Adf4382a 3467945
Adf4382a 3467945
ADF4382A
Microwave Wideband Synthesizer with Integrated VCO
Rev. 0
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Data Sheet ADF4382A
TABLE OF CONTENTS
REVISION HISTORY
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Data Sheet ADF4382A
SPECIFICATIONS
3.3 V Supply Group 1 pins voltage (V3.3V_1) = 3.3 V Supply Group 2 pins voltage (V3.3V_2) = 3.15 V to 3.45 V, V5_VCO voltage (V5V_VCO) =
5V_CP voltage (V5V_CP) = 5V_CAL voltage (V5V_CAL) = 4.75 V to 5.25 V, all voltages are with respect to GND, and TA = −40°C to +105°C,
operating temperature range, unless otherwise noted.
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Data Sheet ADF4382A
SPECIFICATIONS
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Data Sheet ADF4382A
SPECIFICATIONS
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Data Sheet ADF4382A
SPECIFICATIONS
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Data Sheet ADF4382A
SPECIFICATIONS
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Data Sheet ADF4382A
SPECIFICATIONS
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Data Sheet ADF4382A
ABSOLUTE MAXIMUM RATINGS
TRANSISTOR COUNT
The transistor count for the ADF4382A is 4700 (bipolar) and
385,400 (CMOS).
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Data Sheet ADF4382A
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
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Data Sheet ADF4382A
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
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Data Sheet ADF4382A
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 7. Open-Loop VCO Phase Noise vs. Offset Frequency at Various Figure 10. Open-Loop VCO Phase Noise Across Frequency at 10 kHz Offset
Frequencies
Figure 11. Open-Loop VCO Phase Noise Across Frequency at 100 kHz Offset
Figure 8. Open-Loop VCO Phase Noise vs. Offset Frequency at
RFOUT = 20 GHz and Various Temperatures
Figure 12. Open-Loop VCO Phase Noise Across Frequency at 1 MHz Offset
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Data Sheet ADF4382A
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 13. Open-Loop VCO Phase Noise Across Frequency at 10 MHz Offset Figure 16. Closed-Loop Phase Noise vs. Offset Frequency at 20 GHz VCO
Frequency Across Temperatures
Figure 14. Open-Loop VCO Phase Noise Across Frequency at 100 MHz Offset
Figure 17. Closed-Loop Phase Noise vs. Offset Frequency at 20 GHz VCO
Frequency and Divided Output Frequency
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Data Sheet ADF4382A
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 19. 1 kHz to 100 MHz Integrated Jitter in Fractional Mode, Figure 22. Worst Case Integer Boundary Spurs (IBS) Level vs. Output
fPFD = 250 MHz Frequency with fPFD = 250 MHz
Figure 20. FOM, L1/f Integer Mode vs. Bleed Setting, fPFD = 500 MHz, Figure 23. PFD Spur vs. Output Frequency at Various Temperatures
RFOUT = 20 GHz
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Data Sheet ADF4382A
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 25. Harmonic Power vs. Fundamental Output Frequency Figure 28. Reference Sensitivity for DMA Buffer at Various Temperatures
Figure 26. Minimum Input Signal for REF_OK = 1 for Delayed Match Amplifier Figure 29. Reference Sensitivity for LNA Buffer at Various Temperatures
(DMA) Buffer at Various Temperatures
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Data Sheet ADF4382A
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 31. Reference Doubler Sensitivity for LNA Buffer at Various Figure 34. Propagation Delay vs. Output Frequency
Temperatures
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Data Sheet ADF4382A
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 37. Phase Shift vs. PHASE_ADJUSTMENT for Various Temperatures Figure 40. Differential Amplitude vs. Time at 20 GHz
Figure 38. Output Power when Buffer Powered Down (PD_RFOUTx = 1) vs.
Output Frequency
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Data Sheet ADF4382A
THEORY OF OPERATION
INTRODUCTION er, VCO, and external loop filter form a feedback loop to accurately
control the output frequency (see Figure 41). When operating
A PLL is a complex feedback system that can conceptually be con- in integer mode, the reference divider or reference doubler sets
sidered a frequency multiplier. The system multiplies the frequency the frequency resolution. When operating in fractional mode, the
input at REFP/REFN and outputs a higher frequency at RFOUTxP/ fractional-N divider sets the frequency resolution.
RFOUTxN. The PFD, charge pump, output divider, feedback divid-
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Data Sheet ADF4382A
THEORY OF OPERATION
OUTPUT FREQUENCY The REF_SEL bit (Register 0x030, Bit 5) can be set to either a
CML reference input or sine wave or slow slew-rate reference input.
When the loop is locked, the fVCO (in Hz) produced at the output of When REF_SEL is set to 0, the delay matched amplifier (DMA)
the VCO is determined by fREF and the O, R, and N values given by buffer is selected. The DMA is optimized for high slew rate signals,
the following equation. such as square waves or higher frequency and higher amplitude
fVCO = fREF × D×N×O sine waves. The DMA has a controlled propagation delay from the
R reference input to clock output, which eases time zero and over
where N is given by the following: temperature multichip clock alignment.
