User Guide

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Table of Contents

Introduction ........................................................................................................................................... 4
1.1 Overview .............................................................................................................................................. 4
1.2 Supported Files ..................................................................................................................................... 6
1.3 User Preferences ................................................................................................................................... 7
Starting an Analysis ................................................................................................................................ 7
Inspection Parameters ............................................................................................................................ 9
1.4 Views .................................................................................................................................................. 10
Summary ..................................................................................................................................................................... 10
Measurement.............................................................................................................................................................. 10
3D Views...................................................................................................................................................................... 11
A-Scan ......................................................................................................................................................................... 14
B/D-Scan...................................................................................................................................................................... 14
C-Scan .......................................................................................................................................................................... 15
S-Scan .......................................................................................................................................................................... 15
L-Scan .......................................................................................................................................................................... 16
TOFD ............................................................................................................................................................................ 17
Top and End ............................................................................................................................................................ 17

1.5 Inspection ........................................................................................................................................... 19

1.6 Part..................................................................................................................................................... 19
1.7 Probe .................................................................................................................................................. 20
1.8 Wedge ................................................................................................................................................ 20
1.9 Scan .................................................................................................................................................... 21
1.10 Import Custom Focal Laws ................................................................................................................... 23
1.11 Geometry............................................................................................................................................ 24
1.12 Encoder .............................................................................................................................................. 25
1.13 Measurements .................................................................................................................................... 25
Analyzing Inspection Data .................................................................................................................... 26
1.14 Customizing Layouts ............................................................................................................................ 26
Adding and Removing Views .................................................................................................................................. 28
Swapping Views ...................................................................................................................................................... 29
Rotating a View ....................................................................................................................................................... 30
Using the Zoom ....................................................................................................................................................... 31
Using Color Palettes ................................................................................................................................................ 32
Extracting a View .................................................................................................................................................... 36
Adding Sheets ......................................................................................................................................................... 38

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1.15 Using Cursors and Gates ...................................................................................................................... 39

Adding and Deleting Cursors or Gates .................................................................................................................... 40
Gate Synchronization.............................................................................................................................................. 41
Linking Cursors ........................................................................................................................................................ 42
Making Measurements with Gates......................................................................................................................... 43
Preparing TOFD Data for Analysis ........................................................................................................................... 46

1.16 Software Gain ..................................................................................................................................... 50

1.17 Using the Part Overlay......................................................................................................................... 51
1.18 Changing View and Cursor Properties .................................................................................................. 53
Changing the View Orientation .............................................................................................................................. 53
Changing Palette Color, Position, and Amplitude................................................................................................... 54
Displaying Rulers and Grids .................................................................................................................................... 54
Using Overlay Parameters ...................................................................................................................................... 56
Displaying Measurements in the View ................................................................................................................... 57
Changing the Extracted View Display ..................................................................................................................... 57
Changing the 3D View Display ................................................................................................................................ 58
Probe view (bottom-right) ...................................................................................................................................... 59
Annotation Table .................................................................................................................................................... 60

1.19 Total Focusing Method (TFM) Properties ............................................................................................. 64

Propagation Modes ................................................................................................................................................ 65
Rejection Level ........................................................................................................................................................ 66
First and Last Scan Frame ....................................................................................................................................... 66
Region of Interest (Scan/ROI Parameters) .............................................................................................................. 66
TFMi ........................................................................................................................................................................ 70

Analysing Multiple Files ........................................................................................................................ 70

Creating Reports................................................................................................................................... 70
Exporting Data as a CSV File ................................................................................................................. 72
Creating Configuration Files for an Instrument ...................................................................................... 73
Probes and Wedges ................................................................................................................................................ 75
Scans ....................................................................................................................................................................... 76
Part and Geometry ................................................................................................................................................. 78
Configuration summary .......................................................................................................................................... 78

Help and Support .................................................................................................................................. 79

1.20 Help .................................................................................................................................................... 79
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Introduction
This manual provides information for the UTStudio+ analysis software. It has been designed so that
people with good knowledge of ultrasonic testing can easily use the software to help them assess
inspection data, make reports, and create configurations to be used with Sonatest inspection
instruments.
NOTE: Procedures presented in this document use commands from menus to explain how to perform tasks; however,
most of these same commands are available on the toolbar and in contextual menus when you right-click in a view.

1.1 Overview
This section presents the main components of UTStudio+.

Tree Contextual view

Menu Bar
Toolbar properties

View Panes

Annotations Section
(if enabled)

Menu bar

The menu bar provides access to all software functions such as opening files, interacting with the
application, and displaying help documentation.

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Toolbar

The toolbar provides quick access to software functions commonly used. These same functions are
available through the menus. Different buttons are available depending on the type of view selected.

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34

Add vertical Delete

1 New file 12 23 Measure 34
splitter Annotation

2 Open file 13 Delete area 24 Overlay

Keep aspect
3 Recent files 14 Properties 25
ratio

4 Save file 15 Annotations 26 Zoom in

Import
5 reference A- 16 Help 27 Zoom out
scan

6 Load Law File 17 3D options 28 Rotate

7 Create report 18 Rulers 29 Add cursor

Toggle units
8 19 Palette position 30 Delete cursor
(mm/in.)

Toggle
9 20 Palette election 31 Link to
background

Color palette Synchronise

10 21 32 Unlink
editor Palette

Add
11 horizontal 22 Depth/Amplitude 33 Add annotation
splitter

Tree

The Tree is one of the most important component of UTStudio+. The Tree provides access to inspection
data, hardware settings, and views. The available information depends on the inspection settings. Some
parameters can be modified to help with the analysis. Each item from the Views tab can be dragged
and dropped in an empty view pane.
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This is a dockable window that can be floated anywhere on screen or, if you use two monitors, you can
move the Tree on one monitor and UTStudio+ on the other. Once floated, the Tree window can be
resized.

View panes

The view panes allow you to display a variety of information, such as summary of inspection
information, inspection data, part geometry, and probe position on the part, provided that all these
parameters were configured properly in the inspection configuration. You can also create a list of
measurements that are of particular interest. All these elements can be dragged and dropped from the
Views and Measurements tabs of the Tree directly in an empty pane.

The slider at the bottom of some views allows you to move through the inspection. You can move the
slider manually or use the arrows on the left to see the inspection frame by frame. You can also click
the play button to continuously play the inspection recording.

View Properties

A view window must be selected inside each sheet. Hence, its view properties expose all its parameters.

Annotation Section

All annotations measurement content is inside this window. This window is enabled by the annotation
toolbar button.

1.2 Supported Files

This section presents the file types supported by UTStudio+.

NOTE: UTStudio+ versions support Prisma and Veo+ Veo3 series only. The UTStudio 3.X will always support former Veo
16:64 and 16:128. UTStudio 3 and UTStudio+ can coexist on the same computer.

Two types of Sonatest files are supported: configuration (*.utcfg) and data (*.utdata).

Configuration

The configuration files contain all the information defining the probe, the wedge, the part geometry,
and the specific ultrasonic settings.

Data

The data files contain all the data collected during an inspection including the inspection configuration
and the acquisition layout.

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1.3 User Preferences

Preferences for the interface, color palettes, and annotations are set in the Preferences dialog box.
These will be the default settings that will apply when starting UTStudio+. To open the Preferences
dialog box, on the Edit menu, click Preferences.

