK/CK#[3:2]) signals to the single DIMM within a channel. Make sure the
DIMM Clock specific signals not routed to the single DIMM are test pointed on the motherboard and left as no connects.
2. For every transition signal via in the processor break-out regions, a ground via must be placed at maximum of one grid
distance away. If needed, it is acceptable to share a ground via between two transition signal vias.
3. The trace widths in these segments are for reference ONLY. The controlling specification is the trace impedance.
4. Strongly recommend that designs increase the Isolation spacing in the Break Out Regions A, B, and C as much as possible
and get to the Main Segment Region D as quickly as possible.
5. In a One DIMM per Channel memory layout implementation, designers must route the Control signals associated with the
specific DIMM Clocks routed to the single DIMM within a channel (CS#/CKE/ODT[1:0] to CK/CK#[1:0], CS#/CKE/ODT[3:2]
to CK/CK#[3:2]). Make sure the DIMM specific Control signals not routed to the single DIMM are test pointed on the
motherboard and left as no connects.
6. The trace widths in these segments are for reference ONLY. The controlling specification is the trace impedance.
7. Strongly recommend that designs increase the Spacing in the Break Out Regions A, B, and C as much as possible and get
to the Main Segment Region D as quickly as possible.
8. If needed a minimum Control to Control trace spacing of 10 mils and a minimum Control to Command/address isolation
spacing of 10.25 mils are allowed for Region D but for not more than 300 mils maximum.
9. Region E must utilize three track routing with only two near aggressors. If needed a minimum trace spacing of 4.5 mils is
allowed in Region E but the total combined length of reduced trace spacing must be less than 100 mils maximum.
10. The DDR4 Data Mask DM[8:0] pins of all DDR4 DIMM connectors must be tied directly to VDDQ.
11. For platforms that donot support ECC, the DQS[8], DQS#[8] and DQ[71:64] pins must be left as no connection at the
processor side.
12. Data bit swapping within a byte lane in the same channel is allowed.
13. Regions E must utilize 2 track routing with only 1 near aggressor.
14. The Signal/Trace Reference can be powered or grounded but they must maintain the same reference and not cross any
plane splits.
15. Capacitor C1 is a defensive design and should have NO STUFF by default.
16. DQ and DQS must have the same widths.
17. Impedance numbers are for reference only, it is calculated according to the stackup layers thickness. The material
conductivity, traces spacing and width. The recommendation is to follow stackup and traces geometries.
Table 3-6. CFL-S DDR4 Mixed SODIMM and Memory down x16 - Memory Down Routing
Guideline (Sheet 1 of 3)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
C(uF)
Signal
Byte [1 and
Tolerance
Breakout
Group[1
Group to
Region
Group
and 2]
Ended
Group
Single
Total
(%)
Diff
Diff
2]
BO1 MS VSS 1 4 4 4.5 4.5 300
650
BO2 SL VSS 0 3.5 4 15 15 600
4.5/ (R1)
M2 SL VSS 0 5/5.5 16 16 1000 36
4 [1st]
(C1)
6000
0.0033 1,2,3,
CLK BI1 SL VSS 8 3 3.5 16 16 150 (C1-no 6,7
[Last] stuff)
8000 (C2)
BI2 SL VSS 0 4.5 85 ±10 4.5 16 16 700
0.01
T3 MS VSS 1 3 3.5 16 16 50
T3 MS VSS 1 3 3.5 16 50
4.5/
M SL VSS 0 5.5/7 40 ±10 16
5.5 [1st]
6000
CMD BI1 MS VSS 8 3 3.5 16 150 36 1,2,3
[Last]
8000
BI2 SL VSS 0 4.5 50 ±10 6.5 16 700
T3 MS VSS 1 3 3.5 16 50
Table 3-6. CFL-S DDR4 Mixed SODIMM and Memory down x16 - Memory Down Routing
Guideline (Sheet 2 of 3)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
C(uF)
Signal
Byte [1 and
Tolerance
Breakout
Group[1
Group to
Region
and 2]
Group
Ended
Group
Single
Total
(%)
Diff
Diff
2]
BO1 MS VSS 1 4 4 /12 4/12 300
650
BO2 SL VSS 0 3.5 4 /12 5/12 600 1,2,4,
Strobe 4500 5,6,8,
M SL VSS 0 4/4.5 85 ±10 4.5 16 25 9
4.5/
M SL VSS 0 4/4.5 50 ±10 16
5.5 [1st] (R1
6000 connec
Alert BI1 MS VSS 0 3 3.5 16 150 ted to 1,2,3
[Last] VDDQ)
8000 50
BI2 SL VSS 0 4.5 50 ±10 6.5 16 700
T3 MS VSS 1 3 3.5 16 50
MS/
BO1 VSS 1 3 3.5 75
SL
250
BO2 SL VSS 0 3.5 20 200 (R1)
470
(R2)
Reset M SL VSS 1 3.5 50 ±10 20 3,7
0
(C1)
BI1 MS VSS 8 3 20 8000 0.1
BI3 MS VSS 8 3 20
Table 3-6. CFL-S DDR4 Mixed SODIMM and Memory down x16 - Memory Down Routing
Guideline (Sheet 3 of 3)
Trace Width
Layer Route
R (Ω±1%)
Reference
Via Count
Region
(mils)
Notes
C(uF)
Signal
Byte [1 and
Tolerance
Breakout
Group[1
Group to
Region
and 2]
Group
Ended
Group
Single
Total
(%)
Diff
Diff
2]
Notes:
