Ming Deng Calibration LA 1999 0160 C
Ming Deng Calibration LA 1999 0160 C
: LA-1999-0160-C
Blk 20 Woodlands Link, #04-12
Woodlands East Industrial Estate Issue No. : 26
Singapore 738733
Date : 01 March 2023
Page : 1 of 26
A. Dimensional
A4. Internal & Stick Micrometer In-house Procedure MDCP -04 : 2022
0 – 200 mm BS 959 : 2008 2 m
> 200 – 500 mm 3 m
> 500 – 1000 mm 4 m
A5. Height Setting Micrometer & In-house Procedure MDCP -05 :2022
Riser Block ISO 7863 : 1984
Length
0 – 600 mm 0.5 m
Parallelism 1.0 m
Flatness 0.2 m
Up to 10 mm 0.5 m
10 – 100 mm 0.5 m
100 – 200 mm 1.0 m
A15. Thread Plug Gauge In-house Procedure MDCP -15 : 2022 Pitch Dia : 0.7 m
Major Dia : 0.5 m
> M1 – M50 ISO 1502 :1996 Pitch : 5 m
ISO 228-1 : 2000 Angle : 10 mins
ISO 228-2 : 1987
FED – STD - H28: 2019
ASME/ANSI B 1.2-1983
ASME/ANSI B1.16M – 1984
ASME/ANSI B1.22M-1985
JIS B 0251 : 2008
JIS B 0254 : 2011
JIS B 0255 : 1998
JIS B 0261 : 2020
BS 919 Part 1 to 4 : 2007
BS 84 : 2007
BS 93 : 2008
BS 1580 Part 1 : 2007
BS 1580 Part 3 : 2007
BS 3643 Part 1 & 2 : 2007
BS 4377 : 1991
A17. Surface Plate (Lab / Site) In-house Procedure MDCP -17 : 2022
Up to 2500 x 2000 mm BS 817 : 2008 2 m
A18. Profile Projector (Lab / Site) In-house Procedure MDCP -18 : 2022
50 mm JIS B 7184 : 2021 3 m
50 – 300 mm 4 m
Magnification (10X to 100X) 0.04 % magnification
Protractor Accuracy 2 min
Perpendicularity 0.002 mm
0 – 50 mm 1.9 m
50 – 100 mm DIN 863 : Part 4 : 1999 & 3.5 m
100 – 150 mm DIN 2250 : Part 1 : 2008 5.1 m
Lead Screw 0.9 m
A29. Dial Gauge Calibrator In-house Procedure MDCP -40 : 2022 0.19 m
0 – 100 mm
A32. Screw Thread Micrometer In-house Procedure MDCP -28 : 2022 1.0 m
BS 870 : 2008 as a guide
ISO 3611 : 2010
A38. Caliper Gauge (Lab / Site) In-house Procedure MDCP -44 : 2022 1 m
A39. Dial Gauge Stand In-house Procedure MDCP -45 : 2022 0.9 m
A44. Coating Thickness Gauge In-house Procedure MDCP -54 : 2022 0.5 m
Up to 1000 m
A54. Optical Flat and Parallel In-house Procedure MDCP-66: 2022 0.1 m
Diameter: 0 – 45 mm JIS B 7430 : 1977
JIS B 7431 : 1977
A56. Measuring Tape / Textile Tape In-house Procedure MDCP -55 : 2023 0.04 inch
Up to 396 inch JIS B 7512 : 2018
JIS B 7522 : 2018
A57. Taper Thread Plug Gauge In-house Procedure MDCP -78 : 2022 0.6 µm
ANSI/ASME B1.20.1 : 1983
ASME B1.20.5 : 1991
JIS B 0253 : 1985
A58. Taper Thread Ring Gauge In-house Procedure MDCP -72 : 2022 1.5 µm
ANSI/ASME B1.20.1 : 1983
ASME B1.20.5 : 1991
JIS B 0253 : 1985
A59. Taper Plug Gauge In-house Procedure MDCP -73 : 2022 0.7 µm
JIS B 3301 : 2008
A60. Taper Ring Gauge In-house Procedure MDCP -74 : 2022 1.1 µm
JIS B 3301 : 2008
B. Mechanical
B2. Hand Torque Tool In-house Procedure MDCP -31: 2023 0.4 % of full scale
0.1 Nm to 1000 Nm ISO 6789-1 : 2017 Clause 6 (Exclude
Overloading Test and Endurance
Test)
B3. Torque Meter/Gauge In-house Procedure MDCP -30: 2023 0.04% of full scale
(0 - 15 Nm)
B4. Push/Pull Gauge In-house Procedure MDCP -19: 2022 0.03 % of full scale
(0 - 5 000 N)
B8. Tensile Testing Machine In-house Procedure MDCP -61 : 2023 0.01 % of full scale
(Lab / Site) ISO 7500-1 : 2018
Up to 250 kN
B9. Load Cell (Lab / Site) In-house Procedure MDCP -62 : 2022 0.01 % of full scale
