Designation: E2446 16

Standard Practice for

Manufacturing Characterization of Computed Radiography
Systems1
This standard is issued under the fixed designation E2446; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon () indicates an editorial change since the last revision or reapproval.

1. Scope this practice may carry out the tests at different or additional
1.1 This practice describes the manufacturing characteriza- radiation qualities (X-ray or gamma ray) if required.
tion of computed radiography (CR) systems, consisting of a 1.6 The values stated in SI are to be regarded as the
particular phosphor imaging plate (IP), scanner, software, and standard.
an image display monitor, in combination with specified metal 1.7 This standard does not purport to address all of the
screens for industrial radiography. safety concerns, if any, associated with its use. It is the
1.2 The practice defines system tests to be used to charac- responsibility of the user of this standard to establish appro-
terize the systems of different suppliers and make them priate safety and health practices and to determine the
comparable for users. applicability of regulatory limitations prior to use.
1.3 This practice is intended for use by manufacturers of CR
2. Referenced Documents
systems or certification agencies to provide quantitative results
of CR system characteristics for nondestructive testing (NDT) 2.1 ASTM Standards:2
user or purchaser consumption. Some of these tests require E746 Practice for Determining Relative Image Quality Re-
specialized test phantoms to ensure consistency of results sponse of Industrial Radiographic Imaging Systems
among suppliers or manufacturers. These tests are not intended E1165 Test Method for Measurement of Focal Spots of
for users to complete, nor are they intended for long term Industrial X-Ray Tubes by Pinhole Imaging
stability tracking and lifetime measurements. However, they E1316 Terminology for Nondestructive Examinations
may be used for this purpose, if so desired. E1815 Test Method for Classification of Film Systems for
Industrial Radiography
1.4 The CR system performance is described by the basic
E2002 Practice for Determining Total Image Unsharpness
spatial resolution, contrast, signal and noise parameters, and
and Basic Spatial Resolution in Radiography and Radios-
the equivalent penetrameter sensitivity (EPS). Some of these
copy
parameters are used to compare with DDA characterization and
E2007 Guide for Computed Radiography
film characterization data (see Practice E2597 and Test Method
E2033 Practice for Computed Radiology (Photostimulable
E1815).
Luminescence Method)
NOTE 1For film system characterization, the signal is represented by E2445 Practice for Performance Evaluation and Long-Term
the optical density of 2 (above fog and base) and the noise as granularity. Stability of Computed Radiography Systems
The signal-to-noise ratio is normalized by the aperture (similar to the basic
E2597 Practice for Manufacturing Characterization of Digi-
spatial resolution) of the system and is part of characterization. This
normalization is given by the scanning circular aperture of 100 m of the tal Detector Arrays
micro-photometer, which is defined in Test Method E1815 for film system E2903 Test Method for Measurement of the Effective Focal
characterization. Spot Size of Mini and Micro Focus X-ray Tubes
1.5 The measurement of CR systems in this practice is 2.2 ISO Standard:3
restricted to a selected radiation quality to simplify the proce- ISO 17636-2 Non-Destructive Testing of Welds
dure. The properties of CR systems will change with radiation Radiographic TestingPart 2: X- and Gamma Ray Tech-
energy but not the ranking of CR system performance. Users of nologies with Digital Detectors

1 2
This practice is under the jurisdiction of ASTM Committee E07 on Nonde- For referenced ASTM standards, visit the ASTM website, www.astm.org, or
structive Testing and is the direct responsibility of Subcommittee E07.01 on contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
Radiology (X and Gamma) Method. Standards volume information, refer to the standards Document Summary page on
Current edition approved June 1, 2016. Published June 2016. Originally the ASTM website.
3
approved in 2005. Last previous edition approved in 2015 as E2446 15. DOI: Available from International Organization for Standardization (ISO), 1, ch. de
10.1520/E2446-16. la Voie-Creuse, CP 56, CH-1211 Geneva 20, Switzerland, http://www.iso.org.

Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States

1
 E2446 16
3. Terminology 4.4 The quality factors can be determined most accurately
3.1 DefinitionsThe definition of terms relating to gamma- by the tests described in this practice. Some of the system tests
and X-radiography, which appear in Terminology E1316, require special tools, which may not be available in user
Guide E2007, and Practice E2033, shall apply to the terms used laboratories. Simpler tests are described for quality assurance
in this practice. and long term stability tests in Practice E2445.
3.2 Definitions of Terms Specific to This Standard: 4.5 Manufacturers of industrial CR systems or certification
3.2.1 computed radiography system (CR system)A com- agencies will use this practice. Users of industrial CR systems
plete system of a storage phosphor imaging plate (IP), a may use Practice E2445 or perform some of the described tests
corresponding read out unit (scanner or reader), software and and measurements outlined in this practice, provided that the
an image display monitor, which converts the information of required test equipment is used and the methodology is strictly
the IP into a digital image (see also Guide E2007). followed. Any alternative methods or radiation qualities may
3.2.2 computed radiography system performance levelA be applied if equivalence to the methods of this practice is
particular group of CR performance levels, which is charac- proven to the appropriate cognizant engineering organization.
terized by a SNRN (signal-to-noise ratio) range, an interpolated 4.6 The publication of CR system performance levels will
basic spatial resolution range iSRbdetector and equivalent pen- enable specifying bodies and contracting parties to agree to
etrameter sensitivity (EPS) shown in Table 4 in a specified particular system performance level, as a first step in arriving
exposure range. at the appropriate settings of a system, or the selection of a
3.2.3 gain/amplificationOpto-electrical gain setting of the system. Confirmation of necessary image quality shall be
scanning system. achieved by using Practice E2033.
3.2.4 ISO speed SIPxDefines the speed of a CR system and 5. Apparatus
is calculated from the reciprocal dose value, measured in Gray
(Gy), which is necessary to obtain a specified minimum SNRN 5.1 CR system evaluation depends on the combined prop-
of a CR system performance level. erties of the phosphor imaging plate (IP) type, the scanner and
software used, and the selected scan parameters and image
3.2.5 linearized signal intensitya numerical signal value
display monitor. Therefore, documentation for each test shall
of a picture element (pixel) of the digital image, which is
include the IP type, scanner, software, scan parameters, and
proportional to the radiation dose. The linearized signal inten-
image display monitor, and the results shall be calculated and
sity is zero, if the radiation dose is zero.
tabulated before arriving at a performance assignment. The
applied test equipment for SNR measurement (Fig. 1) and
4. Significance and Use
algorithm 6.1.1 correspond to Test Method E1815. The recom-
4.1 There are several factors affecting the quality of a CR mended thickness for aperture test object (diaphragm) is
image including the basic spatial resolution of the IP system, 10.2 mm (0.4 in.) of Pb. The SDD shall be at least 1 m (39 in.).
geometrical unsharpness, scatter and contrast sensitivity. There Do not use any material (for example, lead) behind the cassette
are several additional factors (for example, software and and leave a free space of at least 1 m (39 in.) behind the
scanning parameters) that affect the accurate reading of images cassette or use a steel screen of about 0.5 mm (0.02 in.) and a
on exposed IPs using an optical scanner. lead plate of > 2 mm (0.08 in.) just behind the cassette (steel
4.2 This practice is to be used to establish a characterization screen is positioned between cassette and lead) and in contact
of CR system by performance levels on the basis of a with the cassette.
normalized SNR, interpolated basic spatial detector resolution 5.2 The step wedge method (Fig. 2) describes a simpler
and EPS. The CR system performance levels in this practice do procedure for SNR measurement than described in Test
not refer to any particular manufacturers imaging plates. A CR Method E1815, which permits obtaining similar results with
system performance level results from the use of a particular less expense, and less accuracy.
imaging plate together with the exposure conditions, standard-
ized phantom, the scanner type, and software and the scanning 6. Procedure for Quantitative Measurement of Image
parameters. This characterization system provides a means to Quality Parameters
compare differing CR technologies, as is common practice 6.1 Measurement of the Normalized Signal-to-Noise Ratio
with film systems, which guides the user to the appropriate (SNRN)
configuration, IP, and technique for the application at hand. 6.1.1 Step Exposure MethodFor measurement of the SNR,
The performance level selected may not match the imaging the following steps are taken (see also Test Method E1815):
performance of a corresponding film class because of the 6.1.1.1 The IP shall be positioned in front of an X-ray tube
difference in the spatial resolution and scatter sensitivity. with tungsten anode. Make the exposures with an 8 mm
Therefore, the user should always use IQIs for proof of contrast (0.32 in.) copper filter at the X-ray tube and the kilovoltage set
sensitivity and basic spatial resolution. such that the half value layer in copper is 3.5 mm (0.14 in.).
4.3 The measured performance parameters are presented in The kilovoltage setting will be approximately 220 kV. Metal
a characterization chart. This enables users to select specific screens can be used in the cassette if the manufacturer
CR systems by the different characterization data to find the recommends its application. The focal spot size is not relevant
best system for his specific application. for SNR measurements.

2
 E2446 16

FIG. 1 Scheme of Experimental Arrangement for the Step Exposure Method

FIG. 2 Scheme for the Measurement of the SNR by the Step Wedge Method

6.1.1.2 Determine the required exact kilovoltage setting by 6.1.1.5 The procedure shall be carried out and documented
making an exposure (or an exposure rate) measurement with for one or more agreed sets of scanner parameters per imaging
the detector placed at a distance of at least 750 mm (29.5 in.) plate type. It is recommended to use the standard parameters of
from the tube target and an 8 mm (0.32 in.) copper filter at the the CR scanner as given by the manufacturer and the parameter
tube. Then make a second measurement with a total of set for the highest resolution.
11.5 mm (0.45 in.) of copper at the tube. These filters should be 6.1.1.6 IPs are exposed under the conditions described
made of 99.9 % pure copper. above: A signal (S) and noise () or the quotient, the signal to
6.1.1.3 Calculate the ratio of the first and second readings. If noise ratio (SNR vs. dose and pixel value curve shall be
this ratio is not 2, adjust the kilovoltage up or down and repeat measuredsee Fig. 3 and Fig. 4). It is important that the
the measurements until a ratio of 2 (within 5 %) is obtained. exposure of the IP for the SNR measurements be spatially
Record the setting of kilovoltage for use with the further IP uniform. Any non-uniformities in X-ray transmission of the
tests. cassette front, or defects in a front metal screen or in the
6.1.1.4 The scanner shall read with a dynamic range of phosphor layer itself could influence the SNR measurement.
12 bit and operate at its highest spatial resolution or a basic No major scratches or dust shall be visible in the measurement
spatial resolution for which the characterization shall be carried area. Therefore, exercise considerable care in selection and
out. Background and anti-shading correction may be used placement of the aperture, selection, and maintenance of the
before the analysis of data, if it relates to the standard cassette, the metal screens (if any), and the imaging plate. To
measurement procedure for all measurements. achieve a uniform area of interest on to the IP, the following

3
 E2446 16

FIG. 3 Scheme for Measurement of SNR in the RoI with Pixel Values PVij

NOTE 1The tested CR system qualifies for:

Level I performance from PV 350 4095 (see Table 4)
Level II performance from PV 140 4095 (see Table 4)
PVmax = 4095, as determined with procedure of 6.4
FIG. 4 Example Plot of Measured SNRN Versus PV (12 bit system, iSRb = 70 m) for Determination of Level I and II Performance Range
(see 6.4)

standard protocol is recommended. Other approaches may be ments shall be made on at least six different samples, and the
used as long as a uniform exposure is created. At least twelve results are to be averaged for each of the twelve or more dose
areas (test areas) of 400 mm2 (0.62 in.2) are evenly exposed levels measured.
on the same IP over the full working range of dose. Due to the 6.1.1.7 The signal (S) and noise (standard deviation ) of
different construction principles of scanners, the measurement the measured pixel values shall be calculated from a region of
shall be performed for different pixel sizes as recommended by interest (RoI) without shading or artifacts. Sample SNR values
the manufacturer. A waiting time of 15 minutes is recom- shall be taken in different regions of the image area under test
mended between exposure and scan of the IPs to avoid to ensure that SNR values are within 10 %. The size of the RoI
distortions by fading effects. Typically the characterization is used to measure the mean signal and noise shall be at least 40
performed for selected parameter sets only if agreed by the by 200 pixels.
manufacturer and the certifying laboratory. The digital read-out 6.1.1.8 An example technique for ensuring reliable signal-
pixel values shall be calibrated in such a way that they are to-noise measurements is described in the following. This can
linear in relation to the radiation dose, which corresponds to be achieved using a commonly available image processing
the photo stimulated luminescence (PSL) intensity of the tool. The signal and noise shall be calculated from a data set of
exposed IPs. These calibrated pixel values shall be used for the 8000 values or more per exposed area. The unfiltered data set
calculation of the SNR to obtain a reliable result. Measure- is subdivided into 200 groups or more with 40 values per group

