MMM 2016 2561498
MMM 2016 2561498
o
scillators are integral to the
design of modern communica-
tions systems. Generally, these
oscillators act as part of a synthesizer
and are voltage controlled, meaning
that the frequency is determined by
tuning diodes, frequently called varac-
tors. The applied dc voltage varies the
frequency. For high-performance cir- A-Z image ©istockphoto.com/Simon Bradfield, wave image licensed by ingram publishing
August 2016 59
c c c
b b b
C1 C1 C1
e L e e
L C3
L RL RL RL
Re
C2 C2 C2
C3
Figure 1. (a) A conventional Colpitts configuration, (b) a modified Colpitts (Clapp–Gouriet) configuration, and (c) a modified Colpitts
configuration for oscillators used with ceramic resonators.
Figure 3(a) and (b) illustrates the oscillator oscillator into real and imaginary parts,
subcircuit for the purpose of calculating including parasitics, we obtain
the negative resistance.
Based on Figure 3(b), the circuit RN (3)
R NEQ =
equation is given from Kirchoff’s volt- (1 + ~ 2 Y 221 L 2p)
age law (KVL) as 1 = 1
C EQ *> (C 1 + C P) C 2 H
Vin = I in ^X C 1 + X C 2 h - I b ^X C 1 - bX C 2 h (C 1 + C 2 + C P)
(1a)
- = ~ Y221 L2 P 2 G
2
0 = - I in ^X C 1 h + I b ^X C 1 + h ie h . (1b) (1 + ~ Y 21 L P)
Figure 2. A photograph of a 1-GHz
#> H4
ceramic resonator oscillator [12], [28]. Y21 (4)
Considering 1/Y11 = h ie, ~ (C 1 + C P) C 2
60 August 2016
I in I in Ib
hie
C1 C1 β Ib RL
RL
V in Z in V in
C2
C2
(a) (b)
Cc1
Cc Lp
C1 Cp
L C
YL
Lp
R sl
C2
Z IN
(c)
Figure 3. (a) An oscillator subcircuit for impedance analysis, (b) an equivalent suboscillator circuit for calculating the negative
resistance, and (c) a Colpitts oscillator with base–lead inductances and package capacitance.
approximations and works for practi- 1 - S 11 C G is the useful power to the load. An
CL = (11)
cally all microwave oscillator designs S 22 - DC G empirical expression for the common-
[6], [28]. The equivalent criteria for the source amplifier output power, found
S S C S - DC G
negative resistance can be calculated Sl22 = S 22 + 12 21 G = 22 by Johnson [29], is
1 - S 11 C G 1 - S 11 C G
in the form of S-parameters. (Detailed (12)
definitions of S-parameters can be
Pout = Psat c 1 - exp - GPin m, (15)
found in [31].) This negative resistance 1 = 1 - S 11 C G . (13) Psat
will cause oscillations if the following Sl22 S 22 - DC G
conditions are satisfied. Assume that where Psat is the saturated output power
the oscillation condition is satisfied at Comparing (9) and (12), we find that of the amplifier and G is the tuned
port 1 and is given by small-signal common-source transdu
1 = C , (14)
Sl22 G cer gain of the amplifier, which is identi-
1 = C . (6) cal to S 21 2 . Because the objective is to
G
Sl11
where S11 and S22 are the input and out- maximize (Pout - Pin), where Pout and
Thus, put reflection coefficients, respectively. Pin are the output and input power of
The previous discussion shows that the amplifier,
the oscillation condition is also satis-
Sl11 = S 11 + S 12 S 21 C L fied at port 2, which proves the simul- d (Pout - Pin) = 0 (16)
1 - S 22 C L
taneous oscillation condition at both
= 11 DC L
S - (7)
ports. Thus, if either port is oscillat-
1 - S 22 C L 2Pout
ing, the other port must be oscillating = 1 (17)
Pin
1 = 1 - S 22 C L = C . (8)
Sl11 S 11 - DC L G as well. A load may appear at either or
2Pout
both ports, but normally the load is in = G exp - GPin = 1 (18)
C L, the output termination. Pin Psat
By expanding (7), we get
It is helpful to use the common-
source-based amplifier to compute exp GPin = G (19)
Psat
C G S 11 - DC L C G = 1 - S 22 C L (9) the oscillator output power. For osc
illators, the objective is to maximize Pin = ln G . (20)
C L (S 22 - DC G) = 1 - S 11 C G (10) (Pout - Pin) of the amplifier, which Psat G
August 2016 61
little under large signal conditions, e x cos (wt) = / a n (x) cos (nwt)
as does S 22 . Reliable large-signal S- n
Frequency- \
Active parameters for bipolar transistors and = I 0 (x) + 2 / I n (x) cos (nwt) .
Determining
Circuit FETs are difficult to obtain. 1
(34)
Circuit
62 August 2016
Table 1. The data generated at various drive levels for T = 300 K.
Fundamental
Drive Level Drive Voltage Offset Coefficient DC Offset Current Second Harmonic
c; E * x m mV
[x] kT ln [I 0 (x)] kT [ln I (x)] mV 2 [I 1 (x) /I 0 (x)] [I 2 (x) /I 1 (x)]
0
q q
as shown in Table 1. This gives good I c = 70 mA, and Ptot = 300 mW; the noise transistor BFG520 is used. At the pro-
insight into the nonlinearities involved figure Fmin at 350 MHz is lower than posed starting dc current of 6 mA (this
in oscillator design. 1 dB, and at 5 mA the associated gain is being close to the minimum noise fig-
It may be of interest at this point to more than 17 dB. ure current and used as a first trial to
see the start-up condition of an oscilla- meet the output power), fT is 6 GHz.
tor; the transient response is shown in A Design Example for a When se l
ecting a transistor with a
Figure 5. 350-MHz Fixed-Frequency higher fT, there is always a possibil-
Colpitts Oscillator ity of unwanted microwave oscilla-
Selecting the Right Transistor Following is an exact m athematical tion and higher flicker noise.
