C141-E004J

X-ray Diffractometer

XRD-6100
Ease of use and abundant functions herald a new era of analysis

The Windows 7-supported application software ushers this compact, multi-functional,

general purpose X-ray Diffractometer into the networking era of analysis.

X-Ray Diffractometer

XRD-6100

In addition to its basic ease of use and abundant functions, the XRD-6100 boasts an integrated design featuring a vertical goniometer and
data processing software supporting the Windows 7 user interface.
The XRD-6100 offers solutions encompassing wide-ranging analysis requirements, from routine qualitative and quantitative analysis to state
change analysis, including stress analysis, residual austenite quantitation, crystallite size/lattice strain, crystallinity calculation, materials
analysis via overlaid X-ray diffraction patterns, enhanced material evaluation and sample heating analysis. Of course, crystalline structural
analyis, including precise lattice constant determination, is also supported.
A g en er a l-p u r p o s e X -r a y d if f r a ct om et er
to ad d re s s y o u r v a r io u s a n a ly t ic al
n eed s X R D -6 1 0 0

Fea tu res
Hi g h -p rec i s i o n built -in v e r t ica l goniom e t e r
Enables measurements of a variety of samples including hard-to-secure samples like powders
and thin films as well as highly soluble samples.

Wi n d o ws 7 em ploy e d a s sof t w a re pla t f or m

The main unit control and data processing software supports the widely used Windows 7 user
interface. For this reason, data can export to marketed software. Network support and
multi-user accessibility are easily achieved.

Multi-functional auto-search/match software (qualitative analysis)

equipped as standard
The XRD-6100 is equipped with auto-search / match software as standard to aid qualitative
analysis - the important analysis task of X-ray diffraction. The detailed search parameter
settings, second search function, and the comparison display of candidate substances on a
raw data profile make analysis easy to understand - even for beginers. What’s more, a greater
success ratio in results can be achieved with the system. In addition, an easy quantitative
calculation function and a function that incorporates element data from the X-ray
fluorescence spectrometer are included in the system.

Routine performance maintenance is easy

Adjustments to the optical system are performed by automatic setting function. And since
the XRD-6100 has a function to automatically save the system's adjustment parameters,
system status can be monitored and recorded. Consequently, routine performance
maintenance can be easily controlled, which is vital for quality control in analytical
instruments.

Safe, c o mp ac t body
The main body has been massively slimmed and as the rear is a sheer flat surface with no
superfluous protrusions, the device can placed up against walls, which means it does not take
up room when installed on site or in the lab. The unit has also been specifically designed to
promote ease of handling in sample loading and positioning and, together with the door
lock mechanism engaged during X-raying, provides a safe operating environment.
 Applications of X-ray Diffractometry

F e rro u s me ta ls
Steel
Qualitative analysis of steel sheet, measurement of
residual austenite and residual stress, analysis of friction and wear test samples,
measurement of iron oxide films and nitride layers, evaluation of plating and
texture.
Cast iron
Qualitative analysis of precipitates and additives in cast iron.
Surface-treated steel
Evaluation of characteristics of surface-treated areas, quality control, residual
stress measurement.

N o n - ferro u s me ta ls
Copper and zinc
Qualitative analysis of alloys, orientation measurements
of foil samples, evaluation of texture, qualitative analysis of plated areas.
Aluminum
Qualitative analysis of aluminum and aluminum alloys, oxides and nitrides,
evaluation of texture in rolled material.
Other metals
Qualitative analysis of metal alloys, oxides and nitrides, evaluation of
characteristics of surface-treated areas, residual stress measurement.

M a c h in e ry, a u to mo b ile s, shipbuilding

Machinery
Qualitative analysis of tool steels, surface analysis of
machined parts, analysis of austenite layers, qualitative analysis of surface
plating, residual stress measurement.
Automobiles and shipbuilding
Qualitative analysis of structural parts, quantitative analysis of austenite, residual
stress measurement.
Qualitative analysis of exhaust gas catalysts.

C h e m ica ls a n d cata lysts

Chemicals
Qualitative analysis of organic and inorganic chemicals,
analysis of impurities.
Catalysts
Qualitative analysis and degree of crystallinity measurements, measurement of
crystallite size to check final product.

C e ra mics
Porcelain and ceramics
Qualitative analysis of raw materials, final product
evaluation, analysis of crystal structures during heating (crystal system, crystallite
size, lattice constant).
Cement and glass
Qualitative and quantitative analysis of clinker and cement (free lime, etc.),
qualitative analysis of raw materials. Qualitative analysis and orientation
measurements of thin film layers formed at the glass surface.

4
Pharmac eutic als and medic al tre at m en t
Pharmaceuticals
Qualitative analysis of raw materials, identification of
impurities. Crystal polymorphism analysis and degree of crystallinity
measurements, quality control during pharmaceutical manufacture using
crystallite size measurement. Final product quality check and crystal
polymorphism analysis related to patents.
Dental materials
Qualitative analysis of dental materials such as apatite.

Resourc es and energy

Coal, oil, natural gas
Plant-scale qualitative analysis, evaluation of carbon
materials, evaluation of catalysts during petroleum refining.
Rocks and minerals
Qualitative analysis of raw materials and identification of impurities.
Qualitative/quantitative analysis of asbestos minerals (compatible with PRTR
method).

Electrical and electronic materials

Electrical components
Qualitative analysis of corrosion and adhering matter on
electrical contacts. Stress measurements in structural parts, qualitative analysis
of plated parts.
Electronic components
Qualitative analysis and orientation measurements of thin-film electronic
materials. Measurement of substrate crystal orientation for magnetic heads and
electronic elements.
Superconductors
Crystal structure analysis of superconducting materials using the Rietveld
method.

Construction and civil engineering

Qualitative/quantitative analysis of asbestos in construction materials.
Qualitative analysis of construction materials such as tiles and bricks.

Environment and industrial wastes

Environment
Qualitative/quantitative analysis of asbestos in the work environment.
Qualitative analysis of dust.
Industrial waste
Qualitative analysis of residual matter in plating liquids, combustion ash, coal
ash, and furnace slag.

XRD-6100
X-ray Diffractometer 5
 Polycapillary optical system

P ri n c ip le o f th e p o lycap illary optic al system Schematic diagram

of the polycapillary optical system
The fine glass capillaries in the order of several microns are arranged in a
solid as guides to multiple X-rays. The X-rays pass along each capillary while Output divergence angle
0.22°
repeating total internal reflection and exit from the opposite end of the
Intake angle
polycapillary system. The capillaries are curved so that repeated total internal 4.1°
reflection is allowed, and the X-rays from the point X-ray source exit the unit
as a parallel beam with a large solid angle.