4
 E2446 16
(200 or more profile lines with 40 pixels per profile). For each 6.1.2.2 The projected area of each step shall be about 20 by
group with index i, the signal SI and the noise value i are 20 mm (400 mm2). SNR values should not be taken closer
calculated from the pixel values PVij in the region of interest than four times the iSRbimage to an edge.
(RoI). An increased number of groups per RoI yields a better 6.1.2.3 All details for the measurement of the SNR shall
(lower) uncertainty of the result. Fig. 3 describes the measure- correspond to 6.1.1.6 6.1.1.9. The graphical analysis shall be
ment procedure in detail and the equations to use. If SRbdetector based on the plot of SNR = f(sqrt [Exposureexp(-Cu wCu)]),
> pixel size, it is recommended to use a profile line width (lw) where Cu is the absorption coefficient, wCu is the wall
of: thickness of the corresponding step of the step wedge and the
lw ~ pixel ! 5 40 iSR detector pixel size (1)
value Exposure is calculated from exposure time (seconds),
b
multiplied by tube current (mA).
6.1.1.9 The final value S is obtained by the median of all Si NOTE 4For accurate plots, it is necessary to consider the wall
values. The final value is obtained by the median of all i thickness dependence of Cu on the wall thickness (beam hardening). The
values. SNR shall be calculated as reference value SNRN, influence of scattered radiation should be reduced by exact collimation.
normalized to a resolution of 88.6 m, which is related to a Different exposures with different exposure time or mA-settings are
squared aperture (pixel size of 88.6 x 88.6 m). The final value recommended for the required plot. The exposure value (mAs) of the
different exposures of the step wedge target should be increased by about
SNRN is calculated by considering the measured interpolated 5.
basic spatial resolution iSRbmax (see 6.5):
6.2 Contrast Sensitivity by Equivalent Penetrameter Sensi-
88.6 m tivity (EPS)
SNRN 5 SNR (2)
iSR bmax 6.2.1 The characterization by performance levels being
where: based on the EPS can be performed with less accuracy on basis
of visual evaluation of radiographs than by the quantitative
iSRbmax = interpolated maximum value of basic spatial reso-
SNRN step exposure method using the following procedure on
lution in m as measured in 6.5.
basis of Practice E746, as illustrated in Fig. 5. The standard
NOTE 2Test Method E1815 requires the use of a micro-photo procedure is the EPS measurement at 90% of the maximum
densitometer with circular aperture of 100 m diameter for the measure- achievable pixel value, PVmax (see also 6.3 and Fig. 4) with a
ment of granularity D of films. Because the pixels in digital images are steel absorber as described in Practice E746 and the measure-
organized in squares, the corresponding pixel size is calculated by sqrt
ment of the effective attenuation coefficient. Optionally, the
((100 m)2 / 4) = 88.6 m (1 m = 3.93701E-05 in.). This value of 88.6
m for normalization was selected for comparison of noise in digital complete plot of EPS vs. dose curve may be measured (Fig. 5)
images with film granularity. and PVmin may be determined as shown in Fig. 6 for the
different performance levels. Other fine grained materials than
6.1.1.10 SNRN shall be plotted versus pixel value (Fig. 4)
mild steel and different radiation qualities may be used if
and versus exposure dose.
requested for other applications as, for example, testing of light
6.1.2 Step Wedge Method (Manufacturer Test and Enhanced materials in aerospace applications.
User Test)The measurement of the SNR can be performed 6.2.2 Required Measurements and EvaluationsThese
with less accuracy using a step wedge, as shown in Fig. 2. This evaluations are adapted from Practices E746 and E2002. Image
method, if approved by the cognizant engineering organization quality indicators from these standards and a 1-mm steel plate
(CEO), may be of interest for users to determine the SNR with for measurement of the relative contrast are arranged in a
less expensive equipment: standard phantom (Fig. 5) and exposed with a (Practice E746)
6.1.2.1 For that purpose, a step wedge of Cu, with at least 19 mm (34 in.) absorber of mild steel to qualify. The tube
twelve equally increasing steps, shall be used as in the voltage shall be 220 kV with 2 mm Cu in front of the tube port
arrangement shown in Fig. 2. The selection of the X-ray instead of 200 kV as recommended in Practice E746.
voltage shall be as described in 6.1.1.1. The maximum thick- 6.2.2.1 The EPS value shall be determined at least at 90 %
ness of the step wedge shall absorb 90 % of the radiation of the of the PVmax. Alternatively, the EPS performance may be
central beam, which requires a thickness of 11.7 mm (0.46 in.). determined in the characterized linear or linearized PV range as
To cover a range of two or more orders of magnitude of the illustrated in Fig. 5.
radiation dose, at least two suitable and different exposures
with adequate exposure time or tube current (mA) shall be
made. A waiting time of 10 minutes is recommended between
exposure and scan of the IPs to avoid distortions by fading
effects. The distance between step wedge and IP shall be
500 mm (19.69 in.) to reduce the influence of scattered
radiation. A magnification of 2 is recommended. A beam
collimator shall be used to restrict exposures to the step wedge
only. X-ray voltage and filtering shall be selected in accordance
with 6.1.1.1 through 6.1.1.3.
NOTE 3X-ray penetration through Cu-steps of different thickness is
distorted by beam hardening and suitable adjustment of exposure is FIG. 5 Illustration of EPS Characterization Set Up (left) and Test
required. Phantom (right). The Duplex Wire IQI is Tilted Approximately 5.

