Project No.

: TM-2410000341P Page: 1 / 70
Report No.: TMXD2410003790DA Rev.: 00

E/ECE/324, E/ECE/TRANS/505
Addendum 9: Regulation No. 10
(Rev. 06)
TEST REPORT
for

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Display

MODEL: RTD-S11

Issued to:

RuggON corporation
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4F, No.298, Yang Guang St., NeiHu. Taipei, Taiwan, 11491

Issued by:

Compliance Certification Services Inc.

Xindian Lab.
No.163-1, Jhongsheng Rd., Xindian Dist.,
New Taipei City, Taiwan.
TEL: 886-2-22170894
FAX: 886-2-22171029
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Issued Date: November 26, 2024

Note: This document may be altered or revised by Compliance Certification Services Inc. personnel only,
and shall be noted in the revision section of the document. The client should not use it to claim product
endorsement by TAF, NIST or any government agencies.

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested and such sample(s) are retained for 90 days only.
除非另有說明，此報告結果僅對測試之樣品負責，同時此樣品僅保留90天。本報告未經本公司書面許可，不可部份複製。
This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at http://www.sgs.com.tw/Terms-and-Conditions
and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at http://www.sgs.com.tw/Terms-and-Conditions. Attention is drawn to the limitation of liability,
indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention
only and within the limits of client’s instruction, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their
rights and obligations under the transaction documents. This document cannot be reproduced, except in full, without prior written approval of the Company. Any unauthorized alteration,
forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.

Compliance Certification Services Inc. No.163-1, Jhongsheng Rd., Xindian Dist., New Taipei City, Taiwan /新北市新店區中生路 163-1 號
程智科技股份有限公司 t: (886-2) 2217-0894 f: (886-2) 2217-1029 www.sgs.com.tw
Member of the SGS Group
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Report No.: TMXD2410003790DA Rev.: 00

Revision History

Issue Effect
Rev. Date Revisions Page Revised By
00 November 26, 2024 Initial Issue ALL Andrea Chen

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Report No.: TMXD2410003790DA Rev.: 00

TABLE OF CONTENTS

1 TEST RESULT CERTIFICATION ....................................................................................... 4

2 EUT DESCRIPTION ........................................................................................................... 5
3 TEST METHODOLOGY ..................................................................................................... 6
3.1. UNIT OF MEASUREMENT .................................................................................................. 6
3.2. ANTENNA ............................................................................................................................ 6
3.3. DECISION OF FINAL TEST MODE ..................................................................................... 6
3.4. EUT SYSTEM OPERATION ................................................................................................ 6
4 SETUP OF EQUIPMENT UNDER TEST ............................................................................ 7
5 INSTRUMENT AND CALIBRATION .................................................................................. 8
5.1. MEASURING INSTRUMENT CALIBRATION ...................................................................... 8

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5.2. MEASUREMENT EQUIPMENT ........................................................................................... 8
6 FACILITIES AND ACCREDITATIONS ................................................................................ 9
6.1. FACILITIES .......................................................................................................................... 9
6.2. EQUIPMENT ........................................................................................................................ 9
7 E/ECE R10 REQUIREMENTS .......................................................................................... 10
7.1. RADIATED EMISSION ...................................................................................................... 10
7.2. TRANSIENTS IMMUNITY TEST ....................................................................................... 29
7.3. VOLTAGE TRANSIENT EMISSIONS TEST ...................................................................... 47
8 PHOTOGRAPHS OF THE TEST CONFIGURATION ....................................................... 58
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APPENDIX 1 - PHOTOGRAPHS OF EUT ................................................................................... 61
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Report No.: TMXD2410003790DA Rev.: 00

1 TEST RESULT CERTIFICATION

Product: Display

Model: RTD-S11

Brand: RuggON
Applicant: RuggON corporation
4F, No.298, Yang Guang St., NeiHu. Taipei, Taiwan, 11491
Manufacturer: Ubiqconn Technology, Inc.
4F, No.300, YangGuang St., Neihu Dist., Taipei City, Taiwan, R.O.C., 114

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Tested: November 7, 2024 ~ November 15, 2024

Standards
E/ECE/324, E/ECE/TRANS/505
Addendum 9: Regulation No. 10 (Rev. 06)
Applicable Standard Item TEST RESULT
CISPR 25: 2002 No non-compliance noted
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ISO 7637-2: 2004 No non-compliance noted
Deviation from Applicable Standard
N/A
Statements of Conformity
Determination of compliance is based on the results of the compliance measurement, not taking into
account measurement instrumentation uncertainty.

The above equipment was tested by Compliance Certification Services Inc. for compliance with
the requirements set forth in E/ECE/324, E/ECE/TRANS/505 Addendum 9: Regulation No.10.
(Rev. 06). The results of testing in this report apply only to the product/system, which was tested.
Other similar equipment will not necessarily produce the same results due to production tolerance
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and measurement uncertainties.

Approved by: Reviewed by:

Howard Peng Eva Fan

Technology Team Leader Supervisor of report document dept.
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Report No.: TMXD2410003790DA Rev.: 00

2 EUT DESCRIPTION

Product Display

Brand Name RuggON

Model RTD-S11

Applicant RuggON corporation

Housing material Plastic

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Received Date October 25, 2024

EUT Power Rating 12VDC/24VDC

DC Power During Test 12VDC/24VDC

Note: for more details, please refer to the User’s manual of the ESA.
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I/O PORT

I/O PORT TYPES Q’TY TESTED WITH

1. HDMI Port 1 1
2. USB-A Port 4 4
3. USB-C Port 1 1
4. USB-B Port 1 1

Note: Client consigns only one model sample to test (Model Number: RTD-S11).
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Report No.: TMXD2410003790DA Rev.: 00

3 TEST METHODOLOGY
All tests were performed in accordance with the procedure documented in E/ECE/324,
E/ECE/TRANS/505 Addendum 9: Regulation No.10 (Rev. 06) as referenced in CISPR25 and
ISO7637-2.

