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A 2.6Ps - Period-Jitter 900Mhz All-Digital Fractional-N PLL Built With Standard Cells

This document summarizes an all-digital fractional-N phase-locked loop (PLL) built using standard cells and digital synthesis tools. The PLL achieves good jitter performance of 2.62ps rms at 900MHz while consuming 4.2mA from a 1.8V supply. It uses an embedded time-to-digital converter (TDC) with multiple paths to increase resolution. Digital correction circuitry is also included to resolve issues from clock skew. The PLL was implemented in a 0.18um CMOS process and occupies an area of 500um by 500um.

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Richard Su
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0% found this document useful (0 votes)
58 views4 pages

A 2.6Ps - Period-Jitter 900Mhz All-Digital Fractional-N PLL Built With Standard Cells

This document summarizes an all-digital fractional-N phase-locked loop (PLL) built using standard cells and digital synthesis tools. The PLL achieves good jitter performance of 2.62ps rms at 900MHz while consuming 4.2mA from a 1.8V supply. It uses an embedded time-to-digital converter (TDC) with multiple paths to increase resolution. Digital correction circuitry is also included to resolve issues from clock skew. The PLL was implemented in a 0.18um CMOS process and occupies an area of 500um by 500um.

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Richard Su
Copyright
© Attribution Non-Commercial (BY-NC)
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Download as PDF, TXT or read online on Scribd
You are on page 1/ 4

Green: Behavioral Verilog

Blue: Standard Cells


Yellow: Non-Standard Cells
A 2.6ps
rms
-Period-Jitter 900MHz
All-Digital Fractional-N PLL Built with Standard Cells
Richard Su, Steven Lanzisera*, Kristofer S. J. Pister
BSAC, University of California, Berkeley, USA
E-mail: yukuwan@eecs.berkeley.edu
*now with Lawrence Berkeley National Laboratory

Abstract An all-digital fractional-N Phase-Locked Loop (PLL)
built with standard cells and digital synthesis tools allows easier
integration with digital blocks and portability to different
processes or technologies. This paper presents a PLL built with
standard cells and digital synthesis tools and achieves good jitter
performance. It uses an embedded time-to-digital converter
(TDC) with multipath to increase TDC resolution, and includes
digital correction circuitry to resolve issues from clock skew. A
.18m CMOS prototype occupies 500m x 500m of area,
generates a 900MHz clock from a 10MHz reference, has phase
noise of -90dBc/Hz at 1MHz offset and 2.62ps
rms
jitter while
consuming 4.2mA from a 1.8V supply.

I. INTRODUCTION
High-performance fractional-N PLLs used in wireline and
wireless communication systems require careful design by
experienced and skilled analog IC designers. The design of
such PLL blocks is thus expensive in terms of design time
and engineering costs. In this paper, we present a PLL
prototype that is built with standard cells, requires limited
analog design skills, can be easily ported to different
processes, and still has competitive performance.
Analog fractional PLLs and several all-digital fractional
PLLs recently published use a multi-modulus divider in the
feedback path to synthesize an output frequency step size that
is smaller than the reference frequency [1]. This prototype
uses a more digital architecture, which removes the divider
and directly computes the ratio between the output and
reference frequency using a counter and a TDC [2]. This ratio
is then compared with a Frequency Control Word (FCW) to
determine the phase difference. In this approach, phase
information is converted to digital values earlier and cannot
be further degraded by noise. Digital processing techniques,
such as digital correction used in this prototype, can be easily
incorporated into the system.
An inverter delay chain and a Vernier delay line are two
simple forms of TDCs [3]. The latter can resolve resolution
finer than an inverter delay, but suffers from increased area
and device mismatch. In addition, calibration between the
TDC and the digitally-controlled ring oscillator (DCO) is
necessary in both of the aforementioned typical TDC
approaches. This PLL prototype embeds the TDC within the
DCO [4, 5] to achieve area reduction, require no calibration,
and have good jitter performance.