Several ten thousand Output beam size

capillaries 8 x 8mm
Point X-ray source

F e a tures o f th e p o lycap illary optic al system Configuration of polycapillary

parallel-beam optical system
Compared with the conventional focused beam system and the normal
parallel-beam system, the polycapillary optical system more efficiently Parallel-beam optical system Flat crystal monochromator
exploits the beam from the X-ray tube, resulting in higher diffraction X-ray
Polycapillary Detector
intensity. A displacement of the sample in a Bragg-Brentano optical system
can move it outside the focus, causing a significant displacement in
diffraction angle and a dramatic drop-off in diffraction X-ray intensity.
Solar slit for
Conversely, a displacement of a few millimeters in a parallel-beam system Point X-ray source parallel beam
has no effect on the diffraction angle and a small decrease on the diffraction
Sample
X-ray intensity. Consequently, incorrect loading of the upper and lower
sample faces or an uneven sample surface causes no angular displacement
and accurate measurement is possible. The parallel-beam system also allows Configuration of Bragg-Brentano optical system
analysis of curved surfaces, something not possible with conventional optical Divergence slit (DS)
systems. Curved crystal monochromator

Receiving slit (RS)

Scattering prevention slit (SS)

Sample

S a mp le me a su reme n t u sing Tablet-formed acetaminophen

th e p o lyca p illary o p tical system 20000.00

This example shows measurements of the raw drug acetaminophen and its
16000.00
tablets during the process of manufacturing. Tablets can be directly analyzed
Intensity (CPS) C
ntsPerSecond

to evaluate the degree of crystallinity and crystal polymorphism. The 12000.00

XRD-6100 is able to perform accurate, highly sensitive measurements on

8000.00
irregular surfaces or curved surfaces like this. Tablet 2

4000.00 Tablet 1

0.00
Ingredient
10.00 20.00 30.00 40.00

2 θ- θ

6
Qualitative and quantitative analysis of asbestos
and free silicic acids
The concentration of asbestos in construction materials is
measured using phase contrast dispersion staining microscopes
and X-ray diffractometers.
After pulverizing the sample acquired from the site in a pulverizer,
a phase contrast dispersion staining microscope and X-ray
diffractometer are used respectively to qualitatively analyze the
sample. If the sample is determined to contain asbestos at this
stage, then it is quantitatively analyzed using the X-ray
diffractometer. In actual practice, asbestos analysis (JIS A 1481)
requires sensitivity sufficient to determine 0.1 % content by
weight in 100 mg of acquired sample. To increase sensitivity so
that such trace asbestos levels can be detected, formic acid is used
to dissolve matrix components in the pulverized sample. Then the
residue after formic acid treatment is recovered in a fluorocarbon The major types of asbestos are serpentine asbestos (chrysotile) and amphibole
asbestos (amosite and crocidolite). The characteristic peaks of these types can
polymer binder filter using a suction filtration system for use in
be quantitatively analyzed by X-ray diffractometry.
quantitative analysis. In this case, the quantitative analysis is
performed using an X-ray diffractometer, where the absorption of
diffracted X-rays must be corrected to compensate for the
asbestos itself and the undissolved matrix components. This
correction process (base standard absorption correction method)
involves first measuring the metal plate (base plate) for a blank
filter, placing the filter with the formic acid-treated asbestos in the
diffractometer, and measuring the asbestos together with the
metal base plate to determine a correction factor from the
diffraction intensity ratio of the metal plate. Then that correction
factor is used to determine the corrected asbestos diffraction
intensity. Note that this method was originally developed for
measuring the free silicic acid content in mineral particulates
during work environment measurements.
Qualitative analysis results for asbestos
The XRD-6100 X-ray diffractometer environmental measurement
package includes a user database for environmental samples,
which is effective for increasing the accuracy of qualitative
analysis, a filter holder and rotational sample stage for use in the
base standard absorption correction method, and environmental
quantitation software for performing quantitative calculations that
correct for absorption. This environmental quantitation software
incorporates Shimadzu's proprietary measurement expertise
cultivated from many years in this field, which is especially
valuable when quantitating particularly trace levels of asbestos.
In addition, this XRD-6100 X-ray diffractometer environmental
measurement package is compliant with methods specified in the
Notification No. 0828001 by the Director of the Chemical Hazards
Control Division, Industrial Safety and Health Department, Labour
Standards Bureau, Ministry of Health, Labour and Welfare of
Screenshot of environmental quantitation software
Japan, such as for analyzing asbestos in natural minerals or
measuring the free silicic acid content in mineral particulates
during work environment measurements.

XRD-6100
X-ray Diffractometer 7
 A general-purpose X-ray diffractometer to adress
your various analytical needs
P ri n c ip le o f o p era tio n Cons truc tion
The XRD-6100 analyzes crystalline states under normal
Compact, X-ray-protected housing
atmospheric conditions. This method is non-destructive. X-rays
The compact construction (W900xD700xH1600mm) minimizes
focused on a sample fixed on the axis of the spectrometer
installation space requirements.
(goniometer) are diffracted by the sample. The changes in the
The front door is mounted on guide rollers, enabling light and
diffracted X-ray intensities are measured, recorded and plotted
smooth opening of the door to facilitate easy
against the rotation angles of the sample. The result is referred
installation/exchange of samples and attachments. A magnet
to as the X-ray diffraction pattern of the sample. Computer
latch assures the door closers: and to further ensure safety, a
analysis of the peak positions and intensities associated with
door interlock mechanism is automatically activated whenever
this pattern enables qualitative analysis, lattice constant
X-rays are generated.
determination and/or stress determination. Qualitative analysis
may be conducted on the basis of peak height or peak area.
The peak angles and profiles may be used to determine particle
High-precision, vertical goniometer
diameters and degree of crystallization, and are useful in
High-speed rate (1000°/min) and high-precision angle
conducting precise X-ray structural analysis.
reproducibility (±0.001°) provide fast measurement and highly
reliable data. The vertical goniometer unit allows analysis of
samples in various states, substantially widening the application
Incident X-rays(λÅ) Diffracted X-rays
range. The drive mechanism features an independent dual axis
θ -2θ linkage drive, and independent 2θ and θ axis drives,
freely selectable for efficient thin film and various other types
of analysis.
θ θ

θθ dÅ

dÅ

nλ = 2d · sinθ
Counter monochromator
(option)

A p p l ica tio n s Rotational sample stage

(option)
Steels, non-ferrous metals, machinery, shipbuilding, welding,
automobiles, ceramics, cement, glass, catalysts, electrical parts,
electronic materials, magnetic materials, superconductive
materials, fibers, paper, pulp, food products, chemicals,
agricultural chemicals, dies, pigments, paints, pharmaceuticals,
dental materials, biological matter, petroleum, coal, power
generation, natural gas, mining ore, soil, rocks, clay, minerals,
Vertical Goniometer
construction, civil engineering, environment, and industrial
waste.

