Design of An Error Tolerant Adder
Design of An Error Tolerant Adder
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Abstract: Problem statement: In modern VLSI technology, the occurrence of all kinds of errors has
become inevitable. By adopting an emerging concept in VLSI design and test, Error Tolerance (ET), a
novel Error-Tolerant Adder (ETA) is proposed. The ETA is able to ease the strict restriction on
accuracy and at the same time achieve tremendous improvements in both the power consumption and
speed performance. When compared to its conventional counterparts, the proposed ETA is able to
attain improvement in the Power-Delay Product (PDP). Conclusion/Recommendations: One
important potential application of the proposed ETA is in digital signal processing systems that can
tolerate certain amount of errors. Delay and power are compared for various adders like RCA and
CLA. It is found that ETA has high speed and less power compared to its counterparts.
Key words: Error-Tolerant Adder (ETA), Error Tolerance (ET), Power-Delay Product (PDP),
Minimum Acceptable Accuracy (MAA), Least Significant Bit (LSB)
Fig. 1: Block diagram of 4 Bit Ripple Carry Carry-look-ahead adder CLA: Carry look ahead logic
uses the concepts of generating and propagating carries.
The addition of two 1-digit inputs A and B is said to
generate if the addition will always carry, regardless of
whether there is an input carry. In the case of binary
addition, A+B generates if and only if both a and B are
1. The addition of two 1-digit inputs A and B is said to
propagate if the addition will carry whenever there is an
input carry. The propagate and generate are defined with
respect to a single digit of addition and do not depend on
any other digits in the sum. In the case of binary addition,
A+B propagates if and only if at least one of A or B is 1.
Fig. 2: Block diagram of 4bit carry-look-ahead adder Sometimes a slightly different definition of propagate is
used. By this definition, A+B is said to propagate if the
Table 1: Comparison of delay in adders addition will carry whenever there is an input carry, but
No. of bits/adder RCA (ns) CLA (ns) ETA (ns) will not carry if there is no input carry. For binary
4 bits 11.953 11.989 7.570 arithmetic, or is faster than xor and takes fewer transistors
8 bits 18.607 18.453 8.156 to implement. However, for a multiple-level carry look
12 bits 25.247 24.917 8.300 ahead adder, it is simpler to use. Block Diagram of 4bit
16 bits 31.887 31.381 7.913
32 bits 31.815 57.237 9.411 carry-look-ahead adder is as in Fig. 2.
The carry look ahead adder represents the most
Table 2: Comparison of power in adders widely used design for high-speed adders in modern
No. of bits/adder RCA CLA ETA Computers. The advantage of using a look-ahead design
4 bits 2.199 1.787 0.073 over a ripple carry adder is that the Look-ahead is faster
8 bits 4.988 142.000 0.016 in computing the solution. The carry-in values in a
12 bits 8.237 74.523 0.001 carry look-ahead design are calculated independent of
16 bits 0.142 1294.000 0.021
32 bits 0.028 0.135 0.014 each other through a series of logic circuits.
Carry look ahead depends on two things:
However, for many Digital Signal Processing (DSP)
systems that process signals relating to human senses • Calculating, for each digit position, whether that
such as hearing, sight, smell and touch, e.g., the image position is going to propagate a carry if one comes
processing and speech processing systems, the error- in from the right
tolerant circuits may be applicable (Breuer and Zhu, • Combining these calculated values so as to be able
2006; Lee et al., 2005; Chong and Ortega, 2005). to deduce quickly whether, for each group of
digits, that group is going to propagate a carry that
Conventional adders: comes in from the right
Ripple-Carry Adder (RCA): The n-bit adder built • Supposing that groups of 4 digits are chosen
from n one-bit full adders is known as a ripple carry
adder, because of the way the carry is computed. Each Then the sequence of events goes something like this:
full adder inputs a Cin, which is the Cout of the previous
adder. This kind of adder is a ripple carry adder, since • All 1-bit adders calculate their results.
each carry bit “ripples” to the next full adder. Block Simultaneously, the look ahead units perform their
diagram of Ripple Carry Adder is as in Fig. 1. calculations.
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Am. J. Applied Sci., 9 (6): 818-824, 2012
• Suppose that a carry arises in a particular group. By sacrificing some accuracy, the ETA can attain
Within at most 3 gate delays, that carry will great improvement in both the power consumption and
emerge at the left-hand end of the group and start speed performance.
propagating through the group to its left ETA design was proposed in Zhu et al. (2010).