5
 E2446 16
TABLE 1 EPS Values on Standard 19-mm (-in.) Absorber Plate
as a Function of Step and Hole Size
Step Size Hole Size EPS
Plaque Number
mm (in.) mm (in.) %
0.71 (0.028) 1.92
15 0.38 (0.015) 0.64 (0.025) 1.82
0.58 (0.023) 1.71

0.79 (0.031) 1.66

10 0.25 (0.010) 0.71 (0.028) 1.57
0.64 (0.025) 1.49

0.71 (0.028) 1.41

8 0.20 (0.008) 0.64 (0.025) 1.33
0.58 (0.023) 1.25

0.81 (0.032) 1.19

0.71 (0.028) 1.12
NOTE 1The tested CR system qualifies for: 5 0.13 (0.005) 0.64 (0.025) 1.05
0.58 (0.023) 1.00
Level I performance from PV 3504095 (see Table 4)
0.50 (0.020) 0.94
Level II performance from PV 1404095 (see Table 4)
PVmax = 4095, as determined with procedure of 6.4
aEPS = 1.16
FIG. 6 Example Plot for Measured of EPS Versus PV (12 bit
system, iSRb = 70 m) for Determination of Level I and II Perfor-
mance Range
(steel screen is positioned between cassette and lead) and in
contact with the cassette. The EPS method may be applied for
materials other than steel by agreement of the CEO or the
6.2.2.2 Determination of Relative Contrast C1mmFig. 5 contracting parties.
illustrates a typical layout for a 19-mm (-in.) thick steel plate, 6.2.3.2 The interpolated basic spatial resolution as deter-
at least 20 cm ( 8 in.) wide by 25 cm ( 10 in.) long, mined from the exposure through the absorber plate shall be no
containing a series of Practice E746 EPS plaques of varying more than 10 % worse than the interpolated basic spatial
thicknesses and hole sizes, a 1-mm steel plate and a Practice resolution as determined without the absorber plate at 220 kV
E2002 unsharpness gauge with duplex wires oriented approxi- (8 mm Cu). If this is not achieved, the focal spot size (as
mately 5 tilted to the plate edge direction for monitoring of the measured by Test Methods E1165 or E2903) shall be reduced
influence of the geometric unsharpness and all IQIs are situated or the SDD shall be increased.
on the source side. The 19-mm (34-in.) steel plate should cover 6.3 Linearity Test of Pixel Value Response for Linearized
the complete IP and IP cassette. The X-ray source shall be Values
collimated to the 19-mm (34-in.) plate only. The surface finish 6.3.1 Measured signal values (mean pixel values) of 6.1 or
of the absorber plate shall be no worse than RMS 250. If the 6.2 are plotted versus exposure dose along a linear exposure
EPS absorber plate does not cover the entire IP, the IP shall be scale for linear systems (see Fig. 7). Nonlinear systems shall be
masked with lead around the absorber plate. tested with a numeric linearization corresponding to the
6.2.3 EPS characterization by Practice E746. For each manufacturers conversion equation for linearization. The pixel
exposure (data point in Fig. 6) at different dose of the set of value range characterization is valid only for the specific
Fig. 5, determine the lowest (best) EPS performance of each scanner operational parameters used, including photomultiplier
exposure by determining the duplex row (Practice E746 tube gain, laser power, sampling resolution setting, and all
illustrates step layout and corresponding EPS %), where a other operator adjustable scanner control parameters. Expo-
minimum of 15 holes out of 30 holes in each duplex row (50% sures should be approximately equally distributed within the
rule) are clearly visible. Table 1 provides EPS values (see also qualified PV range. The linearity test shall be performed in the
Practice E746) for each visible duplex row on the specified range from 10 to 90 % of the full PV range. At least eight data
standard of a 19-mm (34-in.) absorber plate of steel. Plot the points should be taken.
EPS (in %) taken with the set of Fig. 5 in a graph as presented 6.3.2 The measured pixel values shall not deviate from the
in Fig. 6 that corresponds with the qualifying hole size row of linear fit more than 5 %. If the linearity does not cover the full
Table 1, its corresponding exposure identification and pixel range, a PVmax value shall be specified that shall not be
value. exceeded in NDT practice.
6.2.3.1 The source-to-detector distance (SDD) shall be at 6.3.3 No PVmax characterization is required if the system is
least 1 m (39 in.). The geometric unsharpness, ug, shall not linear over the full scanner PV range to exposure dose.
exceed 50 m and ug shall not exceed 20 % of iSRbdetector. The NOTE 5PVmax specification is typically not required. Related to the
kilovoltage setting shall be selected corresponding to 6.1.1.1 observation that sometimes nonlinearities may appear, if readers scan IP
6.1.1.3 and is approximately 220 kV for the steel absorber. No areas that have been exposed with extraordinary high exposure dose
material (for example, lead) shall be used behind the cassette, values, the linearity test should cover the full PV range. Fading may also
free space of at least 1 m (39 in.) shall be left behind the influence the linearity with increased exposure time.
cassette or a steel screen of about 0.5 mm (0.02 in.), and a lead 6.4 Determination of Minimum Pixel Value, PVmin
plate of > 2 mm (0.08 in.) shall be used just behind the cassette 6.4.1 Determination of PVmin with the SNR Method

6
 E2446 16
TABLE 2 Required Tests of Practice E2445 and Required Result
Required Test Required Result
Geometric Distortion (by spatial linearity image quality indicators in Type I Test Phantom) Fail if distortion > 2%
Laser Jitter (by T-target in Type I CR Test Phantom) Not permitted
Straight and continuous edges required
Laser Beam Scan Line Integrity (no test object required) Not permitted
Scan column dropout (no test object required) Not permitted
Scanner Slippage (by homogeneous strip slippage target in Type I CR Test Phantom) Not permitted
Imaging plate Artifacts (no test object required) Not permitted
Erasure (high absorption object required) Fail if > 2%
Shading or banding (by homogeneous plate, three shading image quality targets in Type I) Fail if more than 10%
Test Results Shall be Reported, also in Case of Exceeding the Limits Result to Report
PMT Non-linearity (by T-target in Type I CR Test Phantom) Report if > 2%
Burn-In (high absorption object required) Report if > 2%
Spatial Linearity (by spatial linearity image quality indicators in Type I CR Test Phantom) Report if > 2%
Imaging plate response variation (no test object required) Report if > 10%
Optional Test on Request Result to Report
Imaging Plate Fading (no test object required), optional test Report fading in %, calculated from values
measured at 5 min and 2 h.

TABLE 4 CR System Performance by Performance Levels

Required Permitted Permitted
CR System Minimum SNRN Maximum Maximum
Performance (Normalized to iSRbdetector Value Achieved EPS
SRb=88.6 m) (m) by E746 (%)A
CR Special 200 50 1.00
CR Level I 100 100 1.41
CR Level II 70 160 1.66
CR Level III 50 200 1.92
A
E746 specifies the test for steel at 200-220 kV. If the measurement is performed
with other materials or kV values, or both, user dependent values may be
specified.