Figure 1-3 The Preference Dialog Box

Starting an Analysis
Data analysis starts by opening a data file (*.utdata) generated by a Sonatest instrument. For the
purpose of this presentation, we are using example data files provided when installing UTStudio+.

To open an analysis session:

1 Start UTStudio+.
2 On the File menu, click Open File.
File examples are stored in My Documents> My UTStudio Files> Examples.

Figure 2-1 The File menu

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3 In the Open File dialog box, in the File name list, select a data file and click Open.
The Tree appears on the left-hand side of the main window.

Figure 2-2 The main window with the tree

4 In the Tree area, click the Acquisition Layout and drag it to the view pane.

Figure 2-3 Dragging an inspection layout to a view pane

The layout used during acquisition is displayed.

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Figure 2-4 The acquisition layout

After you have worked on a data file, you can save your work by saving the .utdata file. If you do not
want to alter the original data, on the File menu, click Save As and, in the Save File dialog box, in the
File name box, type the name of the new file; otherwise, click the Save File command.

Inspection Parameters
Inspection parameters are found in the Tree which opens at the left of the UTStudio+ main window
when you open a file (*.utdata or *.utcfg). The Tree includes information about the views, the
inspection, the probes and wedges, the part, and the scan.
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1.4 Views
At the top of the Tree you have the Views tab. Each element can be dragged and dropped to an empty
view. You find a summary of inspection information, scan plans, and a variety of layouts whether user
defined or standard. The suggested content is customized for each data file and, therefore, will vary
according to the inspection.

Figure 3-1 Elements available on the Views tab

Summary
Open an empty view and drag and drop the Summary into that view. The summary contains a choice
of inspection information such as the inspection date, encoder type, probe and wedge types, and notes.
Yellow messages indicate elements that you should consider and red messages indicate errors in the
configuration.

The information can be copied in order to be pasted in another format; make a right-click in the view
and, in the contextual menu, click Select All and then Copy.

Figure 3-2 Summary view

Measurement
Measurement is an empty view that is used to drag and drop a selection of measurements from the
Measurements tab of the Tree (refer to "Measurements" on page 19).

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Figure 3-3 The empty Measurements view (left), one measurement added in the view (right)

3D Views
The 3D view allows you to see the scan plan of the part with its probes and wedges, provided these
parameters have been clearly defined before the inspection. The figure below presents an overall view
but you can also view separate elements by clicking and dragging specific probes (P1, P2, P3, etc.) or
Scans (S1, S2, S3, etc.) in a view pane.

Figure 3-4 3D overall scan plan

As required by many codes, the position of the probe relative to the weld needs to be known and
recorded. The legend box in the topright corner of the view presents the elements of the scan plan.
Depending on the scan plans, different elements will appear in the legend.
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Figure 3-5 The scan plan legend

The Part Datum, identified by a yellow dot, is an arbitrary point on the part under test. All ultrasonic
data is referenced to the part datum or the wedge reference.

Figure 3-6 Part datum

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The wedge reference (Wedge Ref), identified by a red dot, is different for each type of wedge or probe.
Probe Type Reference Drawing
Phased Array Without a wedge Reference point on the
center of the probe active
surface

With a flat wedge Reference point on the

center of the wedge contact
surface

With an angular Reference point on the

wedge center of the wedge front
edge

Conventional With or without a Reference point on the

wedge beam exit point

In a multi-probe scenario, the probes and wedges are defined relative to a group reference (scanner)
identified by a green dot (Grp Ref) on the plan view. This reference point can be positioned anywhere,
but a good practice is to position it aligned with the weld center line and the probe/wedge center.
The focalization point (Focus Pt) represents the highest concentration of energy for each focal law in
yellow Xs.
The scan axis is shown by a gray arrow.
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A-Scan
The A-scan view is probably the most important ultrasound view. For most cases, it is the source of all
other views such as B/D-scan, C-scan, and S-scan. The Cartesian Extractor cursor and Gates are available
for this view.

Figure 3-7 A-scan view with the Cartesian Extractor cursor and two Gates

B/D-Scan
The B-scan is a view generated from the extractor angle of the S-scan or L-scan. If the extractor angle is
changed, a different B-scan will be created. Depending on your probe displacement, the B-scan may be
considered as a D-scan. In an encoded inspection, there will be no confusion between the B-scan and
D-scan since the system knows the direction of the probe.
Cursors available for this view are Cartesian Extractor, Cartesian, and Freehand.

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Figure 3-8 B-scan with the Cartesian Extractor cursor and one Cartesian cursor

The first slider (Index Frame) at the bottom of the view allows you to position the Cartesian Extractor
cursor along the scan axis.
The second slider (FL) allows you to navigate through focal laws one by one.

C-Scan
The C-scan is a view generated from a 0 degree linear scan. It can be described as a two-dimensional
graphical representation displaying the gate information obtained relating to signal features in a top,
plan view of the part under test. The specificity of the C-scan is that gates are used to extract
information from the A-scan (for example the amplitude of a specific echo).

A variety of information from gates may be displayed for different evaluation methods:

• Signal amplitude
• Depth (calibrated from the time base using material velocity)
• Depth in a gate relative to the depth in another gate (thickness of material, depth of bottom
surface relative to top surface)
• Signal amplitude in a gate relative to the signal amplitude in another gate (comparison of echo
amplitude) Cursors available for this view are Cartesian Extractor, Cartesian, and Freehand.

Figure 3-9 C-scan with the Cartesian Extractor cursor and one Cartesian cursor

S-Scan
The S-scan view is a powerful tool available when using phased array probes. More generally, it is the
accumulation of color-coded A-scan lines or “pie” sections, placed side-by-side since they represent A-
scans acquired at different consecutive angles. Cartesian Extractor, Angular, Cartesian, Freehand, and
Extractor Box cursors are available for this view. The S-scan is also called azimuthal or sectorial.
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Figure 3-10 S-scan with an Angular cursor (green arrow), the Cartesian Extractor cursor and one Cartesian
cursor

The information displayed at the top right corner of the view (Vel, WDly, Sen, and TCG) indicates, in
green, what was included in the calibration before the inspection: velocity, wedge delay, sensitivity, and
time-corrected-gain curve. However, if the calibration was done manually, the parameters included in
the calibration will not be indicated.

L-Scan
L-scan means linear scan. It presents, on screen, a parallelogram view at a specific angle. The L-scan
view is composed of multiple A-scans at the same transmitted angle, but from different exit points. The
exit point variation is due to the fact that a small group of active elements is moved along the array
performing an electronic raster scan. The L-scan is also know as an electronic scan (E-scan).

Cursors available for this view are: Cartesian Extractor, Cartesian, Angular, Freehand, and Extractor Box.

Figure 3-11 L-scan with one Cartesian cursor and the Cartesian Extractor cursor

The information displayed at the top right corner of the view (Vel, WDly, Sen, and TCG) indicates, in
green, what was included in the calibration before the inspection: velocity, wedge delay, sensitivity, and
time-corrected-gain curve. However, if the calibration was done manually, the parameters included in
the calibration will not be indicated.

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TOFD
The TOFD view generally displays data using a gray-scale B-scan or D-scan. Cartesian Extractor,
Cartesian, Hyperbolic, and Freehand cursors are available for this view.

Figure 3-12 TOFD view with the Cartesian Extractor cursor and one Hyperbolic cursors

Top and End

Top and End views are extracted from L-scans and S-scans (refer to "Extracting a View" on page 29).
They are essentially projected views from a top or an end perspective of the part. Cursors available for
these views are: Cartesian Extractor, Cartesian, and Freehand.

