Ida E: Functional Safety Engineering II SIS Design - SIL Verification
Ida E: Functional Safety Engineering II SIS Design - SIL Verification
North America
Europe
former TÜV Managers
Africa former Safety PLC Product Manager
(Siemens)
Instrumentation Engineers
(UOP, Bayer, Air Products, etc.)
Application Design +
Operation Asia Pacific
Copyright © 2000-2006 exida.com 2
exida has extensive
experience in automation
safety.
•Authored ISA best sellers on
automation safety and
reliability
•Authored industry databook
on equipment failure data
Copyright © 2000-2006 exida.com 3
Safety Lifecycle Software Tools - exSILentia
SILect – SIL selection and documentation tool
SILver - SIL design verification and documentation tool
SafetyCaseDB – Safety Case requirements database tool
Training
Courses for CFSE
On-line Training lessons for CFSE
Application Courses – Fire and Gas, BMS, HIPPS
Instructor
Name
Background/experience
Classmates
Name, company, position
Background/experience
Course objectives?
Copyright © 2000-2006 exida.com 6
Course Objectives
Objetivos del Curso
Sample Data
Histograms
Probability Density Functions
Cumulative Density Functions
Mean-Median
Hours Units
Censored Data
0-1000 7
1001-2000 4 8
2001-3000 3
7
3001-4000 3
4001-5000 2 6
5001-6000 1 Failed Units
5
6001-7000 1
4
7001-8000 1
8001-9000 1 3
9001-10000 1 2
10001-11000 1
1
11001-12000 1
12001-13000 1 0
13001-14000 3 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Operational Hours - 1000
0.25
0.2
0.15
0.1
0.05
0
1 2 3 4 5 6 7 8 9 10 11 12 13 14
X
1 failure, e.g.
probability of
0.8 failure
between 0
0.6 and 14000
hours is one.
0.4
0.2
0
1 2 3 4 5 6 7 8 9 10 11 12 13 14
x - Thousands of Hours
1.2
0.6
0
engineering and safety
1 2 3 4 5 6 7 8 9 10
x - Thousands of Hours
11 12 13 14
analysis
Censored Data •Uncertainty of data
8
7
•Applicability of data
F a i l e d U n i ts
6
5
4
3
2
Sample Data
Histograms
Probability Density Functions
Cumulative Density Functions
Mean-Median
Failure Rate
Stress-Strength
Wear out / Bathtub Curve
Reliability / Unreliability
Systematic vs Random Failure
Low, High and Continuous Demand
Constant Failure Rate
PFavg
Specification of requirements,
design, implementation
Function required
The system is not correct or execution trajectory hits
incorrectness
Continuous Demand
High Demand } Continuous Mode
Many find this confusing – in addition, the one year mark is arbitrary and
misleading. Technically the wording in Part 4, 3.5.12 is wrong as the
above Notes in other portions of IEC 61508 give examples that express
the true intent. The diagnostic test rate (proof test included) must be
greater than the demand rate
0.9
0.8
0.7
0.6
0.5
Strength
0.4
Stress
0.3
0.2
0.1
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.02
F a ilu re ra te
0.015
0.01
0.005
0
101
201
401
501
601
701
301
801
1
Time
Stress-strength explains how failure rates vary with time.
Weak units from a production population fail early. This portion of the curve
is known as “infant mortality.”
When weak units are eliminated from the population stress-strength
indicates a steady but declining failure rate.
When strength declines, the failure rate increases significantly.
Copyright © 2000-2006 exida.com 33
Stress - Strength: Failures
Esfuerzo – Fortaleza: Fallas
0.025
0.02
Constant Failure Rate
Failure rate
0.005
0
1
101
201
401
501
601
701
301
801
Time
0.8
Probability of
0.6
0.4
0.2
(t )
Common Assumption -
reasonable for the middle
of the failure rate curve.
t
R (t ) e Even if the failure rate is
decreasing (more
realistic), this assumption
t
F (t ) 1 e is conservative.