6.4.1.4 When establishing minimum pixel values using this

method, the specific scanner and its parameters used as well as
the specific imaging plate type used shall be recorded for this
characterization.
6.4.1.5 The minimum SNRN values for specification of
PVmin and PVmax (if required) for performance Special to
Level III are provided in Table 4.
6.4.2 Determination of PVmin with the EPS Method
6.4.2.1 Plot a graph of EPS versus mean pixel value PVmean
as a function as illustrated in Fig. 6.
FIG. 7 PV Linearity Characterization for CR Systems with 5% 6.4.2.2 Use the EPS versus PV graph as presented in Fig. 6
Bars for the specific characterization of the CR system to determine
(a) The system is qualified successfully in the PV range from 0
to 65535 (16 bit system).
the minimum pixel value that provides the desired EPS for the
(b) The error bars in the low intensity range can be evaluated performance level as specified in Table 4.
better in the double logarithmic graph. 6.4.2.3 Pixel values and EPS values shall be determined
without the use of any digital filtering. Some scanner systems
may provide degraded EPS values at very high pixel values and
low gain. In the event that this occurs, a maximum pixel value
6.4.1.1 Plot a graph of SNRN versus mean pixel value (PVmax) shall be specified.
PVmean as a function as illustrated in Fig. 4. 6.4.2.4 When establishing minimum pixel values using this
6.4.1.2 Use SNRN versus PV correlation data as presented method, the specific scanner and its parameters used as well as
in Fig. 4 for the specific qualifying CR system to determine the the specific imaging plate type used shall be recorded for this
minimum pixel value that provides the desired minimum characterization.
SNRN for the performance level as specified in Table 4. 6.4.2.5 The maximum EPS values for specification of PVmin
6.4.1.3 Pixel values and SNRN values shall be determined and PVmax (if required) for performance Special to Level III
without the use of any digital filtering. Some scanner systems are provided in Table 4.
may provide degraded SNR or SNRN values at very high pixel
NOTE 6Minimum SNRN performance levels are one of the three basic
values and low gain. In the event that this occurs, a maximum preconditions for satisfying image quality. The IQI sensitivity improves
pixel value (PVmax) shall be specified as the upper linear PV (smaller EPS) with (1) higher SNR or SNRN (higher radiation intensity
without degradation of the plotted line. and exposure time), (2) higher attenuation coefficients (reduced radiation

7
 E2446 16
energy), and (3) better (lower values) basic spatial resolution. All these 6.5.1.4 For sufficient accuracy in the measurement of the
three parameters are relevant for sufficient image quality. iSRbdetector value the 20% modulation depth (dip) value shall
NOTE 7The classical quality assurance procedure in film radiography
is based on the measurement of the film density. Exposed films are
be approximated from the modulation depth (dip) values of the
accepted only if they have a minimum optical density. A similar procedure neighbor duplex wire modulations. Fig. 8 and Fig. 9 illustrate
can be applied in CR. Each CR system (or any digital imaging system) the procedure for determination of iSRbdetector.
provides pixel values of each picture element (pixel). The pixels in the 6.5.1.5 The iSRbdetector is calculated as the polynomial
region of interest (RoI) that are to be evaluated, should exceed a minimum approximation of the modulation depth (dip) vs. the wire pair
pixel value, in a similar way as minimum optical density in film
radiography. Single outliers as e.g. indications of dust indications may not spacing of neighbored wire pairs with at least two wire pairs
be evaluated. This minimum pixel value is the reference minimum pixel with more than 20 % dip between the wires in the profile and
value PVminx as determined in 6.4. This procedure permits basic quality at least two wire pairs with less than 20 % dip between the
assurance in CR in relation to contrast sensitivity. wires in the profile (Fig. 8 and Fig. 9), if their values are larger
6.5 Determination of Interpolated Basic Spatial Detector than zero. If no values are available with dip < 20 %, the largest
Resolution of CR Systems wire pair value with the dip of zero shall be used. If the
6.5.1 Duplex-Wire Method measured iSRbdetector is smaller than the pixel size, for
6.5.1.1 The test object to measure the iSRbdetector is the example, a result of aliasing effects, iSRbdetector shall be
duplex-wire gage corresponding to Practice E2002. The expo- characterized as iSRbdetector = pixel size.
sure shall be performed in a distance of 1 m (39 in.) or greater 6.5.1.6 The calculation of the modulation depth (dip) shall
using an X-ray tube with a focal spot size 1 mm. Focal spot be performed as shown in Fig. 8c and Fig. 8d. The resulting
size and focus detector distance shall be selected for a approximated or interpolated basic spatial resolution value (see
geometric unsharpness of less than 5 % of the total measured Fig. 9) shall be documented as interpolated SRbdetector-value
unsharpness. The duplex-wire gage shall be positioned directly or iSRbdetector.
on the cassette with the IP and lead screen. The measurement NOTE 8The dependence of modulation depth (dip) from wire pair
shall be performed perpendicular and parallel to the scanning spacing should be fitted with a polynomial function of second order for
direction of the laser beam. This requires two exposures with calculation of the intersection with the 20 % line as indicated in Fig. 8 and
one gauge or one exposure with two gauges. The duplex-wire Fig. 9.
gage shall be used in an angle of about 5 to the scanning 6.5.1.7 The interpolated basic spatial resolution shall be
direction of the laser beam and about 5 to the perpendicular measured both perpendicular and parallel to the scanning
direction. direction of the laser. The larger value of both iSRbdetector-
6.5.1.2 The measurement of unsharpness may depend on the values (SRbmaxdetector) shall be used as maximum interpolated
radiation quality. For characterization and applications above basic spatial resolution for characterization. It should be
160 kV the test shall be performed with 220 kV (X-ray tube rounded to the nearest 5 m step in the characterization
with beryllium window, tungsten target, and no pre-filtering). statement.
For low energy applications the radiation quality shall be NOTE 9If a system has an interpolated basic spatial resolution of 200
90 kV (X-ray tube with beryllium window, tungsten target, and m in fast scan direction of the laser, and 100 m perpendicular to the fast
no pre-filtering). A pre filter up to 0.5 mm (0.02 in.) copper in scan direction, then the final maximum interpolated basic spatial system
front of the tube port can be used by specification of the resolution is iSRbmaxdetector = 200 m
manufacturer. The CR image shall be exposed between 60 % 6.6 Test Procedures of Practice E2445
and 90 % of full saturation value. The full saturation value is 6.6.1 When making radiographs for CR system perfor-
the maximum achievable pixel value, PVmax, of the system mance characterization, the manufacturers guidelines shall be
(e.g., PVmax = 65 535 for a linear 16 bit system. See also 6.3 used for handling and scanning. The following tests, described
for determination of PVmax.). A SNR of 100 shall be in Practice E2445 under Test Procedures, shall be performed
obtained. additionally. The tests shall be passed with no findings or the
6.5.1.3 The measurement shall be done across the middle results shall be under the threshold of Table 2, otherwise the
area of the IQI image integrating along the width of about 30 test result shall be documented in the characterization report.
to 60 % of the wire length of the duplex wires to avoid 6.6.1.1 This means there will be minimum geometric dis-
variability along the length of the wires (Fig. 8a). tortion and nonlinearity. The characteristics of the laser beam