High voltage transformer for

high output X-ray tube
The high voltage transformer supports either the 2.2kW high
output fine focus X-ray tube or 2.7kW high output broad focus
X-ray tube.

8
X-ray tubes Highly stable X-ray generator
The XRD-6100 will accept various types of X-ray tubes, Shimadzu's long experience in producing high-performance
including the normal focus (NF) 2kW type and broad focus (BF) X-ray generators has enables the production of a highly stable
2.7kW type, which are standard accessories, as well as the X-ray generator, with tube voltage and tube current both
optional long fine focus (LFF) 2.2kW type. By attaching the stable to within ±0.01%. This stability is unaffected during
optional counter monochromator, all types of samples, fluctuation of source voltage or ambient temperature, ensuring
including Fe samples, can be analyzed using the standard Cu high reliability of data even during prolonged periods of data
X-ray tube. acquisition.

Detector

Goniometer Monitor
A
B
Angle of B
diffraction A
2θ B
θ

Sample

X-ray tube

High voltage Goniometer control

Standard data
transformer Detector high
processing system
X-ray control voltage PHA

XRD-6100 Relational Diagram

XRD-6100
X-ray Diffractometer 9
 Providing a Complete Analysis System

Analysis System

Standard Software Options

X-ray generator control X-ray ON/OFF, tube Qualitative analysis

voltage/current setting Counter monochromator
ICDD database PDF2, PDF4
Optical path adjustment Goniometer adjustment PDF2 search software

Measurement Single scan, multi-scan Quantitative analysis

Residual austenite quantitation software
File maintenance ASCII data conversion Rotational sample stage
ASCII data to XRD-6100 data conversion Environmental quantitation analysis system
XD-D1 data to XRD-6100 data conversion

Basic data processing Smoothing, background Peak processing

elimination, Kα1-Kα2 separation, Profile fitting software (overlapping peak separation)
peak search, system error
correction, internal/external Crystalline structural analysis
standard correction, operations Precise lattice constant determination software
between data Rietveld analysis software

Graphic display Vertical display, horizontal

display State analysis
Overlay display (3D) Crystallite size/lattice strain calculation
Log display Crystallinity calculation
Thin film measurement attachment
Qualitative analysis Auto search Fiber sample attachment
User database creation (with orientation evaluation software)
Stress measurement attachment
(with stress analysis software)
Quantitative analysis Calibration curve generation
Sample heating attachment
Quantitation
Micro-measuring attachment

Auto search results and thin film sample overlay display

10
Automatic Measurement, Easy Operation
[ Goniometer optical system adjustment and saving of adjustment data are both fully automated.]

Measurement Display
Sample measurement conditions can be set by
easily.
The scheduling and the progress condition of the
measurement can be confirmed in one view by
the analysis spooler.

Measurement Screen

Multitasking for enhanced analysis efficiency

Basic Data Processing
The multitasking capability provided with the
Windows 7 operating environment allows
measurement and data processing to be
conducted simultaneously, enhancing the
efficiency of analysis operations.

Basic Data Processing Screen

XRD-6100
X-ray Diffractometer 11
 Pleasant Data Processing Environment

Graphic Display
Data can be freely zoomed with a click of the mouse, so profile
comparison of thin film data or heating measurement data etc.
is easily accomplished using combined 2-dimensional or
3-dimensional display. The software also features a variety of
other useful graphic functions, such as intensity Log conversion
display and hidden-line processing on the 3-dimensional display.
Each type of data can be output to a color printer, so
differences between samples can be recognized at a glance.

3-Dimensional Screen of Thin Film Sample

2-Dimensional Output of Thin Film Sample

Adding/Subtraction Operations
Data manipulation functions such as deletion of unnecessary
peak profiles and addition of re-analyzed data to obtain a
summed profile are some of the invaluable tools available for
conducting efficient data analysis. Spectral calculations are
conducted in the window displayed below.

Spectral Calculation Window

12
File Maintenance ~Data Format Conversion~
Conversion between profile data and text data, conversion
from Shimadzu X-ray Diffractometer
XD-D1(previous model) acquisition data to XRD-6100 format
data, and re-analysis are all possible. File format conversion is
conducted using the window displayed at right.

File Conversion Window

Optical Adjustments
The XRD-6100 system makes fully automatic optical the θ and 2θ axes, the x-ray detector high voltage settings, the
adjustments to the goniometer from the computer screen, PHA baseline and window width settings, it also automatically
even for optional attachments. In addition to completely saves the settings information. This feature can be utilized for
automatically adjusting all settings, such as the zero angle for routine maintenance.

The PHA (Pulse Height Analysis)

Adjustment Screen

HV (high voltage) adjustment screen

θ-Axis Adjustment Screen

XRD-6100
X-ray Diffractometer 13
 Enhanced Auto Search System
[ Auto Search, General Quantitation Software Provided as Standard ]

I d e n t ifi ca tio n wo rk can be performed effic iently on s c reen.

Detailed search parameters c an be set.
To obtain correct results with automatic search/match, search
parameters that conform to each sample must be set. The
XRD-6100 enables the setting of detailed search parameters
such as selection of files to be used in the search and three
levels of element data input. Furthermore, the XRD-6100
comes with a standard function for element data, which takes
up qualitative results (element analysis) from X-ray fluorescence
spectrometers as files via LAN.

Replete with second search function for

authoritative identification of a small amount
of components.
Identifying a small amount of components with a primary
search is difficult; a second search is needed after the maior
Search Parameter Setting Screen
components have been identified. The XRD-6100 is equipped
with a second search function to provide an environment for
easy identification of small amount of components.

Various search result data can be displayed.

