TEST REPORT

Report No.: BCTC2305010964E

SHENZHEN WEI PENG SHIJI TECHNOLOGY CO.,

Applicant:
LTD

Product Name: Portable power Station

Model/Type
S3
reference:

Tested Date: 2023-05-24 to 2023-06-05

Issued Date: 2023-06-30

Shenzhen BCTC Testing Co., Ltd.

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 Report No.: BCTC2305010964E

Product Name: Portable power Station

Trademark: N/A
Model/Type reference: S3
Prepared For: SHENZHEN WEI PENG SHIJI TECHNOLOGY CO., LTD
Building A3, Zhengfeng Industrial Park, Tangwei Avenue, Tangwei Community,
Address:
Fuhai Town, Bao'an District, Shenzhen, China
Manufacturer: SHENZHEN WEI PENG SHIJI TECHNOLOGY CO., LTD
Building A3, Zhengfeng Industrial Park, Tangwei Avenue, Tangwei Community,
Address:
Fuhai Town, Bao'an District, Shenzhen, China
Prepared By: Shenzhen BCTC Testing Co., Ltd.
1-2/F., Building B, Pengzhou Industrial Park, No.158, Fuyuan 1st Road,
Address:
Zhancheng, Fuhai Subdistrict, Bao'an District, Shenzhen, Guangdong, China
Sample Received Date: 2023-05-24

Sample tested Date: 2023-05-24 to 2023-06-05

Issue Date: 2023-06-30
Report No.: BCTC2305010964E
EN 55032:2015+A11:2020+A1:2020, EN 55035: 2017+A11:2020
Test Standards:
EN IEC 61000-3-2:2019+A1:2021, EN 61000-3-3:2013+A2:2021
Test Results: PASS

Tested by: Approved by:

Lei Chen/Project Handler Zero Zhou/Reviewer

The test report is effective only with both signature and specialized stamp. This result(s) shown in this
report refer only to the sample(s) tested. Without written approval of Shenzhen BCTC Testing Co., Ltd, this
report can’t be reproduced except in full. The tested sample(s) and the sample information are provided by
the client.

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 Report No.: BCTC2305010964E
Table Of Content

Test Report Declaration Page

1. Version .................................................................................................................. 5
2. Test Summary ....................................................................................................... 6
3. Measurement Uncertainty ..................................................................................... 7
4. Product Information And Test Setup ..................................................................... 8
4.1 Product Information ............................................................................................... 8
4.2 Test Setup Configuration ...................................................................................... 8
4.3 Support Equipment ............................................................................................... 8
4.4 Test Mode ............................................................................................................. 9
5. Test Facility And Test Instrument Used ............................................................... 10
5.1 Test Facility ......................................................................................................... 10
5.2 Test Instrument Used .......................................................................................... 10
6. Conducted Emissions .......................................................................................... 12
6.1 Block Diagram Of Test Setup .............................................................................. 12
6.2 Limit .................................................................................................................... 12
6.3 Test Procedure ................................................................................................... 12
6.4 Test Result .......................................................................................................... 13
7. Radiated Emissions Test ..................................................................................... 15
7.1 Block Diagram Of Test Setup .............................................................................. 15
7.2 Limits................................................................................................................... 15
7.3 Test Procedure ................................................................................................... 15
7.4 Test Results ........................................................................................................ 16
8. Harmonic Current Emission(H)............................................................................ 18
8.1 Block Diagram Of Test Setup .............................................................................. 18
8.2 Limit .................................................................................................................... 18
8.3 Test Procedure ................................................................................................... 18
8.4 Test Results ........................................................................................................ 19
9. Voltage Fluctuations & Flicker(F) ........................................................................ 22
9.1 Block Diagram Of Test Setup .............................................................................. 22
9.2 Limit .................................................................................................................... 22
9.3 Test Procedure ................................................................................................... 22
9.4 Test Results ........................................................................................................ 23
10. Immunity Test Of General The Performance Criteria .......................................... 24
11. Electrostatic Discharge (ESD) ............................................................................. 25
11.1 Test Specification .............................................................................................. 25
11.2 Block Diagram Of Test Setup ............................................................................ 25
11.3 Test Procedure ................................................................................................. 25
11.4 Test Results ...................................................................................................... 26
12. Continuous RF Electromagnetic Field Disturbances (RS) ................................... 27
12.1 Test Specification .............................................................................................. 27
12.2 Block Diagram Of Test Setup ............................................................................ 27
12.3 Test Procedure ................................................................................................. 27
12.4 Test Results ...................................................................................................... 28
13. Electrical Fast Transients/Burst (EFT) ................................................................. 29
13.1 Test Specification .............................................................................................. 29