FRAC1WORD + FRAC2WORD When the REF_SEL bit is set to 1, the LNA is selected. The LNA
MOD2WORD
N = NINT + MOD1WORD
is optimized for low slew rate signals, such as lower frequency or
lower amplitude sine waves.
Here, fPFD is given by the following:
The REF_SEL bit must be set correctly to optimize the in-band
fREF × D
fPFD = phase noise performance and propagation delay, tPD. See Table 7
R
for recommended settings.
and fVCO can be alternatively expressed as follows: Table 7. REF_SEL Programming
fVCO = fPFD × N × O REF_SEL Sine Wave Slew Rate (V/µs) Square Wave Optimized tPD
0 ≥1000 Preferred Yes
The output frequency, fRFOUT, produced at the output of the output
divider is given by the following: 1 <1000 Not applicable Not applicable
fVCO To calculate the slew rate of a sine wave, use the following equa-
fRFOUT = O tion:
CIRCUIT DESCRIPTION Slew Rate = 2 × π × f × V
where:
Reference Input Buffer
f is the sine wave frequency.
The reference frequency of the PLL is applied differentially on V is the sine wave amplitude (in V peak)
the REFP and REFN pins. These high impedance inputs are self
The FILT_REF bit (Register 0x02F, Bit 6) controls the reference
biased and must be AC-coupled with 1 µF capacitors (see Figure
input LPF of the LNA and must be set only for sine wave signals
42 for a simplified schematic). Alternatively, the inputs can be used
less than 20 MHz to limit the wideband noise of the reference. The
single ended by applying the reference frequency at REFP and
FILT_REF bit must be set correctly to reach the normalized in-band
bypassing REFN to GND with a 1 µF capacitor.
phase noise floor (LNORM). Square wave inputs have FILT_REF set
to 0. Table 8 shows the recommended settings.
Table 8. FILT_REF Programming
FILT_REF Sine Wave fREF (MHz) Square Wave fREF
0 ≥20 All fREF
1 <20 Not applicable
The BST_REF bit (Register 0x02F, Bit 7) must be set based upon
the input signal level to prevent the LNA reference input buffer
from saturating. The BST_REF programming is the same whether
the input is a sine wave or a square wave. See Table 9 for
Figure 42. Reference Input Stage recommended settings.
Table 9. BST_REF Programming
A high quality signal must be applied to the REFP and REFN inputs
BST_REF Sine Wave fREF (dBM)
as these inputs provide the frequency reference to the entire PLL.
To achieve the in-band phase noise performance of the ADF4382A, 0 ≥8
apply a continuous wave signal or a square wave with a slew rate 1 <8
of at least 1000 V/µs. See the Reference Source Considerations
section for more information on reference input signal requirements
and interfacing.
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Data Sheet ADF4382A
THEORY OF OPERATION
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Data Sheet ADF4382A
THEORY OF OPERATION
Charge Pump Test Mode The 13-bit bit field BLEED_I (Register 0x01D, Bits[7:0] and Register
0x01E, Bits[4:0]) is used to select the bleed current. This bit field
When the EN_CPTEST bit (Register 0x02E, Bit 2) is set to 1, the consists of both a coarse bleed and a find bleed value. The 4 MSBs
CP_UP and CP_DOWN bits (Bit 1 and Bit 0, respectively) in the are used to calculate the coarse bleed current, and the 9 LSBs are
same register can be programmed to force a constant ICP source used to calculate the fine bleed current as shown in the following
or sink current, respectively, on the CP pin. The EN_CPTEST or equations.
CP_UP and CP_DOWN bits must be set to 0 to allow the loop to
lock. These bits can be used as an aid to debug PLL-related issues ICOARSE BLEED = COARSE_BLEED × 202 µA
during the hardware and software development phase of a project.
For normal operation, set EN_CPTEST, CP_UP, and CP_DOWN to IFINE BLEED = FINE_BLEED × 567 nA
0. ITOTAL BLEED = ICOARSE BLEED + IFINE BLEED
Table 12. Charge Pump Test Mode
The propagation delay of the output frequency corresponds to the
CP Pin ITOTAL BLEED as follows:
EN_CPTEST CP_UP CP_DOWN State Debug Test
ITOTAL BLEED
1 0 0 High-Z VCO open loop tPROPAGATION DELAY = ICP × tPFD
1 1 0 ~VV5_CP Charge pump output
voltage verification where:
1 0 1 ~GND Charge pump output ICOARSE BLEED is the coarse bleed current.
voltage verification COARSE_BLEED represents the 4 upper MSBs of the BLEED_I bit
0 0 0 Normal Not applicable field.
operation IFINE BLEED is the fine bleed current.
FINE_BLEED represents the lower 9 LSBs of the BLEED_I bit field.
Charge Pump Bleed Current Optimization ICP is the charge pump current value selected.