Search results can be stack-displayed with each standard data
display over raw data. Also, for easy comparison, standard
substance names, chemical equations, ore names, Miller
indices, and ICDD numbers can be displayed on each peak.
Furthermore, an easy quantitative calculation function using a
corundum ratio for candidate substances is included in the
equipment.

If your system has a PDF2 or PDF4 database, PDF2 or PDF4

detailed data for candidate substances can be displayed on a
separate window.
Search Result Screen

D e d i ca te d u ser d ata b ase c an be c reated.

The user's own database file - separate from the sub-file
supplied by ICDD (International Center for Diffraction Data) -
can be created. Selected ICDD standard data and substance
data not registered with ICDD can be input into this file. And
data obtained through measurements by the XRD-6100 can be
registered in the database file, which means that the user's
basic samples can be registered, and comparisons made with
those substances to provide an extra dimension to quality
control.

User Database Creation Screen

14
Polished Quantitation Software

S a ti s fi e s yo u r a n aly sis objec tives .

Calibration Curves
Calibration curves can be generated for intensity, integrated
intensity or intensity ratio.
Intensity and integrated intensity calculations are used for the
internal standard and standard addition methods.

Calibration Curve Screen for Integrated Intensity

Quantitative Analysis
The internal standard method and 2 intensity methods are
available to satisfy most of the application needs.
Further, up to 5 peaks may the specified for quantitation and up
to 10 sets of data may be calculated simultaneously.

Integrated Intensity Quantitation Results Screen

Note: Residual austenite quantitation and environmental quantitation software packages are optional.

XRD-6100
X-ray Diffractometer 15
 Accessories

Q u a l itativ e a n aly sis

Counter monochromator
Installed in the X-ray detector unit, the counter
monochromator transforms X-rays which have passed through
the entrance slit into monochromatic X-rays, allowing only the
characteristic X-rays (Kα rays) to be detected. Exclusion of all
other X-rays from the sample, including continuous rays and
Kß rays as well as fluorescent X-rays, ensures diffraction
patterns with a high signal-to-noise ratio.

Part Description Application P/N

Counter monochromator CM-3121 Cu X-ray tube 215-22360-02
Counter monochromator CM-3131 Co X-ray tube 215-22360-03
Counter monochromator CM-3141 Fe X-ray tube 215-22360-04
Counter monochromator CM-3151 Cr X-ray tube 215-22360-05

ICDD PDF2 / PDF4

This is the powder X-ray diffraction database provided by ICDD. ICDD PDF2 P/N for Educational Institutions P/N for Other Uses
PDF2 is provided on CD-ROM, and contains, in addition to Single license Note1) 239-50002-12 239-50002-11
substance name, chemical formula and d-I data, Miller indices,
lattice constants, space groups and other crystallographic
information. Using the special PDF2 Automatic Search Software
(option), unknown substances can be easily identified via the
registered crystallographic information.

In addition to the functions of PDF2, database PDF4 features data searching software (DDVIEW+), the display of 2D, 3D structural
charts, various lattice parameters, simulation wave form by the calculation, and the import of the measurement data.
There are two databases of PDF4+ (for general) and PDF4/Organics (for organics).

ICDD PDF4+ P/N for Educational Institutions P/N for Other Uses ICDD PDF4 / Organics P/N for Educational Institutions P/N for Other Uses
Single license Single license
(New, 1 year license) 239-50015-02 239-50015-01 (New, 1 year license) 239-50015-22 239-50015-21

Single license Single license

(Renewal, 1 year license) 239-50015-04 239-50015-03 (Renewal, 1 year license) 239-50015-24 239-50015-23

Single license Single license

(Renewal, 3 year license) 239-50015-06 239-50015-05 (Renewal, 3 year license) 239-50015-26 239-50015-25

Single license Single license

(Renewal, 5 year license) 239-50015-08 239-50015-07 (Renewal, 5 year license) 239-50015-28 239-50015-27

PDF2 Search Software

Searches can be performed from the card No., as well as based
on multiple elements using "AND" or "OR" conditions, with
analyte identification and crystalline structure obtained
simultaneously.

PDF2 Search Software (DDVIEW)

Single license Note1)

Note 1: After 5 years, this license will need to be re-affirmed in order

to make it perpetual.

16
Q u a l itativ e a n aly sis
Rotational Sample Stage RS-1001
The RS-1001 performs in-plane rotation of the sample in
combination with oscillation around the goniometer sample
axis (θ) to minimize the scatter in diffraction pattern intensities
attributable to the sample crystalline orientation, and thereby
enhance the precision in most types of quantitative analysis.

Main specifications
Rotation ß axis (sample in-plane)
Rotation speed 1 to 60rpm
Minimum step width 0.1 degree
Operation modes Constant speed rotation,oscillation sample
in-plane rotation scan (continuous, step)
Measuring angle range 2θ 5° to 163°

Part Description P/N

Rotational sample stage (without option driver) 215-21766-01
Note: Please arrange the option driver at the same time.
Please refer to the special accessories on page 24.

Environmental Measurement Stage RS-2001

A complete environmental analysis system, this comprises a
special environmental quantitative analysis stage, filter holder
and quantitation software. A special filter holder is provided
which allows measurement using an asbestos-imbedded filter
as is. The main specifications of the environmental stage are
the same as those of the general-purpose rotational sample
stage. The calibration curve correction is based on Zn; however,
when the diffraction line of the sample overlaps with that of
Zn, an Al sample holder (optional) is also available.
The sample stage option driver can also be used with the
rotational sample stage.

Main specifications
Measuring angle range 2θ 5° to 163°

Part Description P/N

Environmental Analysis Stage (with S/W) 215-21767-03
Al filter holder (ø25) 215-23765-92
Aluminum sample holder (5PC) 215-22507-06
Note: Please arrange the option driver at the same time.
Please refer to the special accessories on page 24.

Environmental Quantitation Software

(P/ N 2 15 - 00421- 92)
Environment samples, as suspended dust particles, collected in
a very small quantity on a filter present an analytical challenge.
The XRD-6100 reliably addresses this challenge. The software
eliminates the effect of X-ray absorption by the filter, providing
a calibration curve with good linearity and high accuracy. The
software associated with the use of a special sample holder
allows the application of a very efficient filter absorption
correction.

