PR and SM Doped NdRuO3
PR and SM Doped NdRuO3
Masashi Kawasaki
Department of Applied Physics and Quantum-Phase Electronics Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan
and Center for Emergent Matter Science (CEMS), RIKEN, Saitama 351-0198, Japan
We have investigated the magnetotransport properties for solid-solution thin films of Nd1−x Pr x RuO3 and
Nd1−y Smy RuO3 prepared through a solid phase epitaxy. It is found that the peculiar magnetotransport properties
that emerge in NdRuO3 are modified by the systematic control of the electron correlation strength through the
tuning of the bandwidth as well as in the total angular momentum J of rare earth magnetic ions. The transition
from metal to insulator is observed with increasing the concentration y of smaller Sm3+ in Nd1−y Smy RuO3 ,
while Nd1−x Pr x RuO3 is kept metallic with increasing x for larger Pr 3+ . An anomalous Hall effect is observed
for all the conducting samples with the maximum Hall angle appearing for NdRuO3 . The topological Hall effect
observed for NdRuO3 gradually diminishes with increasing the doping concentrations x and y.
DOI: 10.1103/PhysRevMaterials.8.074407
FIG. 1. (a) Schematics of the sample preparation method. Amorphous precursor film is deposited by pulsed laser deposition while
switching two targets, and then annealed ex situ to obtain a solid-solution epitaxial film with a thickness of ∼10 nm. (b) X-ray diffraction θ -2θ
scans for Nd1−x Pr x RuO3 and Nd1−y Smy RuO3 films taken around STO (002) peak (vertically shifted for clarity). Peaks from STO substrate and
films are marked with an asterisk and triangles, respectively. (c) Out-of-plane lattice spacing d001 deduced from the (002) peak position of the
films as a function of the nominal doping concentration x and y. Error bars are indicated for Sm-rich films (y 0.5) due to the ambiguity of
the peak positions.
the bandwidth and the average size of A-site ions has been deposited at a substrate temperature of 600 ◦ C and an oxygen
well studied for perovskite oxides. Therefore, the present pressure of 0.1 mTorr as shown in Fig. 1(a). The doping
solid-solution films based on NdRuO3 provide an ideal plat- concentration was controlled by the thickness ratio of two
form to study the bandwidth control effect on its electronic constituent layers. Here it is worth noting that the doping con-
state, and to gain a hint for the origin of the unconventional centrations x and y for Nd1−x Pr x RuO3 and Nd1−y Smy RuO3
AHE. We have revealed that the electronic state changes from in this work are nominal values. Because all three Ln-site
metal to insulator upon doping smaller Sm3+ reminiscent elements (Pr, Nd, Sm) are located close to each other on the
of the Mott transition. Negative magnetoresistance at lower periodic table, it is unable to determine the actual dopant
temperatures in NdRuO3 is enhanced (suppressed) with dop- levels of the films through conventional energy-dispersive
ing Sm (Pr) and eventually becomes positive for PrRuO3 . In x-ray spectroscopy technique. The total thicknesses of the
addition, we have observed the reduction of anomalous Hall films were designed to be ∼10 nm, which was confirmed
angle and the disappearance of the THE on both sides of with x-ray reflectivity measurements at a low-angle range.
heavy doping. The amorphous films were then annealed ex situ with RuO2
powder at 1000 ◦ C for 2 h under 160 ml/min N2 flow. The
annealing process promotes the epitaxial crystallization as
II. METHODS
well as the formation of a solid solution of the two constituent
Nd1−x Pr x RuO3 and Nd1−y Smy RuO3 thin films with x, y = compounds [Fig. 1(a)].
0, 0.25, 0.5, 0.75, and 1 were fabricated on SrTiO3 (STO)(001) Figure 1(b) summarizes the x-ray diffraction (XRD) pat-
substrates with a combination of pulsed laser deposition terns of the Nd1−x Pr x RuO3 and Nd1−y Smy RuO3 films. The
and ex situ annealing, following the procedure described in films are confirmed to have a (001) oriented single phase in a
Ref. [15]. Targets for LnRuO3 layers were prepared by solid- pseudocubic setting. The clear peak shift indicates that the
state reaction using Ln2 O3 (Ln = Nd or Sm) or Pr 6 O11 lattice constant systematically expands (shrinks) upon Pr (Sm)
and RuO2 powders as chemical agents. To avoid the defi- doping. Figure 1(c) shows the out-of-plane lattice spacing d001
ciency of Ru, these powders were mixed with molar ratio of deduced from the (002) peak position of the films. Note that
Ln:Ru = 1:1.25. The mixed powders were milled and calcined Sm-rich films (y 0.5) have large error bars, because their
for 24 h at 1150◦ C, forming pyrochlore Ln2 Ru2 O7 phases peak positions are adjacent to the peaks from STO substrate.
while excess Ru being remained as RuO2 . Before deposition, The deduced d001 is almost linear to the nominal doping
chemically etched STO substrates were annealed in situ at concentrations x and y, indicating uniformity of the dopants.
950 ◦ C under 10−5 Torr oxygen to obtain a clear step-terrace Coherently strained lattice structure of the films is con-
structure with single-unit-cell height [20]. A KrF excimer firmed by XRD reciprocal space mappings around STO (103)
laser (λ = 248 nm) with a pulse frequency of 5 Hz and a peak (see Supplemental Material, Fig. S1 [21], including
laser fluence of ∼2 J/cm2 was employed to ablate the targets. Refs. [15,22,23]).