• If that carry is going to propagate all the way Design of low-power high-speed truncation-error-
through the next group, the look ahead unit will tolerant adder and its application in digital signal
processing. IEEE Transactions on Very Large Scale
already have deduced this. Accordingly, before the
Integration (VLSI) Syst., 18: 8. However there are
carry emerges from the next group the look ahead unit tradeoffs between speed and power.
is immediately (within 1 gate delay) able to tell the
next group to the left that it is going to receive a carry Proposed addition arithmetic: In a conventional adder
- and, at the same time, to tell the next look ahead unit circuit, the delay is mainly attributed to the carry
to the left that a carry is on its way Table 1 and 2 propagation chain along the critical path, from the Least
shows the result obtained for CLA Significant Bit (LSB) to the Most Significant Bit
(MSB). Meanwhile, a significant proportion of the
Error-tolerant adder: Before detailing the ETA, the
definitions of some commonly used terminologies power consumption of an adder is due to the glitches
shown in this study are given as follows: that are caused by the carry propagation. Therefore, if
the carry propagation can be eliminated or curtailed, a
• Overall error (OE) OE = Rc-RE, where RE, is the great improvement in speed performance and power
result obtained by the adder and Rc denotes the consumption can be achieved. In this study, we propose
correct result (all the results are represented as for the first time, an innovative and novel addition
decimal numbers) arithmetic that can attain great saving in speed and
• Accuracy (ACC): In the scenario of the error- power consumption. This new addition arithmetic can
tolerant design, the accuracy of an adder is used to be illustrated via an example shown in Fig. 3.We first
indicate how “correct” the output of an adder is for split the input operands into two parts: an accurate part
a particular input. It is defined as: ACC = (1-(OE/ that includes several higher order bits and the
Rc))/100% inaccurate part that is made-up of the remaining lower
• Its value ranges from 0-100%. order bits. The length of each part need not necessary
• Minimum Acceptable Accuracy (MAA): Although be equal. The addition process starts from the middle
some errors are allowed to exist at the output of an (joining point of the two parts) toward the two opposite
ETA, the accuracy of an acceptable output should directions simultaneously. In the example of Fig. 1, the
be “high enough” (higher than a threshold value) to two 16-bit input operands,“1011001110011010”
meet the requirement of the whole system.
(45978) and “0110100100010011” (26899), are divided
Minimum acceptable accuracy is just that threshold
equally into 8 bits each for the accurate and inaccurate
value. The result obtained whose accuracy is
higher than the minimum acceptable accuracy is parts. The addition of the higher order bits (accurate
called acceptable result. part) of the input operands is performed from right to
• Acceptance Probability (AP): Acceptance probability left (LSB to MSB) and normal addition method is
is the probability that the accuracy of an adder is applied. This is to preserve its correctness since the
higher than the minimum acceptable accuracy. higher order bits play a more important role than the
lower order bits. The lower order bits of the input
Need for error-tolerant adder: Increasingly huge data operands (inaccurate part) require a special addition
sets and the need for instant response require the adder mechanism. No carry signal will be generated or
to be large and fast. The traditional Ripple-Carry Adder
taken in at any bit position to eliminate the carry
(RCA) is therefore no longer suitable for large adders
propagation path. To minimize the overall error due to
because of its low-speed performance. Many different
types of Rc fast adders, such as the Carry-Skip Adder the elimination of the carry chain, a special strategy is
(CSK) (Lehman and Burla, 1961), Carry-Select adder adapted and can be described as follow: (1) check every
(CSL) (Bedrij, 1962) and Carry-Look-Ahead adder (CLA) bit position from left to right (MSB to LSB); (2) if both
(MacSorley, 1961), have been developed. Also, there are input bits are “0” or different, normal one-bit addition is
many low-power adder design techniques that have been performed and the operation proceeds to next bit
proposed (Yeo and Roy, 2005) However, there are always position; (3) if both input bits are “1,”the checking
trade-offs between speed and power. process stopped and from this bit onward, all sum bits
The error-tolerant design can be a potential to the right are set to “1.” Table 1 and 2 shows the
solution to this problem. result obtained for RCA.