XRD-6100
X-ray Diffractometer 17
 Accessories

A u to m a tic A n aly sis

Auto 5 Position Sample Changer ASC-1001
This stage is used in order to automatically measure a
maximum of 5 samples.
The ASC-1001 performs in-plane rotation of the sample in
combination with oscillation around the goniometer sample
axis (θ) to minimize the scatter in diffraction pattern intensities
attributable to the sample crystalline orientation. It is also
possible to use the filter holder (option) with the Environmental
Measurement Stage RS-2001.

Main specifications
Sample position 5
Sample size Powder:25mm ø
Filter: 25mm ø (option)
Rotation speed 1 to 60rpm
Measuring angle range 2θ5° to 163°

Part Description P/N

Auto 5 position sample changer (with an option driver unit) 215-23175-01
Zn filter holder (25mm ø) 5pc/set 215-23760-91
Al filter holder (25mm ø) 5pc/set 215-23760-92
Note: Please arrange the option driver at the same time.
Please refer to the special accessories on page 26.

Sample Plates for RS-2001 and ASC-1001

Part Description P/N

Aluminum sample holder (5pc) 215-22507-06
Glass sample holder (5pc) 215-22507-07
Glass Micro sample holder (5pc) 215-22507-08
Non-reflective sample holder (2pc) 215-22507-09

Thin Film Analysis using Attachment THA-1101

This is a specialized thin film analysis that includes the thin film
sample stage, monochromator and suction pump.
Employing the fixed incidence angle, parallel X-ray
diffractometry method, penetration of incident X-rays into the
substrate sample is limited as much as possible, providing low
background, thin film X-ray diffraction patterns.
Specimens are easily set in place using the suction pump.
The sample stage option driver can also be used with the
rotational sample stage.

Main specifications
Rotation ß axis (sample in-plane)
Rotation speed 1 to 60rpm
Minimum incidence angle 0.1degree
Sample suction pump AC100V, 10W (1 pump)
Operation modes Constant speed rotation, oscillation, sample
in-plane rotation scan, (continuous, step)

Part Description P/N

Thin film analysis attachment (without option driver) 215-21765-01
Note: Please arrange the option driver at the same time.
Please refer to the special accessories on page 26.

18
Fiber Sample Attachment
Used in combination with the Rotational Sample Stage
(RS-1001), this system measures the degree of orientation for Fiber sample
fibers. The acquired data is then processed using the provided attachment
fiber sample attachment software to calculate the degree of
orientation. Rotational
sample stage
Part Description P/N
Fiber sample attachment (with S/W) 215-22624

Fiber orientation software ( P/N 2 1 5 - 0 0 4 2 8 - 9 2 )

This software evaluates the degree of orientation for fiber
samples, using the data of peak width at half height acquired
from orientation measurement (sample in-plane ß axis
measurement).

Degree of Orientation Evaluation Screen

Automatic Variable Slit System AVS-1101

Environment samples, as suspended dust particles, collected in
a very small quantity on a filter present an analytical challenge.
The XRD-6100 reliably addresses this challenge. The software
eliminates the effect of X-ray absorption by the filter, providing
a calibration curve with good linearity and high accuracy. The Detector side

software associated with the use of a special sample holder

allows the application of a very efficient filter absorption
correction. Emitter side

This mechanism automatically sets the DS, SS and RS slit widths

according to the measurement mode selected on the screen.

Mode:
The emission slit is adjusted so that all sample surfaces are
irradiated with the X-ray of the same width. The detector
slits (SS and RS) are also adjusted in accordance with the
irradiation width.
Fixed Irradiation Width Mode: Degree of Orientation Evaluation Screen
The DS, SS and RS slit widths are fixed at the set values.

The data obtained using this software can be converted to the

conventional fixed-slit-width data by performing irradiation
width compensation (patent pending).

Part Description P/N

AVS-1101 Automatic Variable Slit System 215-23950

XRD-6100
X-ray Diffractometer 19
 Accessories

Micro Area Measurement Attachment MDA-1101/1201

The Micro Area Measurement Attachment uses a pinhole slit
for emission, allowing the measurement of micro regions.
Measured surfaces are observed via a CCD camera, so
observation images can be loaded onto a computer, saved and
edited. The product line includes two models: the MDA-1101
that uses an optical microscope and the MDA-1201 that uses a
zoom (8 - 80 mm) camera lens.

Key Specifications
Pinhole Emitter Slit 0.1, 0.2, 0.3, 0.5, 1, or 2 mm diameters
XYZ Movement ±7.5 mm
Sample Surface Observation CCD camera image viewed on computer
Method screen

Part Description P/N

Micro Area Measurement Attachment (MDA-1101) 215-23180-93
Micro Area Measurement Attachment (MDA-1201) 215-23180-94

Stress Analysis Attachment SA-1101

This specialized stress analysis system using the side-inclination
method includes the stress analysis sample stand, X-ray tube
and stress, analysis software.
X-ray stress analysis is widely used to measure the level of
stress in substances.
In the X-ray diffractometry of stress extremely small changes in
the lattice space are measured from the X-ray diffraction
pattern profile. The use of the special stress analysis stand
associated with the side-inclination method allows the precise
measurement of the residual stress. This technique is free of
absorption error.
The software includes the following functions: as
measurement, width at half height, peak position calculation
and stress calculation. Depending on the type of sample and
reflective plane, either the Cr X-ray tube or Co tube is
necessary. The sample stand option driver can also be used
with the rotational sample stage.

Main specifications
Inclined axis α axis
Inclined angle range 0 to 50 degrees
Operation modes Oscillating, fixed

Part Description P/N

Stress analysis attachment (with Cr tube, S/W) 215-21769-01
Stress analysis attachment (with Co tube, S/W) 215-21769-03
Note: Please arrange the option driver at the same time.
Please refer to the special accessories on page 26.

Stress Analysis Software ( P/ N 2 1 5 - 0 0 4 2 9 - 9 2 )

This software can analyze data obtained using either a
parallel-beam (fixed ψ or fixed ψ 0) or orthogonal-beam method. Residual Stress Analysis Result Screen

20
PCL-1001 Polycapillary Unit
The polycapillary unit is a new optical X-ray element that splits
a single X-ray beam emitted from a point’s light source into
multiple X-ray beams using three-dimensionally arranged
capillary optics. This creates a powerful parallel beam output
that covers a large area.
1) Compared to conventional methods, this unit uses the X-ray
more effectively and increases the intensity of the diffracted
X-ray, allowing more sensitive analysis.
2) With conventional methods, variations in sample surface
height are directly translated into variations in X-ray diffraction
angles. This polycapillary unit uses parallel beams, so it is not
affected by variations in sample surfaces.