The basic design of a Colpitts oscilla- solution for designing a 350-MHz Col Comparing microwave transist
tor is the same, whether one uses an pitts oscillator. ors with audio transistors, it becomes
FET or a bipolar junction transistor The circuit consists of the Colpitts apparent that at much lower fT fre-
(BJT). Bipolar-transistor-based oscilla- configuration following Figure 1(c). To quencies, there is much less flicker
tors can now easily be designed up to have enough loop gain, a microwave noise contribution. This transistor can
20 GHz. The basic advantage of the bipo-
lar transistor (also known as BIP) is the
lower flicker noise corner frequency. 800.00
Currently, transistor chips with Fmax up Vemit
emitter
m ter
400.00
For the purpose of this design sy n
thesis, we use a Philips BFG520, a 200.00
highly linear transistor. It is vali-
dated with a three-tone test (the typi-
0.00
cal two-tone test is easier to perform),
as explained on the product data sheet;
–200.00
the mixing products are better than −60 0.00 10.00 20.00 30.00 40.00 50.00
dB suppressed relative to the carrier. Time (ns)
Based on past experience, the BFG520
shows good linearity and, therefore, Figure 5. An example of the transient simulation of a ceramic-resonator-based high-Q
also has low distortion and low noise. oscillator with the dc offset shown in the fourth column of Table 1. (The voltage displayed
The key parameters are VCEO = 15 V, is taken from the emitter.)
August 2016 63
be safely operated at 30 mA, but the oscillation at 350 MHz. Experimenting Vout = Pout (mW) # 2R L
rule of thumb when using 10–15% of with the simulation, it turns out that Lb = 14 # 10 -3 # 2 # 200
Ic max is that the flicker contribution is set to 0.5 uH gives a much better phase = 2.37 V (41)
much lower. For low noise operation, noise, about 10 dB better at 100 Hz offset;
V
the data sheet indicates a 1.1-dB spot- however, this could not be verified yet in I 1 = out = 2.37 , 11.85 mA (42)
200 200
noise figure at 900 MHz, 5 mA. a real circuit.
The 350-MHz oscillator, using The output power is taken from I1
I e = I dc =
the bipolar transistor BFG520, is de the collector with the following 1.932
signed based on analytical equations des ig n procedure. The goal is to = 11.85 = 6.13 mA. (43)
and later verified with simulation obtain an output power of over 1.932
results. Based on the output power 10 dBm, using a simple design for Note that no saturation voltage is
requirement and harmonics at a given good understanding. assumed. This results in slight varia-
load, the drive level is fixed. The nor- tions among the calculated, simulated,
malized drive level ( x = 15) is chosen Step 1: Initial Specification and measured values of Pout.
to allow adequate drive level to sustain The normalized drive level is set
oscillation and still not produce exces- at 15, for which the fundamental peak Step 2: Biasing
sive harmonic content. current I 1 (fundamental) = 1.932I dc The transistor uses a 12-V power supply
Figure 6 shows the values of the opti- (this is taken from Table 1). I 1 is the and an 825-Ω emitter resistor at ~6 mA,
mized circuit. While simulating for a fundamental current specified by the resulting in ~5-V drop, so the transistor
series resonant configuration, the value output power needed for the desig- can afford a large voltage swing between
of C p = 8.2 fF was used as a place holder, nated load. base and ground. This reduces flicker
based on impedance considerations. The primary impedance of the trans- noise (resistive feedback) and distortion.
C p was set to 8.2 pF for parallel resonant former is 200 X, and we calculate the RF The base voltage divider, for reasons
configuration, and the values of L = voltage for R L = 200 X and for an out- pertaining to temperature stability, uses
21 nH and C c = 3.3 pF were set to achieve put power of Pout . 11 dBm . 14 mW: a higher than normal dc current and is
Ind
+
–
10 µH cap
blos
3.9 nF
2.29 koh
V : 12
res
200 to 50 Ω 220 pF
R2 res R1 trf
n1 n2 cap
2.27 koh Vb
220 pF
n3 n4
1.7 µH
Q = 120 V
Ind
c cap C0
Lb
b/p P1
3.3 pF osc
ptr bfg520
b
cap Cc
cap
22 pF
e
L
cap
C1
8.2 pF
21 nh
Ind
res
Cp
Q = 220 1 oh
cap
825 oh
8.2 pF
res
C2
Re
Figure 6. The design of a 350-MHz Colpitts oscillator, optimized for phase noise.