A small programmable constant charge pump current, known as Bleed Current Modes
bleed current, can be used to optimize the phase noise and frac-
tional spurious signals in fractional mode, which also changes the The ADF4382A spurious performance can be optimized by pro-
propagation delay from the REFP and REFN input pins to the gramming tBLEED setting based on the frequency of operation. The
RFOUTP and RFOUTN output pins. In fractional mode, after setting recommended tBLEED for the RFOUT frequency of operation for
the bleed current for best performance, the output can be shifted by each of the SDM modes are shown in Table 13.
using the phase word which is effectively used in the Σ-Δ modulator
To calculate the required BLEED_I setting required for a specific
(SDM). In integer mode, bleed current can be used to shift the
tBLEED with the bleed current refer to Charge Pump Bleed Current
output in both directions.
Optimization section.
To enable the bleed current, set the EN_BLEED bit to 1. When
the BLEED_POL bit is set to 1, a small constant source current is
forced onto the CP pin. When the register BLEED_POL is set to 0,
a small constant sink current is forced onto the CP pin.
Table 13. Bleed Setting vs. Frequency for Each SDM Mode
tBLEED (ps)
RFOUT SDM Mode 0 SDM Mode 4 SDM Mode 5
RFOUT ≥ 10 GHz 300 510 720
3.996 GHz ≤ RFOUT< 10 GHz 625 625 + (2/RFOUT) 900 + (1.7/RFOUT)
1.8 GHz ≤ RFOUT < 3.996 GHz 1000 1350 1400 + (4/RFOUT)
RFOUT < 1.8 GHz 3600 3600 3600 + (4/RFOUT)
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Data Sheet ADF4382A
THEORY OF OPERATION
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Data Sheet ADF4382A
THEORY OF OPERATION
window time (tLDWIN) for a valid lock condition with the LDWIN_PW
bit field (Register 0x02, Bits[7:5]).
Table 16. LDWIN_PW Programming
LDWIN_PW [7:5] Mode of Operation
000 Integer mode, 500 MHz maximum PFD with bleed ≤ 85 ps
001 Integer mode, 500 MHz maximum PFD with bleed > 85 ps
010 Fractional mode, 250 MHz maximum PFD, RFOUT ≥ 6.4 GHz Figure 48. Temperature Sensor
011 Fractional mode, 250 MHz maximum PFD, RFOUT ≥ 5 GHz
100 Fractional PLL, 200 MHz maximum PFD, RFOUT ≥ 4 GHz
Before an ADC measurement can occur, program the registers of
the ADF4382A as shown in Table 17.
101 Fractional PLL, 100 MHz maximum PFD, RFOUT ≥ 2 GHz
110 Fractional PLL, 50 MHz maximum PFD, RFOUT ≥ 1 GHz Table 17. ADC Register Setup
111 Fractional PLL, 40 MHz maximum PFD, RFOUT ≥ 800 MHz Bit Fields Value
EN_DRCLK, EN_DNCLK 1
MUXOUT ADC_ST_CNV, EN_ADC, 1
EN_ADC_CLK
The state of the MUXOUT pin is determined by the MUXOUT bits PD_ADC 0
(Register 0x02E, Bits[7:4]), which allow the user access to various
internal nodes. The MUXOUT pin and MUXOUT bits are commonly After the bits in Table 17 are programmed, start an ADC conver-
used as an additional lock status output or to debug PLL-related sion with a register write to Register 0x045. An ADC conversion
issues during the hardware and software development phase of a requires 17 clock cycles to complete. In Register 0x058, Bit 2,
project. The CMOS_OV bit (Register 0x03D, Bit 5) determines if the ADC_BUSY bit monitors the conversion status. During a con-
the logic high level for the MUXOUT pin, LKDET pin, SDO pin, and version, ADC_BUSY is set to 1, and when the conversion is
SDIO pin is 3.3 V or 1.8 V. complete, ADC_BUSY is set to 0. Measurements are recorded in
the CHIP_TEMP bit fields, Bits[8:0], in Register 0x05B and Register
0x05C.
Double Buffering
Double buffering refers to a main and subordinate configuration for
the bit fields shown in Table 18.
Only the subordinate bit fields control the actual state of the
ADF4382A. When double buffering is enabled for a bit field, the
serial interface only writes to the main bit field. The subordinate
bit field retains its previous value until a register write is sent to
Register 0x010. After writing to Register 0x010, all the main bit
fields are automatically loaded to their respective subordinate bit
fields. Writing to Register 0x010 also starts the autocalibration of
the VCO (see the Standard Power-Up and Initialization Sequence,
Figure 47. MUXOUT Automatic VCO Calibration section), which allows the user to up-
date several bit fields that change the output frequency of the
Temperature Sensor ADF4382A and starts a new VCO calibration on the same register
write. When double buffering is disabled, the SPI writes directly to
The temperature sensor is composed of an 8-bit ADC, which the subordinate bit field.
measures the proportional to absolute temperature (PTAT) voltage
with respect to the reference voltage (VREF) of a bandgap. The Table 18. Double Buffer Enabled Bit Fields
purpose of the temperature sensor is to measure changes in the Double Buffer Enabled Bits Double Buffered Bit Fields
die temperature and not the absolute junction temperature. The Not applicable, always enabled N_INT, R_DIV, EN_RDBLR, CP_I
maximum ADC clock frequency is 400 kHz. The ADC clock is
RFOUTODIV_DB RFOUT_DIV
generated from the RCLK.