Figure 3-13 Top and End views extracted from the S-scan on the bottom
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At the bottom of these views, there is an additional display feature, which is a level slider that acts as a
gate threshold. It is used to isolate indications and remove unwanted noises. For views that were
extracted from the same cursor, the sliders are linked.

Figure 3-14 Different display levels in Top and End views

1.4.10.1 TFM Top and End View Properties

Under Top and End view properties, there is an extra option under the Data Extraction section for TFM
scans. When available, the user can increase the extraction resolution from the “Low” default value to
up to a “High” setting.

The Extraction Resolution parameter, when set to:

• Low setting = Renders a 0.25 mm resolution

• Medium setting = Renders a 0.1 mm resolution
• High setting = Renders a 0.05 mm resolution
• IMPORTANT
• Set to 0.05 mm “Medium” resolution, the End view does not interpolate or add data from the TFM
scan. The extraction resolution cannot enhance the End view rendering when the TFM has a poor
resolution.

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1.5 Inspection
The Inspection tab in the Tree offers information about the inspection provided that this information
has been set in the inspection file.
Hardware settings cannot be altered during analysis.

Figure 3-15 The Inspection tab

Under Report Settings there is a list of parameters to add to the report. To add or remove a parameter,
select or clear the check box next to it. If some parameters have not been set in the inspection file they
will not be available for the report.

1.6 Part
The Part tab in the Tree offers information about the part that has been inspected, its material
properties (such as ultrasound velocities), the weld description, and the calibration block used, provided
that this information has been set in the inspection file. Most of these parameters cannot be altered
during analysis.

Figure 3-16 The Part tab

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1.7 Probe
The Probe tab in the Tree offers information about the probe and its elements, provided that this
information has been set in the inspection file. These parameters cannot be altered during analysis.
For inspections made using more than one probe, click the left and right arrows at the top of the tab to
move from probe to probe.

Figure 3-17 The Probe tab

1.8 Wedge
The Wedge tab in the Tree offers information about the wedge provided that this information has been
set in the inspection file. These parameters cannot be altered during analysis.
For each probe, a wedge is created; therefore, probe 1 is automatically linked with wedge 1, probe 2
with wedge 2, etc.
For inspection made using more than one wedge, click the left and right arrows at the top of the tab to
move from wedge to wedge.
When no wedge has been defined, the Wedge Type parameter will be defined as None.

Figure 3-18 The Wedge tab

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1.9 Scan
The Scan tab in the Tree offers information about the scans, provided that this information has been
set in the inspection file. Some parameters on this tab can be changed during analysis
For inspections made using more than one scan, click the left and right arrows at the top of the tab to
move from scan to scan. According to the type of scan, the list of parameters differs.

Figure 3-19 The Scan tab

The following describes the parameters that can be modified during the analysis.

Gain

Software Gain: Controls additional gain. This parameter can be changed to add or subtract gain in a
*.utdata file after acquisition.

Reference Amplitude: The desired reference amplitude used as default reference for AWS, TCG, and
Sensitivity Wizards. All measurements in decibels (dB) are referenced to this parameter.

Acquisition Area

The Travel Mode parameter allows the analyst to select the way the time-base is interpreted (half for
pulse echo and full for pitch-catch or tandem) for the Angular cursor in the L-scan and S-scan, and the
for the measurement ruler in the A-scans.
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Figure 3-20 The Travel Mode list of parameters

Element Step Adjustment

Tree View (Scan tab/Focusing sub-section/Element Step)

This feature allows the user to change the element increment for a linear scan in between each pulsed
group.

As example:

The incremental algorithm for the by default value who is normally 1 Element per step and 8 actives
elements goes like:

EL1 To EL8, EL2 to EL9, EL3 to EL10...

Beam #n to beam #n+1 is spaced by the pitch of the PA probe.

Let’s use a step of 3 now the algorithm would go like:

EL1 To EL8, EL4 to EL11, EL7 to EL14...

Beam #n to beam #n+1 is spaced by the 3 times the pitch of the PA probe.

It is often used as a way of reducing the file size, hence increased the speed of the inspection. The probe
active resolution axis can now be changed as the encoder axis. Thus, adjusting these two parameters
could make a another squared “datum”.

Also, an high resolution and a low-resolution scan could be generated by the setup up simultaneously
for customer report purpose:

High resolution for report documentation, analysis and measurements.

Low resolution for manageable .csv file

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DR stands for Double Resolution which is the 0.5 times the pitch of the probe in its active aperture axis.

1.10 Import Custom Focal Laws

It is possible to use CIVA and BeamTool law files for each PA scan. The use of custom focal law files (CFL)
can extend the scan sequences made by our Sonatest software. For example, it would be possible to
generate a linear spread beam set (also known as compound S-scan). Please note that you cannot use
any law beyond the hardware pulsing limitation. A 32-element aperture CFL will not work on a
Veo+/Veo3 16:128.

To load a CFL Civa file, please check the following parameters:

1. Pick the Focal Law Type under the Inspection tab.

a.
2. The Civa type requires the user to load .pte and .law files from the Load Law File button ( ).
a. The Civa .pte file must have the same name as its .law file.
3. Set the scan sequence from the CIVA file

a.
4. Import the Sequence. (One .law Civa file may contain lots of sequence)

a.
5. The CFL is enabled, then the summary view should contain:

Scan
└ Scan 1 ( Sectorial PE, Custom focal file in use)
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To load a CFL ESBeamTool file, please check the following parameters:

1. Pick the Focal Law Type under the Inspection tab.

a.
2. Load a ESBT .law file

a.
3. If the file is valid, you can import that ESBT sequence, and it will apply the delays and exit points
automatically. ( temporarily gets back to Sonatest focal laws)

a.

Note: The BeamTool .law must be at the version 5.2 format.

Note: 3D views do not display CFL delays and 3D ray tracings.

1.11 Geometry
The Geometry tab in the Tree offers information about the relative position of each probe/wedge on
the part and the encoding area, provided that this information has been set in the inspection file. These
parameters cannot be altered during analysis. All probes appear in the list; click the arrow on the left of
a probe to expand its list of geometry parameters.

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Figure 3-21 The Geometry tab

1.12 Encoder
The Encoder tab in the Tree offers information about the encoder itself and the encoding setup,
provided that this information has been set in the inspection file. Under Statistics, you find the data file
size and the encoding speed. These parameters cannot be altered during analysis.

Figure 3-22 The Encoder tab

1.13 Measurements
The Measurement tab in the Tree provides all measurement information for all cursors, views, and
sheets.
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Figure 3-23 The Measurement tab

Analyzing Inspection Data

Inspection results analysis starts by opening a data file (*.utdata). UTStudio+ offers a wide range of tools
to help the analyst reach a decision in flaw evaluation. This chapter presents the UTStudio+ tools and
how to use them.

1.14 Customizing Layouts

The layout is the way you set your view panes in a sheet. Views can be moved around, removed, and
added. In a data file, you have a wide selection of default layouts to choose from:

• The Acquisition Layout is the one used by the operator at the time of inspection. It is
recorded with the data.
• The Standard Layouts have been prepared by Sonatest.
• The User Layouts are the ones that have been created and saved by analysts. These layouts
are available no matter what files you are working with (*.utdata and *.utcfg), if the scan type is
compatible. Unlike the other layouts, these can be added, renamed, or deleted.
On the Views tab of the Tree, click a layout and drag and drop it on the sheet.

