FET
FET
Transistors
1
Overview (1)
p-channel
JFET n-channel
2
Overview (2)
3
Enhancement mode n-MOSFET
Fig. 5.3 An NMOS transistor with vGS > Vt and with a small vDS applied. The device acts
as a conductance whose value is determined by vGS. Specifically, the channel
conductance is proportional to vGS - Vt, and this iD is proportional to (vGS - Vt) vDS. 7
Note that the depletion region is not shown (for simplicity).
nMOS operation modes (3)
9
Derivation of the iD vs. vDS characteristic
10
nMOS equations (1)
11
nMOS equations (2)
12
nMOS characteristics
Source: 13
Kang, Leblebici, CMOS Digital Integrated Circuits, 3/e, McGraw-Hill
nMOS output characteristics
Fig. 5.11 (a) An n-channel enhancement-type MOSFET with vGS and vDS applied and
with the normal directions of current flow indicated. (b) The iD - vDS characteristics
for a device with Vt = 1 V and k’n(W/L) = 0.5 mA/V2. 14
Zooming in the output characteristics
Fig. 5.6 The drain current iD versus the drain-to-source voltage vDS for an
enhancement-type NMOS transistor operated with vGS > Vt.
15
nMOS in saturation: iD vs. vGS
Fig. 5.15 Increasing vDS beyond vDSsat causes the channel pinch-off point to move
slightly away from the drain, thus reducing the effective channel length (by L).
17
Effect of channel length modulation
Fig. 5.16 Effect of vDS on iD in the saturation region. The MOSFET parameter VA is
typically in the range of 30 to 200 V.
18
The device’s figure of merit
19
The MOSFET as an amplifier
Fig. 5.31 Conceptual circuit utilized to study the operation of the MOSFET
as an amplifier.
20
Small signal analysis (AC)
21
Fig. 5.32 Small-signal operation of the enhancement MOSFET amplifier.
Total component analysis (DC + AC)
23
Total component analysis
24
Small signal models
Fig. 5.34 Small-signal models for the MOSFET: (a) neglecting the dependence of iD on
vDS in saturation (channel-length modulation effect); and (b) including the effect of
channel-length modulation modeled by output resistance ro = |VA|/ID. 25
gm and ro
26
Figure 5.24 Determination of gm and ro
Load Line Analysis Example (1)
27
Load Line Analysis Example (2)
28
Load Line Analysis Example (3)
29
Practical Bias Circuits (1)
(DC operating point)
30
Practical Bias Circuits (2)
(DC operating point)
31
Practical Bias Circuits (3): Load Line
32
Practical Bias Circuits (4): Load Line
33
Practical Bias Circuits (4)
(DC operating point)
34
Practical Bias Circuits (5)
(DC operating point)
35
Practical Bias Circuits (5)
(DC operating point)
36
An Alternative Bias Circuit (6)
(DC operating point)
37
Common Source (CS) Amplifier
with Degeneration (1)
38
Common Source (CS) Amplifier
with Degeneration (2)
39
Common Source (CS) Amplifier
w/o degeneration (1)
40
Common Source (CS) Amplifier
w/o degeneration (2)
41
Common Drain (CD) Amplifier
42
Common Drain (CD) Amplifier (2)
43
Common Gate (CG) Amplifier (1)
44
Common Gate (CG) Amplifier (2)
45
Common Gate (CG) Amplifier (3)
46
n-MOSFET
current mirror
47
MOSFET current mirror characteristic
Fig. 5.42 Output characteristic of the current source in Fig. 5.40 and the current
mirror for the case Q2 is matched to Q1.
48
p-MOSFET current mirror
49
Common source amplifier
Fig. 5.45 The CMOS common-source amplifier: (a) circuit; (b) i-v characteristic of the
active-load Q2; (c) graphical construction to determine the transfer characteristic; and
50
transfer characteristic.
CS amplifier (small signal analysis)
51
Body effect (1)
52
Body effect (2)
53
Body effect (3)
54
Body effect (4)
55
Common gate amplifier
Fig. 5.47 The CMOS common-gate amplifier: (a) circuit; (b) small-signal equivalent
circuit; and (c) simplified version of the circuit in (b). 56
CG amplifier (small signal analysis)
57
CG amplifier (small signal analysis)
58
Common drain amplifier
Fig. 5.48 The source follower: (a) circuit; (b) small-signal equivalent circuit; 59
and (c) simplified version of the equivalent circuit.
CD amplifier (small signal analysis)
60
CD amplifier (small signal analysis)
61
Junction FET (n-channel)
62
Figure 5.38 n-Channel JFET.
JFET for vDS=0 (n-channel)
Figure 5.39 The nonconductive depletion region becomes thicker with increased reverse bias.
(Note: The two gate regions of each FET are connected to each other.)
63
JFET for vGS=0 (n-channel)
Figure 5.41 Drain current versus drain-to-source voltage for zero gate-to-source voltage. 65
n-channel JFET: output characteristics
67
Breakdown
Figure 5.44 If vDG exceeds the breakdown voltage VB, drain current increases rapidly. 68
Depletion mode n-MOSFET
Figure 5.47 Drain current versus vGS in the saturation region for n-channel devices. 71
p-channel FET
Figure 5.48 p-Channel FET circuit symbols. These are the same as the circuit symbols for
n-channel devices, except for the directions of the arrowheads.
72
iD vs. vGS for the various FET
Figure 5.49 Drain current versus vGS for several types of FETs. iD is referenced into 73
the drain terminal for n-channel devices and out of the drain for p-channel devices.
p-FET equations
74
p-FET output characteristics
75