NOTE 1X distance
Y amplitude
FIG. 8 Example for Measurement of the Modulations Depth of Radiographs with Duplex Wire IQI
(a) Image of Duplex Wire as Shown in a Radiograph

8
 E2446 16

FIG. 8 (b) Measured Duplex Wire Profile with Determined Modulation Depths (Dips) (continued)

6.6.2 The measurement of the PMT nonlinearity is based on

the measurement of an image taken with the T-target in the
Type I CR test phantom. The Type I CR test phantom shall be
positioned in a distance of 1 m (about 39 in.) from the X-ray
source and the IP shall be positioned directly behind the
phantom. The exposure shall be taken at 90 kV without any
filter in front of the tube port. Lead filters in front of the IP shall
be used in agreement with the manufacturer requirements. The
CR image shall be exposed between 60 % and 90 % of full
saturation value. A SNR of 100 shall be obtained. A profile
function shall be used to determine the PMT nonlinearity. The
profile is taken as shown in Fig. 10 about 12 mm (12 in.) from
FIG. 8 (c) Enlarged Duplex Wire Profile. (continued) the T-end, perpendicular to the fast scan direction. The nonlin-
earity PMTNl is calculated by:
P1 2 P2
PMT Nl 5 200% (4)
P11P2
If the left and right profile steps are different, the average
value of both steps shall be taken.
7. Determination of Characterization Data
7.1 Determination of ISO Speed
7.1.1 The ISO speed SISO is calculated by the dose KS,
which is needed for exposure of an IP with the pixel value
PVmin by SISO = KS-1 (KS in Gray). The ISO speed shall be
given corresponding to each system class, which can be
achieved with a system.
FIG. 8 (d) Scheme of the Calculation of the Dip Value in % with NOTE 10For the same CR system, different ISO speeds are given for
Dip = 100 x (A+B-2C)/(A+B). (continued) different performance levels.
7.1.2 The CR system manufacturer will provide the ISO
speeds and the PVmin-values depending on the imaging plate
in the scanner will be optimized with no beam jitter, no signal type, the scanner and software used and its parameter setting.
dropout, and best laser focus. The CR plates will be transported The ISO speed may be determined in steps corresponding to
without slipping. The image shading will be within limits of the values of Table 3.
610 %. The plates used will be correctly erased and will be
7.2 EffciencyThe efficiency shall be determined from the
free from artifacts.
plot SNRN versus exposure dose (see Fig. 4). The efficiency at
6.6.1.2 Fading effects will be measured optionally. The
220 kV is defined as the SNRN value at an exposure of 1 mGy
standard measurement shall be taken at 5 min and 2 h. The
(SNRN at 1mGy). If the measured efficiency (SNRN at 1mGy)
fading Fd (in %) is calculated from the pixel value taken after
is smaller than 50, then the efficiency shall be determined as the
5-min waiting time after exposure (PV5) and 120-min waiting
SNRN value at an exposure of 5 mGy divided by 2.24 (SNRN
time after exposure (PV120). FA is calculated by:
at 5mGy/square root of 5). This value shall be given as
Fd 5 100 ~ 1 2 ~ PV120 PV5 !! (3) parameter in the spider net graph in Fig. 12.
6.6.1.3 If specified by the manufacturer, the graph of fading 7.3 Achievable aSNRNaSNRN is measured at 90% 65%
versus time shall be included in the characterization report. PV at the selected scanner parameter set to characterize the

9
 E2446 16

NOTE 1X- wire pair spacing in m

Y- modulation depth (dip) in %
Example for determination of the interpolated basic spatial resolution (iSRbdetector) by interpolation from the measured modulation depths (dips) of
neighbored duplex wire elements and interpolation of the 20 % value resulting here in iSRbdetector = 66 m.
FIG. 9 Modulation Depth vs. Duplex Wire Pair Spacing (SRbdetector)

NOTE 1The measurement is performed perpendicular to the fast scan direction at the profile position as shown, at the end of the T-target, in a distance
of 12 mm (12 in.). The measured value is 0.9 %.
FIG. 10 Test of PMT-nonlinearity at the T-Target

system (see Fig. 4). The value can be approximated from the 7.5 Achievable Contrast Sensitivity (CSa)
graph SNRN versus PV. 7.5.1 The achievable contrast sensitivity is calculated from
7.4 aSNRN Limit the aSNRN (Fig. 4) and the measured contrast C1mm of the EPS
7.4.1 The measured SNRN shall be plotted versus exposure exposure setup (Fig. 5).
dose. The curve shall be fitted with the following equation to 7.5.2 The relative contrast is calculated from the profile
determine a, b, and c: function across the edge of the 1-mm Fe plate at the 19-mm Fe
plate at 220 kV (see 6.1.1.1 6.1.1.3 for correct kV selection)
K
SNR N 5 (5) and highest used exposure dose (see Fig. 5). Fig. 11 gives an
=a 1 bK 1 cK 2 example for this measurement and the setting of the profile
where: function. The profile function shall be used with line averaging
to achieve a CNR > 10. The relative contrast for the 1 mm step
K = Exposure dose in mGy,
a = Noise offset, for example, opt. read out noise, (in mm-1) is approximated as follows:
b = Factor for photon noise, and
c = Factor for detector structure noise (fixed pattern noise). C lmm 5 ln S D
I max
I min
'
2 I
I min1I max
1mm 21 (7)

7.4.2 Typically, twelve measurements at twelve dose values The expected value at 220 kV and sufficient collimation to
over three dose decades are required for the exposure. the absorber plate is C1mm 0.05 mm-1 for mild steel.
7.4.3 The aSNRN- limit for high-dose exposure of the 7.5.3 The CSa value in % of material thickness for the 1 mm
IP-scanner system and the selected scan parameter set is step at the 19 mm absorber plate is calculated by:
calculated by:
I max1 I min
1 CS a 5 100% (8)
aSNR limit
N 5 (6) 19.5 2I aSNR
=c with SRbmaxdetector in mm.