DCLK_DIV_DB DCLK_DIV1
DEL_CTRL_DB INV_RFKOUT, BLEED_I, BLEED_POL
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Data Sheet ADF4382A
THEORY OF OPERATION
Serial Port
The SPI-compatible serial port provides control and monitoring
functionality. The CMOS_OV bit (Register 0x03D, Bit 5) determines
if the logic high level for the SDO and SDIO SPI output pins is 3.3
V or 1.8 V. The CMOS_OV bit also sets the output level for the
MUXOUT and LKDET pins.
The serial port can be programmed to support several different
configurations in Register 0x000 and Register 0x001.
The SDO_ACTIVE bit (Register 0x000, Bit 3) determines if the
Figure 51. VCO and Clock Output Divider
serial port is configured as a 3-wire or 4-wire serial interface (see
the timing diagrams in Figure 2, Figure 3 and Figure 4). The correct VCO core, band, and bias are chosen automatically by
performing a VCO calibration. After a VCO calibration is performed
for a specific frequency, the VCO core, band, and bias values
can be recorded for that particular device. These values can be
programmed manually later when the same device and frequency
are used, thereby avoiding the VCO calibration time.
Figure 49. Serial Interface, MSB First (LSB_FIRST = 0)
VCO Calibration
A VCO calibration is required to select the correct VCO core, band,
and bias settings for a specific VCO frequency. This procedure
assumes that the device is powered up, the desired reference
frequency is present on the REFP and REFN pins, and all other
Figure 50. Serial Interface, LSB First (LSB_FIRST = 1)
registers are programmed correctly. Figure 52 and Figure 53 are
The SPI register map can be programmed with single instructions, provided as visual aids for this procedure.
as shown in Figure 49 and Figure 50, or in streaming mode.
Streaming mode allows for efficient data transfer read or write
cycles to multiple registers. Streaming mode allows the user to
program a bit stream composed of one register address in the
instruction header and data for that register address, which is then
followed by data in subsequent register addresses.
VCO
The VCO core consists of two separate VCOs both of which uses Figure 52. VCO Calibration Dividers
512 overlapping bands, which allows the device to cover a wide
frequency range without large VCO tuning sensitivity (KVCO). The
output frequency can be further extended by utilizing the output
divider.
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Data Sheet ADF4382A
THEORY OF OPERATION
The following calibration timeout bit fields must be programmed for 2. Calculate and set the minimum required values for
autocalibration: CAL_VTUNE_TO, CAL_VCO_TO, and CAL_COUNT_TO as
per their corresponding formulas previously described in this
► CAL_VTUNE_TO: At the beginning of the calibration, VTUNE section.
is precharged to a nominal voltage, which is dependent on the
temperature of operation. CAL_VTUNE_TO sets the precharge 3. Set the N_INT, RFOUT_DIV, and R_DIV bits and the
time as follows: EN_RDBLR bit by programming Register 0x010 last. Any writes
CAL_VTUNE_TO = Ceil to Register 0x010 start the VCO autocalibration.
f PFD 4. Monitor the ADC_BUSY bit and FSM_BUSY bit (Register
Target VTUNE Calibration Timeout × DCLK_DIV1 0x058, Bit 2 and Bit 3, respectively). The calibration is finished
2
when ADC_BUSY transitions from high to low, followed with
The largest value capacitor in the loop filter directly affects the FSM_BUSY transitioning from high to low.
time taken to precharge to VTUNE. Refer to the Calibration Time 5. After the VCO calibration is complete, disable the calibra-
Performance Consideration section for more details. tion clocks to limit unwanted spurious content by setting
► CAL_COUNT_TO: CAL_COUNT_TO is the count calibration EN_DRCLK = EN_DNCLK = 0.
timeout. During autocalibration, there are nine band decisions
Table 19. DCLK_DIV1 and DCLK_MODE Setup
to be made to select the final band of operation for the selected
frequency. CAL_COUNT_TO is used to program the time taken fPFD (MHz) DCLK_DIV1 DCLK_MODE fDIV_RCLK (MHz)
for each band decision. This time affects the calibration accura- ≤11 0 0 fFPD
cy. Use the following equation to set the decision time of each >11 and ≤160 0 1 fFPD/2
band: >160 and ≤320 1 1 fPFD/4
CAL_COUNT_TO = Ceil
Target Band Decision Time × f PFD >320 2 1 fPFD/8
2DCLK_DIV1 × 16
Total Autocalibration Time
► CAL_VCO_TO: This bit field is used to set the time required for
frequency settling after each band decision. To se this time, use Use each of the calibration timeout values to calculate the total
the following equation: autocalibration time as follows:
CAL_VCO_TO = Ceil Total Autocalibration Time = Target VTUNE Calibration Timeout +
Target VCO Frequency Settling Timeout×f PFD (2/fDIV_RCLK) + (10 × VTUNE Setting Time) + VCAL Low Time
2DCLK_DIV1 where:
To perform a VCO calibration, set up the following several registers VTUNE Settling Time =
as outlined in the following procedure: Target VTUNE Calibration Timeout + (2 ×f DIV_RCLK
fPFD
1. Set DCLK_DIV1 and DCLK_MODE to the values listed in Table fDIV_RCLK =
2DCLK_DIV1 + DCLK_MODE
19 and record fDIV_RCLK for later use.