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Am. J. Applied Sci., 9 (6): 818-824, 2012
(a)
(b)
Breuer, M.A., S.K. Gupta and T.M. Mak, 2004. Defect Kuok, H.H., 1995. Audio recording apparatus using an
and error tolerance in the presence of massive imperfect memory circuit. U.S. Patent, 5: 414-758.
numbers of defects. IEEE Des. Test Comp., 21: Lee, K.J., T.Y. Hsieh and M.A. Breuer, 2005. A novel
216-227. DOI: 10.1109/MDT.2004.8 test methodology based on error-rate to support
Breuer, M.A., 2005. Let's think analog. Proceeding of error-tolerance. Proceedings of the International
the IEEE Computer Society Annual Symposium, Conference Test Conference, Nov. 8-8, IEEE
May 11-12, IEEE Xplore Press, pp: 2-5. DOI: Xplore Press, Austin, pp: 1136-1144. DOI:
10.1109/ISVLSI.2005.48 10.1109/TEST.2005.1584081
Breuer, M.A. and H.H. Zhu, 2006. Error-tolerance and Lehman, M. and N. Burla, 1961. Skip techniques for
multi-media. Proceedings of the International high-speed carry-propagation in binary arithmetic
Conference Intelligent Information Hiding and units. IRE Trans. Elect. Comput., 10: 691-698.
Multimedia Signal Process, (IIHMSP’ 06), IEEE DOI: 10.1109/TEC.1961.5219274
Xplore Press, Pasadena, USA., pp: 521-524. DOI: MacSorley, O., 1961. High speed arithmetic in binary
10.1109/IIH-MSP.2006.265055 comp. IRE Proc., 49: 67-91.
Cheemalavagu, S., P. Korkmaz and K.V. Palem, 2004. Palem, K.V., 2005. Energy aware computing through
Ultra low energy computing via probabilistic probabilistic switching: A study of limits. IEEE
algorithms and devices: CMOS device primitives Trans. Comput., 54: 1123-1137. DOI:
and the energy-probability relationship. 10.1109/TC.2005.145
Proceedings of the International Conference Solid Stine, J.E., C.R. Babb and V.B. Dave, 2005. Constant
State Devices and Materials, (SSDM’ 04), Tokyo, addition utilizing flagged prefix structures.
Japan, pp: 402-403. Proceedings of the International Conference of
Chong, I.S. and A. Ortega, 2005. Hardware testing for Symposium Circuits and Systems (ISCAS), May
error tolerant multimedia compression based on 23-26, IEEE Xplore Press, pp: 668-671. DOI:
linear transforms. Proceedings of the 20th IEEE 10.1109/ISCAS.2005.1464676
International Symposium on Defect and Fault
Van, L.D. and C.C. Yang, 2005. Generalized low-error
Tolerance in VLSI Systems, Oct. 3-5, IEEE Xplore
area-efficient fixed-width multipliers. IEEE Trans.
Press, pp: 523-531. DOI: 10.1109/DFTVS.2005.38
Circ. Syst. I, Reg. Papers, 52: 1608-1619. DOI:
Chung, H. and A. Ortega, 2005. Analysis and testing
10.1109/TCSI.2005.851675
for error tolerant motion estimation. Proceedings of
Yeo, K.S. and K. Roy, 2005. Low Voltage, Low Power
the Defect Fault Tolerance in VLSI System
Symposium, Oct. 3-5, IEEE Xplore Press, pp: 514- VLSI Subsystems. 1st Edn., McGraw-Hill, New
York, ISBN-10: 007143786X pp: 293.
522. DOI: 10.1109/DFTVS.2005.19
Zhu, N., W.L. Goh, W. Zhang, K.S. Yeo, Z.H. Kong,
Hsieh, T.Y., K.J. Lee and M.A. Breuer, 2007.
2010. Design of low-power high-speed truncation-
Reduction of detected acceptable faults for yield
error-tolerant adder and its application in digital
improvement via error-tolerance. Proceedings of
the conference on Design, automation and test in signal processing. IEEE Trans. Very Large Scale
Europe, April 16-20, ACM, USA., pp: 1-6. Integrat. Syst., 18: 1225-1229. DOI:
10.1109/TVLSI.2009.2020591
Korkmaz, P., B.E.S. Akgul, K.V. Palem and L.N.
Chakrapani, 2006. Advocating noise as an agent
for ultra-low energy computing: Probabilistic
complementary metal-oxide-semiconductor
devices and their characteristics. Japan. J. Applied
Phys., 45: 3307-3316.
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