64 August 2016
isolated from the base using an RF choke Figure 9 show Ic as a function of drive The large-signal transconduc-
(frequently, in designs, this circuit trick is level X. tances Y21 and G1 are transformed to
not used): Based on KVL, the following set of the current source through the volt-
equations can be used to determine the age divider Veb /Vcb . The voltage Veb
Vb = I e ;R e + R e E + Vbe = 5.96 V. (44)
feedback factor n [the oscillator circuit must be added to Vce to calculate the
b+1 with passive component parameters is transformation ratio, which is also the
shown in Figure 7(a)]: inverse of the feedback factor and can
b is assumed to be around 100, and be written as
Y 21L = 1.1 mS
V be is approximately 0.8 V. Bias resistor
Veb
R1 and R 2 is given as (dc transconductance, with no high- = C 2 = 1 (51d)
Vcb C1 + C2 n
frequency effects included), where
a = 0.99. Then, Vce
Vb = R 2 Vcc = 5.96 V & R 1 . 1 = C 1 = n - 1 . (51e)
R1 + R2 R2 Vcb C1 + C2 n
(45) Y 1 = G 1 + jB 1 & j~C 1 for G 1 = 0 (51a)
R 1 = 2270 X (46) The conductance G2 is already in
Y 2 = G 2 + jB 2 & G 2 + j = 2 G.
(~ 2 LC - 1) ~C c
parallel with the current source, so it
R 2 = 2290 X (47) ~ L (C c + C) - 1
remains unchanged. The factor n rep-
Vcc = 12 V. (48) (51b) resents the ratio of the collector–base
voltage to the emitter–base voltage at
Here, G 2 equals the loss parameter/
Resistor bias current is ~2.6 mA, (Vcc / the oscillator resonant frequency
load conductance of the resona-
(R 1 + R 2)) . Base current is 43 nA, so the
tor connected parallel to the reso-
safety factor is 2.6/0.043 , 60. G 1 " G21 (51f)
nator components C 1, C 2 , and L, n
respectively.
Step 3: Determining the Large- Y21 " Y212 & G m2 (51g)
Signal Transconductance n n
Y 3 = G 3 + jB 3 & G 3 + j~C 2 . (51c)
Based on Table 1 and x = 15, the dc
G 3 " 8 n - 1 B G 3 . (51h)
2
August 2016 65
Y21 R P = n (51v)
–50.00 n 1-n
x = Drive–Level
R P = 1 , Y21 R P " loop gain (51w)
–75.00 G2 n
1.00E03
1.00E04
1.00E05
1.00E06
1.00E07
(51n) is reduced to
G 3 = 1 = 1 = 1.21 mS (52a)
Figure 8. An example of the single sideband phase noise as a function of the normalized Re 825
drive level x for a high-Q 1-GHz oscillator.
n 2 (1.21) - n (2 # 1.21 + 1.1 # 0.99)
(52b)
+ (1.21 + 1.1) = 0
The transformed conductance is pro- To ensure higher loop gain, n 1 is
1.21n 2 - 3.514n + 2.313 = 0 (52c)
portional to the square of the voltage selected from n max [n 1, n 2] . Once the
ratios given in (51d) and (51e), producing value of n is fixed, then the ratio of the 3.514 ! (3.514) 2 - 4 # 1.21 # 2.313
a total conductance as seen by the current capacitance is calculated as n=
2 # 1.21
source at resonance as (53)
C 2 = 1 (51r) n & n 1 = 1.888 and n 2 = 1.01. (54)
G tot al = G 2 + G m +2 G 1 + 8 n - 1 B G 3 . (51i)
2
C1 + C2 n
n n
The higher value of the transformation
C 2 = C 1 & C 1 = n - 1. (51s)
For sustained oscillation, the closed n-1 C2 factor, n, is selected as n = 1.888.
loop gain at resonance is given as The ratio for the values of C1 and C2
If G 3 and G 1 are zero, then the qua- is calculated as
V Y a dratic equation (51n) reduces to
c be 21 m
> nG total H = 1 & nG = Y a (51j) C 2 = 1 & C = C 1 (55)
C1 + C2 n 2
n-1
V be
total 21 n 2 G 2 - nY21 a + Y21 = 0 (51t)
nG total = n ;G 2 + Y21 +2 G 1 + ` n - 1 j G 3E
2
(2G 3 + Y21 a) ! (2G 3 + Y21 a) 2 - 4 (G 2 + G 3) (G 1 + G 3 + Y21)
n n n= (51o)
2 (G 2 + G 3)
(51l)
(2G 3 + Y21 a) (2G 3 + Y21 a) 2 - 4 (G 2 + G 3) (G 1 + G 3 + Y21)
and (51m)–(51q) in the box to the n1 = + (51p)
2 (G 2 + G 3) 2 (G 2 + G 3)
right. From the quadratic equation
(51l)–(51q), the value of the factor n can
be calculated, and, thereby, an estima- (2G 3 + Y21 a) (2G 3 + Y21 a) 2 - 4 (G 2 + G 3) (G 1 + G 3 + Y21)
n2 = - (51q)
tion of the capacitance can be made 2 (G 2 + G 3) 2 (G 2 + G 3)
a priori.
66 August 2016
The ratio of the capacitor C1 to C2 is assessed for individual circuits, but the thus producing less loading and bet-
1. For larger transconductance, Y21, (C1/ general trend follows the plot shown. ter phase noise, but at the cost of lower
C2) > 1. In Figure 9, x = 1 is the linear case power output.