3.1. UNIT OF MEASUREMENT

Measurements of radiated interference are reported in terms of dB(uV/m) at a specified distance.
The indicated readings on the Spectrum analyzers were converted to dB (uV/m) by use of
appropriate conversion factors. Measurements of conducted interference are reported in terms of
dB(uV).

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3.2. ANTENNA
The calibrated antennas used to sample the radiated field strength are mounted on a
non-conductive, motorized antenna mast 1 meters from the leading edge of the turntable.

3.3. DECISION OF FINAL TEST MODE

The EUT was tested together with the below additional components, and a configuration, which
produced the worst emission levels, was selected and recorded in this report.
The test configuration/ modes are as the following:
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Modes:
1 12VDC Mode
Normal Operation
2 24VDC Mode

Worst: Mode 1, 2

3.4. EUT SYSTEM OPERATION

1. To perform operations SOP to test EUT.
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Note: Test program is self-repeating throughout the test.
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Report No.: TMXD2410003790DA Rev.: 00

4 SETUP OF EQUIPMENT UNDER TEST

The EUT has been tested as an independent unit together with other necessary accessories or
support units. The following support units or accessories were used to form a representative test
configuration during the tests.

Peripherals Devices:
No. Equipment Model No. Serial No. FCC ID / BSMI ID Brand Name Data Cable Power Cord

1 Smart Phone Galaxy Note 7 N/A N/A Samsung Shielded, 1.8m N/A

2-5 USB HDD TS1TSJ25M3G N/A BSMI: D33193 Transcend Shielded, 2.0m N/A

HDMI:
Shielded, 1.8m

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6 Host PC Precision 3640 74ZVTC3 BSMI: R33002 DELL Unshielded, 1.8m
USB:
Shielded, 2.0m

7 Battery N/A N/A N/A N/A Unshielded, 3.0m N/A

Note:
1) All the equipment/cables were placed in the worst-case configuration to maximize the emission during the test.
2) Grounding was established in accordance with the manufacturer’s requirements and conditions for the intended use.
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Report No.: TMXD2410003790DA Rev.: 00

5 INSTRUMENT AND CALIBRATION

5.1. MEASURING INSTRUMENT CALIBRATION
The measuring equipment, which was utilized in performing the tests documented herein,
has been calibrated in accordance with the manufacturer’s recommendations for utilizing
calibration equipment, which is traceable to recognized national standards.

5.2. MEASUREMENT EQUIPMENT

Equipment Used for Radiation Emission Measurement
966 Chamber D (CISPR 25)

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Name of Equipment Manufacturer Model Serial Number Calibration Due
MXE EMI Receiver Keysight N9038B MY62210130 01/29/2025
BBA 9106
Antenna Schwarzbeck 01869 12/06/2024
(VHBB 9124)
Antenna Schwarzbeck VUSLP 9111 402TX 12/06/2024
N-Type Cable EMEC CFD400E-LW SD-R084 04/11/2025
Pre-Amplifier EMCI EMC330H 980111 08/06/2025
Thermo-Hygro Meter Wisewind N/A SD-R027 08/06/2025
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LISN Schwarzbeck NNBM 8124 01734 12/27/2024
LISN Schwarzbeck NNBM 8124 01735 12/27/2024
Test S/W EZ-EMC Ver.CCS-03A1
Note: The measurement uncertainty is less than +/- 2.8dB, which is evaluated as per the NAMAS NIS 81
and CISPR/A/291/CDV.

Equipment Used for Transient Immunity Measurement

Immunity Shielded Room (ISO 7637-1/-2)
Name of Equipment Manufacturer Model Serial Number Calibration Due
Transient Immunity Tests Teseq NSG 5500 1543 12/13/2024
Power Amplifier Teseq PA 5840 4106 12/13/2024
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Test S/W Autostar7 V2.0.0.0

Equipment Used for Transient Emissions Measurement

Immunity Shielded Room (ISO 7637-1/-2)
Name of Equipment Manufacturer Model Serial Number Calibration Due
Artificial Network Teseq AN 5501 1417 12/13/2024
Digital Phosphor
TEKTRONIX TDS 3054C C013600 04/22/2025
Oscilloscope
Automotive Emission
Teseq SC 5501 1417 12/13/2024
System
High Voltage Probe Tektronix Tek P5100 SD-S053 04/21/2025
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Report No.: TMXD2410003790DA Rev.: 00

6 FACILITIES AND ACCREDITATIONS

6.1. FACILITIES
All measurement facilities used to collect the measurement data are located at CCS
Taiwan Xindian Lab. at No.163-1, Jhongsheng Rd., Xindian Dist., New Taipei City,
Taiwan.

