Diffraction and the Wavelength of Light

Goal: To use a diffraction grating to measure the wavelength of light from

various sources and to determine the track spacing on a compact disc.

Lab Preparation

Light is an electromagnetic wave, like a radio wave, but very high frequency and
very short wavelength. Different colors of light have different wavelengths. The
eye can detect wavelengths ranging from about 400 nm (violet) to 700 nm (red).

The distribution of wavelengths of light given off by a particular source is called

the spectrum of that source. An incandescent lamp gives off a continuous
spectrum containing all wavelengths in the visible part of it, from red to violet.
A laser emits light of a single wavelength. A spectral lamp that contains the
excited vapor of a particular element emits a spectrum that contains a few
discrete wavelengths that are characteristic of that atom. The object of this
experiment is to measure some of these
wavelengths, and then to use observations of
diffraction from a compact disc to infer spacing of
information stored on the CD.

The word “diffraction” refers to the spreading out

of waves after passing through a small opening
(Figure 1). Diffraction effects are important when
the size of the opening is comparable to or less
than the wavelength.

To measure wavelengths, we need a device that

can split a beam of light up into different
wavelengths. Such a device is a diffraction
grating. A transmission diffraction grating consists Figure  1  
of a very large number of equally spaced parallel lines scratched on a transparent
surface. The diffraction gratings used in this experiment are plastic replicas of a
master grating, made by pressing the plastic against the master grating, which
acts as a mold. A diffraction grating behaves as if it were a series of slits in an
opaque screen.

Consider a diffraction grating consisting of a very large number of slits. When

all the waves spreading out from all the slits are added up, they cancel out
everywhere except in certain directions along which all the crests of all the waves
exactly coincide and add up constructively. These particular directions are
determined by the wavelength of the light, 𝜆, and the distance d, between centers
of adjacent slits in the grating, known as the grating spacing. An example of the
constructive interference that arises for just two slits is shown in Figure 2.

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 A B A and B

Figure 2

The patterns that arise for more than two slits sharpen the directions of the
brightest regions. For a diffraction grating, the directions of maximum intensity
can be specified by a series of angles. Consider Figure 3 below. The angles are
measured relative to the line 𝑂𝑃, which is parallel to the light falling on the
diffraction grating initially.
A2

2
A1
1

O P
1

grating
B1
2

B2

Figure 3

On either side of 𝑂𝑃 are two directions of maximum intensity (lines 𝑂𝐴! and
𝑂𝐵!  ) known as the "first order" maxima, at angle 𝜃! given by

𝜆 =  𝑑𝑠𝑖𝑛𝜃!

Two other directions are lines 𝑂𝐴! and 𝑂𝐵! (the "second order" maximum) at
angle 𝜃! given by
2𝜆 =  𝑑𝑠𝑖𝑛𝜃!

Higher order maxima may be observed at angles given by the general formula

𝑚𝜆 =  𝑑𝑠𝑖𝑛𝜃! with m = 1, 2, 3, ...

The diffraction gratings used in this lab have 600 lines per mm. So the spacing d
between lines is simply
!.!!  !!
𝑑   = !""   =    1.67 x 10-3 mm = 1670 nm.

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*Be extremely careful with the laser. Do not look directly in the laser beam
and never aim it at another person.

Procedure

I. Measuring the wavelength of a laser

A. Set up Figure 4 using the laser, diffraction grating, and meter stick. The
distance L should be about 50 cm and the diffraction grating used here
contains 600 lines per mm. Take special care to ensure the incident laser
beam is perpendicular to the meter stick and the grating. The accuracy of
your measurements here will influence later measurements in the lab.
Make adjustments until you are able to view 1st and 2nd order spots on
the meter stick.

L
SCALE

z
LASER

GRATING

Figure 4

B. Measure and record the location of the first order spots on either side of
the central spot (z and z') in a table similar to the one below. Compute the
!
average z and use it to find 𝜃 (note: tan 𝜃= ! as shown in Figure 4). Use 𝜃
to find 𝜆.

m z z' zav 𝜃 𝜆
1
2

C. Repeat the measurements and calculations for the second order spots.

II. Measuring discrete wavelengths in an atomic spectrum

A. Position the gas discharge lamp directly behind the screen with the single
slit and place the meter stick in the holder as shown in Figure 5.

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 scale
Top view
P
grating lamp
z
O 1

S
eye 1

slit
P'
L

Figure 5

The diffraction grating is mounted at O, at a distance L (30 - 50 cm) from

the meter stick so the line from the center of the diffraction grating to the
slit (line 𝑂𝑆) is perpendicular to the scale on the meter stick.