(class-A operation), and the values If the transistor is overdriven at the
A Discussion About above x = 15 produce narrow pulses. base, the collector current folds back
Drive Level and Noise Class-A operation gives higher out- (dip), and the actual current gain falls
The plot in Figure 8 [5] shows the impact put power but is not optimized for phase to values of 1.4, in our case (Figure 9).
of the normalized drive level x on the noise. However, at higher drive levels, For the uncompressed current gain
phase noise. The exact values have to be the transistor is on for a shorter duration, (Y21/Y11) . (C2/C1) . 270 pF/10 pF, the
80.00
x = 15
60.00 x = 2 to 14
x=1
40.00
lc(_lib1) (mA)
20.00
0.00
–20.00
–40.00
0.00 1.00 2.00 3.00 4.00 5.00 6.00
Time (ns)
–50.00
PN1<H1> (dBc/Hz)
1 colpitts scheY1
PN1<H1>
2
–100.00 3
C1/C
C2 = 33 pf/10 pF for Optmized
Phase Noise (Series Tuned Circuit)
4
–150.00
–200.00
1.00E01 1.00E02 1.00E03 1.00E04 1.00E05 1.00E06
FDev (Hz)
X1 = 1.00E01 Hz X2 = 8.11E01 Hz X3 = 1.18E03 Hz X4 = 8.70E04 Hz
Y1 = –68.11 dBc/Hz Y2 = –86.32 dBc/Hz Y3 = –109.57 dBc/Hz Y4 = –146.94 dBc/Hz
Figure 10. Optimization of the phase noise for the series-tuned circuit.
August 2016 67
circuit will actually oscillate but does not as found in ceramic-resonator-based 1 1 + 1
~= ; E (59)
have acceptable phase noise [low value oscillators. L C1 C2
of x, n = 28, where n = (C 1 /C 2) + 1)] . The quality factor of the induc-
; E
By changing the capacitors C 1 /C 2 tor is assumed 60 at 350 MHz, a 2
~ =
1 1 + 1 = C 1 + C 2 . (60)
L C1 C2 LC 1 C 2
to 33 pF/10 pF, n = 4.3, the phase low Q case. The value of inductor is
noise performance is optimized, as obtained as
shown in Figure 10. This circuit is a The value of the capacitor is deter-
series-tuned oscillator, and now we Q T = R P & L = 3649 , (57) mined as
~0L 60 # ~ 0
move on to a high-Q (from Q = 220 to
Q = 450) circuit, where the resonator where R p is calculated using C2 = 2.55 . 14 pF (61)
2
~ # 17E - 9
is loosely coupled to the transistor.
G m (x) = 1 C 1 ;1 + C 2 E
2
The tuned circuit consists of a 22-nH C 1 . C 2 . 14 pF. (62)
RP C2 C1
inductor and 8.2-pF capacitor. The
following shows the design calcula- L= 3649 . 27 nH Taking into consideration the actual
60 # 2r # 350 # E6
tion for the parallel-tuned circuit, (58) parasitics and RF parameters of the
26⋅10–3 1
re := gm1 := gm1 := 0.238 q := 1.602⋅10–19 i := 0...7 foi := 10i
Ic re
Kf⋅IbAF
4⋅q⋅Ic⋅gm12 + ⋅gm12
woi w02 1 (C 1 + C 2)2
Lwi := 10⋅log 4⋅KT⋅R + ⋅ ⋅ +
2 4⋅(woi)2⋅Vcc2 Q2 2 2
C 1⋅C 2⋅(w 0)4⋅L 2
2 C2
(w0)2⋅C 1 ⋅ (w0)2⋅β 2⋅C22 + gml2⋅ 2
C1
foi Lwi
0
1 –5.227
10 –35.222 –20
100 –65.165 –40
1⋅103 –94.633
–60
–121.303
1⋅104
–143.272 –80
1⋅105 –163.529 Lwi –100
1⋅106 –183.555
–120
1⋅107
–140
–160
–180
–200
1 10 100 1 + 103 1 + 104 1 + 105 1 + 106 1 + 107
foi
68 August 2016
transistor, the optimized values are L (~) = 10Log •• Q L = loaded Q of the tuned circuit
C 1 = 12 pF and C 2 = 8.2 pF. ZR R VV •• Q O = unloaded Q of the tuned
]S S K f I bAF 2 WW
]S S 4qI c g 2m + gm WW
# [S4kTR +S ~ circuit
2 WW
]]SS SS ~ 0 C 1 (~ 0 c b ) C 2 + g m 2 m WWWW
2 2 2 + 2 2 2 C2 • • kT = 4.1 # 10 −21 at 30 0 K (room
Step 4: Calculating the Coupling \T C1 temperature)
T XX
; 2 2 E= 2 + 2 2 4 2 G3,
Capacitor Cc
2
~0 1 [C 1 + C 2] 2 •• R = equivalent loss resistance of
The expression for the coupling capaci- 4~ V cc Q C1 C2 ~0 L (65) the tuned resonator circuit
tor is •• I c = RF collector current
where
•• I b = RF base current
•• b + = ; + E;
C 1 Ep
C 2C 2 +
Y 21
10 C •• Vcc = RF collector voltage
Y 11 C 2
Z _ •• C 1, C 2 = feedback capacitor.
]] (~ 2 C 1 C 2) (1 + ~ 2 Y 221 L 2P) bb •• g m = 6Y +21@6C 1 /C 2@q , with the values Using a Mathcad calculation, we
[ [Y 21 C 2 - ~ C 1 C 2)(1+ ~ Y 21 L P) ` (63)
2 2 2 2 2
of p and q depending upon the obtain the results as shown in Figure 11
] # (C 1 + C P + C 2)] b
\ a drive level (x) [5], which compare well with the mea-
•• Y +21, Y +11 = large signal [Y] param- sured data.