6.2. EQUIPMENT
Radiated emissions are measured with one or more of the following types of linearly
polarized antennas: tuned dipole, biconical, log periodic, bi-log, and/or ridged waveguide,

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horn. Spectrum analyzers with preselectors and quasi-peak detectors are used to perform
radiated measurements.
Calibrated wideband preamplifiers, coaxial cables, and coaxial attenuators are also used
for making measurements.
All receiving equipment conforms to CISPR Publication 16-1, “Radio Interference
Measuring Apparatus and Measurement Methods.”
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Report No.: TMXD2410003790DA Rev.: 00

7 E/ECE R10 REQUIREMENTS

7.1. RADIATED EMISSION
LIMIT
(1) Broadband reference limits

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Report No.: TMXD2410003790DA Rev.: 00

(2) Narrowband reference limits

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Report No.: TMXD2410003790DA Rev.: 00

TEST CONFIGURATION

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1 DUT
2 Test harness
3 Load simulator
4 Battery
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5 Artificial network (AN) or 50 ohm BAN
6 Ground plan
7 Low relative permittivity support (εr≦1.4)
8 Log-periodic antenna (and Bi-conical antenna)
9 Monitoring device
10 Double-shielded coaxial cable (50 ohm)
11 Bulkhead connector
12 RF Amplifier System
13 RF absorber material

TEST PROCEDURE
The immunity of ESA representative of its type shall be tested by the method(s) according
to CISPR 25: as described in E/ECE/324, E/ECE/TRANS/505 Addendum 9: Regulation
No.10 (Rev.06).
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Report No.: TMXD2410003790DA Rev.: 00

TEST RESULTS
No non-compliance noted

Test Data
DC 12V: Broadband - 30MHz to 200MHz – Vertical
Model No. RTD-S11 Polarization: Vertical

Test item: Radiation Test Power Source: DC 12V

Temp.(℃)/Hum.(%): 24.2(℃)/53%

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Engineer Signature: Angus Chen
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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (QP) (V/H)
1 33.9100 34.20 -17.17 17.03 61.13 -44.10 QP V
2 42.0700 36.30 -16.67 19.63 59.32 -39.69 QP V
3 49.7200 37.10 -17.59 19.51 57.62 -38.11 QP V
4 78.4500 45.80 -20.57 25.23 52.12 -26.89 QP V
5 99.0199 56.40 -20.18 36.22 52.81 -16.59 QP V
6 125.3700 48.50 -17.62 30.88 53.70 -22.82 QP V
7 132.0000 58.20 -17.55 40.65 53.93 -13.28 QP V
8 175.3500 37.70 -15.62 22.08 55.40 -33.32 QP V
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Report No.: TMXD2410003790DA Rev.: 00

DC 12V: Broadband - 30MHz to 200MHz – Horizontal

Model No. RTD-S11 Polarization: Horizontal

Test item: Radiation Test Power Source: DC 12V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (QP) (V/H)
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1 30.6800 32.70 -17.39 15.31 61.85 -46.54 QP H
2 36.6300 32.10 -17.13 14.97 60.53 -45.56 QP H
3 48.8700 40.30 -17.44 22.86 57.81 -34.95 QP H
4 78.1100 44.60 -20.53 24.07 52.11 -28.04 QP H
5 85.4200 48.40 -20.43 27.97 52.35 -24.38 QP H
6 119.9300 43.80 -17.83 25.97 53.52 -27.55 QP H
7 164.9800 62.90 -16.51 46.39 55.05 -8.66 QP H
8 177.7300 38.50 -15.53 22.97 55.48 -32.51 QP H
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Report No.: TMXD2410003790DA Rev.: 00

DC 12V: Broadband - 200MHz to 1GHz – Vertical

Model No. RTD-S11 Polarization: Vertical

Test item: Radiation Test Power Source: DC 12V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (QP) (V/H)
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1 240.0000 53.40 -15.02 38.38 57.58 -19.20 QP V
2 307.2000 54.10 -14.84 39.26 59.86 -20.60 QP V
3 445.6000 52.80 -12.17 40.63 63.00 -22.37 QP V
4 593.6000 53.20 -9.98 43.22 63.00 -19.78 QP V
5 776.8000 46.90 -6.89 40.01 63.00 -22.99 QP V
6 940.8000 45.70 -5.59 40.11 63.00 -22.89 QP V
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Report No.: TMXD2410003790DA Rev.: 00

DC 12V: Broadband - 200MHz to 1GHz – Horizontal

Model No. RTD-S11 Polarization: Horizontal

Test item: Radiation Test Power Source: DC 12V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (QP) (V/H)
D
1 244.0000 51.80 -14.99 36.81 57.72 -20.91 QP H
2 313.6000 47.60 -14.46 33.14 60.08 -26.94 QP H
3 445.6000 46.90 -12.17 34.73 63.00 -28.27 QP H
4 643.2000 36.10 -9.19 26.91 63.00 -36.09 QP H
5 780.8000 52.40 -6.82 45.58 63.00 -17.42 QP H
6 960.0000 41.50 -5.17 36.33 63.00 -26.67 QP H
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Report No.: TMXD2410003790DA Rev.: 00

DC 24V: Broadband - 30MHz to 200MHz – Vertical

Model No. RTD-S11 Polarization: Vertical

Test item: Radiation Test Power Source: DC 24V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (QP) (V/H)
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1 33.9100 31.80 -17.17 14.63 61.13 -46.50 QP V
2 42.0700 36.40 -16.67 19.73 59.32 -39.59 QP V
3 50.4000 46.20 -17.71 28.49 57.47 -28.98 QP V
4 79.6400 47.70 -20.61 27.09 52.16 -25.07 QP V
5 99.0199 56.50 -20.18 36.32 52.81 -16.49 QP V
6 120.1000 48.10 -17.82 30.28 53.53 -23.25 QP V
7 132.0000 58.30 -17.55 40.75 53.93 -13.18 QP V
8 192.8600 36.40 -14.56 21.84 55.99 -34.15 QP V
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Report No.: TMXD2410003790DA Rev.: 00