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13.2 Block Diagram Of EUT Test Setup ................................................................... 29
13.3 Test Procedure ................................................................................................. 29
13.4 Test Results ...................................................................................................... 29
14. Surges Immunity Test ......................................................................................... 30
14.1 Test Specification .............................................................................................. 30
14.2 Block Diagram Of EUT Test Setup ................................................................... 30
14.3 Test Procedure ................................................................................................. 30
14.4 Test Result ........................................................................................................ 30
15. Continuous Induced RF Disturbances (CS) ........................................................ 31
15.1 Test Specification .............................................................................................. 31
15.2 Block Diagram Of EUT Test Setup ................................................................... 31
15.3 Test Procedure ................................................................................................. 31
15.4 Test Result ........................................................................................................ 31
16. Voltage Dips And Interruptions (DIPS) ................................................................ 32
16.1 Test Specification .............................................................................................. 32
16.2 Block Diagram Of EUT Test Setup ................................................................... 32
16.3 Test Procedure ................................................................................................. 32
16.4 Test Result ........................................................................................................ 32
17. EUT Photographs ................................................................................................ 33
18. EUT Test Setup Photographs.............................................................................. 37

(Note: N/A Means Not Applicable)

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 Report No.: BCTC2305010964E

1. Version

Report No. Issue Date Description Approved

BCTC2305010964E 2023-06-30 Original Valid

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 Report No.: BCTC2305010964E

2. Test Summary

The Product has been tested according to the following specifications:

Emission
Test
Standard Test Item
result
EN 55032 Conducted emissions from the AC mains power ports Pass

EN 55032 Asymmetric mode conducted emissions N/A1

EN 55032 Conducted differential voltage emissions N/A2

EN 55032 Radiated emissions Pass

EN IEC 61000-3-2 Harmonic current emission(H) Pass

EN 61000-3-3 Voltage fluctuations & flicker(F) Pass

Immunity
Test
Standard Test Item
result
EN 55035 Electrostatic discharge (ESD) Pass

EN 55035 Continuous RF electromagnetic field disturbances(RS) Pass

EN 55035 Electrical fast transients/burst (EFT) Pass

EN 55035 Surges Pass

EN 55035 Continuous induced RF disturbances (CS) Pass

EN 55035 Broadband impulse noise disturbances, repetitive N/A3

EN 55035 Broadband impulse noise disturbances, isolated N/A3

EN 55035 Power frequency magnetic field (PFMF) N/A4

EN 55035 Voltage dips and interruptions (DIPS) Pass

Remark:
1. Applicable to ports listed above and intended to connect to cables longer than 3 m.
2. The Product has no antenna port.
3. Applicable only to CPE xDSL ports.
4. The Product doesn’t contain any device susceptible to magnetic fields.

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3. Measurement Uncertainty

Where relevant, the following measurement uncertainty levels have been estimated for tests performed on
the Product as specified in CISPR 16-4-2. This uncertainty represents an expanded uncertainty expressed
at approximately the 95% confidence level using a coverage factor of k=2.

Test item Value (dB)

Conducted Emission (150kHz-30MHz) 3.20
Radiated Emission(30MHz~1GHz) 4.80

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4. Product Information And Test Setup

4.1 Product Information

Ratings: AC 220-240V 50Hz,

DC 48V from battery
The highest frequency of less than 108 MHz, the measurement shall only be made up to 1 GHz.
the internal sources of the between 108 MHz and 500 MHz, the measurement shall only be made
EUT is 2480MHz: up to 2 GHz.
between 500 MHz and 1 GHz, the measurement shall only be made up to
5 GHz.
above 1 GHz, the measurement shall be made up to 5 times the highest
frequency or 6 GHz, whichever is less.