1
MTTF
Copyright © 2000-2006 exida.com 47
CONSTANT FAILURE RATE
Rata de Falla Constante
t t
R (t ) e F (t ) 1 e
1
0.8
F(t)
Probability
0.6
0.4
R(t)
0.2
0
31
37
40
43
10
13
16
19
22
25
28
34
46
49
1
A Useful Approximation:
t
F (t ) 1 e
2 3 4
x x x
e 1 x ....
x
2! 3! 4!
e 1 x
x
e t
1 t F (t ) t
Alternate Notation:
PF = t
Copyright © 2000-2006 exida.com 49
Unreliability Approximation
Aproximación para la No-Confiabilidad
3.5
F (t ) t
3
2.5
t
1.5
1
F (t ) 1 e
0.5
PF<0.1
0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
1 1
MTTR = =
MTTR
MTBF=MTTF + MTTR
TTF
TTF
An average over a large
TTR TTR number of systems and
a large number of
TBF TBF
failure/restore cycles.
MTTF = 1/
OK Fail
MTTR = 1/
Constant Restore Rate
Fail
If the model is
OK
solved for
Constant Restore Rate probability of
success as a
1 function of
0.9 A(t) operating time
0.8
Availability interval,
0.7
eventually the
Probability
0.6
availability model
0.5
reaches a
0.4
R(t) “steady state” or
0.3
0.2
average value.
0.1
Reliability This represents
0
many failure /
Operating Time Interval restore cycles.
0.6
0.5
availability model
0.4
reaches a
“steady state” or
0.3
Unavailability U(t)
0.2 average value.
0.1 This represents
0 many failure /
Operating Time Interval restore cycles.
This is a different
Availability
situation which requires 1
different modeling
techniques. Steady-
Probability
state availability will not
work.
Test/Inspection
Interval
OK Fail
Unavailability
0.7
0.6
Probability
equals zero
0.5
0.4
between inspections 0.3
31
34
10
13
16
19
22
25
28
37
40
1
Availability
An average technique
Average
has been defined in 1
Probability
average of the time
dependent values
must be calculated. Test/Inspection
Interval
Unavailability
0.7
OK Fail 0.6
Average
Probability
0.5
0.4
after an inspection 0
31
34
10
13
16
19
22
25
28
37
40
1
OK Fail
Constant Restore Rate
PFavg
OK Fail
13
15
17
19
21
23
25
27
29
31
33
11
1
equals zero
The average unavailability in a periodic between inspections
test/inspect situation is not the same as the equals one right
steady state unavailability! It is a different after an inspection
Markov model with different solution results.
Copyright © 2000-2006 exida.com 63
Availability. Periodic Test and Inspection
Disponibilidad. Inspección y Prueba Periódica
Unavailability
0.7
0.6
Average
Probability
0.5
0.4
0.3
0.2
0.1
0
10
40
13
16
19
22
25
28
31
34
37
1
T
1
PFavg PF t dt
T 0
Approx PF = TI
Approx PFavg = TI /2
Copyright © 2000-2006 exida.com 64
Simplified Equation PFAVG
Ecuación Simplificada para PFPROM
PFAVG = TI / 2
PF(t)
PFAVG
Test period
Operating time interval
Time interval
Copyright © 2000-2006 exida.com 65
The Effects of Incomplete Testing
Efectos de Pruebas Incompletas
PF(t)
IEC61511
SIL 1
SIL 2
PFavg
SIL 3
SIL 4
Operating Time
test
period
CPT
test period
Time interval
Average probability
Safety Integrity of failure on demand Risk Reduction
Level per year Factor
(Low Demand mode of
operation)
To what SIL level does this design qualify? SIL 2 >=10-7 to <10-6
10 minutes
3
• Fault Tree Diagrams
DDN
• Markov Models 1
OK
0
A A
DUN
POWER
SUPPLY
CONTROLLER 2
B B Fail
Energized
POWER 4
SUPPLY CONTROLLER
AC POWER MOTOR
Unavailability
Probability of
US = UA + UB – (UA * UB )
Failure
Copyright © 2000-2006 exida.com 79
Reliability Block Diagrams
Diagrama de Bloques de Confiabilidad
Parallel System
POWER
SUPPLY
A
POWER