DC 24V: Broadband - 30MHz to 200MHz – Horizontal

Model No. RTD-S11 Polarization: Horizontal

Test item: Radiation Test Power Source: DC 24V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (QP) (V/H)
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1 31.5300 28.10 -17.40 10.70 61.66 -50.96 QP H
2 43.0900 31.50 -16.84 14.66 59.09 -44.43 QP H
3 49.0400 37.60 -17.45 20.15 57.77 -37.62 QP H
4 77.7699 45.80 -20.53 25.27 52.09 -26.82 QP H
5 85.9300 47.20 -20.42 26.78 52.37 -25.59 QP H
6 103.2699 42.50 -19.78 22.72 52.96 -30.24 QP H
7 164.9800 63.90 -16.51 47.39 55.05 -7.66 QP H
8 197.9600 35.40 -14.24 21.16 56.16 -35.00 QP H
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Report No.: TMXD2410003790DA Rev.: 00

DC 24V: Broadband - 200MHz to 1GHz – Vertical

Model No. RTD-S11 Polarization: Vertical

Test item: Radiation Test Power Source: DC 24V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (QP) (V/H)
D
1 240.0000 51.80 -15.02 36.78 57.58 -20.80 QP V
2 307.2000 52.40 -14.84 37.56 59.86 -22.30 QP V
3 445.6000 54.10 -12.17 41.93 63.00 -21.07 QP V
4 594.4000 49.90 -9.98 39.92 63.00 -23.08 QP V
5 776.8000 47.30 -6.89 40.41 63.00 -22.59 QP V
6 940.8000 46.50 -5.59 40.91 63.00 -22.09 QP V
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Report No.: TMXD2410003790DA Rev.: 00

DC 24V: Broadband - 200MHz to 1GHz – Horizontal

Model No. RTD-S11 Polarization: Horizontal

Test item: Radiation Test Power Source: DC 24V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (QP) (V/H)
D
1 243.2000 51.70 -14.99 36.71 57.69 -20.98 QP H
2 313.6000 45.20 -14.46 30.74 60.08 -29.34 QP H
3 445.6000 49.10 -12.17 36.93 63.00 -26.07 QP H
4 657.6000 34.20 -8.81 25.39 63.00 -37.61 QP H
5 784.0000 50.80 -6.72 44.08 63.00 -18.92 QP H
6 960.0000 42.60 -5.17 37.43 63.00 -25.57 QP H
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Report No.: TMXD2410003790DA Rev.: 00

Test Data
DC 12V: Narrowband - 30MHz to 200MHz – Vertical

Model No. RTD-S11 Polarization: Vertical

Test item: Radiation Test Power Source: DC 12V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (AVG) (V/H)

1 33.5700 27.71 -17.24 10.47 51.21 -40.74 AVG V

2 35.9500 29.90 -17.11 12.79 50.68 -37.89 AVG V
3 49.5500 26.11 -17.56 8.55 47.66 -39.11 AVG V
4 78.6200 36.35 -20.59 15.76 42.12 -26.36 AVG V
5 99.0199 51.00 -20.18 30.82 42.81 -11.99 AVG V
6 119.9300 42.48 -17.83 24.65 43.52 -18.87 AVG V
7 132.0000 51.15 -17.55 33.60 43.93 -10.33 AVG V
8 177.2200 28.10 -15.55 12.55 45.46 -32.91 AVG V
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Report No.: TMXD2410003790DA Rev.: 00

DC 12V: Narrowband - 30MHz to 200MHz – Horizontal

Model No. RTD-S11 Polarization: Horizontal

Test item: Radiation Test Power Source: DC 12V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (AVG) (V/H)
D
1 30.5100 21.91 -17.44 4.47 51.89 -47.42 AVG H
2 35.9500 22.41 -17.11 5.30 50.68 -45.38 AVG H
3 49.0400 29.62 -17.45 12.17 47.77 -35.60 AVG H
4 79.1300 35.59 -20.64 14.95 42.14 -27.19 AVG H
5 85.2500 37.69 -20.43 17.26 42.35 -25.09 AVG H
6 119.9300 38.80 -17.83 20.97 43.52 -22.55 AVG H
7 164.9800 56.95 -16.51 40.44 45.05 -4.61 AVG H
8 177.9000 29.45 -15.53 13.92 45.48 -31.56 AVG H
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Report No.: TMXD2410003790DA Rev.: 00

DC 12V: Narrowband - 200MHz to 1GHz – Vertical

Model No. RTD-S11 Polarization: Vertical

Test item: Radiation Test Power Source: DC 12V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (AVG) (V/H)
D
1 240.0000 39.58 -15.02 24.56 47.58 -23.02 AVG V
2 307.2000 43.43 -14.84 28.59 49.86 -21.27 AVG V
3 445.6000 41.94 -12.17 29.77 53.00 -23.23 AVG V
4 593.6000 39.51 -9.98 29.53 53.00 -23.47 AVG V
5 742.4000 37.27 -7.29 29.98 53.00 -23.02 AVG V
6 940.8000 34.95 -5.59 29.36 53.00 -23.64 AVG V
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Report No.: TMXD2410003790DA Rev.: 00