Part Description P/N

PCL-1001 Polycapillary Unit 215-23980

CM-4121 Counter Monochromator Assembly

(for parallel beams) 215-22360-06

X-Ray Tube (Long fine focus, with Cu target) 210-24100-11

Note: If an LFF type X-ray tube is used in the XRD-6100 system,

the X-ray tube listed above is not required.

Sample Heating Attachment HA-1001

This system, consisting of a special sample heating furnace and
temperature controller, is used to heat the sample during X-ray
diffractometry to study the influence of heat on the crystalline
structure. The atomosphere in the furnace, consisting of air, an
inert gas or a vacuum, may be heated to 1500°C during
measurement. The measurement results are output in multiple
data formats to enable comparison of X-ray diffraction patterns
obtained at various temperatures.

Main Specifications
Thermocouple Pt-Pt/Rh
Measurement temperature 1500°C max. in vacuum, air
1200°C max. using inert gas (N2)
Control functions PID value setting, fixed temperature control
(temperature increase, decrease, hold, stop)
Power supply Single phase 200/220V±10% 10A
HA-1001
Part Description P/N for Other Uses
Sample heating attachment
(for XRD-6100 with temperature controller) 215-23000

XRD-6100
X-ray Diffractometer 21
 Accessories

Heating or Cooling Attachment TTK-450

This system, consisting of a special sample heating furnace and
temperature controller, is used to heat the sample during X-ray
diffractometry to study the influence of heat on the crystal
structure. The atmosphere in the furnace, consisting of air, an
inert gas or vacuum, may be heated to 450°C during
measurement at TTK-450.
With a vacuum kit and cooling kit, the atmosphere may be
cooled to -180°C.at TTK-450
The measurement results are output in multiple data formats to
enable comparison of
X-ray diffraction patterns obtained at various temperatures.

Main Specifications
TTK-450
Thermocouple PT100 resister
Power supply RT to 300°C (in the air,or an inert gas)
Temperature RT to 450°C (in vacuum) TTK-450

-180 to 450°C (With cooling kit in vacuum)

Control PID value setting fixed temperature control
functions (increase, decrease, hold, stop)
Power supply single phase 200/220V±10% 5A

Part name P/N

Heating attachment TTK-450 215-24030-93
Vacuum kit for TTK-450 for XRD-6100 215-24034-91
Cooling kit for TTK-450 for XRD-6100 215-24033-91

Sample Heating Measurement Result Screen

22
Q u a l ita tiv e a n aly sis
Residual Austenite Quantitation
(P/ N 2 15 - 00430- 92)
A common method to quantify residual austenite is to apply
the method for samples consisting of 2 components such as
tempered copper α-iron and γ- iron. Special software allows the
determination without the need of standard sample.
The software directly uses the intensity ratio of the measured
X-ray peaks of the α-iron and γ- iron components to
theoretically perform the calculation. The five-peak average
method is used to make the determination, so scattering due
to the matrix effect is reduced, enhancing the reliability of the
results. Using the rotational sample stage (P/N 215-21766) for
measurement further helps to overcome data scattering.

Quantitation Results Screen

P e a k P ro ce ssin g
Overlapping Peak Separation Software
(P/ N 2 15 - 00423- 92)
Using the Gauss and Lorentz models, overlapping peaks are
separated one by one, with information including position,
intensity, width at half height and integrated intensity
calculated for each diffraction peak.
These are then utilized to conduct quantitative analysis and
crystalline structure analysis.

Peak Separation Screen

C ry s t a llin e S tru ctu ral A nalys is

Precise Lattice Constant Determination
Software ( P/ N 215- 00424- 92)
In X-ray diffractometry, higher accuracy is often required to
determine the lattice constant, which is a fundamental
parameter for determining a substance's crystalline structure.
This is most often used for quantitating solid solution content.
This software corrects the raw diffraction angle data calculated
via basic data processing to determine enhanced precision
lattice constants for up to 7 crystals concurrently, employing
the least squares method to further minimize error in
diffraction angles. In addition, the Miller index is applied to
each peak.
Precise Lattice Constant Determination Calculation Result Screen

XRD-6100
X-ray Diffractometer 23
 Optional Software

C ry s ta llin e S tru ctu re A n alys is

Rietveld Analysis Software ( P /N 2 1 5 - 0 0 4 3 4 - 9 2 )
The Rietveld method analyzes the crystalline structure by
directly refining structural parameters and lattice constants
over the entire powder X-ray or neutron diffraction pattern. It
compares the diffraction pattern calculated from a presumed
structural model with the actual measured pattern, and refines
each parameter using the nonlinear least square method
developed by the National Institute for Materials Science
(formerly the Institute for Research in Inorganic Materials). This
Rietveld Analysis Software utilizes the RIETAN program created
by Mr. Fujio Izumi at the National Institute for Materials
Science.

S ta te A n aly sis
Crystallite Size & Lattice Strain Software
(P / N 21 5- 00426- 92)
Samples normally consist of crystallites ranging in size from
several μm to tens of μm. However, in the case of catalyst
crystallites, which may measure several hundred Å, X-ray
diffraction is insufficient, resulting in diffraction peak
spreading. This software quantitatively determines that spread,
and applies the Scherrer's equation to calculate the crystallite
size. When there is involvement of lattice strain, the diffraction
spread is determined for a number of diffraction peaks, and
from the resultant line slope and intercepts, the size of each of
the crystallites and the lattice strain are calculated. (Hall's
Method)
Hall's Equation Calculation Result Screen

Crystallinity Calculation Software

(P/ N 2 15 - 00427- 92)
The degree of crystallization of a mixture of crystalline and
amorphous substances, such as found in high polymer samples,
is an important parameter of substance characterization.
This software automatically or manually separates the
measured diffraction patterns into those of crystalline
components and those of amorphous components. Then, it
calculates the integrated intensity of the two types of
substances, called degree of crystallization using the peak area
ratio of the two classes of components.

Crystallinity Calculation Result Screen

24
Other Accessories

Sample Holders
The following sample holders, inclusinf the alminum sample
holder, which is supplied as standard with the diffractometer,
are available for different applications.