No. Cable Type Quantity Provider Length (m) Shielded Note

With a ferrite ring in mid
1 -- -- Applicant --- Yes/No
Detachable
2 -- -- BCTC -- Yes/No --

4.2 Test Setup Configuration

See test photographs attached in EUT TEST SETUP PHOTOGRAPHS for the actual connections between
Product and support equipment.

4.3 Support Equipment

No. Device Type Brand Model Series No. Note

1. --- --- --- --- ---
Notes:
1. All the equipment/cables were placed in the worst-case configuration to maximize the emission during
the test.
2. Grounding was established in accordance with the manufacturer’s requirements and conditions for the
intended use.

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4.4 Test Mode

Test item Test Mode Test Voltage
Conducted emissions from the AC mains power
Charging AC 230V/50Hz
ports (150KHz-30MHz) Class B
Charging* AC 230V/50Hz
Radiated emissions(30MHz-1GHz) Class B
Working DC 48V

Harmonic current emission Class A Charging AC 230V/50Hz

Voltage fluctuations & flicker(F) Charging AC 230V/50Hz

Electrostatic discharge (ESD)
Charging AC 230V/50Hz
Air Discharge: ±2,4,8Kv
Contact Discharge: ±2,4kV
Working DC 48V
HCP & VCP: ±2,4kV
Continuous RF electromagnetic field
Charging AC 230V/50Hz
disturbances(RS)
80MHz-1000MHz, 1800MHz,
2600MHz,3500MHz,5000MHz
3V/m,80% AM Working DC 48V
Front, Rear, Left, Right
H/V
Electrical fast transients/burst (EFT)
1kV AC(Input)
Charging AC 230V/50Hz
0.5kV DC(Input)
0.5kV signal,Telec,control
Surges
1kV Line-Line,
2kV Line-PE, N-PE
0.5kVDC(Input)
Charging AC 230V/50Hz
1KV, 4KV signal,Telec, control
Line-Line:90°+1kV,270°-1kV
Line-PE:90°+2kV,270°-2kV
N-PE:90°-2kV,270°+2kV
Continuous induced RF disturbances (CS)
0.15MHz to 80MHz 3V
AC( Input) Charging AC 230V/50Hz
DC(Input)
signal, control
Voltage dips and interruptions (DIPS)
Less 5% 0.5P
70% 500ms Charging AC 230V/50Hz
Voltage Interruptions
less5% 5000ms
All test mode were tested and passed, only Radiated Emissions shows (*) is the worst case mode which were
recorded in this report.

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5. Test Facility And Test Instrument Used

5.1 Test Facility

All measurement facilities used to collect the measurement data are located at Shenzhen BCTC Testing
Co., Ltd. Address: 1-2/F., Building B, Pengzhou Industrial Park, No.158, Fuyuan 1st Road, Zhancheng,
Fuhai Subdistrict, Bao'an District, Shenzhen, Guangdong, China. The site and apparatus are constructed
in conformance with the requirements of ANSI C63.4 and CISPR 16-1-1 other equivalent standards.

5.2 Test Instrument Used

Conducted Emissions Test

Equipment Manufacturer Model# Serial# Last Cal. Next Cal.

Receiver R&S ESR3 102075 May 15, 2023 May 14, 2024

LISN R&S ENV216 101375 May 15, 2023 May 14, 2024
EMC-CON
Software Frad EZ-EMC \ \
3A1
Attenuator \ 10dB C-6GHz 1650 May 15, 2023 May 14, 2024

Radiated Emissions Test (966 Chamber#01)

Equipment Manufacturer Model# Serial# Last Cal. Next Cal.