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Figure 4-1 Dragging a layout in a sheet

Moving the mouse cursor over a layout displays a small representation of the layout. In this case, an S-
scan and an A-scan.

The sheet now contains the layout with the inspection data.

Figure 4-2 S-scan (left) and A-scan (right)

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Adding and Removing Views

Any type of view can be added to a layout as long as it is compatible with the scan.

To add a view:
1 In the sheet, select a view to split in half.
2 On the Layout menu click either Add Horizontal Splitter or Add Vertical Splitter.

Figure 4-3 Splitting a view to add an empty view pane

3 In the Tree, click the Views tab, select a layout and drag and drop it in the new empty view. In
this example a TOFD view.

Figure 4-4 Adding a TOFD view

The TOFD data is displayed in the pane.

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Figure 4-5 The TOFD view in the new pane

To remove a view:
1 In the sheet, select the view to remove.
2 On the Layout menu, click Delete Area.

Figure 4-6 Deleting a view

Only the data is removed, the view pane

remains.
3 To remove the view pane repeat step 2
NOTE: You can also delete the data as well as the pane, by clicking the X at the top right corner of the view twice. The first
click deletes the data, the second one deletes the pane.

Swapping Views
You can change the order of the views in the sheet for any view.

To swap views:
Click the title bar of the view you want to move and drag and drop it to the view you want swap it
with.
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Figure 4-7 Swapping the A-scan and the S-scan

Rotating a View
All views can be rotated (except for the 3D plan view). The rotation tool differs according to the type of
view you are working on.

To rotate a view:
1 In the sheet, select a view to rotate.
2 On the View menu, point to Rotate and click either Horizontal Left, Horizontal Right, Vertical
Top, or Vertical Bottom.

Figure 4-8 The View menu

The view is automatically rotated.

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Figure 4-9 The original A-scan (left) and the rotated one (right)

To rotate a 3D view:
Click in the view and drag the cursor to move the view.

Figure 4-10 The original 3D (left) and the rotated one (right)

NOTE: The plan (Top View) cannot be rotated (lower left corner).

Using the Zoom

A zoom function is available for the following views: B/D-scan, Top, End, TOFD, and all 3D views. The
fastest way to zoom in and out all these views is to click the view and use the mouse wheel.
There are two other ways to zoom views, except for the 3D views which only accept the mouse wheel
action.
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Zoom
buttons

Zoom/Scroll cursors

Figure 4-11 Zoom tools

NOTE: The content of a view can be moved (panned) inside its pane by holding the Ctrl key of the keyboard, and clicking
and dragging the view.

Using Color Palettes

Many color palettes are available to characterize signal amplitude in any color-coded view. There are
the standard palettes already defined in UTStudio+ and there are user-defined palettes.

1.14.5.1 Standard Palettes

The default palettes are selected in the Preferences dialog box, refer to "User Preferences" on
page 3 for more information. The choice of palettes is found in the Properties window, on the
View Properties tab. To display the Properties window, click the View menu and select
Properties.

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Figure 4-12 The View menu

Next to View Palette, click the value to open the palette list.

Figure 4-13 The list of color palettes

Palette
Regular Inverted
name
3-level
Threshold
ABF
Amplitude
Aeronautic

Cubic Law

Fire Ice

Grayscale

Rainbow

Spectrum

TOFD
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Thermal

Inverted palettes are very useful when working with depth-type views.

All palettes can be shrunk and moved along the palette bar to isolate indications and remove
unwanted noises.

In the following figure, we are displaying the same scan with different palette ranges.

Figure 4-14 The palette over the full range (left) and the palette over a smaller range (right)

1.14.5.2 Custom Palettes

Any existing palette can be modified according to your needs.

To modify a palette:

1 On the toolbar, click the color palette editor button ( ).

2 In the Palette Editor dialog box, in the Palette Name list, select a palette to modify or
select New Palette.

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Figure 4-15 The Palette Editor dialog box

3 Click and drag the color handles at the top of the palette to move them or drag them out of
the dialog box to remove them.

Figure 4-16 Cursor moved (left) and removed (right)

The handle position can be adjusted with more precision by double-clicking the number at
the top of the handle.

Figure 4-17 The Enter the position dialog box

4 On the left select the type of data you want displayed by the palette.
No Data: This will be the color to show that no data was recorded; for example, when a scan
is going too fast.

No IFT: For L-scans only; this will be the fill color of the IFT.

Filtered: This will be the color of data according to the threshold used.

The color of these parameters is changed by clicking the color box next to it. It is important
to use colors very different from the ones defined in your palette.
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Figure 4-18 The Select Color dialog box

5 In the Scale list, select one of the two available scales.

6 Click the Save button.
7 In the Save Palette As dialog box, in the File name box, type the name of the new palette
and click Save.

• IMPORTANT
Use the default path to save your palettes. UTStudio+ automatically adds your palettes
to the list of palettes from this folder.

Figure 4-19 The Save Palette As dialog box

Extracting a View
The standard layouts offer many view options; however, you can add more views by extracting them
from existing ones. You can get A-scans, B-scans, Top, and End views from an S-scan or an L-scan.
You can also get a C-scan from an A-scan; however that A-scan must have been extracted from an L-
scan.
Extracted views are opened either in a new view pane, which you can create by splitting an existing view,
or in an existing view which will be deleted and replaced with the new one.

You can extract a view from a cursor position or from a new cursor. If you want to use an existing cursor
to extract a view, select the cursor first and then make a right-click on that cursor to open the contextual

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menu from which you will choose the view type desired. If you want to use a new cursor, make a right-
click anywhere in the view to open the contextual menu from which you will choose the view type
desired. A new cursor will be created in the view used for extraction. For example, in an S-scan, if you
extract a Top view, a Rectangle Box cursor appears in the S-scan; if you extract an A-scan, a dotted
angular cursor appears.
NOTE: The extracted view can replace an existing view or be displayed in an empty one. If you do not want to lose any
views, prepare an empty view area before extracting a view (refer to "Adding and Removing Views" on page page 21).

To extract a view:
1 Click in the view from which you want to extract a new view.
2 On the contextual menu, point to either Extract From new cursor or Extract From current
cursor and, in the list, select the view type you want to extract.
The mouse cursor takes the shape of the selected view icon.

Figure 4-20 The list of views you can extract from a new cursor

3 Click in the destination view to display the new view.

The extractor (the cursor from which the view was extracted) will now be the master of the new
view. This means that moving the extractor cursor will change the slave view.
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Figure 4-21 The A-scan extracted from the L-scan and the merged C-scan (bottom view) extracted from the A-
scan

NOTE: The A-scan gate positions appear on the extraction cursor.

Figure 4-22 The location of the two gates

Adding Sheets
You can keep different layouts on separate sheets. There are three ways to add a new sheet: from the
Layout menu, from the contextual menu (making a right click on the sheet bar), and by clicking the
green plus sign at the top right of the view pane display.

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Figure 4-23 Adding a sheet

The sheet can be renamed by clicking the Rename this sheet command on the Layout menu.
To save this new layout, click the Save sheet command on the Layout menu. The Save Layout dialog
box opens.

Figure 4-24 The Save Layout dialog box

Once you fill the text boxes and click OK, the layout then becomes available in the User Layouts list in
the Tree.