C c = 3.3 pF. (64)
eter of the active device
•• K f = flicker noise coefficient Measured Results for
Step 5: Calculating the •• AF = flicker noise exponent a 350-MHz Oscillator
Phase Noise of the Colpitts •• L (~) = ratio of sideband power in a The measured phase noise of the
Oscillator 1-Hz bandwidth at ~ to total power oscillator shown in Figure 12 is not
The mathematical expression of the in dB quite comparable with the mathemat-
phase noise of a Colpitts oscillator is •• ~ = frequency offset from the c arrier ics because it has a two-stage buffer
[5, p. 180] •• ~ 0 = center frequency amplifier that isolates the oscillator
–70
–90
–110
SPR Off
TH 0 dB
–130
Figure 12. The measured phase noise result for a 350-MHz oscillator.
August 2016 69
08/27/15 Ansoft Corporation-Harmonica ® v8.71 11:23:33 colpitts scheY1
colpitts_schematics_350 MHz.ckt PN1<H1>
0.00
–50.00
2
PN1<H1> (dBc/Hz)
3
–100.00
4
5
–150.00
–200.00
1.00E01 1.00E02 1.00E03 1.00E04 1.00E05 1.00E06
FDev (Hz)
X1 = 9.33E00 Hz X2 = 1.00E02 Hz X3 = 1.07E03 Hz X4 = 1.00E04 Hz X5 = 9.33E04 Hz
Y1 = –37.37 dBc/Hz Y2 = –68.15 dBc/Hz Y3 = –97.93 dBc/Hz Y4 = –122.10 dBc/Hz Y5 = –142.55 dBc/Hz
(a)
–75.00
3
–100.00
4
–125.00
5
–150.00
–175.00
1.00E01 1.00E02 1.00E03 1.00E04 1.00E05 1.00E06
FDev (Hz)
X1 = 1.00E01 Hz X2 = 1.02E02 Hz X3 = 1.05E03 Hz X4 = 1.07E04 Hz X5 = 9.77E04 Hz
Y1 = –43.57 dBc/Hz Y2 = –73.56 dBc/Hz Y3 = –101.50 dBc/Hz Y4 = –124.58 dBc/Hz Y5 = –144.18 dBc/Hz
(b)
Figure 13. (a) The simulated phase noise and (b) the optimized simulated phase noise for a 350-MHz parallel-tuned Colpitts
configuration.
from the output termination. This the phase noise from −122 dBc/Hz 2.44 nH/pF in the case of discrete com-
explains the limit of −146 dBc/Hz to −125 dBc/Hz at 10-kHz offset. This ponents used in our demonstration), the
at far offset. At close in, the phase is a result of trial-and-error, as we do simulated phase noise is 105 dBc/Hz at
noise is influenced by an automatic not know all the paras itics. Figure 10-kHz offset. (Note: this is due to the
frequency control circuit. The actual 13(a) shows the simulated phase noise fact that the characteristic impedance of a
comparison should be made between plot, and Figure 13(b) shows further ceramic resonator is much lower than the
10 Hz–10 kHz offsets. improvement after optimizing the discrete case: Z 0 = 60 X 1/ f r ln D/d,
To optimize the phase noise for circuit for phase noise. where D = the outer diameter and d =
this type of oscillator using discrete If we replace the parallel-tuned cir- the inner diameter of the ceramic reso-
components, the selection of the val- cuit with a ceramic resonator (at this nator [12], p. 754].) The prediction agrees
ues C p = 8.2 pF, L = 21 nH, C 1 = 22 pF, frequency range, f r will be 88, and the well with the measured phase noise [12,
C 2 = 8.2 pF, and C c = 3.3 pF improved L/C ratio will be 0.048 nH/pF versus Figs. 5–37].
70 August 2016
Figure 14 shows the plots of the col- drive level: (x) is V1/(kT/q). From A table of normalized transconductance
lector and base currents Ic and Ib for the Figure 15, we see that the root mean as a function of the drive level, including
optimized case [C p = 8.2 pF, L = 21 nH square (RMS) value of V be is used the large values, is given in Table 2 [5].
(Q = 60 at 350 MHz), C c = 3.3 pF, to determine the approximate drive Figures 16 and 17 show the phase-
C 1 = 12 pF, and C 2 = 8.2 pF] . From the level. Because V be = V1, t he d r ive noise variation, with variation of
plot in Figure 14, we can determine that the level is Q (L = 22nH) in the L/C resonator. The
ratio of the large signal (Y21/Y11) = b = 1.4. output power, collector current, and
The next critical parameter, shown 500 mVrms base voltage ^Vbh and ^Vbeh plots are
(x) . . 20. (66)
in Figure 15, is for the n ormalized 26 mV also shown for the same combination.
5.00
lb(_lib1) (mA)
lc(_lib1) (mA)
10.00
0.00
5.00
–5.00
0.00
–10.00
–15.00 –5.00
0.00 1.00 2.00 3.00 4.00 5.00 6.00
X1 = 2.46 ns X2 = 3.26 ns X3 = 2.68 ns Time (ns)
Y1 = 12.27 mA Y2 = –12.64 mA Y3 = 19.05 mA
1.00
0.50
Vbe(_lib1) (V)
0.00
–0.50
0.00 1.00 2.00 3.00 4.00 5.00 6.00
X1 = 2.69 ns X2 = 4.16 ns Time (ns)
Y1 = 0.96 V Y2 = –0.44 V
August 2016 71
The parallel-tuned circuit shows mensionless quantity) and is a bi- corner, requires solving the following
better phase noise performance, as as-dependent curve-fitting term, equation [20], [21]:
seen in Figure 18, due to the fact that typicaly 2.