10
 E2446 16

NOTE 1The PV difference between the cursors is divided by the average PV of both cursor positions for calculation of C1mm (see Eq 7).
FIG. 11 Determination of Relative Contrast C1mm from the Edge Profile of the Indication of a 1 mm Fe Plate on 19 mm (34 in.) Fe (Unpro-
cessed Image)

NOTE 1XY Name of CR System and Settings with Fast IP

FIG. 12 Example of the Result of a CR System Characterization

NOTE 11CSa may also be calculated from SNRN if Eq 8 will be 7.6 Achievable EPS (aEPS)
extended by Eq 2, with SRbmaxdetector in mm.
7.6.1 The achievable EPS provides the information about
0.0886 ~ I max 1 I min! the best (minimal) EPS value that can be obtained at high dose
CS a 5 100% (9)
19.5 2I iSR detector
bmax aSNR N applications, measured at 90% 6 5% PV at the selected

11
 E2446 16
TABLE 3 Determination of ISO Speed (SISO) from Dose KS (in measurement for validation of the measurement of 7.6.1 as follows:4
Gray) for an IP Read-Out Intensity of PVmin at the Characterized
Performance Level as Determined from SNRN and EPS Method
LogYKS
ISO Speed (SISO)
aEPS 5 100%
2
19 mm

0.0886
C 1mm aSNR N
-1
(10)
From To Typical values are: C1mm eff 0.05 mm for 220 kV and 19 mm
-4.66 < -4.55 40 000 (34 in.) Fe absorber plate.
-4.55 < -4.45 32 000
-4.45 < -4.35 25 000 7.6.2 The aEPS value shall be documented in the character-
-4.35 < -4.25 20 000
-4.25 < -4.15 16 000 ization statement as determined from the graph EPS versus PV
(Fig. 6) and posted in the spider graph as shown in Fig. 12.
-4.15 < -4.05 12 500
-4.05 < -3.95 10 000
-3.95 < -3.85 8000 8. Interpretation of Results and Classification
-3.85 < -3.75 6300
-3.75 < -3.65 5000
8.1 System Evaluation
8.1.1 The system evaluation for characterization corre-
-3.65 < -3.55 4000 sponding to Table 4 depends on the combined properties of the
-3.55 < -3.45 3200
-3.45 < -3.35 2500
imaging plate (IP) type, the scanner and software used, the
-3.35 < -3.25 2000 selected scan parameters and the image display monitor for the
-3.25 < -3.15 1600 EPS evaluation. Therefore, all measurements must be per-
-3.15 < -3.05 1250
formed with the same IP type, scanner, software with same
-3.05 < -2.95 1000 parameter setting and image display monitor with same param-
-2.95 < -2.85 800 eter setting.
-2.85 < -2.75 640
-2.75 < -2.65 500
8.1.2 The determination of the characterization parameters
is based on the step exposures as described in 6.1.1.1 or on the
-2.65 < -2.55 400 step wedge exposures as described in 6.1.1.2, the EPS method
-2.55 < -2.45 320
-2.45 < -2.35 250
as described in 6.2, and the measurement of the interpolated
-2.35 < -2.25 200 basic spatial resolution iSRbdetector, as described in 6.5. The
-2.25 < -2.15 160 characterization results shall be documented as required by
-2.15 < -2.05 125
Table 6.
-2.05 < -1.95 100 8.1.3 Depending on the results of the previous tests, the CR
-1.95 < -1.85 80 system shall be characterized in accordance with Table 4 as CR
-1.85 < -1.75 64
-1.75 < -1.65 50
Special or CR Level I-III system.
8.1.4 A CR system is characterized to a performance level
-1.65 < -1.55 40 (Special, Level I-III) if the measurement results fulfill all three
-1.55 < -1.45 32
-1.45 < -1.35 25
parameters of Table 4. If it is characterized to a certain level, it
-1.35 < -1.25 20 is also characterized to all levels with less performance, if
exposed with less dose.
8.1.5 The manufacturer shall provide reference scanner
parameters for characterization to the user of this practice.
scanner parameter set to characterize. The EPS setup as shown 8.2 Range of CR System Characterization
in Fig. 5 is used without magnification. The value can be
determined from the EPS measurement versus PV (see Fig. 6)
at 90% 6 5 % PVmax. 4
See U. Ewert, U. Zscherpel, K. Heyne, M. Jechow, K. Bavendiek, Materials
NOTE 12The aEPS value can be approximated from the aSNRN Evaluation, Vol. 70, no. 8, pp: 995-964, 2012.

TABLE 5 Quality Numbers for the CR System CharacterizationA

Parameter FE Quality Number
Condition 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
detector
iSRb 90 kV and 1000 800 630 500 400 320 250 200 160 130 100 80 63 50 40 32 25 20 16 13 10
[m] 220 kV
CSa [%] at C at step 5 4 3.2 2 1.6 1.3 1 0.8 0.63 0.5 0.4 0.32 0.25 0.2 0.16 0.13 0.1 0.08 0.063 0.05 0.04
90% PV 19-20 mm,
220 kV
aEPS [%] at E746, Fe, 2.4 2.2 1.99 1.82 1.71 1.66 1.57 1.49 1.41 1.33 1.25 1.19 1.12 1.05 1.00 0.94 0.88 0.83 0.78 0.7 0.62
90%PV 220 kV
Efficiency at 1 SNRN at 1 16 20 25 32 40 50 63 80 100 130 160 200 250 320 400 500 630 800 1000 1500 2000
mGy mGy, 220 kV
ISO Speed at 220 kV 20 25 32 40 50 64 80 100 130 160 200 250 320 400 500 630 800 1000 1300 1600 2000
best level
aSNRN 220 kV 20 25 32 40 50 63 80 100 130 160 200 250 320 400 500 630 800 1000 1300 1600 2000
at 90% PV
A
The quality numbers of Table 5 deviate partly from the quality levels as defined in Practice E2597. Only iSRbdetector is equivalent to the quality levels in Practice E2597.

