4 ISO Process Capability
4 ISO Process Capability
While the production is in progress, the performance of the production process is monitored to
detect and prevent possible variations. The tool frequently used to monitor a process
performance while the production is in progress is the control chart. It helps detect assignable
causes of variations and facilitate corrective actions. But a control chart is not the correct tool
to determine if the customer's requirements are met because it is only used to monitor the
performance of production processes in progress, and an in-control process does not
necessarily mean that all the products meet the customers’ (or set limit) requirements. In other
words, a process can be contained within the upper and lower control limits and still generates
products that are outside the specified limits.
The control charts do not relate the process performance to the customers’ requirements
because there is not any statistical or mathematical relationship between the standard specified
limits and the process control limits. The process capability analysis is the bridge between the
two; it compares the variability stable in production process with its standard specified limit
Process capability: The ability of a process to produce output meet product design/technical
specification limits, Conducted only when the process is normally distributed. The Process
capability is connection between the specifications or drawings or design requirements and
the manufacturing process
Several capability ratios, or capability indices, have been developed to summarize how well
the process yields measurements within the specification limits. Those produced in this
procedure are Cp, Cpk, Cpm, and Cpkm. Cpm and Cpkm additionally take into account the
nearness of the process to the specification target.
Process data are typically gathered as samples or individual measurements taken from the
process at given times (hours, shifts, days, weeks, months, etc.). If more than one value is
taken at a time, the measurements of the samples at a given time constitute a subgroup.
Process capability ratio index (Cp): is one of basic measurement of process Potential
Capability which is define as the ratio of specification width to the process spread, it indicates
how well the process fits within the two specification limits
Process capability ratio index (Cpk): a second measure of process capability Measuring of
Actual Process Capability, The Cpk differs from the Cp in that it indicates if the process mean
has shifted away from the design target, and in which direction it has shifted that is, if it is off
center. This is the drawback of Cp which does not take in account the location of process
mean relatively to specification. The reason why Cp > 1 does not necessarily mean that the
process is not producing defects, is that, the range of the control limits might be smaller than
the one of the standard specified limits, but if the process mean is not centered to the specified
target, one side of the control limit might exceed the specified limits.
If the Cpk index is greater than 1.00, then the process is capable of meeting design
specifications. If Cpk is less than 1.00, then the process mean has moved closer to one of the
upper or lower design specifications, and it will generate defects. When Cpk equals Cp, this
indicates that the process mean is centered on the design (nominal) target.
CPU = , CPL =
Example 1
Solution
The problem is visually shown in figure below
= (is excellent )
CPL = = =2
CPU =
Cpk= (CPU, CPL) = ( , 2) =2 (the process is centered)
Example 2
A manufacturing process produces a certain part with a mean diameter of 2 inches and
standard deviation of 0.03 inches. The lower and upper engineering specification limits are
1.90 inches and 2.05 inches. Find index and the process is capable or not.
Solution
= the process is not a capable process because
Example 3
A manufacturing process produces a certain part with a mean diameter of 2 inches and a
standard deviation of 0.03 inches. The two lower and upper engineering specification limits
are 1.90 inches and 2.05 inches.
Cpk= (CPU, CPL) = ( , )
Cpk= ( 0.56) =0.56 therefore, the process is not capable (the variation is too large
and the process mean is not on target)
Example 4
Consider a quality characteristic with target of 100 μm and upper and lower specification
limits of 106 μm and 94 μm respectively. If, after carefully monitoring the process for a while,
it appears that the process is in control and producing output predictably (as depicted in the
run chart below), we can meaningfully estimate its mean and standard deviation.
If μ and σ are estimated to be 98.94 μm and 1.03 μm, respectively, Find (Cp and Cpk) indices
= (the process is a capable)