966 chamber ChengYu 966 Room 966 May 15, 2023 May 14, 2026
Receiver R&S ESRP 101154 May 15, 2023 May 14, 2024

Receiver R&S ESR3 102075 May 15, 2023 May 14, 2024
LAPA_01G18
Amplifier SKET \ May 15, 2023 May 14, 2024
G-45dB
Amplifier Schwarzbeck BBV9744 9744-0037 May 15, 2023 May 14, 2024
TRILOG
Broadband schwarzbeck VULB9163 942 May 29, 2023 May 28, 2024
Antenna
Horn Antenna schwarzbeck BBHA9120D 1541 May 31, 2023 May 30, 2024
Software Frad EZ-EMC FA-03A2 RE \ \

Harmonic / Flicker Test

Equipment Manufacturer Model# Serial# Last Cal. Next Cal.

Harmonic &
LAPLAEC AC2000A 439263 May 15, 2023 May 14, 2024
Flicker Tester
AC Power
KIKUSUI PCR4000M UK001879 May 15, 2023 May 14, 2024
Supply
Software HTEC H/F V1.5 \ \

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Electrostatic discharge Test

Equipment Manufacturer Model# Serial# Last Cal. Next Cal.

ESD Tester KIKUSUI KES4201A UH002321 May 15, 2023 May 14, 2024

Continuous RF Electromagnetic Field Disturbances Test

Equipment Manufacturer Model# Serial# Last Cal. Next Cal.

Power meter Keysight E4419 A00065 May 15, 2023 May 14, 2024

Power sensor Keysight E9300A US39211659 May 15, 2023 May 14, 2024

Power sensor Keysight E9300A US39211305 May 15, 2023 May 14, 2024
HAP_801000
Amplifier SKET 21201805013 May 15, 2023 May 14, 2024
-250W
HAP_0103-7
Amplifier SKET 21201805014 May 15, 2023 May 14, 2024
5W
HAP_0306-5
Amplifier SKET 21201805015 May 15, 2023 May 14, 2024
0W
Stacked
double
Schwarzbeck STLP 9129 00077 \ \
Log.-Per.
Antenna
Field Probe Narda EP-601 611WX80256 May 15, 2023 May 14, 2024
Signal
Agilent N5181A MY50143748 May 15, 2023 May 14, 2024
Generator
Software SKET EMC-S 1.2.0.18 \ \

EFT and Surge and Voltage dips and interruptions Test

Equipment Manufacturer Model# Serial# Last Cal. Next Cal.

Compact
TRANSIENT TRA2000 646 May 15, 2023 May 14, 2024
Generator
Coupling CN-EFT100
PARTNER CN-EFT1000 May 15, 2023 May 14, 2024
Clamp 0-1624

Continuous Induced RF Disturbances Test

Equipment Manufacturer Model# Serial# Last Cal. Next Cal.

C/S Test 126B1405/20
SCHLODER CDG-6000-75 May 15, 2023 May 14, 2024
System 16
Attenuator SCHLODER 6DB DC-1G HA1630 May 15, 2023 May 14, 2024
A2210389/20
CDN SCHLODER CDN M2+M3 May 15, 2023 May 14, 2024
16
Injection 132A1272/20
SCHLOBER EMCL-20 May 15, 2023 May 14, 2024
Clamp 16
HUBERTEN
Software HUBERT 1.4.1.0 \ \
61000-4-6

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6. Conducted Emissions

6.1 Block Diagram Of Test Setup

For mains ports:

6.2 Limit

Limits for Conducted emissions at the mains ports of Class B MME

Frequency range Limits dB(μV)

(MHz) Quasi-peak Average
0,15 to 0,50 66 to 56* 56 to 46*
0,50 to 5 56 46
5 to 30 60 50

Notes:
1. *Decreasing linearly with logarithm of frequency.
2. The lower limit shall apply at the transition frequencies.