II. EMBEDDED TIME-TO-DIGITAL CONVERTER
Integer-N PLLs using bang-bang phase detectors may
achieve decent phase noise and jitter performance [6].
However, fractional-N PLLs usually require multi-bit TDCs
as the fractional error estimators. The simplest form of TDC
is a delay chain [7] as shown in Fig. 1.
Since a ring oscillator is used in this PLL prototype, as
opposed to an LC oscillator, the ring oscillator is used as the
TDC itself to reduce area overhead. Additionally, the delay
per stage of the TDC is a fixed fraction of the oscillator
period and no TDC calibration is necessary.



Fig. 1. Delay Chain TDC

III. PLL ARCHITECTURE AND IMPLEMENTATION





Fig. 2. Fractional-N PLL Block Diagram

This PL is built entirely with standard cells, except for the
custom designed current sources (shaded in yellow in Fig. 2)
for ring oscillator frequency control. In addition to almost
solely using standard cells, a great portion of this PLL design
(shaded in green in Fig. 2) is using synthesis tools from
Behavioral Verilog. Using the standard digital synthesis
design flow helps realize the goal of portability to different
processes or technologies with minimal effort. The circuit
blocks designed using the synthesis design flow are: the
binary to thermometer decoder, loop filter, arithmetic blocks,
and additional digital correction circuitry.
This PLL operates as follows. The integer counter outputs
the number of oscillator periods per reference period and the
phase quantizer outputs the residual fractional count of the
oscillator period within each reference period. The output of
the integer counter is sampled by the reference clock and
multiplied by a normalization factor. This is then summed
with the output of the phase quantizer, which is also sampled
by the reference clock to create a feedback digital word. This
feedback digital word is then compared with the frequency
control word (FCW). The resulting phase difference goes
through a loop filter before updating the DCO frequency.

A. Digitally-Controlled Ring Oscillator



Fig. 3. DCO

Fig. 3 shows the DCO architecture used in this prototype.
Since the TDC is embedded into the DCO, the delay per stage
of this DCO is directly related to the quantization noise of the
TDC. To reduce the delay per stage, a DCO with multiple
paths is used [8]. This reduction in delay per stage suppresses
in-band phase noise introduced by TDC quantization error [7].
Their relationship follows (1).

PN (Phase Noise) = 1u log _
(2n)
2
12
[
t
in
1

2
1
]
R
_ (1)

where t
n
is the delay of one stage in the ring oscillator, I:
the oscillation period, and
R
the reference frequency.



Fig. 4. Current DAC

The DCO frequency control current source is shown in
Fig. 4. There are six control bits from a binary array digital to
analog converter (DAC), five bits from a unitary array DAC,
and an additional five bits through a current source controlled
by a 1
st
order sigma-delta modulator clocked at half of the
DCO output frequency. The sigma-delta modulator is a five-
bit accumulator whose output is the carry-out bit. The unitary
array is chosen to ensure monotonicity, whereas the sigma-
delta modulator is used to gain finer frequency steps in the
DCO tuning [5]. Long channel devices are used in the current
sources to achieve a finer frequency step, higher output
impedance, greater matching between current sources, and
lower flicker noise corner. The resulting DCOs finest
frequency step is 30kHz and it can operate from 400MHz to
1.3GHz.

B. Phase Quantizer
The phase quantizer is composed of an array of 26 DFFs
from the standard cell library and works by sampling the
intermediate nodes in the DCO. To ensure that there are no
monotonicity issues due to mismatches between consecutive
DFFs, a fractional count is picked when at least two adjacent
DFFs outputs are high. See Fig. 5 for details. In the event that
only a single DFF outputs a high, an error flag is stored.
During our testing, no error flag has been detected.