12
 E2446 16
TABLE 6 Example for the CR System Performance Statement of a CR Level II System
Performance Requirements Result of Performance Characterization
Permitted Maximum
Required Minimum aSNRN Achieved
CR System Permitted Maximum Achieved EPS by aEPS by
SNRN (Normalized (Normalized to iSRbdetector Value PVmin PVmax
Performance iSRbdetector Value (m) E746 (%) Steel, 220 E746 (%)
to SRb=88.6 m) SRb=88.6 m) (m)
kV
CR Special 200 50 1.00 ... ... ... ... ...
CR Level I 100 100 1.41 ... ... ... ... ...
CR Level II 70 160 1.66 79 145 1.66 850 4095
CR Level III 50 200 1.92 65 145 1.92 350 4095

8.2.1 For computed radiographic characterization, the CR 8.2.3.2 The measured maximum interpolated basic spatial
system performance will be determined by the following resolution shall be rounded to the nearest 5 m for documen-
procedures. tation. The value shall be smaller or equal to the assigned value
8.2.2 The CR system characterization is performed by of Table 4.
determination of an achievable aSNRN-value, an achievable 8.2.3.3 The achieved EPS value shall be taken at 90% 6 5%
aEPS value at 90% 6 5 % of the linearized PVmax of the PV at lowest gain and lowest laser intensity of the scanner. The
selected scanner parameter set to characterize and the interpo- value shall be smaller or equal to the permitted maximum value
lated basic spatial system resolution iSRbmaxdetector in m as of Table 4.
shown in Table 4. 8.2.3.4 The values PVmin and PVmax for the PV range of
8.2.3 The characterization statement consists of three values valid characterization as described in 6.3 and 6.4 shall be
as follows: reported in the resulting table (see Table 7 as an example).
8.2.3.1 The measured normalized SNRN shall be greater or 8.2.4 In addition to the characterization statement, a spider
equal to the assigned value of the required minimum normal- net graph shall be added with the following further character-
ized SNRN in Table 4. ization parameters (see Fig. 12):

TABLE 7 Example of Characterization Report

Product and Test Information
Company name Manufacturer 1
IP type Standard, XY1
Scanner Type Scanner XY2 Standard
Scanner and processing software names and versions Soft XY3, V. 123
Scan parameter set Standard 50 - XY4
Image display monitor type, brand, and maximum brightness in cd/m2 XYZ, 320 cd/m2
Date of characterization Friday, Dec. 13th, 2013
Test agency ABCD
Operator in charge Smith, A. F.
Report Data
Tests of Practice E2446 Results
iSRbdetector 145 m
CSa at 220 kV on EPS absorber of Fe 0.9
aEPS at 220 kV on EPS absorber of Fe 1.66%
Efficiency at SNRN at 1 mGy 70
ISO speed at SNRN = 70 (for CR Level II) 1000
ISO speed at SNRN = 50 (for CR Level III) 4000
aSNRN 79
aSNRNlimit 105
C1mm ('eff) at 220kV on EPS absorber of Fe 0.05 mm-1
PVmin for CR Level II 850
PVmin for CR Level III 350
PVmax 4095
Performance level CR Level II
Applied Tests of Practice E2445 Results
Geometric distortion (by spatial linearity image quality indicators in Type I CR Test Phantom) o.k. (<2 %)
Laser jitter (by T-target in Type I CR Test Phantom) o.k.
PMT non-linearity (by T-target in Type I CR Test Phantom) o.k. (<2 %)
Laser beam scan line integrity (no test object required) o.k.
Scan column dropout (no test object required) o.k.
Scanner slippage (by homogeneous strip slippage target in Type I CR Test Phantom) o.k.
Shading or banding (by homogeneous plate, three shading image quality targets in Type I) o.k.
Erasure (high-absorption object required) o.k. (<2 %)
Burn-In (high-absorption object required) 3 % measured
Spatial linearity (by spatial linearity image quality indicators in Type I CR Test Phantom) o.k. (<2 %)
Imaging plate artifacts (no test object required) o.k.
Imaging plate response variation (no test object required) o.k.
Imaging plate fading (no test object required), optional test 35 %, tested after 5 min and 2 h

13
 E2446 16
8.2.4.1 iSRbdetector as maximum value of the measurements 9.1.1 The quality numbers for the graph are listed in Table
in fast and slow scan speeds as described in 6.5, 5.
8.2.4.2 aSNRN as minimum value of the measurements in 9.2 The result of the characterization shall be printed in the
fast and slow scan speeds as described in 7.3, spider net graph and a table shall be given with the measured
8.2.4.3 CSa as minimum value of the measurements in fast characterization data as shown in Table 6.
and slow scan speeds as described in 7.5, 9.3 List applied test procedures as performed corresponding
8.2.4.4 aEPS as described in 7.4, to Practices E2445 and E2446 and report results as required by
8.2.4.5 Efficiency measured from the plot SNRN versus Table 2. See the example in Table 7.
dose taken at 1 mGy as described in 7.2 or at 5 mGy (if SNRN
< 50 at 1 mGy) and divided by 2.24, and 10. Precision and Bias
8.2.4.6 ISO speed as described in 7.1. 10.1 No statement is made about either the precision or bias
8.2.5 All test procedures under Practice E2445, as required of this practice for measuring characterization of CR systems.
in Table 2, shall be conform with the requirements of Table 2 The results merely state whether there is conformance to the
for a valid systems characterization. The results shall fulfill the criteria for success specified in the procedure.
requirements and shall show deviations, if any, from the 11. Keywords
required properties.
11.1 basic spatial resolution; characterization; computed
radiography; CR; EPS; equivalent penetrameter sensitivity;
9. Presentation of Results
film system classification; manufacturer; minimum pixel value;
9.1 The characterization results shall be presented in a normalized signal-to-noise ratio; photo-stimulated lumines-
spider net graph as shown in Fig. 12. cence; PSL; SNR; SRb; system performance levels

ASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentioned
in this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the risk
of infringement of such rights, are entirely their own responsibility.

This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years and
if not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standards
and should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of the
responsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you should
make your views known to the ASTM Committee on Standards, at the address shown below.

This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,
United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the above
address or at 610-832-9585 (phone), 610-832-9555 (fax), or service@astm.org (e-mail); or through the ASTM website
(www.astm.org). Permission rights to photocopy the standard may also be secured from the Copyright Clearance Center, 222
Rosewood Drive, Danvers, MA 01923, Tel: (978) 646-2600; http://www.copyright.com/

14