SUPPLY
B
Availability
Probability of AP = A A + A B - AA * A B
Success
Unavailability
Probability of UP = U A * UB
Failure
Copyright © 2000-2006 exida.com 80
Reliability Block Diagrams
Diagrama de Bloques de Confiabilidad
Series/Parallel
POWER
CONTROLLER
SUPPLY
A A
Example: POWER
CONTROLLER
SUPPLY
B B
APS = 0.6
AC = 0.8
(for a one year interval)
ASystem? = (APS*AC) + (APS*AC) – (APS*AC)²
= (0.6*0.8) + (0.6*0.8) – (0.6*0.8)²
= 0.7296
Copyright © 2000-2006 exida.com 81
Fault Trees
Arboles de Falla
AC POWER MOTOR
A B
AC POWER UA
Fails
SYSTEM
OR Fails
MOTOR
Fails
UB
US = UA + UB – (UA * UB )
Copyright © 2000-2006 exida.com 82
Fault Trees
Arboles de Falla
POWER
SUPPLY
A
POWER
SUPPLY
B
Pa
POWER SUPPLY A
AND SYSTEM
Pb
POWER SUPPLY B
US = UA * UB
Copyright © 2000-2006 exida.com 83
Fault Trees
Arboles de Falla
POWER
CONTROLLER
SUPPLY
A A
POWER
CONTROLLER
SUPPLY
B B
POWER SUPPLY A
SUBSYSTEM
OR X
CONTROLLER A
AND SYSTEM
POWER SUPPLY B
SUBSYSTEM
OR Y
CONTROLLER B
US = UX * UY
Copyright © 2000-2006 exida.com 84
Fault Trees
A Arboles de Falla
POWER SUPPLY A
SUBSYSTEM
OR X
CONTROLLER A
AND SYSTEM
POWER SUPPLY A
SUBSYSTEM
OR Y
CONTROLLER A
US = UX * UY
In any probability combination method be careful to
check for “identical events.” In an AND gate with
identical events as the input, if Ux and Uy are the
same event, the probability of Us = Ux not Ux * Ux. In
an OR gate with two identical events as the input, the
output = Ux not Ux + Ux – Ux * Ux.
Note: setting up a model this way appears to make no sense but it does happen.
A*B = A * B
Unavailability
0.7
0.6
Average
Probability
0.5
0.4
0.3
0.2
0.1
0
10
40
13
16
19
22
25
28
31
34
37
1
Remember that:
T
1
PFavg PF t dt
T 0
Copyright © 2000-2006 exida.com 87
Fault Trees – PFD avg
Arboles de Falla
TI
2 3
Therefore:
1
PFsys = * TI 2 PFavg , sys
TI 3
2 2
Continuing:
PFavg , sys
TI
Copyright © 2000-2006 exida.com 3 88
Fault Trees – PFDavg
Arboles de Falla
If one calculates PFDavg of each component before the logic:
PFDa
Subsystem A
AND SYSTEM
PFDb
Subsystem B
PFDa = d * TI
PFDavga = d * TI/2 The results are
PFDavgb = d * TI/2 optimistic and
may result in
Therefore:
insufficient
PFDavg,sys = d * TI2 safety!
4
2 2
Rather than the correct:
PFDavg , sys TI d
3
Copyright © 2000-2006 exida.com 89
Markov Models
Modelos de Markov
3
Models different repair rates for
DDN
different kinds of failures. 1
OK
Qualitatively shows the operation
of a fault tolerant system. 0
DUN
2
CIRCLES represent
combinations of failed and
successful components. Fail
Energized
Redundancy
= failure rate
= system repair rate (replacement)
7
Undetected
1 – 7 = Failure Rates
2 Fail-
Danger 1 = Repair Rate after a shutdown
4 4
2 = on-line repair of equipment
3 3 = periodic Inspection / test
3 equals zero between
inspections and one after an
Copyright © 2000-2006 exida.com inspection. 92
Failure Modes
Modos de Falla
SAFE
DANGEROUS
NORMAL
– Failure Modes
• Output Saturated Hi
S/D • Output Saturated Lo
• Frozen Output
D • Indication Error Hi
• Indication Error Lo
• Diagnostic Failure
Define Modes
System
+ + causes
false trip!
Solid State
Discrete Input PLC Output Switch
LOAD
If there is a
+ + demand -
system
cannot
respond.
Solid State
Discrete Input PLC Output Switch
LOAD
We have defined:
• RELIABILITY - the probability of success during an interval of time
• R(t) = P(T>t) where T = Failure Time for an interval 0 - t.