the rate of change of reactance in a •• The KF (flicker noise constant) Fbn = Fmeas [1 + 1/b + 2Vth G in /IB, (68)
parallel-tuned circuit is significantly value ranges from 10−12 to 10−6
larger than that in a simple series- and defines the flicker corner fre- where Fbn = intrinsic base flicker noise
tuned oscillator. quency [32]. corner, Fmeas = measured flicker corner,
One of the important characteris- b = collector–base current gain, Vth =
1/f Noise tics for device evaluation and selec- thermal voltage = kT/q, G in = external
The electrical properties of surfaces or tion is 1/f noise, which is a function of input conductance, and IB = dc base-
boundary layers are influenced ener- the active device characteristics and a biasing current.
getically by states, which are subject to major contributor to phase noise, espe- The equation for the intrinsic base
statistical fluctuations and, therefore, cially in applications such as voltage- flicker corner modifies the measured
lead to the flicker noise, or 1/f noise, for controlled oscillators (VCOs) [5], [20]. flicker corner to account for the device’s
the current flow. In an oscillator, 1/f noise that is pres- input conductance, base current, and
1/f− noise is observable at low fre- ent in transistors at low frequencies is dc current gain. The formula for Fbn
quencies and generally decreases with upconverted and added to the phase is valid, provided that the measured
increasing frequency f according to noise around the carrier signal. Hence, output noise characteristics are domi-
the 1/f− law until it is covered by a fre- proper characterization of 1/f noise and nated by the base flicker and base shot
quency-independent mechanism, such its effects on phase noise is an impor- noise sources.
as thermal noise or shot noise. tant topic. In addition, 1/f noise is not Changing the KF and AF factors
Example: The noise for a conducting solely an active device phenomenon. affects the phase noise, as can be seen
diode is bias dependent and is expressed Passive devices such as carbon resis- from the plots. The Y-intercept of the
in terms of exponents AF and KF: tors, quartz resonators, surface acous- 1/f spectra increases proportionally
tic wave devices, and ceramic capaci- to KF (Figure 19), which is in accor-
AF
I DC tors are among the devices that show dance with (34). The Y-intercept of the
i 2Dn = 2qI dc B + KF B
AC
f the presence of this phenomenon when 1/f spectra decreases more rapidly
used as part of low-noise electronic sys- with an increase in AF (Figure 20).
•• The AF (flicker noise exponent) is tems. Generally, 1/f noise is present in As discussed in the following sec-
generally in the range of 1–3 (di- most physical systems and many elec- tion, the tuning diodes result a noise
tronic components [19], [22], [23]. contribution similar to this flicker
Flicker noise in BJTs is also known mechanism.
Table 2. Large-signal as 1/f noise because of the 1/f slope
transconductance as a function of characteristics of the noise spectra. This AM-to-PM Conversion
drive level based on Bessel function noise is caused mainly by traps associ- from Tuning Diodes
calculations: Gm(x)/gm = 2[I1(x)/xI0(x)] ated with contamination and crystal Figure 21 shows a parallel-tuned circuit
versus the drive level = x. defects in the emitter–base depletion that is connected to the oscillator dis-
layer. These traps capture and release cussed earlier. The frequency change is
Gm(x)/gm
Drive level = x = 2[I1(x)/xI0(x)]
carriers in a random fashion. The time obtained by applying a positive voltage
constants associated with the process to the + terminal. The parallel capacitor is
0.00 1 produce a noise signal at low frequen- replaced by the two tuning diodes. Here,
0.50 0.970 cies. The flicker noise spectral density we will show the influence of the tuning
1.00 0.893 is given by diodes in the VCOs; the resulting phase
2.00 0.698 noise generated by the tuning diodes is
S (f) = (KF) IB AF df/Fc, (67)
3.00 0.540 shown in Figure 22.
where KF = flicker noise constant, It is possible to define an equivalent
4.00 0.432
AF = flicker noise exponent, IB = dc noise Raeq that—inserted in Nyquist’s
5.00 0.357
base current, and FC = flicker noise cor- Johnson noise equation
6.00 0.304
ner frequency.
7.00 0.264 The measured flicker corner fre- Vn = 4kTo RDf , (69)
8.00 0.233 quency, Fmeas , is determined by noting
9.00 0.209 the intersection of the 1/f noise spec- where kTo = 4.2 # 10 -21 at about 300 K,
10.00 0.190 trum and the white-noise spectrum. R is the equivalent noise resistor, and
15.00 0.129 This intersection is where the mea- Df is the bandwidth—determines an
20.00 0.0975 sured flicker noise power and the white open-circuit noise voltage across the
noise power are equal. Determining tuning diode. Practical values of Raeq
25.00 0.075
Fbn, the intrinsic base flicker noise for carefully selected tuning diodes
72 August 2016
are in the vicinity of 200 W–50 kW. ^Dfrmsh = K o # ^1.296 # 10 -8 V h (70) 0.00183 rad (72)
id =
If we now determine the noise fm
voltage, Vn = 4 # 4.2 # 10 -21 # 10, 000 , in 1-Hz bandwidth. To translate this into
the resulting voltage value is 1.296 # an equivalent peak phase deviation, in 1-Hz bandwidth. For fm = 25 kHz
10−8 V Hz . (the typical spacing for adjacent-channel
Ko 2 ^
This noise voltage generated from i d = 1.296 # 10 -8h rad (71) measurements for FM mobile radios),
fm -8
the tuning diode is now multiplied i c = 7.32 # 10 . This can now be con-
with the VCO gain Ko, resulting in the in 1-Hz bandwidth; or, for a typical oscil- verted into the single-sideband modula-
RMS frequency deviation lator gain of 100 kHz/V, tion signal-to-noise ratio as follows:
colpitts scheY1
PN1<H1>
–100.00
–150.00
–200.00
1.00E00 1.00E01 1.00E02 1.00E03 1.00E04 1.00E05 1.00E06 1.00E07
FDev (Hz)
Figure 16. The optimized phase noise for different values of inductor Q.