VCAL Low Time= f 2
DIV_RCLK
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Data Sheet ADF4382A
THEORY OF OPERATION
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Data Sheet ADF4382A
THEORY OF OPERATION
1. Set EN_BLEED = 1. signals with 1.8 V logic. This interface can be used in both bleed
2. Set EN_PHASE_RESYNC = 1. current and Σ-Δ mode phase adjustment. To enable the 2-wire
3. Set DEL_MODE = 0. interface, set EN_AUTO_ALIGN = 1.
4. Use PHASE_ADJUSTMENT to determine the amount by which DELSTR is an active high signal that is used to assert a phase
the phase is adjusted as follows: adjustment. The amount by which the phase is adjusted is set in
PHASE_ADJUSTMENT = PHASE_ADJUSTMENT. The phase is adjusted on the falling edge
Phase in Degrees ×511 f PFD of the signal.
250 µA × ICP × 360 × RFOUT
DELADJ is an active high signal that controls the direction of the
The maximum adjustment time that can achieved using the bleed adjustment. If the signal is set to 0 while DELSTR is high, the
current method is tRFOUT. RFOUT signal phase adjusts to earlier in time relative to the initial
phase. If the signal is set to 1 while DELSTR is high, the RF output
The bleed current applied can be read back from DEL_CNT. signal advances in time relative to the initial phase.
Σ-Δ Modulator Phase Adjustment
The Σ-Δ modulator can be used to adjust the phase of the RFOUT
signal by applying an offset value. The device must be used in
fractional mode to adjust the Σ-Δ modulator, which is the case
whether a fractional or integer frequency is used. Note that the
in-band figure of merit degrades by 2 dB as compared with using
integer mode. In addition, the maximum fPFD is then 250 MHz in
fractional mode, as compared to 625 MHz in integer mode.
Figure 54. DELSTR and DELADJ Timing Diagrams
An advantage of using fractional mode for adjusting the phase is
that the range is infinite, which means that each time a phase
RF Output Buffer
adjust is performed, the phase increments by the value stored in
the PHASE_ADJUSTMENT bits (Register 0x033, Bits[7:0]) without The low noise, differential output buffer in Figure 55 produces a
any limit to the number of times this can be done. differential output voltage. The output amplitude level and common-
mode voltage is programmable with the RFOUT1_OPWR (Register
Ensure that the following bit fields are programmed accordingly to
0x029, Bits[3:0]) and RFOUT2_OPWR (Register 0x029, Bits[7:4])
enable Σ-Δ phase adjustment:
bits. Each output can be either AC- or DC-coupled and terminated
1. Set EN_PHASE_RESYNC = 1. with 100 Ω differentially. If a single-ended output is desired, each
2. Set DEL_MODE = 1. side of the output must be individually AC-coupled and terminated
3. Use PHASE_ADJUSTMENT to determine the amount by which with 50 Ω. External inductors are required to achieve the highest
the phase is adjusted for the Σ-Δ modulator as follows: output power. A 1.4 nH, 0402 sized, pull-up inductor connected to
the RFOUTx 3.3 V supply (V3_RFOUTx) is recommended.
Phase in Degrees
PHASE_ADJUSTMENT = 360 ×212
PHASE_ADJ_POL selects the direction of adjustment.
PHASE_ADJ_POL = 0 is positive and PHASE_ADJ_POL = 1 is
negative. The PHASE_ADJUSTMENT value currently applied can
be read back from the CUM_PHASE_ADJ bits (Register 0x061,
Bits[7:0]). The maximum value is 8192 decimal. If this value is
exceeded, the value overflows and wraps around.
When the required phase offsets are known prior to initializing the
device, the PHASE_WORD bits can be used to program an initial
phase offset using the same PHASE_ADJUSTMENT formula in this
section.
Figure 55. Simplified RF Output Buffer Schematic
Phase Adjust Pins
The ADF4382A has a 2-wire digital interface bus protocol that
allows external control of the phase. This bus consists of DELSTR
(Pin 29) and DELADJ (Pin 28). The signals are CMOS output
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Data Sheet ADF4382A
THEORY OF OPERATION
Mute RF Output
The RFOUTxP and RFOUTxN pins can be muted by using the
MUTE_RFOUTx bit fields (Register 0x04, Bits[5:3] and Bits[2:0],
respectively.
