Lecture 42
Lecture 42
The FLASH Memory array is arranged in the form of rows and columns. The row
line is connected to the Control Gate of each MOS transistor which implements a single
bit storage cell. The number of such MOS transistors in a row generally depends upon the
size of the data value stored at each location. A byte value stored at a location requires 8
cells activated by a single row. Only a single row is selected at a time to select the
appropriate cells. The Source terminals of all the transistors arranged in a column are
connected to a column line. Similarly, the transistors in the second column have their
Source terminals connected together. Generally, if the size of the data stored is a byte, the
memory has eight column lines connecting the Source of the corresponding transistor
cells in each column together. Figure 42.1.
+V +V +V
Active Load Active Load Active Load
Row
Select 0
Row
Select 1
Row
Select 2
Row
Select n-1
Row
Select n
Thus no current flows through a column line if the selected cells has a charge
stored on the transistor gate. If some of the selected cells in a row have charges stored
while others do not have charges stored then current will not flow in columns
corresponding to the cells which have charges stored, while columns having current
flowing through them correspond to cells having no charge. The presence of current in a
column produces a voltage drop across an active load connected at the end of each
column line, while an absence of current doesn’t produce a voltage drop across the active
load. The voltage drop produced across each active load is separately compared with a
reference voltage by a comparator circuit. If there is a voltage drop across the active load
due to flow of current, the comparator output is a 0. If the voltage drop across the active
load is 0 volts due to absence of current the comparator output is a 1. The presence or
absence of current in a column line is based on the binary 1 and 0 stored in the cell. Thus
the comparator output is opposite to the information stored.
Memory Summary
A summary of memory types and their characteristics are shown. Table 42.1. The
Static Ram (SRAM) is non-volatile and is not a high density memory as a latch is
required to store a single bit of information. Implementation of a latch requires almost six
transistors. The Dynamic Ram is also non-volatile however it offers high density
memories as each storage cell requires a single transistor and a capacitor. ROMs and
PROMs retains information permanently even if the supply voltage is removed. Since a
single transistor is used to store a logic 0 or 1 therefore ROMS and PROMs are high
density memories. EEPROMs allow data to be read or written however the ability to
change the data without having to remove the EEPROM chip from a circuit board
requires extra logic. Thus EEPROM memories are not high density memories.
The keyboard buffer is an example of a FIFO memory. In the FIFO scheme data
is not accessed randomly from any location as in RAM and ROM memories where any
location can be accessed by specifying the location address. In the FIFO memory the data
which is written into the memory first is the first one to be read out. As mentioned above,
FIFO memories are used to connect two digital devices that produce and consume data at
The FIFO memory is implemented using shift registers with a control circuitry
that allow the data entered at the FIFO input to be stored at the FIFO output when the
FIFO memory is empty. Addition data that is entered at the FIFO input is shifted to the
appropriate location in the FIFO memory. When the data at the FIFO output is consumed
by a device, the stored data within the FIFO memory is shifted forward so that the second
data to be input into the FIFO memory is placed at the FIFO memory output. Figure
42.2c.
The FIFO Implementation using four, 8-bit shift registers is shown. Figure 42.3.
Data (4-bit data) to be written into the FIFO buffer is placed in the Input Buffer which is
shifted to appropriate location by the Shift Register Control circuit. When the data is
stored in the FIFO buffer at the appropriate location the Input Buffer is ready to accept
more data for temporary storage in the FIFO buffer. The Input Control Logic circuit
indicates the availability of the Input Buffer for latching new data values by activating the
Input Ready control signal. The data is read out from the FIFO buffer through the Output
Buffer. Data at the Buffer Out location is latched in by the Output Buffer from where the
device can read the data. Once the data is read the Shift Control circuitry updates the
buffer by shifting the buffer contents towards the right. The right most data value in the
buffer is moved to the Output Buffer latch for reading by the device. The Output Ready
signal is activated to indicate the availability of data for reading.
Location
7 Buffer Output
Address Register
6
5
5 7
4 3
Buffer Input
3 1 Address Register
2 3