Figure 4-25 The Views tab

1.15 Using Cursors and Gates

Many cursors can be used in views. According to the type of view you have selected, different cursors
will be available.
The following table presents the gate and cursors.

Type Description Drawing

Cartesian The Cartesian Extractor is a default cursor that is linked in all extracted views to allow the you
Extractor to visualize any frame in a given view.
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Cartesian The Cartesian cursor is used to make surface distance and depth measurements in L­scans, S-
scans and A-scans. It is also called the cross-hair cursor

Angular The Angular cursor is used to make sound path measurements in L-scans and S-scans.

Gate The Gates are used to make flank and peak measurements in A-scans. When the gate is
triggered by an echo, the peak amplitude level is displayed.
Freehand The Freehand cursor allows you to make a length measurement of any indication or a distance
measurement between indications, horizontally, vertically, or at an angle. It can also be used to
mark and area of the part that cannot be created with the part geometry parameters. For
example, a part could present a cavity destined to accommodate another part. The cavity could
then be marked on the scan so that this section would easily be ignored during analysis.
Hyperbolic The Hyperbolic cursor is used to measure surface distance and depth in a TOFD view.

Extractor Box The Extractor Box is used to determine the area for the extraction of the Top and End views
from L-scans and S-scans.

Adding and Deleting Cursors or Gates

The list of available cursors is accessed through a contextual menu linked to the selected data view.

To add a cursor or a gate:

1 Make a right-click in the view for which you want to add a cursor.
2 In the contextual menu, point to Add Cursor and select a cursor from the list.

Figure 4-26 List of cursors from the contextual menu

To delete a cursor or a gate:

1 In a view, select the cursor you want to delete.
2 Make a right-click and, in the contextual menu, click Delete Cursor.
OR

Press the delete key on the computer keyboard.

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NOTE: You cannot delete a cursor from which a view is extracted from. If you want to delete a cursor that was used for
an extraction, you must first close the extracted view (refer to "Extracting a View" on page 29 for more information).

Figure 4-27 Unable to delete cursor message

Gate Synchronization
Tree View (Cursor tab (in Play mode, select Gate Cursor)/Measures sub-section/Gate Follow)

Under Gate Follow parameter, selecting the active gate on the A-scan view will give the user the choice
to synchronize the current gate to the previous gate number.

Note: G2 always follows G1 and this is the same for G3 that must follow G2.

-10 mm Trig Offset

Figure 1 The yellow gate 2 follows the red gate 1

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Trig Offset parameter is like a blanking function. This sets the time of flight distance between the
previous gate triggering point. Trigger can be set to Flank or Peak and the following gate will be set at
the time of flight corresponding to the trig offset parameter.

Linking Cursors
Two cursors can be linked together in two different views so that moving one cursor in one view will
update the linked cursor in the other view. You can also link a cursor in a view with another cursor in
more than one view; however, too many links will make it difficult to move the cursors.
You can only link cursors in views that come from the same data file.
You can link two Cartesian cursors to locate an indication from a view in another one. For example,
linking the Cartesian cursor in the S-scan with the one in the A-scan will link the surface distance and
depth measurements in the S-scan with the sound path measurement in the A-scan; linking them in an
A-scan and a B-scan will link the sound path measurements.
You can link an angular cursor in an S-scan with an A-scan, making the angular cursor the new extractor
for the A-scan.
You can link a gate in an A-scan with the Extractor Box in an L-scan or an S-scan. That gate then
determines the amplitude threshold used in the Top and End views that were extracted from the L-scan
or S-scan. What happens then is that the Top and End views will reject every indications that have an
amplitude lower than that of the A-scan gate.

Figure 4-28 Low amplitude threshold (left) and high amplitude threshold (right)

To link cursors:
1 In a view, click the cursor you want to link to another.
2 Make a right-click on the selected cursor and, on the contextual menu, click Link to.

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Figure 4-29 The cursor contextual menu

The mouse cursor changes to a chain link symbol.

3 In the other pane, click the cursor you want to link to the first one.

To unlink cursors:
Make a right-click on one of the linked cursors and, on the contextual menu, click Unlink.

Making Measurements with Gates

Gates in the A-scan provide the usual functions from standard flaw detectors; they are positioned at a
certain screen height (amplitude) and cover a certain range (start and stop point on the sound path
ruler).
The trigger can be set to determine which part of the signal is used for the depth measurement: the
leading flank or the peak. The leading flank measurement of a signal is often more accurate than the
peak. All gates in a view can be set with different triggers; they work independently. This setting is in the
Properties window (View> Properties), on the Cursor Properties tab, under Measures.

The triggered location is identified in the view by a small lozenge.

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Figure 4-30 Leading flank (left) and peak (right)

Gates can also be used to isolate depth or amplitude data in a C-scan extracted from the A-scan (refer
to "Extracting a View" on page 29).
The amplitude or depth data displayed in the C-scan can ignore all signals from the 0 position to a signal
in a gate or subtract all signals in a gate (which becomes the reference) from another gate (which
becomes the data source gate).

To isolate data from gates:

1 In the A-scan, set gate 1 on the desired signal.

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Figure 4-31 Absolute/Interface as reference

2 Click the C-scan view and, in the Properties window, under Data Extraction, select
Absolute/Interface as the Reference Gate.
3 Select G1 as the Data Gate.
The depth of the signal in gate 1 in reference to the absolute interface (part surface) is now
displayed in the C­scan.

OR

In the A-scan, set gate 1 on the first peak and gate 2 on the second one.
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Figure 4-32 Gate 1 as reference

4 Click the C-scan view and, in the Properties window, under Data Extraction, select G1 as the
Reference Gate.
5 Select G2 as the Data Gate.
The signal in gate 1 is subtracted from the signal in gate 2.
NOTE: This example has been done using the amplitude mode. You can switch to the depth mode by changing the Depth/
Amplitude parameter. This changes the color coding of the palette; instead of showing higher amplitudes with a stronger
color, deeper signals will be shown with the stronger color.

Preparing TOFD Data for Analysis

Before marking indications with Hyperbolic cursors, UTStudio+ offers tools to define the lateral wave
position and align all A-scans on a common lateral wave (straightening).
Once you have your TOFD and A-scan views in the layout, click the Scan tab of the Tree.

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Figure 4-33 TOFD parameters in the Tree

Start by adjusting the position of the lateral wave and the position of the reference backwall. These
offsets are used to adjust the TOFD depth ruler.
The lateral wave indicator is represented by a white line in the A-scan. It must be set on the first positive
echo of the surface signal.
The backwall indicator is represented by a blue line in the A-scan. It must be set on the first negative
echo of the lateral wave backwall signal.
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To adjust indicators of the lateral wave surface and backwall signals:

1 On the Scan tab of the Tree, use the arrows at the top of the tab to select the TOFD scan.

Figure 4-34 TOFD parameters on the TOFD scan tab

2 Next to the TOFD section, click the arrow to expand the list.
3 Next to Ruler Lateral Wave Position, click the parameter and change it until the white line in
the A-scan is in the correct position.

Figure 4-35 The first positive echo of the surface signal

The backwall position (blue line in the A-scan) adjusts automatically.

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Figure 4-36 The first negative echo of the lateral wave backwall signal

The next parameter you might want to adjust is the straightening of the surface signal. In some cases
this signal is very granular due to the speed of inspection.
NOTE: The position of the lateral wave and the position of the backwall must be adjusted first.

