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Process Capability Analysis Cp, Cpk,
Pp, Ppk - A Guide
01. What is Process Capability Analysis?
A process capability study uses data from an initial run of parts to predict
whether a manufacturing process can repeatably produce parts that meet
specifications.
Think of it as being similar to a forecast. You will take some historical data, and
extrapolate out to the future to answer the question "can I rely on this process
to deliver good parts?".
Your customers may require a process capability study as part of a PPAP. They
will do this to ensure that your manufacturing processes are capable of
consistently producing good parts.
From The Initial Sample ...
+» Predict Future Process Performance
— ?
02. The Basic Concept
When the manufacturing process is being defined, your goal is to ensure that
the parts produced fall within the Upper and Lower Specification Limits (USL,
LSL). Process Capability measures how consistently a manufacturing process
can produce parts within specifications.The basic idea is very simple. You want your manufacturing process to:
(1) be centered over the Nominal desired by the design engineer, and
(2) with a spread narrower than the specification width.
Cp measures whether the process spread is narrower than the specification
width
Cpk measures both the centering of the process as well as the spread of the
process relative to the specification width
Specification Width Distance from Mean to Nearest Spec Limit
cp= cpk=
Process Width Distance from Mean to Process Edge
Mean
Mean to Process Edge
(Spread) oa a
Process
py Width qe
Mean to Nearest Spec Limit
(Location) aan
Spec Width
ISL USL Ist ust
Cp accounts for only the spread (or Cpk accounts for both the spread and
variation) of the process. location of the process.
03. The Basic Calculations
Before we get into the detailed statistical calculations, let's review the high-level
steps:
1: Plot the Data: Record the measurement data, and plot this data on a run-
chart and on a histogram as shown in the picture on the right.
2: Calculate the Spec Width: Plot the Upper Spec Limit (USL) and Lower Spec
Limit (LSL) on the histogram, and calculate the Spec Width as shown below.
Spec Width = USL — LSL
2: Caleulate the Pracess Width: Similarly we will alsa calculate the ProcessProcess Width = UCL — LCL
Hie CHU) He frie row CEU HEE Hee SS
Width. The simplest way to think about the process width is "the difference
between the largest value and the smallest value this process could create"
4: Calculate Cp: Calculate the capability index as the ratio of the spec width to
the process width.
Cp = Spec Width / Process Width
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04. A Simple Analogy
Imagine a driver trying to park a car in a garage. If the car is too wide, it wont
fit. If it's narrower than the garage opening, but if it's not centered, it won't makerin 1e Win ukery nit/scrape one or tne sides. rimtung one oF tne siaes or ne
garage is equivalent to producing a defective part.
But if the car is narrow enough AND well centered, the car will fit. That is our
goal. We want a manufacturing process width that is narrow and well centered
relative to the specification limits.
Cla
er
= =
erat
05. A More Realistic Analogy
Now let's assume that the car is the right width. It's narrow enough, and should
always fit. It's now up to the driver's skill to park without scraping the sides.
Imagine a driver arriving home after work each day, and parking his car in the
garage.
The Good Driver: A good driver will always center the car well with enough
room on both sides. Over the next 30 days, his run-chart and histogram will
both be very narrow. It's clear from the charts that he's very unlikely to scrape or
dent the car. There's plenty of room on either side.
The Unsteady Driver: On the other hand, an unsteady driver - someone learning
to drive - may not always center the car correctly. Over the next 30 days, his run-
chart and histogram are very wide. It's very likely that he could scrape or dent
the car.
We'll use the same idea in manufacturing. Welll record measurements for each
part made, then plot a histogram and run-chart, and see how much room we
have on each side. The narrower our histogram width relative to the
specification width, the higher our process capability..0
USL
To