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Consultancy Form 2015

This document is a requisition form for various characterization techniques at the Centre for Nanoscience and Nanotechnology at Sathyabama University. It requests information from users such as name, designation, department, university/institution, contact details, type and number of samples, deposition methods required if applicable, and payment details. Notes provide guidelines for sample quantity, size, thickness, and surface quality for different techniques like XRD, AFM, FESEM. Users are requested to acknowledge the center in any publications using the characterization facilities.

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madhu77
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37 views1 page

Consultancy Form 2015

This document is a requisition form for various characterization techniques at the Centre for Nanoscience and Nanotechnology at Sathyabama University. It requests information from users such as name, designation, department, university/institution, contact details, type and number of samples, deposition methods required if applicable, and payment details. Notes provide guidelines for sample quantity, size, thickness, and surface quality for different techniques like XRD, AFM, FESEM. Users are requested to acknowledge the center in any publications using the characterization facilities.

Uploaded by

madhu77
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as DOC, PDF, TXT or read online on Scribd
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SATHYABAMA UNIVERSITY

Centre for Nanoscience & Nanotechnology


Requisition form for XRD/AFM/FESEM/EDAX/Ball milling/ UV-Vis Spec./Optical/ Inverted/Co-relative/
Epifluorescence Microscopy/Thin film deposition methods/High Temp. Furnace/Cutting/Polishing/Pelletizer

Name : Date:

Designation :

Department :

Name of University/Institution/Industries :

Email ID & Contact Number :

Type of Analysis :

Number of Samples : (Returnable/Non Returnable)

Details of samples (Foil/Film/Powder/Crystal) :


(if hazardous, please indicate the precautions)
Deposition Methods Required (For thin film deposition only): (Thermal/EB-PVD/PLD & DC/RF Sputtering)

XRD Samples (Mention 2 range & Temperature) :

Total Amount :

Payment Mode : DD/Cash

If DD, Name of the Bank/ DD number & Date :

Signature of the Guide/Head Signature of the User


Note: Please bring previous literatures, if available,
For powder samples : Quantity should be 0.5 g (minimum) for XRD and FESEM
For AFM samples : Sample surface should be flat
For thickness : Total sample thickness should below 3 mm for all analysis
Size : Should below 11 cm2 for AFM and FESEM analysis
The user may acknowledge Centre for Nanoscience and Nanotechnology, Sathyabama University,
Chennai for any kind of publications.

FOR OFFICE USE


Name of the Operator: Date Completed:
Signature of the Operator:..
Bill No. :
Forwarded by:

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