Shenzhen SIT Testing Technology Co., Ltd. Report No.

: SIT160107441ER

EMC REPORT
Prepared For : Guangzhou Win Win Electronic Factory
Add: Industial 2nd Road, Li Village, Dashi Town, Panyu District,
Guangzhou, China 511400

Product Name: USB Charger

Model : XBX-017, XBX-017P, XBX017A

Trade Mark: N/A

Prepared By : Shenzhen SIT Testing Technology Co., Ltd

Add: 4th Floor, Co-talent Creative Park, Liuxian Road, Baoan 68
District, Shenzhen

Test Date: January 06, 2016 to January 12, 2016

Date of Report : January 12, 2016

Report No.: SIT160107441ER

Note: This report shall not be reproduced except in full, without the written approval of Shenzhen SIT Testing
Technology Co., Ltd. This document may be altered or revised by Shenzhen SIT Testing Technology Co., Ltd, personnel
only, and shall be noted in the revision section of the document. The test results in the report only apply to the tested
sample.

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

Contents

Cover Page ...........................................................................................................................................................1

Contents................................................................................................................................................................2

1 TEST CERTIFICATION ................................................................................................................................... 3

2 TEST RESULT SUMMARY ..........................................................................................................................4

3 EUT DESCRIPTION ......................................................................................................................................5

4 TEST METHODOLOGY ............................................................................................................................ 5

4.1 DECISION OF FINAL TEST MODE ..................................................................................................... 5

4.2 EUT SYSTEM OPERATION ..........................................................................................................................5

5 SETUP OF EQUIPMENT UNDER TEST................................................................................................... 6

5.1 DESCRIPTION OF SUPPORT UNITS ................................................................................................. 6

5.2 CONFIGURATION OF SYSTEM UNDER TEST .......................................................................................6

6 FACILITIES AND ACCREDITATIONS .................................................................................................... 7

6.1 FACILITIES FACILITIES........................................................................................................................ 7

6.2 ACCREDITATIONS ........................................................................................................................................ 7
6.3 MEASUREMENT UNCERTAINTY ...............................................................................................................7

7 Equipment Used during Test ................................................................................................................. 8

8 EMI and EMS Test Results (EN50498)................................................................................................... 9

8.1 Radiated Emissions, 30 MHz to 1 GHz ............................................................................................... 9

8.1.1 E.U.T. Operation ......................................................................................................... 9
8.1.2 Test Setup and Procedure ........................................................................................... 10
8.1.3 Measurement Data..................................................................................................... 11
8.2 Transient Conducted Emissions Test ....................................................................................................... 13
8.3 Transient Conducted Immunity ............................................................................................................ 14
8.3.1 E.U.T. Operation........................................................................................................ 14
8.3.2 Test Setup................................................................................................................ 14
8.3.3 Measurement Data..................................................................................................... 15

9 Equipment Used during Test ............................................................................................................... 19

9.1 Radiated Emission Test Setup ............................................................................................................. 19

9.2 EUT Constructional Details .......................................................................................................................... 20

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

2 TEST RESULT SUMMARY

1B

EMISSION

Standard Item Result

68B Remarks
69B

Radiated Emissions (30 MHz

EN 50498:2010 PASS Clause 6.5 and 6.6
to 1 GHz)
Transient Conducted
EN 50498:2010 PASS ISO 7637-2:2004
Emissions

IMMUNITY
Standard Item Result Remarks
Transient
EN 50498:2010 Conducted PASS ISO 7637-2:2004
Immunity

Note: 1. The test result judgment is decided by the limit of test standard
2. The information of measurement uncertainty is available upon the customer’s request.

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

3 EUT DESCRIPTION
2B

Product USB Charger

Model XBX-017P
Trade Mark N/A
Applicant Guangzhou Win Win Electronic Factory
Housing material Plastic
Engineering Sample. Product Sample,
EUT Type
Mass Product Sample.
Serial Number N/A
Power Rating AC 110-240V, 3A,15W, 50/60Hz

4 TEST METHODOLOGY
3B

4.1. DECISION OF FINAL TEST MODE

10B

The EUT was tested together with the thereinafter additional components, and a configuration, which

produced the worst emission levels, was selected and recorded in this report.