• UNRELIABILITY - the probability of failure during an interval of time
• F(t) = P(T<=t)
• R(t) = 1 - F(t) (complementary events)
T
1
PFavg PF t dt
T 0
PFS
Nuisance Trip
AVAILABILITY
PFD
Sensor Controller
Common Stress
Sensor Controller
Final Element
0.6
0.5
0.4
0.3
0.2
0.1
Note: this particular graphical representation of beta was derived for a redundant system with two components. The
beta model may be used on systems with more than two components but care must be taken when choosing the beta
number as it will vary depending on the number of components exposed to the common stress.
cc
= independent + common cause
= 0.02 failures / year
= 0.05
CC = 0.05 * 0.02 = 0.001 failures / year
I = (1-0.05) * 0.02 = 0.019 failures / year
= 0.11
IEC 61508, Part 6 Annex D.6
2
Power Power
2 OK Supply A Supply B
1 OK FAIL
Fails Fails
Power Supply
Power Supply
System Failure
System Failure
Power Power
Supply A Supply B
Fails Fails Power Power Common
Supply A Supply B Cause
Fails Fails Failure
b=0.05
Markov Model
2
2 OK 1 OK FAIL
C
30 minutes
FMEA
FMEA Format
Diagnostics
Coverage Factor
FMEDA
Procedure:
1. List all components and each
failure mode.
2. For each component / failure mode,
list the effect of that failure on the
higher level sub-system/system.
3. List the criticality / severity of the
effect.
COOLING
WATER
REACTOR
VALVE1
COOLING
JACKET
COOLING
WATER
FO
TSW DRAIN
1
POWER SUPPLY
PS1
Pointers:
1. Be careful about listing all parts
2. Be careful about listing all known failure modes, refer
to failure mode references.
3. Identify each part uniquely
4. Do not worry about "causes" unless the failure mode
turns out to be critical - then list the cause so that it
perhaps can be eliminated or reduced in magnitude
5. FMEAs should be done in groups or reviewed by
groups
Diagnostic
Coverage
Failure Mode
Distribution
S + D
%Safe =
S
S + D
S = %Safe *
D = (1-%Safe) *
SD = CS*S
SU = (1-CS)*S
DD = CD*D
DU = (1-CD)*D
5V ISO.
D2 +5V
Vin 1K 200K
V1 V2
ac input
F 10K D1
L2
OC1 10K
From ISA Book: Control Systems Safety Evaluation and Reliability, W.M. Goble, 1998.
Copyright © 2000-2005 exida.com
Failure Modes, Effects and Diagnostic Analysis (FMEDA)
Análisis de Modos de Fallas, Efectos y Diagnóstico (AMFED)
From ISA Book: Control Systems Safety Evaluation and Reliability, W.M. Goble, 1998.
Copyright © 2000-2005 exida.com
Failure Modes, Effects and Diagnostic Analysis (FMEDA)
Análisis de Modos de Fallas, Efectos y Diagnóstico (AMFED)
FMEDA for Safety Rated Input Circuit
Failure Modes and Effects Analysis Failures/billion hours Safe Dangerous
Component Mode Effect Criticality FIT Safe Dang. Det. Diagnostic Covered Covered
FIT
R1 - 10K short Threshold shift 1 Safe 0.13 0.125 0 0 0 0
open open circuit 1 Safe 0.5 0.5 0 1 loose input pulse 0.5 0
R2 - 100K short short input 1 Safe 0.13 0.125 0 1 loose input pulse 0.125 0
open Threshold shift 1 Safe 0.5 0.5 0 0 0 0
D1 short overvoltage 1 Safe 2 2 0 1 loose input pulse 2 0
open open circuit 1 Safe 5 5 0 1 loose input pulse 5 0
D2 short overvoltage 1 Safe 2 2 0 1 loose input pulse 2 0
open open circuit 1 Safe 5 5 0 1 loose input pulse 5 0
OC1 led dim no light 1 Safe 28 28 0 1 Comp. mismatch 28 0
tran. short read logic 1 0 Dang. 10 0 10 1 Comp. mismatch 0 10
From ISA Book: Control Systems Safety Evaluation and Reliability, W.M. Goble, 1998.