1. Avoid any parallel routing between two adjacent layers.
2. Signals, while routed on inner PCB layers must be ground referenced with solid ground floods on both sides.
3. Use individual termination resistors (R1) for each signal. Donot use Rpacks.
4. The Strobe and Data Group signals within the same byte must always route together on the same layers for their entire
route.
5. DQ Bit Swapping is allowed within the same byte, and Byte Swapping is allowed within the same channel.
6. Clock (CLK and CLK#) and Strobe (DQS and DQS#) differential signal swapping within a pair is not allowed.
7. Capacitor C1 is a defensive design and should have NO STUFF by default.
8. DQ and DQS signals must route at the same layer and have same width.
9. Route 2 adjacent bytes to same DRAM device, such as DRAM0(BYTE0,1) DRAM1 (BYTE 2,3), for better VREF training per
DRAM device.
10. Impedance numbers are for reference only, it is calculating according to the stackup layers thickness, the material
conductivity, traces spacing and width. The recommendation is to follow stackup and traces geometries.
Table 3-7. CFL-S DDR4 Mixed SODIMM and Memory down x16 - SODIMM Lengths
Matching Guidelines
Length Matching (mils)
Signal
Rule Details Notes
Group
Minimum Maximum
1,2
CMD (max - min) 0 100
CMD
1,2
CK/CK#[1:0] - CMD -500 500
1,2
DQS[X] - DQS#[X], where X = 0 to 7 -5 5
Strobe
1,2
CK/CK#[1:0] - DQS/DQS#[X], where X = 0 to 7 -1000 500
Notes:
1. Length Matching = CPU Die to SO-DIMM Pin (PKG+A+B+C+D+E); where a conversion factor of 0.9 must
be used on Micro-Strip Segments to convert Micro-Strip lengths to Strip-Line equivalent lengths. Keep the
DDR3L signal Die to SODIMM Total Lengths for each signal as short as possible.
2. To help facilitate and check the Length and Matching relationships on a design please reference the
Automated Trace Length Calculator (# 568458). Refer Table 1-2
3. Byte[0] = DQ[7:0], DQS/DQS#[0], Byte[1] = DQ[15:8], DQS/DQS#[1], Byte[2] = DQ[23:16], DQS/
DQS#[2], Byte[3] = DQ[31:24], DQS/DQS#[3], Byte[4] = DQ[39:32], DQS/DQS#[4], Byte[5] =
DQ[47:40], DQS/DQS#[5], Byte[6] = DQ[55:48], DQS/DQS#[6], Byte[7] = DQ[63:56], DQS/DQS#[7].
Table 3-8. CFL-S DDR4 Mixed SODIMM and Memory down x16 - Memory Down Lengths
Matching Guidelines
Length Matching (mils)
Signal
Rule Details Notes
Group
Minimum Maximum
1,2
BI1 (max-min) 0 50
1,2
CK/CK#[0] (max - min) 0 10
2,7
BI1 (max-min) 0 0
1,2,6
CK/CK#[0] - CTRL/CKE -500 0
1,2,7
BI1 (max-min) 0 0
1,2,6
CK/CK#[0] - CMD -500 500
1,2,8
BI1 (max-min) 0 0
1,2
CK/CK#[0] - DQS/DQS#[X], where X = 0 to 7 -1000 500
1,2,5
Data DQ (Byte[X]) - DQS/DQS#[X], where X = 0 to 7 -10 10
Notes:
1. Length Matching = CPU Die to SO-DIMM Pin (PKG+A+B+C+D+E); where a conversion factor of 0.9 must be
used on Micro-Strip Segments to convert Micro-Strip lengths to Strip-Line equivalent lengths. Keep the
DDR3L signal Die to SODIMM Total Lengths for each signal as short as possible.
