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Consultancy Form

The document is a requisition form for various analytical equipment and services at the Centre for Nanoscience and Nanotechnology at Sathyabama Institute of Science and Technology. It requests information like name, designation, department, contact details, type of analysis, number and details of samples, deposition methods if required for thin film deposition, and XRD sample details like temperature range. It also mentions payment details, sample requirements for different techniques, and an acknowledgement clause.

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SHYAM SUNDAR
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13 views2 pages

Consultancy Form

The document is a requisition form for various analytical equipment and services at the Centre for Nanoscience and Nanotechnology at Sathyabama Institute of Science and Technology. It requests information like name, designation, department, contact details, type of analysis, number and details of samples, deposition methods if required for thin film deposition, and XRD sample details like temperature range. It also mentions payment details, sample requirements for different techniques, and an acknowledgement clause.

Uploaded by

SHYAM SUNDAR
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as DOC, PDF, TXT or read online on Scribd
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SATHYABAMA INSTITUTE OF SCIENCE & TECHNOLOGY

(Deemed to be University)

Centre for Nanoscience & Nanotechnology


Requisition form for XRD/AFM/FESEM/EDAX/Ball milling/ UV-Vis Spec./Optical/ Inverted/Co-relative/
Epifluorescence Microscopy/Thin film deposition methods/High Temp. Furnace / Cutting/ Polishing/ Pelletizer/
RCPT/ Concrete cutting/ Concrete carbonation test/ Hall Measurements/Ballmilling/Thickness Measurement

Name : Date:

Designation : Bill No:

Department :

Name of University/Institution/Industries :

Email ID & Contact Number :

Type of Analysis :

Number of Samples : (Returnable/Non Returnable)

Details of samples (Foil/Film/Powder/Crystal) :


(if hazardous, please indicate the precautions)
Deposition Methods Required (For thin film deposition only): (Thermal/EB-PVD/PLD & DC/RF Sputtering)

XRD Samples (Mention 2θ range & Temperature) :

Total Amount :

Payment Mode : DD/Cash

If DD, Name of the Bank/ DD number & Date :

Signature of the Guide/Head Signature of the User


Note: Please bring previous literatures, if available,
For powder samples : Quantity should be 0.5 g (minimum) for XRD and FESEM
For AFM samples : Sample surface should be flat
For thickness : Total sample thickness should below 3 mm for all analysis
Size : Should below 1×1 cm2 for AFM and FESEM analysis
The user may acknowledge “Centre for Nanoscience and Nanotechnology, Sathyabama University,
Chennai” for any kind of publications.

FOR OFFICE USE


Name of the Operator: Date Completed:
Signature of the Operator:……………..
Forwarded by:

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