DC 12V: Narrowband - 200MHz to 1GHz – Horizontal

Model No. RTD-S11 Polarization: Horizontal

Test item: Radiation Test Power Source: DC 12V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (AVG) (V/H)
D
1 243.2000 39.78 -14.99 24.79 47.69 -22.90 AVG H
2 307.2000 36.47 -14.84 21.63 49.86 -28.23 AVG H
3 445.6000 37.92 -12.17 25.75 53.00 -27.25 AVG H
4 593.6000 26.49 -9.98 16.51 53.00 -36.49 AVG H
5 776.8000 43.08 -6.89 36.19 53.00 -16.81 AVG H
6 932.8000 35.13 -5.81 29.32 53.00 -23.68 AVG H
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Report No.: TMXD2410003790DA Rev.: 00

DC 24V: Narrowband - 30MHz to 200MHz – Vertical

Model No. RTD-S11 Polarization: Vertical

Test item: Radiation Test Power Source: DC 24V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

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No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (AVG) (V/H)
D
1 30.8500 22.66 -17.37 5.29 51.81 -46.52 AVG V
2 42.0700 26.70 -16.67 10.03 49.32 -39.29 AVG V
3 49.5500 25.43 -17.56 7.87 47.66 -39.79 AVG V
4 78.6200 37.64 -20.59 17.05 42.12 -25.07 AVG V
5 99.0199 50.43 -20.18 30.25 42.81 -12.56 AVG V
6 119.9300 41.88 -17.83 24.05 43.52 -19.47 AVG V
7 132.0000 50.17 -17.55 32.62 43.93 -11.31 AVG V
8 175.3500 27.20 -15.62 11.58 45.40 -33.82 AVG V
 Page: 26 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 24V: Narrowband - 30MHz to 200MHz – Horizontal

Model No. RTD-S11 Polarization: Horizontal

Test item: Radiation Test Power Source: DC 24V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

ft
ra
No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (AVG) (V/H)
D
1 30.5100 20.37 -17.44 2.93 51.89 -48.96 AVG H
2 35.9500 21.03 -17.11 3.92 50.68 -46.76 AVG H
3 49.0400 30.39 -17.45 12.94 47.77 -34.83 AVG H
4 61.9600 26.17 -19.36 6.81 44.90 -38.09 AVG H
5 85.5899 36.36 -20.43 15.93 42.36 -26.43 AVG H
6 103.2699 37.69 -19.78 17.91 42.96 -25.05 AVG H
7 164.9800 56.70 -16.51 40.19 45.05 -4.86 AVG H
8 172.4600 28.24 -15.89 12.35 45.30 -32.95 AVG H
 Page: 27 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 24V: Narrowband - 200MHz to 1GHz – Vertical

Model No. RTD-S11 Polarization: Vertical

Test item: Radiation Test Power Source: DC 24V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

ft
ra
No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (AVG) (V/H)
D
1 240.0000 40.61 -15.02 25.59 47.58 -21.99 AVG V
2 307.2000 42.18 -14.84 27.34 49.86 -22.52 AVG V
3 445.6000 43.80 -12.17 31.63 53.00 -21.37 AVG V
4 593.6000 39.46 -9.98 29.48 53.00 -23.52 AVG V
5 770.4000 41.92 -6.97 34.95 53.00 -18.05 AVG V
6 940.8000 34.80 -5.59 29.21 53.00 -23.79 AVG V
 Page: 28 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 24V: Narrowband - 200MHz to 1GHz – Horizontal

Model No. RTD-S11 Polarization: Horizontal

Test item: Radiation Test Power Source: DC 24V

Temp.(℃)/Hum.(%): 24.2(℃)/53% Engineer Signature: Angus Chen

ft
ra
No. Frequency Reading Factor Result Limit Margin Detector P/F Remark
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (AVG) (V/H)
D
1 243.2000 40.52 -14.99 25.53 47.69 -22.16 AVG H
2 307.2000 34.97 -14.84 20.13 49.86 -29.73 AVG H
3 445.6000 39.51 -12.17 27.34 53.00 -25.66 AVG H
4 657.6000 24.18 -8.81 15.37 53.00 -37.63 AVG H
5 733.6000 44.36 -7.21 37.15 53.00 -15.85 AVG H
6 960.0000 30.26 -5.17 25.09 53.00 -27.91 AVG H
 Page: 29 / 70
Report No.: TMXD2410003790DA Rev.: 00

7.2. TRANSIENTS IMMUNITY TEST

LIMIT
Functional Status for Systems
Test Pulse Immunity Test Related to Not Related to
Number Level Immunity-Related Immunity-Related
Functions Functions
1 Ⅲ C D
2a Ⅲ B D

ft
2b Ⅲ C D
3a / 3b Ⅲ A D
B
(for ESA which must be
operational during engine
4 Ⅲ D
start phases)
C
(for other ESA)
ra
TEST CONFIGURATION

5cm isolation
supporter

ESA
Transients and &
surges in the Support Units
vehicular
To AC environment Test
D
Source & Set
Ground 0.8m
Ground Reference Plane

Controller Computer
 Page: 30 / 70
Report No.: TMXD2410003790DA Rev.: 00

TEST PROCEDURE
The immunity of ESA representative of its type shall be tested by the method(s) according
to ISO 7637-2: DIS 2004 as described in E/ECE/324, E/ECE/TRANS/505 Addendum 9:
Regulation No.10 (Rev. 06).