Copyright © 2000-2005 exida.com
Diagnostic Coverage
Cobertura por Diagnóstico
PROVIDES:
• IEC 61508 Safe Failure Fraction
• Coverage Factors: CD, CS
• Failure Rates: S, D, SD, SU, DD, DU
Needed for SIL Verification
Copyright © 2000-2006 exida.com 134
IEC61508/IEC61511 Safe Failure Fraction
Fracción de Falla Segura según IEC61508/IEC61511
TYPE A Subsystem
Safe Failure
Hardware Fault Tolerance
Fraction
0 1 2
TYPE B Subsystem
Safe Failure
Hardware Fault Tolerance
Fraction
0 1 2
15 minutes
2. Overall scope
definition
3. Hazard and
Management of Functional Safety
risk analysis
5. Safety requirements
Documentation
allocation
Verification
6. Overall 7. Overall 8. Overall
operation and safety 9. SRS
installation and
maintenance validation E/E/PES
commissioning
planning planning realization
planning
16. Decommissioning
or disposal
Functional Safety Management Objectives
Objetivos de la Gerencia Funcional de Seguridad
Analyze
Hazard Analysis /
Risk Assessment: Document
Define Design
Targets
Design Execute HW
and SW Design Document
• Types of Exams
– Application – Process Industries
– Application – Machine Industries
– Developer – Software
– Developer - Hardware
Resources Available:
•On-line Training
•Study Guide
•Reference Books
15 minutes
Basic Architectures
Comparison
Advanced Architectures
Diagnostics and Common Cause
How much?
Select Technology
What kind of redundancy?
Select
Architecture
1oo1
Determine Test
Philosophy 1oo2
Reliability 2oo3
Evaluation
1oo1D
Performance No
Target Met?
1oo2D
Yes, proceed
Copyright © 2000-2006 exida.com 160
Simplified Equations
Ecuaciones Simplificadas
1oo1 d * T/2 s
d)2 * T2 2s
1oo2
3
d * T 2s2
2oo2
3s + 2/T
2oo3 d)2 * T2 6s2
5s + 2/T
Sensor Controller
Determine Test Final Element
Philosophy
-
s d * T/2
Reliability
Evaluation
STR PFDAVG (Dangerous)
1oo2 +
Select Technology
Sensor Controller
Select
Architecture Sensor Controller
Output
-
Determine Test
Philosophy d)2 * T2
2s
3
Reliability
Evaluation STR PFDAVG (Dangerous)
1oo1 0.01/year 0.01
Performance No
Target Met? 1oo2 0.02/year 0.00013
Yes, proceed Using Simple Approximation Formulas
Copyright © 2000-2005 exida.com
No Common Cause, No Diagnostics
2oo2 Architecture – Redundancy to reduce false trips
Arquitectura 2oo2 – Redundancia para reducir Paros Falsos
2oo2 +
Select Technology Sensor Controller
Select
Architecture Sensor Controller
Output
2s2 -
Determine Test
Philosophy du * T
3s + 2/T
STR PFDAVG (Dangerous)
Reliability
Evaluation
1oo1 0.01 /year 0.01
C
Output Circuit 1
Logic Solver
Sensor Input Circuit Common Circuitry
-
STR PFDAVG (Dangerous)
1oo1 0.01 /year 0.01
1oo2 0.02 /year 0.00013
2oo2 0.0001 /year 0.02
2oo3 0.0003 /year 0.0004
Using Simple Approximation Formulas - No Common Cause, No Diagnostics
Copyright © 2000-2005 exida.com
Diagnostics
Diagnósticos
This can have a strong positive impact on PFDavg, STR and controller
availability – in all architectures but especially in redundant architectures.
Diagnostic capability measured by
“C = Coverage Factor”,
the percentage of failures that will be detected.
Cs = Coverage Factor for Safe Failures
Cd = Coverage Factor for Dangerous Failures
Copyright © 2000-2006 exida.com 166
1oo1 Architecture - Diagnostics
Arquitectura 1oo1 - Diagnósticos
s = 0.05 failures / year 1oo1
+
d = 0.02 failures / year Sensor Controller
T = 1 year Final Element
Cs, Cd = 0 to 0.6 -
This architecture will not automatically shutdown on a detected failure.
Therefore repair time is a variable in the PFDavg equation.