The following test mode(s) were scanned during the preliminary test:
Pre-Test Mode

Mode Mode1 : charging mode at full load

Radiated Emission
Emission supplied by DC 24V battery

Mode Mode2 : charging mode at half load

Radiated Emission
Emission supplied by DC 24V battery

After the preliminary scan, the following test mode was found to produce the highest emission level.

The Worst Test Mode

Mode Mode1 : charging mode at full load

Radiated Emission
Emission supplied by DC 24V battery

4.2. EUT SYSTEM OPERATION

1B

1. Set up EUT with the support equipments.

2. Make sure the EUT work normally during the test.

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

5 SETUP OF EQUIPMENT UNDER TEST

4B

5.1. DESCRIPTION OF SUPPORT UNITS

12B

The EUT has been tested as an independent unit together with other necessary accessories or support
units. The following support units or accessories were used to form a representative test configuration
during the tests.

Note:
1) All the equipment/cables were placed in the worst-case configuration to maximize the emission during the test.
2) Grounding was established in accordance with the manufacturer’s requirements and conditions for the intended
use.

5.2. CONFIGURATION OF SYSTEM UNDER TEST

13B

EUT Resistance
Power

（EUT: USB Charger）

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

6 FACILITIES AND ACCREDITATIONS

5B

6.1. FACILITIES
14B

All measurement facilities used to collect the measurement data are located at SIT LAB.

The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR Publication
22. All receiving equipment conforms to CISPR Publication 16-1, “Radio Interference Measuring Apparatus
and Measurement Methods.”

6.2. ACCREDITATIONS
15B

Our laboratories are accredited and approved by the following approval agencies according to ISO/IEC
17025.

Copies of granted accreditation certificates are available for downloading from our web site, www.sit-
cert.com

6.3. MEASUREMENT UNCERTAINTY

16B

Where relevant, the following measurement uncertainty levels have been estimated for tests
performed on the EUT as specified in CISPR 16-4-2:

Measurement Frequency Uncertainty

Conducted emissions 9kHz~30MHz +/- 3.59dB
30MHz ~ 200MHz +/- 4.77dB
Horizontal
200MHz ~1000MHz +/- 4.93dB
Radiated emissions
30MHz ~ 200MHz +/- 5.04dB
Vertical
200MHz ~1000MHz +/- 4.93dB

This uncertainty represents an expanded uncertainty expressed at approximately the 95%

confidence level using a coverage factor of k=2.

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

7 Equipment Used during Test

RE in Chamber (for automotive)

Cal. date Cal.Due date
No. Test Equipment Manufacturer Model No. Serial No.
(YYYY-MM-DD) (YYYY-MM-DD)
Compact Semi- ChangZhou
EMC0525 N/A N/A 2015-11-5 2016-11-4
Anechoic Chamber ZhongYu
EMC0522 EMI Test Receiver Rohde & Schwarz ESIB26 100283 2015-10-19 2016-10-18
EMC0056 EMI Test Receiver Rohde & Schwarz ESCI 100236 2015-10-03 2016-10-02
N/A EMI Test Software Audix E3 N/A N/A N/A
EMC0514 Coaxial cable SGS N/A N/A 2015-10-28 2016-10-27
EMC0503 Biconical Antenna R& S HK116 100033 2015-07-03 2016-07-02
Log-Periodic Dipole
EMC0504 R& S HL223 100039 2015-09-06 2016-09-05
Antenna
EMC0524 Bi-log Type Antenna Schaffner -Chase CBL6112B 2966 2015-10-28 2016-10-27
EMC2026 Horn Antenna Schwarzbeck BBHA 9120D 9120D-841 2015-10-31 2016-10-30
EMC2065 Amplifier HP 8447F N/A 2015-10-25 2016-10-24
EMC1801 Artifical Mains Network Schwarzbeck NNBM 8125 81251342 2015-11-08 2016-11-07
EMC1802 Artifical Mains Network Schwarzbeck NNBM 8125 81251345 2015-11-03 2016-11-02