TEST RESULTS
No non-compliance noted

Test Pulse Immunity 12V Systems 24V Systems

ft
Limit Pass / Fail
Number Test Level Test Result Test Result
1 Ⅲ D C C Pass
2a Ⅲ D A A Pass
2b Ⅲ D C C Pass
3a / 3b Ⅲ D A A Pass
4 Ⅲ D A A Pass
ra
D
 Page: 31 / 70
Report No.: TMXD2410003790DA Rev.: 00

TEST DATA

DC 13.5V Pulse 1

Project TM-2410000341P
Test Time 2024/11/15
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC

ft
Model RTD-S11
13.5 V
Va (Alternator)
10 A Lim.

Environmental Conditions
Temperature 23.4oC
Humidity 52%
ra
Pressure 1008mbar

Parameters
Us 75 V
td 2 ms
tr 1 µs
Ri 10 Ω
t1 0.5 s
t2 200 ms
D
t3 < 100 µs
Test Duration 5000 (Count)

Test Results
Results Test passed !
Class: C
During the test, EUT shut down.
After the test, EUT return automatically to normal
operation.
Test Engineer Angus Chen
 Page: 32 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 13.5V Pulse 2a

Project TM-2410000341P

Test Time 2024/11/15

Standard ISO 7637-2: 2004

Company Ubiqconn Technology, Inc.

EUT IPC

Model RTD-S11

ft
13.5 V
Va (Alternator)
10 A Lim.

Environmental Conditions

Temperature 23.4oC

Humidity 52%
ra
Pressure 1008mbar

Parameters
Us 37 V
td 50 µs
tr 1 µs
Ri 2Ω
t1 0.2 s
D
Test Duration 5000 (Count)

Test Results

Results Test passed !

Class: A
There was no change compared with the initial operation
during the test.

Test Engineer Angus Chen

 Page: 33 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 13.5V Pulse 2b
Project TM-2410000341P
Test Time 2024/11/15
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
13.5 V
Va (Alternator)
10 A Lim.

ft
Environmental Conditions
Temperature 23.4oC
Humidity 52%
Pressure 1008mbar
ra
Test
CH1 Segment 1 Ramp: "UA"
Parameters (1 ct.)
Offset 13.5 V
Duration 100 ms
Noise None
D
Trigger None
CH1 Segment 2 Ramp: "t12"
Parameters (1 ct.)
Offset 13.5 V ... 0 V (Linear, Stepless)
Duration 1.2 ms
Noise None
Trigger None
CH1 Segment 3 Ramp: "t6"
Parameters (1 ct.)
Offset 0V
Duration 1 ms
Noise None
Trigger None
 Page: 34 / 70
Report No.: TMXD2410003790DA Rev.: 00

CH1 Segment 4 Exponential Rise: "tr"

Parameters (1 ct.)
Amplitude 10 V
Offset 0V
Duration 1 ms
Phase 0 ° ... 0 °
Noise None
Trigger None
CH1 Segment 5 Exponential Fall: "td"
Parameters (1 ct.)

ft
Amplitude 10 V
Offset 0V
Duration 2s
Phase 0 ° ... 0 °
Noise None
Trigger None
CH1 Segment 6 Ramp: "t_wait"
Parameters (1 ct.)
Offset 0V
ra
Duration 1s
Noise None
Trigger None
Channel Parameters CH1
End of Test Voltage 13.5 V
Modulation None
Current Limit 10 A

Test Results
Results Test passed !
Class: C
D
During the test, EUT shut down.
After the test, EUT return automatically to normal
operation.
Test Engineer Angus Chen
 Page: 35 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 13.5V Pulse 3a

Project TM-2410000341P
Test Time 2024/11/14
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
13.5 V

ft
Va (Alternator)
10 A Lim.

Environmental Conditions
Temperature 22.5oC
Humidity 55%
Pressure 1008mbar
ra
Parameters
Us 112 V
td 100 ns
tr 5 ns
Ri 50 Ω
1/t1 10 kHz
t4 10 ms
t5 0.09 s
D
Test Duration 1h

Test Results
Results Test passed !
Class: A
There was no change compared with the initial operation
during the test.
Test Engineer Angus Chen
 Page: 36 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 13.5V Pulse 3b

Project TM-2410000341P
Test Time 2024/11/14
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
13.5 V

ft
Va (Alternator)
10 A Lim.

Environmental Conditions
Temperature 22.5oC
Humidity 55%
Pressure 1008mbar
ra
Parameters
Us 75 V
td 100 ns
tr 5 ns
Ri 50 Ω
1/t1 10 kHz
t4 10 ms
t5 0.09 s
D
Test Duration 1h

Test Results
Results Test passed !
Class: A
There was no change compared with the initial operation
during the test.
Test Engineer Angus Chen
 Page: 37 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 13.5V Pulse 4
Project TM-2410000341P
Test Time 2024/11/15
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
13.5 V
Va (Alternator)
10 A Lim.

ft
Environmental Conditions
Temperature 23.4oC
Humidity 52%
Pressure 1008mbar
ra
Test
CH1 Segment 1 Ramp: "UB"
Parameters (1 ct.)
Offset 12 V
Duration 1s
Noise None
D
Trigger None
CH1 Segment 2 Ramp: "t10"
Parameters (1 ct.)
Offset 12 V ... 6 V (Linear, Stepless)
Duration 5 ms
Noise None
Trigger None
CH1 Segment 3 Ramp: "t7"
Parameters (1 ct.)
Offset 6V
Duration 40 ms
Noise None
Trigger None
 Page: 38 / 70
Report No.: TMXD2410003790DA Rev.: 00