Table 22. MUTE_RFOUTx, Bit 0 through Bit 7, Controls
MUTE_RFOUTx, Bits Function
0 Normal operation
1 Mute low and disable the emitter follower driver
2 Mute high and disable the emitter follower driver
3 Mute low and leave the emitter follower driver on
4 Mute low and disable the emitter follower driver during
calibration
5 Mute low and keep the emitter follower running during
calibration
6 Mute low and disable the emitter follower driver when
LOCKED = 0
7 Mute low and keep the emitter follower running when
LOCKED = 0
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Data Sheet ADF4382A
APPLICATIONS INFORMATION
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Data Sheet ADF4382A
APPLICATIONS INFORMATION
Standard Power-Up and Initialization Table 23. Manually Programmed VCO Calibration Settings
Sequence, Automatic VCO Calibration Bit Fields Value Description
The following standard power-up and initialization sequence is the O_VCO_DB 0x1 Manually calibrated values are dou-
recommended procedure to power up and program the ADF4382A: ble buffered by programming N_INT.
EN_AUTOCAL 0x0 Disables autocalibration.
1. Follow Step 1 through Step 5 in the Power-Up and Initialization
EN_DRCLK 0x0 Disables DIV_RCLK to the digital
Sequence section.
block
2. It is optional to monitor the status of the VCO calibration bits,
EN_DNCLK 0x0 Disables DIV_NCLK to the digital
ADC_BUSY and FSM_BUSY (Register 0x058, Bit 2 and Bit 1,
block.
respectively. A VCO calibration is completed when ADC_BUSY
transitions from high to low followed by FSM_BUSY transition- EN_ADC_CLK 0x0 Disables the ADC clock.
ing from high to low. O_VCO_CORE 0x1 Overrides the VCO core with value in
3. After the VCO calibration is complete, disable the VCO M_VCO_CORE.
calibration clocks by setting EN_DRCLK = EN_DNCLK = O_VCO_BAND 0x1 Overrides the VCO band with
EN_ADC_CLK = 0. Disabling the VCO calibration clocks re- M_VCO_BAND.
duces unwanted spurious content. O_VCO_BIAS 0x1 Overrides the VCO bias with
4. The PLL is locked when the lock detector sets the LKDET pin M_VCO_BIAS.
(Pin 27) and the LOCKED bit (Register 0x58, Bit 0) high. M_VCO_CORE Program with re- Selects the VCO core when
5. When changing the frequency, take the following steps: corded values O_VCO_CORE = 1.
a. Program only the modified registers in descending order. M_VCO_BAND Program with re- Selects the band within the core
corded values when O_VCO_BAND = 1.
b. Write to Register 0x010 to start a new VCO autocalibration
as the final step whether it is modified or not. M_VCO_BIAS Program with re- Selects the bias value used when
corded values O_VCO_BIAS = 1.
Fast Power-Up and Initialization, Manually
Loop Filter Design
Programmed VCO Calibration Settings
A stable loop filter design requires care in selecting the loop filter
For fast frequency hopping applications, much shorter lock time
components of the ADF4382A. It is recommended to download and
is required. The ADF4382A can be manually programmed with
install ADIsimPLL for loop filter design and simulation. ADIsimPLL
predetermined calibration values to decrease overall lock time by
has an integrated tutorial for first time users and a help manual for
bypassing VCO calibration. The calibration values are first obtained
more complex topics. There are also several ADIsimPLL training
by performing an autocalibration and reading back the correspond-
videos available on the ADIsimPLL web page. After a loop filter
ing band, core, and bias values for a given frequency. These
is designed and simulated, it is recommended to verify the new
values can then be manually programmed to the ADF4382A on
loop filter using the ADF4382A evaluation hardware. A full loop filter
subsequent device initializations. The values of the readbacks vary
design tutorial is beyond the scope of this data sheet. However,
with each device due to process variation.
some best practices are shown in the following list. ADIsimPLL aids
The following steps outline the procedure to perform a manual VCO in defining and simulating these parameters. Any significant change
calibration after initialization: to these items requires a new loop filter design.
1. Perform an autocalibration with the target frequency required. A stable loop filter must meet the following criteria:
2. Record the VCO_CORE and VCO_BAND. ► Loop filter phase margin > 45°
3. If VCO_CORE = 0, read the VCO bias value from ► Loop filter bandwidth < fPFD ÷ 10
VCO0_BIAS_RDBK. If VCO_CORE = 1, read the VCO bias
value from VCO1_BIAS_RDBK. The value read is used as the The desired loop filter bandwidth is determined by the following
M_VCO_BIAS value. features of the ADF4382A:
4. On subsequent power-up and initialization sequences, pro- ► ICP
gram the override (O_VCO_CORE, O_VCO_BAND, and
O_VCO_BIAS) and manual VCO bits (M_VCO_CORE, ► KVCO
M_VCO_BAND, and M_VCO_BIAS) as documented in Table ► PFD frequency
23. All other bit fields are programmed as normal. ► Reference input phase noise (see the Reference Phase Noise
5. Repeat the sequence for each target frequency. section).
► Trade-off between minimizing jitter or settling time
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To maintain typical LNORM performance, Table 7 provides criteria OUTPUT PHASE SYNCHRONIZATION OF
for selecting the optimal REF_SEL (Register 0x030, Bit 5) setting MULTIPLE ADF4382A DEVICES
based on the input reference signal type and amplitude
To synchronize multiple ADF4382A devices, use one of the follow-
OUTPUT PHASE NOISE CHARACTERISTICS ing two methods:
In-Band Output Phase Noise ► EZSyncTM method, which uses SPI register writes for synchroni-
zation
Use the following equations to calculate the in-band phase noise ► Timed synchronization method , which uses the SYNCx pin on
floor (LOUT) produced at fOUT: the ADF4382A for synchronization
LOUT =
fOUT
EZSync Method
LNORM + 10 × log10 fPFD + 20 × log10 fPFD
The EZSync synchronization method allows synchronization of the
or output phases of multiple devices without the need for a separate
synchronization signal, which has the advantage of reducing PCB
N layout complexity in systems using multiple ADF4382A devices.
LOUT = LNORM + 10 × log10 fPFD + 20 × log10 O
EZSync relies on sending a synchronization request through the
Output Phase Noise Due to 1/f Noise SPI by setting SW_SYNC = 1 instead of the SYNC pin. The
In-band phase noise at low offset frequencies can be influenced problems with sending the request over the SPI are that the SPI is
by the 1/f noise of the ADF4382A depending on the fPFD. Use the a slow protocol and does not have any time accuracy. Sending the
normalized in-band 1/f noise (L1/f) of −287 dBc/Hz to approximate request in the same reference period is also another challenge and
the output 1/f phase noise at a given frequency offset (fOFFSET) as even impossible for a huge number of ADF4382A devices used.
follows: With EZSync, these problems are solved by starting and stopping
the DC-coupled reference signal glitchlessly, which removes the
LOUT 1/f = L1/f + 20 × log10 fOUT − 10 × log10 setup and hold time concern with sending a request through the
fOFFSET SPI. The reference signals must stop and start accurately and with-
out any glitch or without any runt pulse. The clock generation and
Unlike the in-band noise floor (LOUT), the 1/f noise (LOUT(1/f)) does distribution devices from Analog Devices, such as the LTC6953, are
not change with fPFD and is not constant over offset frequency. For recommended as these devices are compatible with EZSync.
an example of in-band phase noise for fPFD equal to 100 MHz and The following steps outline the procedure to perform an EZSync
500 MHz for integer mode, see Figure 63. The total phase noise with two ADF4382A devices (assumes the LTC6953 is set up in
is the summation of LOUT and LOUT(1/f) calculated by the following SYNC mode):
formula:
1. Set up each ADF4382A as follows:
LOUT TOTAL =
LOUT /10 LOUT 1/f /10 a. Initialize the ADF4382A with the default initialization set-
10 × log10 10 + 10 tings.
b. Set TIMED_SYNC (Register 0x01E, Bit 5) = 1.
c. Set EN_REF_RST (Register 0x01E, Bit 6) = 1.
d. Set EN_PHASE_RESYNC (Register 0x01E, Bit 7) = 1.
e. Set SYNC_SEL (Register 0x053, Bit 5) = 1.
2. Verify that both ADF4382A devices are locked.
3. Synchronize both ADF4382A RFOUT signals:
a. On an oscilloscope, first verify that both ADF4382A parts
are not synchronized
b. Set SW_SYNC (Register 0x01F, Bit 7) = 1 on each
ADF4382A.
c. Set SSRQ (Address hOC, Bit 0) = 1 on LTC6953.
d. Set SW_SYNC = 0 on each ADF4382A.
e. Set SSRQ = 0 on LTC6953.
Figure 63. Theoretical In-Band Phase Noise, fOUT = 10 GHz
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Data Sheet ADF4382A
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4. On the oscilloscope, verify that the outputs from both d. Program to SYSREF pulse mode by setting SRQMD = 0
ADF4382A devices are synchronized (aside from cable mis- and SYSCT = 0.
match). 2. Set up the ADF4382A as follows:
a. Set TIMED_SYNC (Register 0x01E, Bit 5) = 1.
b. Set EN_REF_RST (Register 0x01E, Bit 6) = 1.
c. Set EN_PHASE_RESYNC (Register 0x01E, Bit 7) = 1.
d. Set SYNC_SEL (Register 0x053, Bit 5) = 0.
e. Set R_DIV (Register 0x020, Bits[5:0]) = 4.
f. Set EN_DRCLK (Register 0x02D, Bit 6) = 1.
Figure 64. EZSync Configuration
g. Verify that the ADF4382A devices are locked.
3. Synchronize both ADF4382A devices:
Timed Synchronization Method
a. Verify that both ADF4382A outputs are not synchronized.