–100.00
Lower TR Cc = 3.3 pF, C1 = 22 pF,
C2 = 8.2 pF, Q (L = 22 nH) = 220
–150.00
–200.00
1.00E00 1.00E01 1.00E02 1.00E03 1.00E04 1.00E05 1.00E06 1.00E07
FDev (Hz)
Figure 17. The results of series and parallel-tuned circuits for the same value of inductor Q.
August 2016 73
L (fm) = 20 log 10 i c = - 149 dBc/Hz. changes the picture again. Therefore, 1 # 10 7 2 ^
2 id = 1.833 # 10 -9h rad
(73) with kTo = 4.2 # 10 -21, the resulting fm
noise voltage will be (75)
For the typical oscillator gain of
10 MHz/V found in wireless appli- Vn = 4 # 4.2 # 10 -21 # 200 or
0.026 rad (76)
cations, the resulting phase noise = 1.833 # 10 -9 V Hz . (74) id =
will be 20 dB worse [10 log (10 MHz fm
÷ 100 kHz)]. However, the best tun- From (72), the equivalent peak phase in 1-Hz bandwidth, with fm = 25 kHz,
-6
ing diodes, like the BB104, have an deviation for a gain of 10 MHz/V in a i c = 1.04 # 10 . Expressing this as phase
Rn of 200 X instead of 10 kX, which 1-Hz bandwidth is then noise,
–100.00
–200.00
1.00E00 1.00E01 1.00E02 1.00E03 1.00E04 1.00E05 1.00E06 1.00E07
FDev (Hz)
Figure 18. The results of series- and parallel-tuned circuits for a higher value of inductor Q.
350 MHz_colrY1
PN1<H1>
0.00
PN1<H1> (dBc/Hz)
350 MHz_colrY1
PN1<H1>
–100.00
–150.00
–200.00
1.00E00 1.00E01 1.00E02 1.00E03 1.00E04 1.00E05 1.00E06 1.00E07
FDev (Hz)
X1 = 1.00E03 Hz X2 = 1.00E04 Hz X3 = 1.00E05 Hz X4 = 1.00E06 Hz X5 = 7.20E06 Hz
Y1 = –89.20 dBc/Hz Y2 = –118.57 dBc/Hz Y3 = –144.87 dBc/Hz Y4 = –166.49 dBc/Hz Y5 = –175.17 dBc/Hz
74 August 2016
07/21/15 Ansoft Corporation-Harmonica ® v8.71 17:33:37 350 MHz_colrY1
PN1<H1>
50.00
350 MHz_colrY1
PN1<H1>
0.00 TR1, TR2, TR3, TR4 Shows Phase Noise Plots
for the Values of AF = 1, 1.5, 2, and 2.5 Respectively
PN1<H1> (dBc/Hz)
350 MHz_colrY1
PN1<H1>
–50.00
350 MHz_colrY1
PN1<H1>
–100.00
–150.00
–200.00
1.00E00 1.00E01 1.00E02 1.00E03 1.00E04 1.00E05 1.00E06 1.00E07
FDev (Hz)
X1 = 1.00E03 Hz X2 = 1.00E04 Hz X3 = 1.00E05 Hz X4 = 1.00E06 Hz X5 = 7.20E06 Hz
Y1 = –89.20 dBc/Hz Y2 = –118.57 dBc/Hz Y3 = –144.87 dBc/Hz Y4 = –166.49 dBc/Hz Y5 = –175.17 dBc/Hz
Ctot
Figure 22 shows the influence of
RF Choke
the tuning diode on the phase noise. CP = 0 +
L
For the purpose of this discussion, the
equivalent-noise resistance is assumed Ctot ∞
to be 1 kX, and three sensitivity curves
–
are shown. For a tuning sensitivity
of more than 100 kHz/V, the varactor
noise dominates. As the tuning sen-
Figure 21. A parallel-tuned circuit with tuning diodes [2].
sitivity increases, the influence of the
oscillator noise itself disappears.
Summary
Based on a systematic approach to the –40
Colpitts oscillator, this article provides 1 MHz/V A = 155 dB/Hz
information for an optimized design and –60 100 kHz/V B = 143 dB/Hz (R&S SMDU)
C = 123 dB/Hz
the resulting phase noise. Starting with –80 Fe = 150 MHz
L(/_) (dBc/Hz)
10 Hz
100 Hz
1 kHz
35 kHz
100 kHz
1 MHz
10 MHz
100 MHz
August 2016 75
to computer-assisted design tools can [9] I. G. Gottlieb, Practical Oscillator Handbook. New [22] C. Toro. (2004). “Improved 1/f noise measure-
run some experiments by varying the York: Elsevier, 1997, p. 151. ments for microwave transistors,” M.S. theses,
[10] J. Carr, RF Components and Circuits. Oxford, Dept. Elect. Eng., Univ. South Florida, Tampa,
component values. FL. [Online]. Available: http://scholarcommons.