1 Aluminum 2 Glass 3 Glass Micro 4 Non-reflective

Sample Holder Sample Holder Sample Holder Sample Holder

Part Description Sample area Application Remarks P/N

Aluminum Sample Holder ø25 (dia.) x 1mm (d) General purpose Made of aluminum, 5pc 215-22507-01
Glass Sample Holder ø25 (dia.) x 1mm (d) Lattice constant Made of glass, 5pc 215-22507-02
Glass Micro Sample Holder ø15 (dia.) x 0.5mm (d) Micro samples Made of glass, 5pc 215-22507-03
Non-reflective Sample Holder Ultramicro samples Made of silicon, 2pc 215-22507-05

X-ray Tubes and X-ray Filters

Focus Type Type NF Type BF Type LFF

Focus Size 1 x 10mm 2 x 12mm 0.4 x 12mm
Tube voltage, X-Ray Filter
current 60kV, 50mA 60kV, 60mA 60kV, 55mA
Target X-ray Tube Maximum Load & P/N
Cu 2.0kW (239-24014-01)*1 2.7kW (210-24016-21) 2.2kW (210-24100-11) Part Description P/N
Co 1.8kW (062-40003-04) 2.7kW (210-24016-24) 1.8kW (210-24100-14) Ni filter (for Cu) (215-22500-02)
Fe 1.5kW (062-40003-05) 2.2kW (210-24016-25) 1.0kW (210-24100-15) Fe filter (for Co) (215-22500-03)
Cr 2.0kW (062-40003-06) 2.7kW (210-24016-26) 1.9kW (210-24100-16) V filter (for Cr) (215-22500-05)
*1 When using it as a point focus, combine a X-ray tube and a point focus head of following P/N.
1) X-ray tube (Cn target, 2.0kW, NF) P/N 210-24016-11
2) point focus head P/N 239-16047
*When using the polycapillary system, use LFF type.

Cooling Water Circulator

RKE1500B-V-G2-SP
(for 3kW X-ray tube)

With its built-in cooler, the Cooling Water Circulator cools the
X-ray tube and X-ray generator by circulating cooled, pure or
clean water. The unit is recommended when no tap water is
available or the available water is of poor quality.

Main specifications
Power supply Three phase 200V ±10% 10A (RKE1500B-V-G2-SP)
Ambient temperature 5 to 40°C
Cooling capacity 5.3kw/h (50/60Hz) (RKE1500B-V-G2-SP) RKE1500B-V-G2-SP

Part Description P/N

RKE1500B-V-G2-SP 239-15049-02

XRD-6100
X-ray Diffractometer 25
 Accessories

Special Accessories :Absolutely required :Required :Required depending on objective

Iron and steel related

Non-ferrous metals, precious metals

Machinery, automotive, shipbuilding, welding

Brickmaking, ceramics

Cement and glass

Electrical, electronic materials

Foodstuffs, textiles, paper, pulp

Chemicals, catalysts. dyes, paints

Medical, dental materials, biological organisms

Natural resources, energy

Construction, engineering

Environment, industrial waste

Environment (Asbestos)
Analysis Objective Par t De scrip tio n Part Number

1 BG reduction, especially iron samples Counter Monochromator CM-3121 P/N 215-22360-02

ICDD PDF2 file (CD-ROM) P/N 239-50002-11,12

2 Qualitative analysis PDF2 Search
PDF2 Search S/W (DDVIEW) P/N 239-50002-21,22

3 Qualitative analysis PDF4 Search ICDD PDF4 + (CD-ROM) P/N 239-50015-01,02

* Rotational Sample Stage RS-1001 Note1 P/N 215-21766-01

4 General purpose quantitative analysis
Auto 5 position sample changer ASC-1001 Note1,2 P/N 215-23175-02

* Residual austenite quantitation S/W P/N 215-00430-92

5 Residual austenite quantitation
*Rotational Sample Stage RS-1001 Note1 P/N 215-21766-01

Environmental quantitative
*Environmental Quantitative Analysis Stage RS-2001 Note1 P/N 215-21767-01
6 (Filter holders Zn, with S/W)
analysis system
Filter holder Al (ø 25mm) P/N 215-23765-92

7 Multiple peak separation Profile fitting S/W P/N 215-00423-92

8 Precise lattice constant determination Precise lattice constant determination S/W P/N 215-00424-92

9 Crystal structure analysis Rietveld analysis, RIETAN software P/N 215-00433-92

10 Crystallite size / lattice stress Crystallite Size / Lattice Stress S/W P/N 215-00426-92

11 Degree of crystallization Degree of Crystallization S/W P/N 215-00427-92

12 Heating analysis Sample Heating Attachment HA-1001 P/N 215-23000-01

* Thin Film Analysis Attachment THA-1101 Note1

13 Thin film analysis P/N 215-21765-01
(stage, monochromator, suction pump)

Rotational Sample Stage RS-1001 1) P/N 215-21766-01

14 Fiber degree of orientation analysis
Fiber Sample Attachment (with S/W) P/N 215-22624
Note1
15 Residual stress analysis *Stress Analysis Attachment SA-1101 P/N 215-21769-01
(with Cr X-ray tube, S/W)

16 Micro Measurement with microscope Micro-Measuring Attachment MDA-1101 P/N 215-23180-93

17 Micro Measurement with CCD camera Micro-Measuring Attachment MDA-1201 P/N 215-23180-94

18 Auto Mapping (stress, quantitative analysis) R-θstage for large sample

19 Strong pallarel beam X-ray source poly-capirally unit PCL-1002 P/N 215-24375-91
1) Can be used together with general purpose rotational sample stage
Note1: Please arrange optional additional ASSY(P/N215-23705) with optional driver ASSY(P/N215-21764) at the same time when you arrange the accessories of the asterisk.
Moreover, even when two or more accessories are arranged, the option driver ASSY and optional additional ASSY can use it combinedly with one unit.
Note2: When I arrange an auto 5 position sample changer, please arrange two optional additional ASSY.