CH1 Segment 4 Ramp: "t8"

Parameters (1 ct.)
Offset 6 V ... 9.5 V (Linear, Stepless)
Duration 50 ms
Noise None
Trigger None
CH1 Segment 5 Ramp: "t9"
Parameters (1 ct.)
Offset 9.5 V
Duration 1s
Noise None

ft
Trigger None
CH1 Segment 6 Ramp: "t11"
Parameters (1 ct.)
Offset 9.5 V ... 12 V (Linear, Stepless)
Duration 10 ms
Noise None
Trigger None
CH1 Segment 7 Ramp: "UB"
ra
Parameters (1 ct.)
Offset 12 V
Duration 1s
Noise None
Trigger None
Channel Parameters CH1
End of Test Voltage 13.5 V
Modulation None
Current Limit 10 A

Test Results
Results Test passed !
D
Class: A
There was no change compared with the initial operation
during the test.
Test Engineer Angus Chen
 Page: 39 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 27V Pulse 1

Project TM-2410000341P
Test Time 2024/11/15
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
27 V

ft
Va (Alternator)
10 A Lim.

Environmental Conditions
Temperature 23.4oC
Humidity 52%
Pressure 1008mbar
ra
Parameters
Us 450 V
td 1 ms
tr 3 µs
Ri 50 Ω
t1 1s
t2 200 ms
t3 < 100 µs
D
Test Duration 5000 (Count)

Test Results
Results Test passed !
Class: C
During the test, EUT shut down.
After the test, EUT return automatically to normal
operation.
Test Engineer Angus Chen
 Page: 40 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 27V Pulse 2a

Project TM-2410000341P
Test Time 2024/11/15
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
27 V
Va (Alternator)
10 A Lim.

Environmental Conditions

Temperature

Humidity

Pressure
23.4oC

52%

ft
1008mbar
ra
Parameters
Us 37 V
td 50 µs
tr 1 µs
Ri 2Ω
t1 0.2 s

Test Duration 5000 (Count)

D
Test Results

Results Test passed !

Class: A
There was no change compared with the initial operation
during the test.

Test Engineer Angus Chen

 Page: 41 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 27V Pulse 2b
Project TM-2410000341P
Test Time 2024/11/15
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
27 V
Va (Alternator)
10 A Lim.

ft
Environmental Conditions
Temperature 23.4oC
Humidity 52%
Pressure 1008mbar
ra
Test
CH1 Segment 1 Ramp: "UA"
Parameters (1 ct.)
Offset 27 V
Duration 100 ms
Noise None
D
Trigger None
CH1 Segment 2 Ramp: "t12"
Parameters (1 ct.)
Offset 27 V ... 0 V (Linear, Stepless)
Duration 1.2 ms
Noise None
Trigger None
CH1 Segment 3 Ramp: "t6"
Parameters (1 ct.)
Offset 0V
Duration 1 ms
Noise None
Trigger None
 Page: 42 / 70
Report No.: TMXD2410003790DA Rev.: 00

CH1 Segment 4 Exponential Rise: "tr"

Parameters (1 ct.)
Amplitude 20 V
Offset 0V
Duration 1 ms
Phase 0 ° ... 0 °
Noise None
Trigger None
CH1 Segment 5 Exponential Fall: "td"
Parameters (1 ct.)

ft
Amplitude 20 V
Offset 0V
Duration 2s
Phase 0 ° ... 0 °
Noise None
Trigger None
CH1 Segment 6 Ramp: "t_wait"
Parameters (1 ct.)
Offset 0V
ra
Duration 1s
Noise None
Trigger None
Channel Parameters CH1
End of Test Voltage 27 V
Modulation None
Current Limit 10 A

Test Results
Results Test passed !
Class: C
D
During the test, EUT shut down.
After the test, EUT return automatically to normal
operation.
Test Engineer Angus Chen
 Page: 43 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 27V Pulse 3a

Project TM-2410000341P
Test Time 2024/11/15
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
27 V

ft
Va (Alternator)
10 A Lim.

Environmental Conditions
Temperature 23.4oC
Humidity 52%
Pressure 1008mbar
ra
Parameters
Us 150 V
td 100 ns
tr 5 ns
Ri 50 Ω
1/t1 10 kHz
t4 10 ms
t5 0.09 s
D
Test Duration 1h

Test Results
Results Test passed !
Class: A
There was no change compared with the initial operation
during the test.
Test Engineer Angus Chen
 Page: 44 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 27V Pulse 3b

Project TM-2410000341P
Test Time 2024/11/15
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
27 V

ft
Va (Alternator)
10 A Lim.