MA: Newnes, 2002, p. 127.
usf.edu/etd/1271
[11] A. Basak, Analogue Electronic Circuits and Sys-
Acknowledgments tems. Cambridge, UK: Cambridge University [23] A. van der Ziel, Noise in Solid State Devices and
We would like to thank our reviewers Press, 1991, p. 153. Circuits. New York: Wiley, 1986.
for their valuable suggestions and their [12] U. L. Rohde and M. Rudolph, RF/Microwave [24] Wikipedia. Crystal Oscillator. [Online]. Avail-
able: https://en.wikipedia.org/wiki/Crystal_
patience in helping improve the useful- Circuit Design for Wireless Applications, 2nd ed.
New York: Wiley, 2012, pp. 745–746. oscillator
ness of this article.
[13] UCSB, University of California Santa Barbara Un- [25] K. K. Clarke and D. T. Hess, “Communication
titled Publication, Berkely, CA: Univ of California circuits: Analysis and design,” in Nonlinear
Controlled Sources. Boston, MA: Addison Wes-
References Press, 2007, p. 3.
ley, 1971, Chapter 4.
[1] E. H. Colpitts, “Oscillation generator,” U.S. Pat- [14] S. Sarkar, S. Sarkar, and B. C. Sarkar, “Nonlin-
ent 1624537, Feb. 1, 1918. ear dynamics of a BJT based Colpitts oscillator [26] B. Parzen, Design of Crystal and Other Harmonic
with tunable bias current,” IJEAT, vol. 2, no. 5, Oscillators. New York: Wiley, 1983, Chapter 6.
[2] U. L. Rohde, Microwave and Wireless Synthesiz-
ers: Theory and Design. New York: Wiley, 1997. pp. 1, June 2013. [27] A. Hajimiri and T. Lee, “A general theory of
[15] B. Razavi, Design of Analog CMOS Integrated phase noise in electrical oscillators,” IEEE J.
[3] U. L. Rohde and J. Whitaker, Communications
Circuits. New York: McGraw-Hill, 2001. Solid-State Circuits, vol. 33, no. 2, pp. 179–194,
Receivers, 3rd ed. New York: McGraw-Hill,
Feb. 1998.
2000. [16] T. Jones (2012, Sep. 18). Design a crystal oscil-
lator to match your application. Maxim Tutorial [28] U. L. Rohde and D. P. Newkirk, RF/Microwave
[4] U.L. Rohde, “A new efficient method of de-
5265. Maxim Integrated Products Inc. [Online]. Circuit Design for Wireless Applications. New
signing low noise microwave oscillators,”
Available: https://www.maximintegrated.com/ York: Wiley, 2000.
Ph.D. dissertation, Dept. Elect. Eng. Comput.
Sci., Tech. Univ., Berlin, Germany, 2004. [On- en/app-notes/index.mvp/id/5265 [29] D. V. Perepelitsa, “Johnson Noise and Shot
line]. Available: http://synergymwave.com/ [17] C. Toumazou, G. S. Moschytz, B. Gilbert, Eds. Noise,” Dept. of Physics, MIT, Nov. 27, 2006.
articles/a-new-efficient-method-of-designing- Trade-Offs in Analog Circuit Design: The De- Available: http://web.mit.edu/dvp/Public/
low-noise-microwave-oscillators.pdf signer’s Companion, Part 1. New York: Springer- noise-paper.pdf
[5] U. L. Rohde A. K. Poddar, and G. Böck, The De- Verlag, 2002. [30] U. L. Rohde, “Some thoughts on designing
sign of Modern Microwave Oscillators for Wireless [18] T. Lee, The Design of CMOS Radio-Frequency very high performance VHF oscillators,” QEX,
Applications. New York: Wiley, 2005. Integrated Circuits. Cambridge, UK: Cambridge Nov./Dec. 2015, pp. 32–40.
[6] G. D. Vendelin, Design of Amplifiers and Oscilla- University Press, 2004. [31] R. W. Anderson, “S-parameter techniques for
tors By the S-parameter Method. New York: Wiley, [19] G. Vendelin, A. M. Pavio, and U. L. Rohde, Mi- faster, more accurate network design,” Hewlett
1982. crowave Circuit Design Using Linear and Nonlin- Packard Application Note 95-1, Hewlett Pack-
ear Techniques. New York: Wiley, 2005. ard, Feb. 1967. Available: https://www.ieee.li/
[7] K. Kurokawa, “Some basic characteristics of
pdf/viewgraphs/s_parameter_techniques.pdf
broadband negative resistance oscillator cir- [20] Noise Characteristics Influencing Phase
cuits,” Bell Syst. Tech. J., vol. 48, no. 6, pp. 1937– Noise, AN1026–1/f, California Eastern Lab., [32] U. Rohde, A. Poddar, and A. Apte, “Getting its
1955, July 1969. Santa Clara, CN, 2003, pp. 1–6. measure,” IEEE Microwave Mag., vol. 14, no. 6,
pp. 73–86, Sept./Oct. 2013.
[8] G. Guillermo, Microwave Transistor Amplifiers, [21] J. Costa, et al. “Extracting 1/f noise coeffi-
Analysis and Design, 2nd ed. Englewood Cliffs, cients for BJT’s,” IEEE Trans. Electron Devices,
NJ: Prentice Hall, 1984. vol. 41, no. 11, pp. 1992–1999, Nov. 1994.
Correction
Due to a production error, an incorrect spelling was given Reference
for the surname of the author of the June 2016 “Around the [1] C. Andriese, “Expanding centers for microwave research in Romania,”
IEEE Microwave Mag., vol. 17, no. 6, pp. 102–103, June 2016.
Globe” column [1]. The correct spelling is Cristian Andriesei.
76 August 2016