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"Bounding Integrity Risk and False Alert Probability Over Exposure Time ..."

Yawei Zhai, Xingqun Zhan, Boris Pervan (2020)

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DOI: 10.1109/TAES.2019.2935962

access: closed

type: Journal Article

metadata version: 2020-07-15

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  - https://dblp.org/rec/journals/taes/ZhaiZP20
Yawei Zhai, Xingqun Zhan, Boris Pervan:
Bounding Integrity Risk and False Alert Probability Over Exposure Time Intervals. IEEE Trans. Aerosp. Electron. Syst. 56(3): 1873-1885 (2020)

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