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Demo SEM

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5 views2 pages

Demo SEM

Uploaded by

geetayelge
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Demonstration of SEM

Aim
Observation of surface morphology of solid samples.
Principle
The scanning electron microscope (SEM) images a sample surface by raster scanning over it with a
high-energy beam of electrons. The electrons interact with the atoms comprising the sample to
produce signals that contain information about surface topography, composition and other properties,
such as electrical conductivity. A Field Emission Source (FES), also called a cold cathode field
emitter, does not heat the filament. The emission is reached by placing the filament in a huge
electrical potential gradient. The FES is usually a wire of Tungsten fashioned into a sharp point.
Electrons are liberated from a field emission source and accelerated in a high electrical field gradient.
Within the high vacuum column these so-called primary electrons are focussed and deflected by
electronic lenses to produce a narrow scan beam that bombards the object. As a result, secondary
electrons are emitted from each spot on the object. The angle and velocity of these secondary
electrons relates to the surface structure of the object. A detector catches the secondary electrons and
produces an electronic signal. This signal is amplified and transformed to a video scan-image that can
be seen on a monitor or to a digital image that can be saved and processed further. The acceleration
voltage between cathode and anode is commonly in the order of magnitude of 0.5 to 30 kV, and the
apparatus requires an extreme vacuum (10–6- 10–8 Pa) in the column of the microscope.

Figure 2: Structure of field emission electron


gun.

Figure 1: Components and structure of Scanning Electron Microscope SEM

Components of SEM

 Electron Source: Field Emission Gun


 Electromagnetic and/or Electrostatic Lenses
 Vacuum chamber
 Sample chamber and stage
 Computer
 Detectors: Secondary Electron Detector (SE); Backscatter Detector; Diffracted Backscatter
Detector (EBSD); X-ray Detector (EDS)

Sample Requirements for FESEM

 Sample should be dry & non-magnetic.


 Powder/metal/thin-film samples are accepted for analysis.
 Biological & liquid samples should be fixed and coated/drop-casted on a conducting substrate
and dried well before the observation.
 Quantity of sample required (powder samples only): minimum 10 mg.

Sample Preparation

Biological specimen is chemically fixed, dehydrated through an acetone or ethanol series and then air-
dried or dried at the critical point (a method used to minimize specimen distortion due to drying
tensions). For dry samples, this process is not necessary. The samples are mounted on a stub of metal
with adhesive, coated with 40 ‐ 60 nm of metal such as gold/silver/palladium and then observed in the
SEM for analysis.

Observation

SEM can only be used to see the samples of size up to 10 nm. Same parameters and magnification

Figure 3: SEM image of silver nanoparticles.

need to use to compare different the images.

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