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SP23 MSE 2241 Homework - 239

This document provides instructions for Homework #9 in MSE 2241, due April 19th. It consists of 4 problems involving optical microscopy, electron microscopy, and backscatter electron imaging. Students are instructed to show their work and present problems in the given order to receive full credit.

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Bayejid Bin Zahid 1611942642
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71 views2 pages

SP23 MSE 2241 Homework - 239

This document provides instructions for Homework #9 in MSE 2241, due April 19th. It consists of 4 problems involving optical microscopy, electron microscopy, and backscatter electron imaging. Students are instructed to show their work and present problems in the given order to receive full credit.

Uploaded by

Bayejid Bin Zahid 1611942642
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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MSE 2241, Spring 2023

Homework #9

Due: by 12:00pm, Wednesday, April 19th


Instructions: Show your work; you will not be eligible for full or partial credit without it. You
may write your work and answers out by hand or type them, but it needs to be complete and fully
legible. If the problems involve the generation of external documents (e.g. spreadsheets, graphs),
make sure to embed or attach them. Note: please present the problems in the same order in which
they are assigned here; doing them out of order creates extra complication during grading and may
result in mistakes.

1. (a) [1.5pts] You are working on an optical microscope that only has one objective. The
objective’s working distance (the distance between the sample and the objective aperture) is 2
mm, and the aperture itself has a diameter of 2 mm. Assume you are currently working with
pure red light (λ = 650 nm) and an air gap between your sample and the microscope objective
(refractive index μ = 1.0). Calculate the theoretical resolution (R) and depth of field (h) for
this setup.

(b) [1.0pt] Assuming that we don’t have any other objectives that we can use, what changes
might we make to improve the resolution? If we assume we can only use visible light, what is
the maximum (i.e. smallest) resolution possible with this setup? What is the resultant depth of
field at the maximal resolution setup?

2. Consider the optical system below, which is set up to be exactly in focus (i.e. ignore depth of
field ranges) and is operating in air. Assume that the focal lengths (f) of lenses 1 and 2 are 10
mm and 1 mm, respectively. Further, assume that the distance between lens 1 and the
intermediate image is 20 mm and the distance between lens 2 and the final image is 250 mm.

Intermediate
image

MSE 2241 1 Homework #9


(a) [1.0pts] Calculate the total magnification of the system.
(b) [1.5pts] In most microscopes the physical opening in the metal tube at the end of the
objective lens serves as the limiting aperture. However, if no specific aperture exists, like
in the diagram above, one can consider the lens itself as an effective aperture — any light
outside the radius of the lens simply will not be captured, so it’s basically the same thing
as blocking it. Assuming that the diameter of lenses 1 and 2 are 5 mm and 10 mm,
respectively, calculate the numerical aperture (NA) of each of the lenses.
(c) [1.0pts] Given your answer for part (b), and assuming no aberrations, which lens will most
restrict the ultimate diffraction limited resolution of the system? Give a quantitative
justification for your answer.

3. Imagine you are performing some SEM measurements. Assume the display dimensions of the
computer monitor at your work state is 23 in × 13 in. You are scanning over a sample region
that is 24.0 μm × 13.5 μm, and the SEM accelerating voltage is set to 25 kV.
(a) [1.0pt] What is the wavelength of the electrons in the incident beam? Calculate this value
using both classical and relativistic velocities.
(b) [1.0pt] Assume your SEM is using a W filament thermionic emission electron gun with a
brightness of 105 A/cm2. If you are imaging with a beam current of 0.1 nA and a convergence
half-angle of 0.1 rad, what is your diffraction-limited spot size (diameter)? With this in mind,
does the difference between classical and relativistic wavelengths matter?
(c) [0.5pt] What is the effective magnification of your image given the noted monitor and
sample region sizes?
(d) [0.5pt] What would you need to do to increase the magnification by 10x (i.e. multiplied by
10) using the same SEM and displays?

4. The electron backscatter yield coefficient (η), which is proportional to the image intensity, is
almost independent of accelerating voltage, and can be given by:
𝜂𝜂 = −0.0254 + 0.016𝑍𝑍 − 1.86 × 10−4 𝑍𝑍 2 + 8.3 × 10−7 𝑍𝑍 3
For most imaging applications, the practical contrast limit that our eyes can distinguish is about
5%, where contrast is numerically defined as the relative difference between the intensity at
two different spots: (I2 – I1)/I1.
(a) [1.0pt] Assume you are imaging a sample that contains phase regions that consist of either
mostly Co or mostly Ni. Calculate the Z-contrast (i.e. the difference in signal intensities as
related to atomic number, Z) in a backscattered SEM image between such regions.
Assuming you need a relative contrast of at least 5%, will these different phases be
resolvable (by Z-contrast) in the backscattered image?
(b) [1.0pt] Now assume that the same sample also contains some precipitates that are mostly
Pt. Calculate the Z-contrast between these regions and those from part (a)? Will these be
resolvable in the backscatter image?

MSE 2241 2 Homework #9

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