ISO7637-2 Transient Conducted Immunity

Cal. date Cal.Due date
No. Test Equipment Manufacturer Model No. Serial No.
(YYYY-MM-DD) (YYYY-MM-DD)
Ultra Compact
EMC1804 EM Test/AG UCS 200M V0725102618 2015-08-30 2016-08-29
Simulator

EMC1805 Voltage Drop Generator EM Test/AG VDS 200 B2 V0725102619 2015-08-14 2016-08-13

General used equipment

Cal. date Cal.Due date
No. Test Equipment Manufacturer Model No. Serial No.
(YYYY-MM-DD) (YYYY-MM-DD)

EMC0006 DMM Fluke 73 70681569 2015-09-16 2016-09-15

EMC0007 DMM Fluke 73 70671122 2015-09-20 2016-09-19

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

8 EMI and EMS Test Results (EN50498)

8.1 Radiated Emissions, 30 MHz to 1 GHz
Test Requirement: EN 50498
Test Method: Clause 6.5 and 6.6
Test Date: 2016-01-07
Test Voltage: DC 24V
Frequency Range: 30 MHz to 1 GHz
Measurement Distance: 1 meter
Limits: Table 1 of EN 50498 (for broadband emissions)
Frequency range Limits
F Quasi peak
MHz dBµV/m
30 to 75 62-52 a
75 to 400 52-63 b
400 to 1000 63
a
Decreasing linearly with the log of the frequency.
b
Increasing linearly with the log of the frequency.

Table 2 of EN 50498 (for narrowband emissions)

Frequency range Limits
F Average
MHz dBµV/m
30 to 75 52-42 a
75 to 400 42-53 b
400 to 1000 53
a
Decreasing linearly with the log of the frequency.
b
Increasing linearly with the log of the frequency.

Detector: Peak for pre-scan (120 kHz resolution bandwidth)

Quasi-Peak for broadband emissions
Average for narrowband emissions

8.1.1 E.U.T. Operation

EUT Operation: Mode 1: charging mode at full load supplied by DC 24V battery.
Mode 2: charging mode at half load supplied by DC 24V battery.
A pre-test was performed on the EUT in mode 1-2, compliance test was conducted
at mode 1 as the worst case.
Before test, the voltage of the vehicle batteries is 24V.
After test, the voltage of the vehicle batteries is 23.8V.

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

8.1.2 Test Setup and Procedure

The EUT was insulated placed 50 mm above the ground plane, the ground plan was in a height of 1 m to
the reference plane of semi-anechoic chamber and with electrical connection. No additional electric
connection was made between the EUT and ground plane as the EUT will not be intended to be bonded
to the bodywork of the vehicle. The EUT was powered by 24 V vehicle batteries through 5 uH/50 ohm
LISN.

Key
1. EUT (grounded locally if required in test plan) 8. Antenna
2. Test harness 10. High-quality coaxial cable
3. Load simulator 11. Bulkhead connector
4. Power supply (location optional) 12. Measuring instrument
5. Artificial network (AN) 13. RF absorber material
6. Ground plane (bonded to shielded enclosure) 14. Stimulation and monitoring system
7. Low relative permittivity support

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

8.1.3 Measurement Data

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

8.2 Transient Conducted Emissions Test

There is no need for Transient conducted emission test to be performed on this product in accordance
with 7.3 of this Standard (EN 50498):

“ESAs that are not switched, contain no switches or do not include inductive loads need not be tested for
conducted emission and shall be deemed to comply with paragraph 7.3 of this Standard (EN 50498)

Performance Criteria Description in A.4 of ISO 7637-2 Criterion A:

all functions of a device/system perform as designed during and after exposure to disturbance.