Fig. 5. Phase Quantizer

Because the pull-up and pull-down strength of DFFs may
not be equal, the edge of a given stage in the DCO may be
captured by the DFF before the corresponding edge of the
prior stage on a given reference clock cycle. To avoid this
problem, we use a differential DCO to ensure that we are
always sampling the same type of edge transition. A
differential DCO is chosen to achieve better TDC linearity and
monotonicity. This helps reduce the magnitude of the
fractional spurs in a fractional PLL.
2X 2X 2X
2X 2X 2X
1X
1X
1X
1X
1X
1X
1X
1X
2X 2X
2X 2X
1X
1X
VHIGH
GND
P1 P15 P3
P14 P2 P16 P0
P25
P13
P12
Fractional Count = 0 if PQ<25:0> = 1xxxxxx001
Fractional Count = 1 if PQ<25:0> = xxxxxx0011
Fractional Count = 2 if PQ<25:0> = xxxxx0011x




Fractional Count = 25 if PQ<25:0> = 11xxxxxx00
The 26 DFFs are triggered on the rising edge of the
reference clock. To avoid metastability issues, the output of
these DFFs are sampled on the falling edge of the reference
clock before forming the feedback digital word.

C. Loop Filter
The loop filter used in this work is a digital proportional
and integral (PI) controller. The integral path ensures that the
loop will not settle until the phase offset reaches zero, and the
proportional path is added to help stabilize the system, as the
DCO and the integral path each contribute a zero to the
transfer function at DC [9]. This PI controller is shown in Fig.
6 and runs on the 10MHz reference clock. The input signal
goes through the proportional path (top path in the Fig. 6) with
proportional coefficient , and the integral path with integral
coefficient . The summation of these two paths outputs is
the output of the PI controller. Given the bandwidth and phase
margin of the PLL, the proportional and integral coefficient of
the PI controller can be derived.



Fig. 6. PI Loop Filter

D. Digital Correction
Since a large portion of the PLL is designed using
behavior Verilog, a digital correction scheme can be easily
included in the system. An error can occur when the reference
clock into the integer counter and the phase quantizer have
different skews [10]. This error forces the summation of
integer count and fractional count to be off by one. An
example in which the reference clock arrives at the phase
quantizer earlier than the integer counter is illustrated in Fig.
7. Such an error will essentially eliminate the purpose of the
fractional counter. A digital correction algorithm that looks at
the history of integer counter outputs is implemented to
compensate for this error.



Fig. 7. Integer Counter Error
E. First Order Noise Shaping
Having the TDC embedded into the DCO results in one
additional benefit. Because the quantization noise from the
previous reference cycle is accumulated to the current
reference cycle, there is a first order noise shaping on its
quantization noise. This idea can be better illustrated with the
help of Fig. 8. The total quantization noise at each reference
cycle is the difference between the quantization noise from the
current reference cycle and the previous reference cycle.


Total Quantization Noise = t
2
- t
1

Fig. 8. Noise Shaping

IV. MEASUREMENT RESULTS
The prototype PLL was fabricated in a .18m 6M1P
standard CMOS process without any RF options. The design
is pad-limited with an active area of 500m x 500m
including a serial interface. The die photo is shown in Fig. 9.



Fig. 9. Die Photo

A. Phase Noise Measurement
With a 10MHz reference clock, the proportional and
integral coefficient of the PI controller is set to have this PLL
operate with 1MHz bandwidth and phase margin of 60
degrees. As shown in Fig. 10, the phase noise is -90dBc/Hz at
1MHz offset. The largest fractional spur is -35dBc at 400kHz
offset from the center frequency. The largest reference spur is
-50dBc at 10MHz offset. For comparison, Fig. 11 is the phase
noise measured when the digital correction mechanism is
turned off. Without the digital correction mechanism, the
DCO
DCO
REF into integer counter and
phase quantizer
Integer Count
Fractional Count
Fractional Count
0 1 89 90
With Skew
0.4 0.1
Correct Answer:
90 + 0.1 0.4 = 89.7
0.2 0.9
With Skew:
90 + 0.9 0.2 = 90.7
Without Skew
REF into integer counter
REF into phase quantizer
500m
5
0
0

m

PLL
integer counter mis-count disturbs the PLL from the locking
states and the phase noise is degraded.