To straighten the surface signal:

1 In the Tree, on the Scan tab, under Straightening, select the Activate Straightening check
box. The Straightening Indicators parameter is automatically selected, a line appears on
top of the surface signal, and yellow straightening indicators appears at the top of the TOFD
view.
2 Next to Lateral Wave Trigger Tolerance, click the parameter to open it, and increase or
decrease the value in order adjust the width of the green line to encompass the surface
signal to straighten.

Figure 4-37 Without straightening (left) and with straightening (right)

The next step would be to use the Hyperbolic cursors and the measurement view to evaluate indication
signal in the TOFD view.

To make measurements in the TOFD view:

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1 Click the TOFD view and position the Hyperbolic cursor.

Figure 4-38 Measurements with Hyperbolic cursors

2 Add an empty view at the bottom of the TOFD view by using the Split function (refer to "Adding
and Removing Views" on page 21).
3 In the Tree, click the Views tab and drag and drop the Measurement view in the new empty
area.
4 In the Tree, click the Measurements tab and use the scroll bar to scroll through all
measurements.
5 Select a measurement of interest, and drag and drop it in the measurement view.
6 Repeat step 5 for all other measurements you want to add in the view.

1.16 Software Gain

You can change the gain setting for each scan separately.

To change the software gain:

1 In the Tree, click the Scan tab.

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Figure 4-39 Gain parameters in the Scan tab of the Tree

2 At the top of the tab, click the right or left arrow to select the desired scan.
3 Click the arrow at the left of the Gain category to expand the list.
4 Next to Software Gain, click the value to edit it.
Either use the arrows to change the value or, using the computer keyboard to
type a value. 5 Click anywhere in the main window or press the Enter key to accept
the change.

1.17 Using the Part Overlay

Provided that the part drawing has been included in the inspection file, you can display its contour on
L-scans, Sscans, and A-scans.

To display the part overlay:

1 Select the view in which you want to display the overlay and, on the View menu, click Overlay.
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Figure 4-40 S-scan with overlay (left) and part with weld in 3D (right)

To open the part contour in a view pane, in the Tree, on the Views tab, click Part and drag and
drop it in the view.

You can change the overlay display by changing the number of half skips (View> Properties).

Figure 4-41 The overlay for one skip

2 In the Properties window, in the View Properties tab, click the arrow on the left of the
Overlays category to expand the list.
3 Next to Half Skip Overlays, click the value to edit it.

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Either use the arrows to change the value or use the computer keyboard to type a value.

4 Click anywhere in the main window or press Enter to accept the change.

1.18 Changing View and Cursor Properties

Many view and cursor parameters can be changed by the user; these changes are made in the
Properties window. It is a dockable window that can be floated anywhere on screen or, if you use two
monitors, you can move it to the second monitor.

The parameters will change according to the type of view and type of cursor selected.
The Properties window can be opened from the View menu, the toolbar, or the contextual menu. It
opens on the right side of the main window by default.

Figure 4-42 Ways to open the Properties window

Changing the View Orientation

All views can be rotated (refer to "Rotating a View" on page 23). For all views except the 3D ones, the
Properties window offers a list of positions according to the selected view.

Figure 4-43 View orientations for A-scans, B/D-scans, C-scans, TOFD, Top, or End views

For 3D views, the rotation is done in the view by drag and drop.
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Changing Palette Color, Position, and Amplitude

The color palette for most views is customizable, except for A-scans and 3D views, which are not color-
coded.

1.18.2.1 B/D-scans, C-scans, S-scans, L-scans, Top, and End

For B/D-scans, C-scans, S-scans, L-scans, Top, and End views, the parameters that can be
modified for the amplitude color palette are the color gradient, the gradient position, and the
low and high amplitude levels.

Figure 4-44 Palette properties

The View Palette value opens a list of palettes to choose from (refer to "Using Color Palettes" on
page 26 for all the details).

The choice of palette position in the view includes: left, right, top, and bottom. You can hide the
palette by selecting None in the Palette Position list.

To change the amplitude level, click the value and either use the arrows to change the value or,
using the computer keyboard, type a value. Click anywhere in the main window or press the
Enter key to accept the change. In depth mode, the low and high thresholds are in mm or inch,
meaning that the starting color will be at the specified low depth and the end color will be at the
specified high depth.

TOFD
For TOFD views, the color palette is always black and white.

Displaying Rulers and Grids

All views can show different rulers. Grids are available for all of them except for TOFD and 3D views.

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Figure 4-45 Rulers and grids

Different rulers are available according to the type of view selected. The following table presents the
rulers available to the analyst for his measurements.
Scan Type Ruler Type Ruler
A-scan Amplitude Sound
path

B-scan Scan axis Sound

path

C-scan Top Scan axis

Surface distance

D-scan Index axis Sound

path

L-scan S-scan Surface distance

Depth

End Scan axis

Depth

TOFD Scan axis

Depth (non-linear)

When an encoder is used, the reference point on the surface distance ruler (C-scan, L-scan, S-scan, and
Top view) is identified by a red dot . The values on the ruler are expressed either from
the part reference or the wedge reference.

To select the reference you want to use, on the Tree, click the Measurement tab and, at the top of the
tab, open the Encoded Axis Reference list and click one of the options.
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NOTE: The example below shows the two rulers in a same layout for demonstration purposes only, the reference
selection will apply to all views from a data file, but not to all data files when working with multiple files (refer to chapter
5 "Analyzing Multiple Files").

Figure 4-46 Wedge reference (top) and part reference (bottom)

Using Overlay Parameters

The overlay parameters include the display of the part overlay (refer to "Using the Part Overlay" on page
43) but also the display of measurements for S-scans, L-scans and A-scans, and the envelope and TCG
for A-scans.

Figure 4-47 The A-scan overlay parameters

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Displaying Measurements in the View

Measurements from gates and cursors, in S-scans, L-scans and A-scans, can be displayed directly in the
view.
Open the Properties window (View> Properties) and, on the View Properties tab, click the arrow next
to Overlays to expand the list.
Select the check box next to Show Measures in View.

Figure 4-48 Measurements displayed at the top in the A-scan view

Measurements appearing in blue correspond to the gate selected in the view. Measurements include:
Symbol Description
Peak amplitude

Leading flank amplitude

Surface distance

Depth

Sound path

Changing the Extracted View Display

Views can be extracted from the inspection data (refer to "Extracting a View" on page 29). These
extracted views can be used to display depth, and amplitude or beam path.
Extracted A-scans and B/D-scans show either depth or path (changes the ruler), and C-scans, Top, and
End views show either depth or amplitude (changes the actual data extraction).
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Figure 4-49 Data Extraction parameter for an A-scan

Changing the 3D View Display

A lot of information can be added to the 3D views (refer to "3D Views" on page 8). The following example
shows the various 3D views available.

Figure 4-50 The View Properties tab for the overall 3D view (top left)

Overall view (top-left)

Displays a rotatable view of all active probes and scans with reference to the part datum.

Part view (top-right)

Shows the thickness of the part and the weld parameters if a weld is defined.

Top/Plan view (bottom-left)

Displays a bird's-eye view of the setup and the encoding direction.

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Probe view (bottom-right)

Shows the probe elements and the wedge. The wedge reference point is the red dot. For setups
including more that one probe, you can select a probe in the Probe list.