Using fault trees: average repair time equals 48 hours, inspection period equals
1 year, diagnostic coverage factors = 0.6, no common cause.
Copyright © 2000-2006 exida.com 167
New Generation Architectures
Arquitecturas de Nueva Generación
1oo1D 2oo2D +
+ Diagnostic Circuit(s)
Diagnostic Circuit(s)
Output Circuit
Logic Solver
Output Circuit Input Circuit Common Circuitry
Sensor Logic Solver
Input Circuit Common Circuitry
MP
Actuator
MP Final Element
Sensor Diagnostic Circuit(s)
-
Output Circuit
MP
Output Circuit
Sensor Logic Solver
Input Circuit Common Circuitry
Actuator
MP Final Element
-
STR PFDAVG (Dangerous)
1oo1 0.05 /year 0.00406 Cd = 0.6
1oo1D 0.062 /year 0.004 Cd = 0.6
1oo1 0.05 /year 0.0006 Cd = 0.95
1oo1D 0.069 /year 0.0005 Cd = 0.95
Using fault trees: average repair time equals 48 hours, inspection period
equals 1 year, no common cause.
Copyright © 2000-2006 exida.com 169
New Generation Architectures – 2oo2D
Arquitecturas de Nueva Generación – 2oo2D
+
Diagnostic Circuit(s)
Output Circuit
Logic Solver
Input Circuit Common Circuitry
MP
Output Circuit
Logic Solver
Input Circuit Common Circuitry
Actuator
MP Final Element
-
STR PFDAVG (Dangerous)
1oo1 0.05 /year 0.0006
2oo3 0.00043 /year 0.00000094
1oo1D 0.069 /year 0.0005
2oo2D 0.00021 /year 0.001
Using fault trees: average repair time equals 48 hours, inspection period
equals 1 year, diagnostic coverage factors = 0.95, no common cause.
Copyright © 2000-2006 exida.com 170
New Generation Architectures – 1oo2D
Arquitecturas de Nueva Generación – 1oo2D
MP
Output Circuit
Logic Solver
Input Circuit Common Circuitry
MP
Actuator
Final Element
PT-101A Trip if
either
transmitter SENSOR
indicates a
trip
PT-101B condition
Safety
PLC
2oo2
Voting
FINAL ELEMENT
1oo2
2oo3 (1oo1D, 2oo2D and 1oo2D)
ce
an
are more susceptible to
rm
rfo
Pe degraded performance if
PFDavg
st
diagnostic
Be
settings/configuration in the
1oo1D safety manual are not strictly
1oo1
followed.
2oo2D
high
1 1 0 0
2 2 1 0
3 3 2 1
1 0
2 1
3 2
Redundant Architectures
Complete the problems
10 minutes
Basic Architectures
Comparison
Advanced Architectures
Diagnostics and Common Cause
Process Information
Requirements
SIS Functional Description of each Safety
Exit
Allocation
Required? Instrumented Function, Target SIL,
Safety
Yes Mitigated Hazards, Process parameters,
Logic, Bypass/Maintenance
Develop Safety requirements, Response time, etc
Specification
1oo1
1oo2D
1oo2
– Objective
2oo2 • Determine type of redundancy
needed to meet required Safety
Integrity Level
2oo3 – Tasks
• Choose architecture
• Obtain reliability and safety data
for the architecture
Yes, proceed
Copyright © 2000-2006 exida.com 200
SIF Verification Task
Verificación de las FIS
Safety Requirements-
Specification - Safety Where does the data come from?
Function Requirements
including target SIL
Manufacturer’s
Failure Data
7d. Reliability and
Failure Data Safety Evaluation
Database
PFDavg, RRF
MTTFS,
SIL achieved
Copyright © 2000-2006 exida.com 201
Failure Rate Data Models
Modelos de Datos para Ratas de Falla
1. Industry Databases –
NOT Application Specific,
NOT Product Specific
2. Manufacturer FMEDA, Field
Failure Study –
Product Specific, NOT
Application Specific
Average probability
Safety Integrity of failure on demand Risk Reduction
Level per year Factor
(Demand mode of operation)
Battery
system failure
Batteries
discharged Charger
fails
F = 0.2 F = 0.01
Lambda D (D)
PSH
sov V essel
PFDavg = DU TI / 2
PFDavg = (0.000006 * 8760) / 2
PFDavg = 0.0263
RRF = 1/PFDavg = 38
Copyright © 2000-2006 exida.com 208
IEC61508/IEC61511 Safe Failure Fraction
IEC61508/IEC61511 Fracción de Falla Segura
TYPE A Subsystem
Safe Failure
Hardware Fault Tolerance
Fraction
0 1 2
1. Verify that the DCS was not being used as a “Layer of Protection.”
2. Verify that any DCS failure would not be an “initiating event” for a
hazard.
