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"Enhancing reliability with thermal transient testing."

Vladimír Székely (2002)

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DOI: 10.1016/S0026-2714(02)00028-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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Vladimír Székely:
Enhancing reliability with thermal transient testing. Microelectron. Reliab. 42(4-5): 629-640 (2002)

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