Light from the slit S travels along the line 𝑂𝑆 to the grating and is then
split up into different orders by the grating before entering the eye. The
first order colors are the ones you observe closest to the slit. Higher
orders are further away from the slit.

Consider the first order: light enters the eye at an angle 𝜃! to the line  𝑂𝑆; it
will appear to the eye that this light is coming from point P on the scale at
a distance z from the slit S. In fact, for every wavelength coming from the
source, there will be a different “image” of the slit at a different point P.
The same thing is happening at P’ on the other side of the slit to produce
another image.

B. Place your eye as close as you can to the diffracting grating and look
through it at the scale. You should be able to observe different colors
when looking to the left (point P) and then observe the same colors
looking to the right (point P’). If you look further to the left and right you
should be able to see the 2nd order lines.

C. To measure a particular wavelength, select one of the brightest lines in the

spectrum, focus your eyes on the scale and record the distance z from the
slit S to the point P. Record the result and color in a table similar to the
one below. Repeat the measurement on the other side (z’) at point P’.

Discharge tube gas: L=

Color z z' zav 𝜃 𝜆
.
.
.

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 D. Find the average of z and z’, measure L and use these to calculate the angle
𝜃. Use this angle to calculate the wavelength 𝜆  (recall that d = 1670 nm).

E. Repeat steps C and D for two or three more lines in the spectrum. Choose
the brightest lines you observe. Make sure you record what type of
discharge tube you used on the top of the table.

III. Measuring wavelength for white light

Replace the discharge lamp with an incandescent lamp so that white light shines
through the slit. Once again place your eye close to the diffraction grating and
observe. Since the whole spectrum of white light is coming through the slit you
should see a continuous spectrum off to each side rather than the discrete lines
that appeared in part II.

Measure as closely as you can the upper and lower limits (the z values as in part
II) of the continuous spectrum (in other words, find the violet cut-off and the red
cut-off of the spectrum). Use these values to determine the wavelength range of
the continuous spectrum.

IV. Measuring the track spacing on a compact disk

Light reflected or scattered from an object with a repeating structure can exhibit
interference patterns. The constructive interference of reflections from such an
array will produce a diffraction pattern that is determined by the wavelength of
the light used and the spacing of the repeating structures. Light normally
incident on a line of regularly spaced reflectors with a spacing d will add
constructively in only those directions for which light from each reflector arrives
"in phase" with light from its neighbors. For light reflected or scattered from two
adjacent sites in the line, the path length difference must be an integer number of
wavelengths, ∆L = L1 – L2 = n𝜆. (see Figure 6).

From laser

L1 To observation
point

L2

Figure 6

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When the observation point is far (many wavelengths) away, the paths of waves
reflected or scattered from adjacent sites are practically parallel, and the extra
path length ∆L is just dsin𝜃. The constructive interference condition is the same
as for the diffraction grating used in the preceding parts: dsin𝜃 = m𝜆. Using
laser light of known wavelength, measuring 𝜆 allows a determination of d.

Information on compact disks is stored by several techniques. Mass produced

music or software CD-ROMs store information by small permanent indentations
or pits pressed into a plastic disk with a thin reflective metallic film coating. The
presence or absence of indentations causes a change in reflected light from a
sharply focused laser. These variations are measured and decoded to reconstruct
the data, where each pit (or its absence) represents a single bit of information.
Individually produced CDs use other techniques to create variations in the
reflective film’s properties, which can be permanent (CD-R) or reversible (CD-
RW). The data is arranged in concentric tracks. A laser spot that is spread over
several square millimeters of the surface will sample many tracks, and the CD’s
tracks will act like a reflection diffraction grating as in Figure 6.

A. Set up Figure 7 to help measure the reflection diffraction pattern from a

CD. Be careful setting this up and make sure the laser is reflecting
towards the nearest wall and not out where is can hit other people.

Meter-stick
L
A
S
E
R

CD

Figure 7

B. How many diffraction spots are observed? Determine (by measuring the
necessary distances) the angles, 𝜃! . What value of m does each spot
correspond to? (Hint: where will the m = 0 diffraction spot appear?)

C. Based on the observed diffraction pattern and your measured value of 𝜆

for the laser light, calculate the spacing, d, between tracks on the CD.

*When finished with your lab clean up your lab station.

Homework: For part III compare your values to the known wavelength range
for the visible spectrum.

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