According to the selection you make in the Display Mode list, you will get a choice of probe or scan
display for the view.

For phased-array inspection you can view focal laws one by one for a given probe. To do so, you must
select Beam View as Display Mode, under Display set all parameters to Yes, under Beams set the
Beams parameter to Yes, and select a focal law number next to the Focal Law parameter.

The Beams parameters allows you to view drawings of the beams, the near field, and the scan area.
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Figure 4-51 Beams, near field, and scan area display

The 3D views Orientation parameter gives you a selection of camera positions; the default setting is
Custom.

Figure 4-52 The list of orientation positions

Annotation Table
The Annotation table allows the user to display precise measurements in a table at the bottom of the
main window. The window is dockable and can be floated over the main window. To open the

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Annotation window, on the Edit menu, click Annotations or, on the toolbar, click .

Figure 4-53 Opening the Annotation table

You can add an annotation to the table from the View menu, the contextual menu, or the toolbar.

Figure 4-54 Ways to add an annotation

Adding an annotation creates a box in the center of the selected view. That box can be moved around
and resized to contain the desired data. All measurements are displayed in the table for every
annotation.
To open the Annotations table, click the Annotations button in the toolbar.
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Figure 4-55 Two annotations from an L-scan view

You can delete an annotation by clicking the annotation and clicking the Delete Annotation button on
the toolbar or by making a right-click on the annotation and selecting the Delete annotation command
on the contextual menu.

The measurements appearing in the table are selected from the Annotations Columns dialog box;
which is opened by making a right-click on an annotation and clicking Annotations Columns on the
contextual menu or by clicking the Annotations Columns command on the Edit menu.

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Figure 4-56 The Annotations Columns dialog box

Lock
When selected, the annotation box is locked. It cannot be moved nor resized.

1.18.9.1 Name
The name of the annotation box. The number increases each time you add an annotation
regardless of the view or the sheet. Even if you delete an annotation the number keeps
incrementing from the last annotation added.

View
The view in which the annotation box is located.

1.18.9.2 Defect measurements

The values displayed in the Defect Measurements columns are defined in the Defect zone
dialog box which is opened by making a right-click in the Annotation table and clicking the Defect
Zone command on the contextual menu.
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Figure 4-57 The Defect zone dialog box

Bonding: Threshold used for the Bonding column.

Amplitude defect zone: Thresholds used to measure defects in Amplitude views. The threshold
can be in dB (relative to the peak) or in absolute %FSH amplitude.

Thickness defect zone: Thresholds used to measure defects in Depth views.

The Defect zone dialog box can be docked beside the Annotations table for easy access.

The information of the Annotations table can be included in the inspection report by selecting the
Annotation Info check box in the Create Report dialog box (refer to chapter 6 "Creating Reports").

1.19 Total Focusing Method (TFM) Properties

TFM is an analysis method that is used to keep track of the evolution of a defect through time. It is a
very precise measurement based on acquisitions made with the full matrix capture (FMC), which is a
technique that collects raw A-scan data by using one element as the transmitter and all the other
elements as receivers.
Precise measurements are achieved using the Free hand cursor. A-scans analysis for each TFM frame
and view also supports annotation cursors.

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Figure 4-58 Measuring with the Free hand cursor

When you open files that were made with an instrument that supports FMC inspections the TFM
Properties tab opens in the Properties window (View> Properties).

Figure 4-59 The TFM Properties tab

Propagation Modes
Propagation modes available are as follows: Longitudinal wave (L) and transversal wave (T) which
can be combined from two to four send-receive modes. For example, longitudinal to longitudinal
(L-L), longitudinal to transversal to longitudinal (L-T-L), transversal to transversal to transversal
to transversal (T-T-T-T).
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Rejection Level
This parameter offers a selection of values, in dB, that allows you to eliminate some A-scans from
the final analysis. This is useful when you want the analysis file kept to an acceptable minimum.

The higher the dB value, the more A-scans are used to produce the rendering. This value is
directly linked to the position of the gate in the A-scan and the maximum amplitude measured.

The TFM Rejection Level (TFM Properties tab of the Properties dialog box) enables a signal
processing which consists in rejecting (set to 0) samples with values below the rejection
threshold. This threshold is an absolute value applied on both phases of the signal, negative and
positive.

TFM is only used in linear mode, all values below the threshold are flattened (set to zero). The
rejection level is the maximum amplitude found in the image; therefore the rejection threshold
is:

-6 dB rejection = max. (kij)/2

-12 dB rejection = max. (kij)/4

 kij is the summation of the signal at every pixel. A 64-element probe with 1024 X 1024 pixels
holds over a million of pixels and one pixel represents 642 samples. These samples are summed
at one single point.

Every sample found under that threshold will take the 0 value. Consequently, the rejection level
may be lower or higher but proportional to the maximum (kij) found.

First and Last Scan Frame

The FMC frames (from the acquisition) are brought into the TFM while respecting the same
encoder positions.

The First Scan Frame parameter refers to the first frame determined by the scan axis start
position defined in the inspection instrument (Scan Start Pos). The Scan Start Pos item defines
the position from where the acquisition will be starting relative to the reference point.

The Last Scan Frame parameter refers to the last frame determined by the scan axis stop
position (Scan Stop Pos). The Scan Stop Pos item indicates the position, relative to the scan
and/or index start position, where the encoding area ends and data stops being acquired.

Region of Interest (Scan/ROI Parameters)

The Region of Interest (ROI) parameters set the TFM extraction box limit in the index (X) and
depth (Z) axes according to the wedge and probe reference along the scan and depth distance
respectively. This displays the 2D spatial region for which the image is processed and then
constructed from the collected FMC information. Please note that FMC data is destroyed in a TFM
scan. One frame is a 2D representation whereas a full scan axis representation is presented in
3D.

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Each ROI has its unique colour based on the position of the scan. There are up to 6 TFM scans;
this means the ROI’s tint has up to 6 colours.

Figure 4-60 Live TFM Scan ROI Parameters

1.19.4.1 ROI Area Parameters

The Minimum Index item allows users to define the position from where the ROI box starts in the index
axis.

Figure 4-61 Minimum index dimension

The Maximum Index allows users to define the position from where the ROI box ends in the index axis.
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Figure 4-62 Maximum Index Dimension

The Minimum Depth allows users to define the position from where the ROI box starts in the depth
axis.

Figure 5-62 Minimum Index Dimension

The Maximum Depth allows users to define the position from where the ROI box ends in the depth
axis.

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Figure 6-64 Maximum Depth Dimension

1.19.4.2 Resolution
The Index and Depth Resolution allow users to define the image resolution in the index axis.

The minimum resolution is 0.01 mm (0.00039 inch). Updating Index Resolution invalidates the
Amplitude Fidelity reading.
NOTE: The minimum is 0.01 mm, and the maximum is defined by the current configuration and the wavelength divided by 2.

IMPORTANT: Using very small resolution requires a lot of computing power. Such demanding TFM scan may significantly
reduce the frame rate.

1.19.4.3 SMC – Reception Aperture

The Reception Aperture item allows users to define the receiving elements aperture around the
pulsing element.
NOTE: Very useful to accelerate scan frame rate. For 64 elements array, this is especially useful for LL TFM mapping purpose.

IMPORTANT
Do not use SMC if the image degradation and baseline noise are too strong. A too low aperture SMC can
affect image fidelity and enlarge image artefacts. Please use with care.
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TFMi
As Veo3 option of TFM, when TFMi Mode is enabled, you can combine up to 4 propagation modes.