26
Specifications

XR D - 61 0 0
XRD-6100
Item 2kW Type 3kW Type High-resolution type
Type Cu, NF type Cu, BF type Cu, LFF type
X-ray tube Focus 1.0 x 10mm 2.0 x 12mm 0.4 x 12mm
Max. output 2kW 2.7kW 2.2kW
Max. output 3kW
Output stability ±0.01% (for 10% power fluctuations)
Max. tube voltage 60kV
Max. tube current 80mA
X-ray generator Voltage step width 1kV
Current step width 1mA
Overload limit setting Setting changeable with tube type
X-ray tube protection Against undervoltage, overload, overvoltage, overcurrent and/or failure of water supply
Safety mechanisms Door interlock mechanism (X-ray can be generated only after the door is closed) Emergency stop
Type Vertical type
Scanning radius 185mm
Min. step angle 0.002° (2θ) 0.001° (θ)
Angle reproducibility ±0.001° (2θ)
Scanning angle range -6° to 163° (2θ), -180° to 180°(θ)
Scanning system θ/2θ linkage mode, θ, 2θ independent mode
Goniometer Operation mode
Continuous scan measurement, step scan measurement, calibration, positioning,
θ axis oscillation (when using 2θ continuous scan or step scan)
Max. speed 1000°/minute (2θ)
Scanning speed 0.1° to 50°/min (2θ), 0.05° to 25°/min (θ)
Divergence slit (DS) 0.5°, 1°, 2°, 0.05mm
Scattering (SS) 0.5°, 1°, 2°
Receiving slit (RS) 0.15mm, 0.3mm
Dimensions W900 x D700 x H1600
Casing Leakage X-rays Less than 2.5μSv/h (at maxium output)

X- ra y Tu b e s an d X -ray Filters
Focus Type Type NF Type BF Type LFF
Focus Size 1 x 10mm 2 x 12mm 0.4 x 12mm
X-Ray Filter
Tube voltage, current 60kV, 50mA 60kV, 60mA 60kV, 55mA
Target X-ray Tube Maximum Load & P/N
Cu 2.0kW (239-24014-01)*2 2.7kW (210-24016-21) 2.2kW (210-24100-11) Part Description P/N
Co 1.8kW (062-40003-04) 2.7kW (210-24016-24) 1.8kW (210-24100-14) Ni filter (for Cu) (215-22500-02)
Fe 1.5kW (062-40003-05) 2.2kW (210-24016-25) 1.0kW (210-24100-15) Fe filter (for Co) (215-22500-03)
Cr 2.0kW (062-40003-06) 2.7kW (210-24016-26) 1.9kW (210-24100-16) V filter (for Cr) (215-22500-05)
*2 When using it as a point focus, combine a X-ray tube and a point focus head of following P/N.
1) X-ray tube (Cu target, 2.0kW, NF) P/N 210-24016-11
2) Point focus head P/N 239-16047
*When using the polycapillary system, use LFF type.

D e te cto rs
OneSight Wide-Range High-Speed Detector Scintillation Detector
(FD-1001 1D High-Speed Detector P/N 215-24320-91) SC-1003 P/N 215-24385-92
0-159˚ : Radius of Goniometer 275 mm Scintillator Na I
Scan range 0-150˚ : Radius of Goniometer 200 mm Scaler Preset time: 0.1 to 1000s; digits: 7
0-148˚ : Radius of Goniometer 185 mm 500 to 1200 V high-voltage power supply,
Operation mode Step-scan mode, One-shot mode HV/PHA
baseline and window auto-controlled
Sensor Reverse biased pn-junction array
Detection principle Single photon counting
Weight 280 g
Active area 64 × 8 mm
Number of channels 1280
Width of one channel 50 μm

D a ta Pro ce ssin g U n it
C o mp u ter IBM PC/AT compatible
OS Windows 7
C o n tro lled elements Goniometer, X-ray generation, tube voltage, tube current, detector high voltage, PHA, scaler

B asic d ata proc es s ing Smoothing, BG elimination, Kα1-Kα2 separation, peak searching, peak width at half height, integrated intensity,
systematic error correction, internal/external standard correction, operations between data, graphic display
Qu alita tive analys is Database (library) creation, automatic library search (ICDD PDF2/PDF4 options) calibration curve generation, quantitation calculation
Qu an tit ative analys is Calibration curve generation, quantitative analysis
*Windows and Windows 7 are registered trademarks of Microsoft Corporation (USA) in the United States and other countries.
*Additionally noted company names and product names are the trademarks or registered trademarks of the respective companies.
*The notationsTM and ® are not used in this document.

XRD-6100
X-ray Diffractometer 27
 XRD-6100
Installation Requirements

I n sta llatio n Site

This instrument uses X-rays for measurement and analysis. Accordingly, Cooling water supplied to instrument
before installing the instrument, be sure to consult local regulations
When cooling water supplied to the instrument becomes dirty due to
regarding measures associated with X-ray generation, and comply with
piping corrosion, etc., this causes clogging of the X-ray tube filters.
all necessary regulatory procedures.
Cooling water should be supplied using the following conditions.
Power requirements Temperature 23°C ± 5°C
For main unit Single phase 200/220V ±10% Humidity 60% ± 5%
2kW type: 30A Avoid any sudden changes in temperature, which might cause
3kW type: 50A condensation to form on the surfaces of internal parts.
Heat generated from the instrument is approximately 860cal/h. When
Data processing unit Single phase 100V 10% ±10A the cooling water circulator is installed in the same room, this is
Ground Independent, at least 100 Ω resistance increased by 3.2kW/h for the 2kW X-ray tube and 5.3kW/h for the
3kW X-ray tube.
Installation site environment Flow rate At least 4.0L/min
The following ambient temperature and humidity are required.
Water pressure 3 to 5kgf/cm2
Temperature 23°C ± 5°C Water quality pH6 to 8, hardness less than 80ppm
Humidity 60% ± 5% Particulates Less than 0.1mm
Heat generated from the instrument is approximately 1kW/h. When the Supply water port diameter 12.7mmø
cooling water circulator is installed in the same room, this is increased Drain water port Natural drainage
by 3.2kW/h and 5.3kW/h for the 2kW and 3kW types, respectively.
If the flow rate is lower than 4.0L/mim, the safety circuit for protection
of the X-ray tube is active, disabling the X-ray generation circuit. When
minimum conditions of the flow rate can not be fulfilled, use the
cooling water circulator, available as an option.

3500
200 to
600

Water supply, Circuit board

drain port
Cooling
water Single phase 200V 50A
circulator Single phase 100V 10A
(option)

The device can XRD-6100 Data

also be placed main unit processing
700

next to the wall. H 1600 unit

430kg 70kg
Do not release interlocks, and do not
remove panels and windows to avoid
the risk of exposure to X-radiation.

3000
900 650

Size and weight

XRD-6100 W900 x D700 x H1600 430kg
Data processing unit W650 x D700 x H1600 70kg
with rack case

Unit: mm
Entrance width at least 800

XRD-6100 Floor Plan Example

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