If either of these are possible, then one cannot use the DCS in a safety
instrumented function.
P re s s u re
T r a n s m it te r
D C S TX
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P re s s u re
T r a n s m itte r
DCS TX
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TYPE B Subsystem
Safe Failure
Hardware Fault Tolerance
Fraction
0 1 2
P re s s u re
PFDavg? T r a n s m itt e r
SFF? DC S TX
SIL? V essel
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Transmitter
Safety
TX
PLC
1002 Vessel
sov sov
Voting
S a fe ty
P re s s u re
T r a n s m itte r
S a fe ty
PLC TX
1002 V essel
sov V o tin g
sov
30 minutes
Event History
Identify
Potential Risks Potential Hazards
e id a .com
Layers of Protection exce llence i n dependable a utomatio n
PROBE Tool
Ciclo Vida Seg. Detallado Tolerable Risk Select Target Target SILs
Guidelines Develop non- SIL
SIS Layers e id a .com
exce llence i n depe ndab le automatio n
DOCUMENT Template
Requirements
Required? Exit
Allocation
Instrumented Function, Target SIL,
Safety
Yes Mitigated Hazards, Process parameters,
Logic, Bypass/Maintenance
Develop Safety requirements, Response time, etc
Specification
Select Relays, Fail-Safe Solid State, PLC, Safety
Technology PLC, Sensors, Final Elements
Validation
the activity of demonstrating that the safety
instrumented function(s) and safety instrumented
system(s) under consideration after installation
meets in all respects the safety requirements
specification.
Verification
Activity of demonstrating for each phase of the
safety lifecycle by analysis and/or tests that, for the
specific inputs, the deliverables meet the objectives
and requirements set for the specific phase.
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Terms
Términos
Commissioning
Process Plant
Pre-commissioning Production
VALIDATION & FSA
prior to start-up
REALIZATION
FAT
Design and Development of
Safety Instrumented System,
Factory Acceptance Test INSTALLATION V
A
SAT / SIT L
Installation, Commissioning, and Validation
Sub- clause 14 and 15 I
COMMISSIONING D
OPERATION A
Operation and Maintenance Functional Safety Assessment T
Sub-clause 16
I
START UP O
Modification Decommissioning
N
– Objective
• Install equipment to specifications and drawings
– Activities
• Mount equipment per manufacturers instructions
• Install all equipment components in proper position
• Install all jumpers, keying mechanisms and protection
components
• Connect grounding
• Connect energy sources
• Calibrate instruments
• Connect interfaces and all communications links
• Connect field devices
• Verify environmental stress conditions against
specifications
Validation
A
COMMISSIONING T
I
O
FSA
Objectives N
START UP
Activities
Documentation Required
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Section 9: Operational Requirements
Sección 9: Requerimientos Operacionales
Maintenance Planning
Manufacturer‘s Maintenance Data
Periodic Inspection Testing / Records
Event History
Identify
Potential Risks Potential Hazards
e id a .com
Layers of Protection excelle nce i n dependable a utomation
PROBE Tool
Requirements
Required? Exit
Allocation
Instrumented Function, Target SIL,
Safety
Yes Mitigated Hazards, Process parameters,
Logic, Bypass/Maintenance
Develop Safety requirements, Response time, etc
Specification
Select Relays, Fail-Safe Solid State, PLC, Safety
Technology PLC, Sensors, Final Elements
From Rosemount
3051S, Safety:
Proof Test 1 –
65%
Proof Test 2 –
98%
Why bother with
proof test 1?
Personnel, date
Bypass authorization
Tests performed
Results
System restored
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Management of Change
Before the Request
Modification request
10 minutes
Maintenance Planning
Manufacturer‘s Maintenance Data
Periodic Inspection Testing / Records