Environmental Conditions
Temperature 23.4oC
Humidity 52%
Pressure 1008mbar
ra
Parameters
Us 150 V
td 100 ns
tr 5 ns
Ri 50 Ω
1/t1 10 kHz
t4 10 ms
t5 0.09 s
D
Test Duration 1h

Test Results
Results Test passed !
Class: A
There was no change compared with the initial operation
during the test.
Test Engineer Angus Chen
 Page: 45 / 70
Report No.: TMXD2410003790DA Rev.: 00

DC 27V Pulse 4
Project TM-2410000341P
Test Time 2024/11/15
Standard ISO 7637-2: 2004
Company Ubiqconn Technology, Inc.
EUT IPC
Model RTD-S11
27 V
Va (Alternator)
10 A Lim.

ft
Environmental Conditions
Temperature 23.4oC
Humidity 52%
Pressure 1008mbar
ra
Test
CH1 Segment 1 Ramp: "UB"
Parameters (1 ct.)
Offset 24 V
Duration 1s
Noise None
D
Trigger None
CH1 Segment 2 Ramp: "t10"
Parameters (1 ct.)
Offset 24 V ... 12 V (Linear, Stepless)
Duration 10 ms
Noise None
Trigger None
CH1 Segment 3 Ramp: "t7"
Parameters (1 ct.)
Offset 12 V
Duration 50 ms
Noise None
Trigger None
 Page: 46 / 70
Report No.: TMXD2410003790DA Rev.: 00

CH1 Segment 4 Ramp: "t8"

Parameters (1 ct.)
Offset 12 V ... 19 V (Linear, Stepless)
Duration 50 ms
Noise None
Trigger None
CH1 Segment 5 Ramp: "t9"
Parameters (1 ct.)
Offset 19 V
Duration 1s
Noise None

ft
Trigger None
CH1 Segment 6 Ramp: "t11"
Parameters (1 ct.)
Offset 19 V ... 24 V (Linear, Stepless)
Duration 10 ms
Noise None
Trigger None
CH1 Segment 7 Ramp: "UB"
ra
Parameters (1 ct.)
Offset 24 V
Duration 1s
Noise None
Trigger None
Channel Parameters CH1
End of Test Voltage 27 V
Modulation None
Current Limit 10 A

Test Results
Results Test passed !
D
Class: A
There was no change compared with the initial operation
during the test.
Test Engineer Angus Chen
 Page: 47 / 70
Report No.: TMXD2410003790DA Rev.: 00

7.3. VOLTAGE TRANSIENT EMISSIONS TEST

LIMIT
Maximum allowed pulse amplitude for
Polarity of pulse
amplitude Vehicles with 12 V Vehicles with 24 V
systems systems
Positive + 75V + 150V
Negative - 100V - 450V

ft
TEST CONFIGURATION
ra
(A) Slow pulse
D
 Page: 48 / 70
Report No.: TMXD2410003790DA Rev.: 00

Key

ft (B) Fast pulse

ra
1 oscilloscope or equivalent
2 voltage probe
3 artificial network
4 DUT (source of transient)
5 ground plane
6 power supply
7 Ground connection; length < 100 mm
Note A power supply terminal
B common terminal (may be grounded)
P terminal for DUT
D
 Page: 49 / 70
Report No.: TMXD2410003790DA Rev.: 00

Ambient Condition of the Test Site

Temperature 21.2 °C EUT DC Voltage Rating 13.5V/27V
Humidity 52% Ground Bond Resistance 0.2 Ω
Pressure 1008mbar Test Time 2024/11/7
Tested by Angus Chen

TEST PROCEDURE

ft
The immunity of ESA representative of its type shall be tested by the method(s) according
to ISO 7637-2: DIS 2004 as described in E/ECE/324, E/ECE/TRANS/505 Addendum 9:
Regulation No.10 (Rev. 06).

TEST RESULTS
No non-compliance noted
ra
Slow Pulse Fast Pulse
Polarity of pulse amplitude (ms to slower) (us to ns)
13.5V 27VDC 13.5V 27VDC
Positive +0.9V +1.6V +0.7V +0.8V
Negative -14.2V -29.6V -14.2V -29.4V
+75V +150V +75V +150V
Limit
-100V -450V -100V -450V
Pass / Fail Pass Pass Pass Pass
D
 Page: 50 / 70
Report No.: TMXD2410003790DA Rev.: 00

Test Data
DC 13.5V Slow pulse (ms to slower)
Positive

ft
ra
Positive Width
D
 Page: 51 / 70
Report No.: TMXD2410003790DA Rev.: 00

Negative

ft
ra
Negative Width
D
 Page: 52 / 70
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DC 27V Slow pulse (ms to slower)

Positive

ft
ra
Positive Width
D
 Page: 53 / 70
Report No.: TMXD2410003790DA Rev.: 00

Negative

ft
ra
Negative Width
D
 Page: 54 / 70
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DC 13.5V Fast pulse (us to ns)

Positive

ft
ra
Positive Width
D
 Page: 55 / 70
Report No.: TMXD2410003790DA Rev.: 00

Negative

ft
ra
Negative Width
D
 Page: 56 / 70
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DC 27V Fast pulse (us to ns)

Positive

ft
ra
Positive Width
D
 Page: 57 / 70
Report No.: TMXD2410003790DA Rev.: 00

Negative

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ra
Negative Width
D
 Page: 58 / 70
Report No.: TMXD2410003790DA Rev.: 00

8 PHOTOGRAPHS OF THE TEST CONFIGURATION

RADIATED EMISSION TEST
30MHz ~ 200MHz

ft
ra
200MHz ~ 1GHz
D
 Page: 59 / 70
Report No.: TMXD2410003790DA Rev.: 00

TRANSIENTS IMMUNITY TEST (ISO 7637-1/ -2)

ft
ra
D
 Page: 60 / 70
Report No.: TMXD2410003790DA Rev.: 00

VOLTAGE TRANSIENT EMISSIONS TEST

Slow Pulse

ft
ra
Fast Pulse
D
 Page: 61 / 70
Report No.: TMXD2410003790DA Rev.: 00

APPENDIX 1 - PHOTOGRAPHS OF EUT

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D