Spectros
Spectros
Atomic Emission
• MP-AES
• ICP-MS
• ICP-OES
• X-ray Fluorescence (XRF)
Atomic Interference
• X-ray Diffraction (XRD)
Timeline of Early Developments
Mono-
Lamp Atomizer chromator Detector
H Flame Only He
Li Be Flame & Furnace B C N O F Ne
M
Na Al Si P S Cl Ar
g
M
K Ca Sc Ti V Cr Fe Co Ni Cu Zn Ga Ge As Se Br Kr
n
M
Rb Sr Y Zr Nb Tc Ru Rh Pd Ag Cd In Sn SB Te I Xe
o
Cs Ba La Hf Ta W Re Os Ir Pt Au Hg Tl Pb Bi Po At Rn
Fr Ra Ac
P S T
Ce Pr Nd Eu Gd Tb Dy Ho Er Yb Lu
m m m
A C F M
Th Pa U Np Pu Bk Cf Es No Lr
M m m o
Atomic Absorption Spectroscopy
Other Atomizers
Key Applications
• Determination of trace metals/
impurities in oil, plants, water
• Analysis of elements in fluids,
water, soil, food, serum,
semiconductor material
• And many more
Atomic Emission Spectroscopy
General
• Due to the limitations in AAS, techniques that don’t require dedicated lamps
for each element have come into use. These techniques, called
atomic emission spectroscopy (AES), rely on the fact that once an
atom of a specific element is excited (as in atomic absorption), it emits
light in a characteristic pattern of wavelengths (an emission spectrum)
as it returns to the ground state.
• The flame is not an ideal excitation source for atomic emission.
Therefore hotter sources are used.
• We will discuss the following techniques:
• Microwave plasma atomic emission spectroscopy (MP-AES)
• Inductively coupled plasma optical emission spectroscopy (ICP-OES)
Atomic Emission Spectroscopy
Microwave Plasma Atomic Emission Spectroscopy
Waveguide Plasma
Solid State RF
Sample introduction
system
Inductively Coupled Plasma Mass Spectrometry
General
mass spectrometer
Collision reaction
Quadrupole
Ion lenses
Interface
Detector
cell
• GC-ICP-MS examples:
• Pesticides
• OP nerve agent residues Seven overlaid chromatograms of apple juice spiked with 500
• PBDEs ng/L As standard.
• Nanoparticles
Summary
Atomic Spectroscopy Techniques
AAS MP-AES ICP-OES ICP-MS
Sequential
Measurement Sequential Sequential Sequential Simultaneous Sequential (*MS/MS for difficult
mode (MS) interference problems)