The TFMi algorithm merges in two different ways, by product or by a keep max algorithm. Under
Intermode Operation, selecting Product means:

• At a specific pixel location, this a Tx-Rx sample multiplication determined by all the propagation
modes.

Figure 6-65 TFMi parameters

Under Intermode Operation, selecting Keep Max means:

• At a specific pixel location, it uses a maximum function among all the TFM propagation modes.
o Maximum pixel height function of [TT, TTT, 5T, ---] = Maximum function [23%, 80%, 5%, --
-] = 80% pixel

The Baseline Correction parameter works with the Product Intermode Operation. It is an
amplitude (vertical) offset that increases the TFMi image sensitivity. 0% means no amplification and
50% is the maximum offset correction.
NOTE: TFMi is not compatible with Veo+.

Analysing Multiple Files

UTStudio+ offers the possibility to analyze many data files at the same time. In UTStudio+, open each
data file you want to analyze (File> Open File); the files open different UTStudio+ sessions.

Creating Reports
UTStudio+ allows you to create reports of the inspection and analysis in a PDF format. The elements to
add in the report are selected by clicking Create Report on the Report menu or selected on the Report
Settings section of the Inspection tab in the Tree.

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Figure 6-1 The Report menu (left) and Report Settings on the Inspection tab (right)

According to the report type you select (Expanded, Shortened, Standard), some information will be
included or left out.
The expanded report is spread over multiple pages and contains the complete information about the
inspection. The shortened one only generates the very first page of the report. The standard one
includes information about the inspection (customer, site, operator and qualification, procedure,
couplant), about the part, the probes and wedges and includes all the essential variable required by
most standards

To generate a report:
1 Select the layout from which you want to generate a report.
2 On the Report menu, click Create Report.
3 In the Create Report dialog box, type the report information, select the report type and all the
information you want displayed in it.
The selection you make in this dialog box are automatically applied on the Inspection tab in the
Tree and vice versa.
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Figure 6-2 The Create Report dialog box

4 Click the Create Report button.

5 In the Save report as dialog box, select a folder, type the report name in the File Name text
box, and click Save.

Exporting Data as a CSV File

CSV stands for comma separated values. CSV files are often used as an easy way to exchange a large
volume database between programs.
The exporting function is used to extract a table of thickness measurements in an Excel worksheet. The
table can be expressed in percentages (amplitude) or in millimeters (raw data).

To export data as a CSV file:

1 On the Report menu, click Export to CSV.

Figure 7-1 The Report menu

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2 In the UTStudio+ dialog box, select the type of data you want to export (Configuration details,
Data).

Figure 7-2 The UTStudio+ dialog box

3 In the Data Format list select Amplitude (percentages) or Raw Data (millimeters).
In the case of multiple scans, you can export all scans or select one in particular in the Scan list.

By default, the number of frames and focal laws (FL) includes all of them but you can select a
range of frames and focal laws.

Creating Configuration Files for an Instrument

Configurations can be created directly from a test instrument, but you can also create them in
UTStudio+.

Configurations can be entirely or partially prepared in UTStudio+ and finished from the instrument at a
later time.
There are three ways to create a new configuration:

• Start from scratch (File> New File); a dialog box offers a choice of Sonatest instruments for
which to prepare the configuration.
• Start with an existing configuration and save it under another name.
• Start with a data file (*.utdata) and save it under another name (File> Save As) with the *.utcfg
extension.
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Figure 8-1 The File menu and the Save File dialog box

The inspection parameters on each tab of the Tree are now unlocked and can be modified (refer to
"Inspection Parameters" on page 6).

IMPORTANT
Remember to save the configuration as your work progresses by clicking the Save File
command on the File menu.

Probes and wedges can be loaded from a list already defined in UTStudio+. Click the Load button and,
in the Load file dialog box, select a probe and click Open.

Figure 8-2 Loading a probe

NOTE: Ideally, when you create a configuration file, it would be a good work practice to make sure that probe, wedge,
scan, and encoder parameters are all set before loading it to the instrument in order to keep the operator from guessing

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which parameters should be modified. Inspection, part, and geometry parameters can be left to the operator’s judgment
according to the conditions on site.

While making changes in a configuration you may get an exclamation mark ( ) next to a parameter;
this is to indicate an inconsistency with related settings. The Summary view (Views tab of the Tree) will
show all detailed error messages.

Probes and Wedges

The maximum number of probes/wedges depends on the instrument.

If you are using an existing configuration, you can remove any unwanted probe by clicking the Delete
button.

If you have more than one probe, at the top of the Probe tab, click the arrows to go through the
probe list.

To add a probe:
1 On the Probe tab of the Tree, click the Add button.
2 In the Create new probe dialog box, click a probe name and click OK.

Figure 8-3 The Create new probe dialog box

3 Change the default values of the probe parameters as necessary.

For each probe you add, a corresponding wedge is created; therefore, probe 1 is
automatically linked with wedge 1, probe 2 with wedge 2, etc.

4 Click the Wedge tab and use the arrows at the top of the tab to select the corresponding
wedge.
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Figure 8-4 New wedge corresponding to probe number 1

5 In the Load file dialog box, select a wedge.

6 Change the default values of the wedge parameters as necessary.
Scans
You can prepare a series of scans to be performed concurrently, the maximum number of scans
depends on the instrument.

To add a scan:
1 In the Tree, click the Scan tab.
2 If you are using an existing configuration and you already have more than one scan, at the
top of the tab, click the arrows to go through the scan list.

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Figure 8-5 Navigation arrows at the top of the Scan tab

You can remove undesired scans by clicking the Delete button.

3 Click the Add button.

4 In the Create new scan dialog box, click a scan type and click OK.

Figure 8-6 The Create new scan dialog box

5 Change the default values of the scan parameters as necessary.

The list of probes and scans used in the configuration appears on the Views tab.

Figure 8-7 The list of probes and scans in the configuration

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To see a 3D view of a probe or a scan, drag and drop it in a view pane.

Part and Geometry

When changing parameters on the Part and Geometry tabs of the Tree, it is very useful to open
the overall and part 3D views. This allows you to see the changes to the scanning assembly as
you are making them. To do so, click the Views tab and drag and drop the Overall and Part in
view panes.

Figure 8-8 The Overall (top) and Part (bottom) views

Configuration summary
You can get a detailed summary of the configuration parameters in the Summary view. In the
Tree, click the Views tab, and drag and drop Summary in a view (create an empty view before if
you do not want to replace an existing one).

If there are elements of concern and/or errors in the configuration, colored lines will appear at
the top of the summary. Yellow messages indicate an element that you should consider and red
messages indicate an error in the configuration.

IMPORTANT
Errors must be resolved before trying to make acquisitions with the instrument because
any error will prevent the start of the acquisition.

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Figure 8-9 Consideration and error messages in the configuration Summary view

Help and Support

For information, you can consult the Help section of UTStudio+ or your local distributor for additional
support or training.

1.20 Help
For all parameters on each tab of the Tree and all parameters for each tab of the Properties window,
you can get information from the contextual help. Click a parameter and then, on the Help menu, click
Help.
The Help window is dockable and can be floated anywhere on screen or, if you use two monitors, it can
be floated in a separate monitor.
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Figure 9-1 Help docked at the top of the Tree (left) and floating over the layout (right)

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