2. To help facilitate and check the Length and Matching relationships on a design, refer the Memory Automated
Trace Length Calculator. Refer Table 1-2.
3. Length Matching = CPU Die to SO-DIMM Pin (PKG+A+B+C+D+E); where a conversion factor of 0.9 must be
used on Micro-Strip Segments to convert Micro-Strip lengths to Strip-Line equivalent lengths.
4. To help facilitate and check the Length and Matching relationships on a design, refer the Automated Trace
Length Calculator (# 568458). Refer Table 1-2.
5. Byte[0] = DQ[7:0], DQS/DQS#[0], Byte[1] = DQ[15:8], DQS/DQS#[1], Byte[2] = DQ[23:16], DQS/
DQS#[2], Byte[3] = DQ[31:24], DQS/DQS#[3], Byte[4] = DQ[39:32], DQS/DQS#[4], Byte[5] = DQ[47:40],
DQS/DQS#[5], Byte[6] = DQ[55:48], DQS/DQS#[6], Byte[7] = DQ[63:56], DQS/DQS#[7].
6. The delta between CLK signals to CMD/CTRL/CKE, between DRAMs should be kept < 20 mils. Example:
|DRAM[x] (CK[i]-Addr[j]) - DRAM[y](CK[i]-Addr[j])| < 20 mils.
7. This matching rule refer to all Break-ins (BI) sections that routed within each signal. Example: ADDR[0]
BI1 should be equal in all DRAMs. ADDR[1] BI1 should be equal in all DRAMs. ADDR[0] BI1 may not be
equal to ADDR[1] BI1.
8. DQ - BI should be matched within all bytes and not only within byte (max-min=0). DQ[63..0] BI section
should be equal. DQS - BI should be matched within all bytes and not only within bytes (max-min=0).
DQS[7..0][P/N] BI section should be equal. DQ and DQS BI does not need to be matched. Can allow 50
mils difference. DQS-DQ<=50 mils.
§§
4 CFL-S/H VREF/DM/ODT
Guidelines
Notes:
1. For additional ODT signal connection details, refer to the Customer Reference Board (CRB) schematics
and board files.
CFL H/S
DDR0_VREF_DQ
DDR1_VREF_DQ DDR_VREF_CA
Channel A VDDQ
VREF_CA
DDR4 SO‐DIMM
1K 2
Channel A +/‐1%
+/‐1%
VREF_CA
DDR4 SO‐DIMM 22
1k
+/‐1%
VDDQ Channel B 25
+/‐5%
VREF_CA
DDR4 SO‐DIMM
2 1K
+/‐1% +/‐1%
Channel B
VREF_CA
22 DDR4 SO‐DIMM
1k
+/‐1%
Notes:
25 = Ohm
+/‐5%
= nF
Notes:
1. To enable easy route, at DDR4 systems, DDR1_VREF_DQ is used as VREF_CA for Channel B.
CFL H/S
Notes:
DDR0_VREF_DQ
= Ohm +/‐ 1%
DDR1_VREF_DQ
= nF
DDR_VREF_CA
VDDQ
47 47 47 47
1.8k 2.7
VDDQ
47
47 47 47 1.8k 2.7
CFL H
Notes: DDR0_VREF_DQ
= Ohm +/‐ 1%
DDR1_VREF_DQ
= nF
DDR_VREF_CA
VDDQ
47 47 47 47 47 47 47 47
1.8k 2.7
1.8k 22
VREF_CA VREF_CA VREF_CA VREF_CA VREF_CA VREF_CA VREF_CA VREF_CA
25
ChA ChA ChA ChA ChA ChA ChA ChA
DRAM7 DRAM6 DRAM5 DRAM4 DRAM3 DRAM2 DRAM1 DRAM0
VDDQ
1.8k 2.7
47 47 47 47 47 47 47 47
1.8k 22
VREF_CA VREF_CA VREF_CA VREF_CA VREF_CA VREF_CA VREF_CA VREF_CA
25
ChB ChB ChB ChB ChB ChB ChB ChB
DRAM7 DRAM6 DRAM5 DRAM4 DRAM3 DRAM2 DRAM1 DRAM0
Note: For 2Rx8, each DRAM should have its own cap (47 nF) - 16 caps per channel. In overall
32 caps.
§§
Check PDG schematic checklist for topologies that not covered in this section.