Criterion B:

all functions of a device/system perform as designed during exposure. However, one or more of
them can go beyond specified tolerance. All functions return automatically to within normal limits after
exposure is removed. Memory functions shall remain class A.

Criterion C:

one or more functions of a device/system do not perform as designed during exposure but
return automatically to normal operation after exposure is removed.

Criterion D:

one or more functions of a device/system do not perform as designed during exposure and do
not return to normal operation until exposure is removed and the device/system is reset by simple
“operator/use” action.

Criterion E:

one or more functions of a device/system do not perform as designed during and after exposure
and cannot be returned to proper operation without repairing or replacing the device/system.

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

8.3 Transient Conducted Immunity

Test Requirement: EN 50498
Test Method: Clause 6.8 & ISO 7637-2
Test Date: 2016-01-07
Test Voltage: DC 24V
Test Limit: Table 4 of EN50498

8.3.1 E.U.T. Operation

EUT Operation: Test the EUT in charging mode with full load and half load.

8.3.2 Test Setup

Key
1. oscilloscope 5. ground plane
2. voltage probe 6. Ground connection
a
3. test pulse generator with internal power 7. optional resistor (Rv)
supply resistance Ri
4. EUT 8. optional diode bridgeb
a For simulation of vehicle system loading for load dump test pulses 5a and 5b only. If used, the
value of Rv shall be specified in the test plan (typical value 0,7 Ω to 40 Ω).
b For simulation of load dump waveform for alternator with centralized load dump suppression for
pulse 5b only

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

8.3.3 Measurement Data

Pulse 1
24V

Vs: -75 V
t1: 0.5 s
t2: 200 ms
tr: 1 us
td: 2000 us
Ri: 10 Ohm
Coupling: Battery
Events: 5000
Test duration: 00:41:40 h

Pulse 2a
24V

Vs: +37 V
t1: 0.2 s
tr: 1 us
td: 50 us
Ri: 2 Ohm
Coupling: Battery
Events: 5000
Test duration: 00:16:40 h

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

Pulse 2b
24V

Vs: 10.0 V
t1: 1.0 s
t6: 1 ms
td: 200 ms
Int: 1.0 s
Ri: 0.05 Ohm
t12: 1 ms
tr: 1 ms
Events: 10
Test duration: 00:00:28 h

Pulse 3a
24V

Vs: -112 V
f1: 10 kHz
t4: 10 ms
t5: 90 ms
tr: 5 ns
td: 100 ns
Ri: 50 Ohm
Coupling: Battery
Test duration: 1 h

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

Pulse 3b
24V

Vs: +75 V
f1: 10 kHz
t4: 10 ms
t5: 90 ms
tr: 5 ns
td: 100 ns
Ri: 50 Ohm
Coupling: Battery
Test duration: 1 h

Pulse 4
24V

Va1: -6.0 V
Va2: -2.5 V
t1: 1.0 s
t6: 5 ms
t7: 15 ms
t8: 50 ms
t9: 0.5 s
t11: 5 ms
Events: 1
Test duration: 00:00:02 h

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

Test Results:
24V
Performance Criterion
Immunity Test Level for required
Test Pulse Number Performance under test
24V (min. voltage)
not immunity- related
1 III (-75) D (C)
2a III (+37) D (A)
2b III (+10) D (C)
3a III (-112) D (A)
3b III (+75) D (A)
4 III (-6) D (C)

Remark:
EUT is not immunity- related product.
(A): No Loss of Function.

(C): The EUT stopped working during test, however, it could recover after test.

Conclusion:

The EUT can meet the requirements of the standard.

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

9 Photographs
9.1 Radiated Emission Test Setup

(EN50498)

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

9.2 EUT Constructional Details

Appearance photograph of EUT

Appearance photographs of EUT

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 Shenzhen SIT Testing Technology Co., Ltd. Report No.: SIT160107441ER

Appearance photographs of EUT

--End of Report--

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