By alternately ablating NdRuO3 and dopant (i.e., PrRuO3 Magnetotransport measurements were performed in a liq-
or SmRuO3 ) targets, amorphous multilayer films were first uid He cryostat with a 9 T superconducting magnet (Physical
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FIG. 3. (a) Magnetic field dependence of anomalous Hall resistivity (ρAHE ) at low temperatures for (a)–(e) Nd1−y Smy RuO3 and (f)–(j)
Nd1−x Pr x RuO3 thin films. The hump structure characteristic of the topological Hall effect (see text) is denoted by the triangles. Note that the
data in panels (e) and (f) are identical, and that data at 0.5 and 3 K are overlapped in panel (j).
revealed to exhibit THE below ∼1 K due to a noncoplanar regardless of the species of A and M [25,26]. The smaller f
spin texture realized during the magnetic transition, which is indicates the larger bond angle distortion, leading to the reduc-
indicated by the triangles in Figs. 3(e) and 3(f). The unique tion of one-electron bandwidth or electron conductivity [19].
hump structures at around B = 1 T originating from THE In the present system, with using the ionic size of Ln3+ and
seemingly remain for x, y 0.5 [Figs. 3(c)–3(h)] although the Ru3+ , f is calculated as 0.859 (SmRuO3 ), 0.870 (NdRuO3 ),
data are noisy in the Sm-doped side. In particular for Pr-rich and 0.875 (PrRuO3 ); thus the observed trend is reasonably un-
films (x = 0.75, 1) in Figs. 3(i)–3(j), THE is indiscernible. derstood in the framework of a bandwidth-control driven Mott
At the same time, the kink structure in MRR observed for transition.
NdRuO3 also disappears with increasing x and y (see Sup- As shown in Fig. 2(d), the T dependence of MRR for
plemental Material, Fig. S6 [21]), indicating that these two SmRuO3 and NdRuO3 contrasts with that of PrRuO3 es-
features are attributed to the same origin: plausibly a sort of pecially at lower temperatures. This tendency is further
magnetic transition. confirmed for the solid-solution films as shown in Fig. 4(b).
To quantitatively discuss the magnetotransport properties, MRR of NdRuO3 is negative at both 3 and 0.5 K while
the data are summarized in Fig. 4 for (a) ρxx , (b) MRR, the magnitude is larger at 0.5 K. With increasing Pr-doping
and (c) anomalous Hall angle (θAHE ≡ ρxx ρAHE /(ρxx 2 + concentration x, negative MRR is suppressed and turns into
ρAHE 2 )) at B = 9 T deduced from the transport results positive at both 3 and 0.5 K for PrRuO3 , the magnitude
(Figs. 2 and 3). Pr doping does not cause appreciable effects of which is ∼4%. In contrast, with increasing Sm-doping
on ρxx . Upon doping Sm, ρxx systematically increases both concentration y, negative MRR is enhanced, the magnitude
at 3 and 300 K; especially for SmRuO3 , ρxx (3 K) diverges of which reaches as much as −25% for y = 0.5 at 0.5 K.
and is one order of magnitude higher than Nd1−x Pr x RuO3 Considering that all the Ln ions employed in this work are
[Fig. 4(a)]. The lattice distortion of perovskite AMO3 is gov- magnetic with finite J, the observed positive MRR in PrRuO3
erned√by the tolerance factor f , which is defined as f = (rA + is unusual since negative MRR is expected due to the suppres-
rO )/ 2(rM + rO ). Here ri (i = A, M, or O) represents the ionic sion of magnetic scattering by the applied field. Indeed, in the
size of each element [24]. When f is close to 1, the cubic per- case of LnNiO3 thin films, negative MRR has been commonly
ovskite structure is realized. As rA or equivalently f decreases, observed for Ln = Sm [27], Nd [28], and Pr [29] at lower
the lattice structure distorts to an orthorhombic structure, to temperatures, where they are in antiferromagnetic insulating
which LnRuO3 belongs [10]. In the case of the orthorhombic phases. This positive MRR in PrRuO3 may be related to the
lattice, the M-O-M bond angle varies continuously with f , emergence of a topological semimetallic state, similar to that
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IV. CONCLUSION
In summary, we have clarified the magnetotransport prop-
erties of Nd1−x Pr x RuO3 and Nd1−y Smy RuO3 thin films. At
both ends of the solid solutions, PrRuO3 and SmRuO3 respec-
tively show metallic and insulating temperature dependences
of ρxx , implying the transition of the electronic ground state.
AHE is consistently observed across the entire range of dop-
ing concentrations, while the Hall angle decays and THE
disappears on both sides of the doping from NdRuO3 . Our
work on systematic chemical substitution on the novel mate-
rials platform of perovskite oxide with Ru3+ not only enables
the systematic tuning of transport properties but also paves the
way for investigating electronic phase transition and poten-
FIG. 4. (a) Longitudinal resistivity (ρxx ) at 3 K and 300 K under tially uncovering more exotic transport phenomena associated
B = 0 T, (b) MRR at 3 K and 0.5 K under B = 9 T, and (c) anomalous with magnetic topological materials.
Hall angle at 3 K and 0.5 K under B = 9 T, as a function of the
nominal doping concentrations x and y. On the top, total angular ACKNOWLEDGMENTS
momentum (J) and ionic radii of each Ln3+ are also shown. Note
that data at 0.5 and 3 K are overlapped for x = 1. This work was supported by JSPS Grants-in-Aid for Sci-
entific Research (S) No. JP22H04958, JSPS Grant-in-Aid
for Early-Career Scientists No. JP20K15168, the Mitsubishi
observed in SrIrO3 with large positive MRR [30], which orig- Foundation, the Izumi Science and Technology Foundation,
inates from the d 5 electronic configuration of Ir 4+ . Although the Tokuyama Science Foundation, and the Toyota Physical
PrRuO3 also possesses d 5 electronic configuration, further and Chemical Research Institute.
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