4 - Imperfections in Solids - Updates
4 - Imperfections in Solids - Updates
4 CHAPTER 4
Imperfections
in
Solids
Chapter
4 Topic Contents
Introduction
Point Defect
Vacancies and Self-Interstitials
Impurities in Solid
Specification of Composition
Miscellaneous Imperfections
Dislocations – Linear Defects
Interfacial Defects
Bulk or Volume Defects
Atom Vibrations
Microscopic Examination
General
Microscope Techniques
Chapter
4 TOPIC OUTCOMES
At the end of the lecture, students will be able:
1. Describe both vacancy and self-interstitial crystalline
defects.
2. Calculate the equilibrium number of vacancies in a
material at same specified temperature, given the
relevant constants.
3. Name the two types of solid solutions, and provide a
brief written definition and/or schematic sketch of each.
4. Given the masses and atomic weights of two or more
elements in a metal alloy, calculate the weight percent
and atom percent for each element
Chapter
4 TOPIC OUTCOMES
5. For each of edge, screw and mixed dislocations:
(a) describe and make a drawing of the dislocation.
(b) note the location of the dislocation line, and
(c) indicate the direction along which the
dislocation line extends
6. Describe the atomic structure within the vicinity of
(a) a grain boundary and
(b) a twin boundary
Chapter
4 INTRODUCTION
ISSUES TO ADDRESS...
heat
flow
Shell of
Columnar in equiaxed grains
area with less due to rapid
undercooling cooling (greater
T) near wall
Example:
- Sterling silver (92.5% Silver, 7.5%
copper (impurities)
- strong & hard compared to pure silver.
Chapter
4
Types of Imperfections
• Vacancy atoms
• Interstitial atoms Point defects
• Substitutional atoms
i. vacancy
ii. self-interstitial
Chapter
4
i. Vacancies
• Vacancies:
-vacant atomic sites in a structure.
Vacancy
distortion
of planes
Chapter
4
i. Vacancies
Nv Q
No. of potential exp
v
N kT
defect sites.
Temperature
Boltzmann's constant
(1.38 x 10 -23 J/atom-K)
(8.62 x 10 -5 eV/atom-K)
Each lattice site
is a potential
vacancy site
Chapter
4
ii. Self-Interstitials
• Self-Interstitials:
self-
interstitial
distortion
of planes
Chapter
4
ii. Self-Interstitials
• An atom from crystal that is crowded into
interstitial site.
• A small void space that under ordinary
circumstances is not occupied.
• In metal – self-interstitial introduces
relatively large distortions in the
surrounding lattice.
• Atom is substantially larger than the
interstitial position.
• self-interstitial lower than vacancies.
Chapter
4
Ionic Crystals Point Defects
• In ionic crystal defects are more complex due to the
necessity to maintain electrical neutrality.
1. Schottky Imperfection
when two oppositely charged ions are missing
from an ionic crystal, a cation-anion divacancy is
created.
2. Frenkel Imperfection
if a positive cation moves into an interstitial site in
an ionic crystal, a cation vacancy is created in the
normal ion site.
Chapter
4
Ionic Crystals Point Defects
• 2D representation of an ionic crystal illustrating a Schottky defect
and a Frenkel defect.
Chapter
4
Impurity of atoms in Solid
• Impurity atoms of the substitution or
interstitial type are also point defects and
may be present in metallic or covalent
bonded crystals.
• For example,
– Very small amounts of subtitutional impurity
atoms in pure silicon can greatly affect its
electrical conductivity for use in electrical
conductivity for use in electronic device.
OR
Factors:
i. Atomic size factor – solute may be
accommodated of solid solution only when
the difference in atomic radii between the
two types less ± 15%.
ii. Crystal structure – for both atom types
must be the same.
iii. Electronegativity - must be the same
iv. Valences - must be the same
Chapter Example:
4
Cu Ni
Atomic Radius (nm) 0.128 0.125
Crystal Structure FCC FCC
Electronegativity 1.9 1.8
Valence +1/+2 +2
Chapter ii. Interstitial
4
slip steps
Burger’s vector, b:
measure of lattice
distortion
Chapter
4 Edge Dislocation
• Created by insertion of extra half planes of atoms.
31
Chapter
4 Motion of Edge Dislocation
Screw Dislocation
b
Dislocation
line
Burgers vector b (b)
(a)
Chapter
4
Screw Dislocation
• Created due to shear stresses applied to
regions of a perfect crystal separated by cutting
plane.
• Distortion of lattice in form of a spiral ramp.
• Burgers vector is parallel to dislocation line.
34
Chapter
4 Edge, Screw, and Mixed Dislocations
Mixed
Edge
Screw
Chapter
4
3D view of
grains
Grain Boundaries
In 1018 steel
Chapter
4
Grain Boundaries
• Stacking faults
– For FCC metals an error in ABCABC packing sequence
– Ex: ABCABABC
Chapter Bulk or Volume Defects
4
• Specification of
composition m1
C1 x 100
– weight percent
m1 m2
m1 = mass of component 1
nm1
– atom percent C
'
1 x 100
nm1 nm 2
= 98.7 at %
= 1.30 at %
Chapter
4 Microscopic Examination
52
Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
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Effect of Etching
Unetched Etched
Unetched Etched
Brass Brass
Steel Steel
200 X 200 X
200 X 200 X
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Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
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Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
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Grain Size
56
Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
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200 X 200 X
1018 cold rolled steel, n=10 1045 cold rolled steel, n=8
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Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
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Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
Chapter
4 Optical Microscopy
• Useful up to 2000X magnification.
• Polishing removes surface features (e.g., scratches)
• Etching changes reflectance, depending on crystal
orientation.
crystallographic planes
Adapted from Fig. 4.13(b) and (c), Callister
7e. (Fig. 4.13(c) is courtesy
of J.E. Burke, General Electric Co.
Micrograph of
brass (a Cu-Zn alloy)
0.75mm
Chapter
4 Optical Microscopy
Grain boundaries...
• are imperfections,
• are more susceptible
to etching,
• may be revealed as polished surface
dark lines,
• change in crystal surface groove
orientation across grain boundary
(a)
boundary.
ASTM grain
size number
N = 2n-1
• Polarized light
– metallographic scopes often use polarized
light to increase contrast
– Also used for transparent samples such as
polymers
Chapter
4 Microscopy
Optical resolution ca. 10-7 m = 0.1 m = 100 nm
For higher resolution need higher frequency
– X-Rays? Difficult to focus.
– Electrons
• wavelengths ca. 3 pm (0.003 nm)
– (Magnification - 1,000,000X)
• Atomic resolution possible
• Electron beam focused by magnetic lenses.
Chapter Scanning Tunneling Microscopy (STM)
4
• Electron Microscope:
i. The Scanning Electron Microscope
(SEM)
ii. Transmission Electron Microscopy
(TEM)
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• Electron produced by
heated tungsten
filament.
• Accelerated by high
voltage (75 - 120 KV)
• Electron beam passes
through very thin Collagen Fibrils
of ligament as
specimen.
seen in TEM
• Difference in atomic
arrangement change
directions of electrons.
• Beam is enlarged and
focused on fluorescent
screen.
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Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
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TEM (..Cont)
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Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
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Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
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Foundations of Materials Science and Engineering, 5th Edn. in SI units Smith and Hashemi
Chapter
4 i. The Scanning Electron Microscope (SEM)