The timed synchronization method uses an external synchroniza-
b. Toggle the SSRQ bit on the LTC6953, and outputs on both
tion signal to synchronize multiple ADF4382A devices, which is the
ADF4382A devices should now be phase synchronized.
more traditional method for synchronization of devices. This method
requires an additional external signal from the clock distribution
device to provide the synchronization signal. Each synchronization
signal must be matched for accurate output phase matching. A
rising edge of the synchronization pulse on the SYNC pin of the
ADF4382A triggers the start of the synchronization process which
puts the device into a reset state. On the falling edge of the syn-
chronization pulse, the RFOUT signal phase on each ADF4382A is Figure 65. Timed Synchronization Configuration
then aligned to a known phase relative to the reference phase.
The following steps outline the procedure to perform a timed syn- PHASE SYNCHRONIZATION SETTINGS
chronization with two ADF4382A devices using the LTC6953: To optimize phase noise and spurious performance on the
1. Set up the LTC6953 as follows: ADF4382A, there are a number of bit fields that must be program-
med based on the fPFD used. Table 24 shows the optimal settings
a. Program the REF outputs for /4 (assumes the reference for phase synchronization.
frequency (fREF) = 1 GHz).
b. Program the SYNC outputs for /512.
c. Program to the SYNC mode by setting SRQMD = 1 and
toggle SSRQ from 0 to 1.
Table 24. Phase Synchronization Settings
RDIV = 3, 6, 12, 14, 15, 24, 26 to 31, 46, 48 to 63 RDIV = 1, 2, 4, 5, 7 to 11, 13, 16 to 23, 25, 32 to 45, 47
PFD Frequency REF_CK_FALL REF_DC_SEL xx_DEL1 REF_CK_FALL REF_DC_SEL xx_DEL1
fPFD ≥ 225 MHz 0 0 3 0 0 3
200 MHz ≤ fPFD < 225 MHz 0 0 4 0 0 4
148 MHz ≤ fPFD < 200 MHz 1 3 1 1 3 0
130 MHz ≤ fPFD < 148 MHz 1 3 3 1 3 1
85 MHz ≤ fPFD < 130 MHz 1 3 4 1 3 1
fPFD < 85 MHz 1 2 0 1 2 1
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Data Sheet ADF4382A
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PHASE RESYNCHRONIZATION
Phase resynchronization is a feature that allows a consistent phase
on the RFOUT signal with respect to the input reference at each
output frequency, which is useful in applications requiring synchro-
nization of multiple ADF4382A devices. After multiple devices are
synchronized, any additional resynchronizing (for example, after a
frequency change) is not needed.
The following sequence is the phase resynchronization method
procedure:
1. Power up and initialize the ADF4382A devices.
2. Program all ADF4382A devices to the same frequency.
3. Perform an initial synchronization (timed synchronization or
EZSync).
4. Enable phase resynchronization mode by taking the following
steps:
a. Set DEL_MODE (Register 0x032, Bit 5) = 1.
b. Set EN_PHASE_RESYNC (Register 0x01E, Bit 7) = 1.
c. Set EN_REF_RST Register 0x01E , Bit 6) = 1.
d. Set EN_DRCLK (Register 0x02D, Bit 6) = 1.
e. Program the tRESYNC default to 100 μs by
tRESYNC= RESYNC_WAIT
fPFD
for fPFD = 250 MHz and tRESYNC = 25,000.
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Data Sheet ADF4382A
Σ-Δ MODULATOR OPTIMIZATION MODES
The ADF4382A can be configured in three different Σ-Δ modulator ER1, DITHER1_SCALE, and EN_DITHER2 control the amount of
modes for performance optimization. A different Σ-Δ modulator dithering that is applied.
mode can be configured to optimize for either phase jitter or spuri-
ous performance by configuring the EFM3_MODE bits (Register Some common fractional spur mechanisms that can be reduced
0x032, Bits[2:0]) to select SDM mode. with Σ-Δ modulator optimization are as follows:
A common feature used in fractional spur reduction known as ► FRAC1WORD multiples of 8192.
dithering can be incorporated in addition to the Σ-Δ modulator ► Fractional values close to 2N. These values increase in level
optimization. This dithering involves reducing spurs by applying a towards the upper region of each core.
randomization to the fractional N-divider feedback value. EN_DITH- ► Fractional values of multiples 1/1000.
Table 25. SDM Mode Optimization
EFM3_MODE Minimum N Divider Optimization Description
0 10 Best jitter performance This is the default mode used, and fractional spurs are present. These spurs
can be reduced by using dithering.
4 23 Best spurious This setting removes the fractional spur mechanism while degrading jitter
performance performance as compared with EFM_MODE = 0 performance.
5 27 Phase noise profile The phase noise profile can appear more linear and up to 1 dB of phase noise
optimization improvement at frequency offsets ≥10 MHz. Dither can be applied to further
reduce fractional spurs.
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REGISTER DETAILS
Address: 0x000, Reset: 0x00, Name: REG0000
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Data Sheet ADF4382A
OUTLINE DIMENSIONS
EVALUATION BOARDS
1 Z = RoHS-Compliant Part.
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