Fig. 10. Phase Noise with Digital Correction Turned On


Fig. 11. Phase Noise with Digital Correction Turned Off

B. Jitter Measurement
The period jitter is measured using a 20Gsamples/sec real-
time scope to capture more than 1 million PLL output clock
cycles. As shown in Fig. 12, the rms period jitter is 2.62ps,
and the peak-to-peak period jitter is 26ps. The measured time
interval error (TIE) is 13.9ps.


Fig. 12. Period Jitter Measurement

C. Comparison
Table 1 compares this work with two recently published
all-digital fractional-N PLLs. Operating at 900MHz with
reference clock of 10MHz, this PLL has comparable period
jitter, TIE jitter and power consumption. This work occupies
larger active area because our implementation was designed
using a .18m process as opposed to the 65nm processes used
in [4, 5].

[4] [5] This
Work
Technology 65nm 65nm .18m
DCO Frequency 800MHz 750MHz 900MHz
Reference 2MHz-
40MHz
25MHz 10MHz
Period Jitter (rms) N/A 4ps 2.6ps
TIE Jitter (rms) 21.5ps N/A 13.9ps
Power Consumption 2.6mA 3.4mA 4.2mA
Area .027mm
2
.046mm
2
.25mm
2

TABLE I Performance Summary and Comparison

V. CONCLUSION
An all-digital fractional-N PLL built with extensive use of
standard cells and digital synthesis tools is proposed and
implemented. This prototype uses a differential multi-path
DCO, embedded TDC, and digital correction circuitry to
achieve low in-band phase noise and competitive jitter
performance. Additionally, because of the widespread use of
digital synthesis tools and standard cells as building blocks,
this PLL has great portability to different processes and
technologies.
REFERENCES
[1] E. Temporiti, C. Wu, D. Baldi, R. Tonietto, and F. Svelto, Insights
into wideband fractional all-digital PLLs for RF applications, CICC,
2009.
[2] R. Staszewski, K. Muhammad, D. Leipold, et al., All-digital TX
frequency synthesizer and discrete-time receiver for Bluetooth radio in
130-nm CMOS, IEEE JSSC, Dec. 2004.
[3] P. Dudek, S. Szczepanski, and J.V. Hatfield, A high-resolution CMOS
time-to-digital converter utilizing a Vernier delay line, IEEE JSSC,
Feb. 2000.
[4] M.S. Chen, D. Su, and S. Mehta, A calibration-free 800MHz
fractional-N digital PLL with embedded TDC, ISSCC, 2010.
[5] W. Grollitsch, R. Nonis, N.D. Dalt, A 1.4psrms-period-jitter TDC-less
fractional-N digital PLL with digitally controlled ring oscillator in
65nm CMOS, ISSCC, 2010.
[6] A. Rylyakov, J. Tierno, H. Ainspan, et al., Bang-Bang digital PLLs at
11 and 20GHz with sub-200fs integrated jitter for high-speed serial
communication applications, ISSCC, 2009.
[7] R.B. Staszewski, D. Leipold, C. Hung, and P. Balsara, TDC-based
frequency synthesizer for wireless applications, RFIC, 2004.
[8] M.Z. Straayer, and M.H. Perrott, A multi-path gated ring oscillator
TDC with first-order noise shaping, IEEE JSSC, April 2009.
[9] J. Kim, M.A. Horowitz, and G. Wei, Design of CMOS adaptive-
bandwidth PLL/DLLs: a general approach, IEEE Transactions on
Circuits and Systems-II:Analog and Digital Signal Processing, Nov.
2003.
[10] E. Temporiti, C. Wu, D. Baldi, R. Tonietto, and F. Svelto, A 3 GHz
fractional all-digital PLL with a 1.8 MHz bandwidth implementing spur
reduction techniques, IEEE JSSC, Mar. 2009.

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