Up to 250 kN
C. Temperature
Type E (Lab)
-250 oC to 1000 oC 0.51 ºC
Type E (Site)
-200 oC to 950 oC 0.74 ºC
Type J (Lab)
-210 oC to 1200 oC 0.32 ºC
Type J (Site)
-200 oC to 1200 oC 0.82 ºC
Type K (Lab)
-200 oC to 1372 oC 0.4 ºC
Type K (Site)
-200 oC to 1372 oC 0.97 ºC
Type N (Lab)
-200 oC to 1300 oC 0.4 ºC
Type N (Site)
-200 oC to 1300 oC 1.2 ºC
Type R (Lab)
0 oC to 1767 oC 0.77 ºC
Type R (Site)
-20 oC to 1750 oC 2.0ºC
Type S (Lab)
0 oC to 1767 oC 0.73 ºC
Type S (Site)
-20 oC to 1750 oC 0.2.0 ºC
Type T (Lab)
-250 oC to 400 oC 0.55 ºC
Type T (Site)
-200 oC to 400 oC 0.97 ºC
Range:
-70 oC to 200 oC 2.6 ºC
Range:
200 oC to 800 oC 2.2 ºC
Range :
(18 to 70) ºC 1.0 ºC
(40 to 95) % relative humidity 5.4 % relative humidity
D. Electrical
1.0 mV to 33 mV 10 Hz to 45 Hz 7 μV
45 Hz to 10 kHz 120 µV/V + 5 μV
10 kHz to 20 kHz 160 µV/V + 5 μV
20 kHz to 50 kHz 780 µV/V + 5 μV
50 kHz to 100 kHz 0.28 % + 10 μV
100 kHz to 500 kHz 0.63 % + 40 μV
3.3 mA to 33 mA 10 Hz to 20 Hz 2.5 μA
20 Hz to 45 Hz 0.07 % + 1.6 μA
45 Hz to 1 kHz 0.03 % + 1.6 μA
1 kHz to 5 kHz 0.07 % + 1.6 μA
5 kHz to 10 kHz 0.16 % + 2.3 μA
10 kHz to 30 kHz 0.31 % + 3.1 μA
0.33 A to 3 A 10 Hz to 45 Hz 0.09 mA
45 Hz to 1 kHz 0.05 % + 0.09 mA
1 kHz to 5 kHz 0.79 mA
5 kHz to 10 kHz 2.0 % + 3.9 mA
10 A – 16.5 A 45 Hz – 65 Hz 0.33 % + 58 mA
10 A – 16.5 A 65 Hz – 100 Hz 0.92 % + 58 mA
10 A – 16.5 A 100 Hz – 440 Hz 0.93 % + 58 mA
(On-site)
0 to 300 µA 0.047 % + 0.012 µA
>0.30 mA to 3.0 mA 0.047 % + 0.12 µA
>3.0 mA to 30 mA 0.047 % + 1.2 µA
>30 mA to 300 mA 0.093 % + 24 µA
>300 mA to 1A 0.093 % + 0.70 mA
>1 A to 10 A 0.058 % + 0.58 mA
20 mA to <200 mA 10 Hz 0.031 % + 19 µA
>10 Hz to 10 kHz 0.028 % + 19 µA
(On-site)
0 µA to <30mA 20 Hz to 45 Hz 1.1 % + 3.3 mA
46 Hz to 100 Hz 0.44 % + 3.3 mA
101 Hz to 400 Hz 0.39 % + 3.3 mA
401 Hz to 20 kHz 0.39 % + 3.3 mA
21 kHz to 100 kHz 1.3 % + 3.3 mA
1 A to 10 A 45 Hz to 1k Hz 1.8 % + 5.8 mA
1k Hz to 20k Hz 1.8 % + 12 mA
High Voltage
2 MΩ to <20 MΩ 16 µΩ/Ω + 9.3 Ω
20 MΩ to <200 MΩ 62 µΩ/Ω + 0.93 kΩ
200 MΩ to <2 GΩ 0.018 % + 0.093 MΩ
2 GΩ to 20 GΩ 0.15 % + 9.3 MΩ
(On-site)
0 to 30 mV 52 µV/V + 4.3 µV
>30 mV to 300 mV 41 µV/V + 45 µV
>300 mV to 3V 29 µV/V + 7.0 µV
>3 V to 30V 47 µV/V + 0.22 mV
>30 V to 300V 64 µV/V + 0.70 mV
>300 V to 1000 V 0.12 % + 0.24 V
NOTE : Direct conversion of the metric units to imperial units will be applied for imperial measurement
Approved Signatories:
Ms Lee Siew Moy - Item A (1-12, 16, 19-21, 26-27, 29, 31-32, 34-36, 38, 41, 53)
Mr Apichai Thepmaneerat - Item A (4, 12-16, 18, 24-25, 28, 34, 45-47, 49, 52, 58-60)
Mr Koo Chih Wei - Item A (1-42, 44-46, 48, 50-51, 53-56)Item B (1-4, 6-11, 13)
Note :
This laboratory is accredited in accordance with the recognised International Standard ISO/IEC
17025. A laboratory's fulfilment of the requirements of ISO/IEC 17025 means the laboratory meets
both the technical competence requirements and management system requirements that are
necessary for it to consistently deliver technically valid calibrations. The management system
requirements in ISO/IEC 17025 are written in language relevant to laboratory operations and operate
generally in accordance with the principles of ISO 9001.