6.3 Test Procedure

For mains ports:

a. The Product was placed on a nonconductive table 0. 8 m above the horizontal ground reference plane,
and 0.4 m from the vertical ground reference plane, and connected to the main through Line Impedance
Stability Network (L.I.S.N).

b. The RBW of the receiver was set at 9 kHz in 150 kHz ~ 30MHz with Peak and AVG detector in Max Hold
mode. Run the receiver’s pre-scan to record the maximum disturbance generated from Product in all power
lines in the full band.

c. For each frequency whose maximum record was higher or close to limit, measure its QP and AVG
values and record.

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6.4 Test Result

Temperature: 26 ℃ Relative Humidity: 54%

Pressure: 101kPa Phase : Line
Test Voltage : AC 230V/50Hz Test Mode: Charging

Remark:
1. All readings are Quasi-Peak and Average values.
2. Factor = Insertion Loss + Cable Loss.
3. Measurement = Reading Level + Correct Factor
4. Over = Measurement - Limit

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Temperature: 26 ℃ Relative Humidity: 54%

Pressure: 101kPa Phase : Neutral
Test Voltage : AC 230V/50Hz Test Mode: Charging

Remark:
1. All readings are Quasi-Peak and Average values.
2. Factor = Insertion Loss + Cable Loss.
3. Measurement = Reading Level + Correct Factor
4. Over = Measurement - Limit

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7. Radiated Emissions Test

7.1 Block Diagram Of Test Setup

30MHz ~ 1GHz:

7.2 Limits

Limits for radiated disturbance of Class B MME

Frequency (MHz) Quasi-peak limits at 3m dB(μV/m)

30-230 40
230-1000 47

7.3 Test Procedure

30MHz ~ 1GHz:

a. The Product was placed on the nonconductive turntable 0.8 m above the ground in a semi
anechoic chamber.

b. Set the spectrum analyzer/receiver in Peak detector, Max Hold mode, and 120 kHz RBW. Record the
maximum field strength of all the pre-scan process in the full band when the antenna is varied between 1~4
m in both horizontal and vertical, and the turntable is rotated from 0 to 360 degrees.

c. For each frequency whose maximum record was higher or close to limit, measure its QP value: vary the
antenna’s height and rotate the turntable from 0 to 360 degrees to find the height and degree where
Product radiated the maximum emission, then set the test frequency analyzer/receiver to QP Detector and
specified bandwidth with Maximum Hold Mode, and record the maximum value.

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7.4 Test Results

30MHz ~ 1GHz:

Temperature: 26 ℃ Relative Humidity: 54%

Pressure: 101KPa Phase : Horizontal
Test Voltage : AC 230V/50Hz Test Mode: The worst data

Remark:
1. Factor = Antenna Factor + Cable Loss – Pre-amplifier.
2. Measurement = Reading Level + Correct Factor
3. Over = Measurement - Limit

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Temperature: 26 ℃ Relative Humidity: 54%

Pressure: 101KPa Phase : Vertical
Test Voltage : AC 230V/50Hz Test Mode: The worst data

Remark:
1. Factor = Antenna Factor + Cable Loss – Pre-amplifier.
2. Measurement = Reading Level + Correct Factor
3. Over = Measurement - Limit

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8. Harmonic Current Emission(H)

8.1 Block Diagram Of Test Setup

8.2 Limit

EN IEC 61000-3-2:2019+A1:2021

8.3 Test Procedure

a. The Product was placed on the top of a non-conductive table above the ground and operated to produce
the maximum harmonic components under normal operating conditions for each successive harmonic
component in turn.

b. The correspondent test program of test instrument to measure the current harmonics emanated from
Product was chosen. The measure time shall be not less than the time necessary for the Product to be
exercised.

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8.4 Test Results

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9. Voltage Fluctuations & Flicker(F)

9.1 Block Diagram Of Test Setup

9.2 Limit

EN 61000-3-3:2013+A2:2021 Clause 5.

9.3 Test Procedure

a. The Product was placed on the top of a non-conductive table above the ground and operated to produce
the most unfavorable sequence of voltage changes under normal operating conditions.

b. During the flick test, the measure time shall include that part of whole operation cycle in which the
Product produce the most unfavorable sequence of voltage changes. The observation period for short-term
flicker indicator is 10 minutes and the observation period for long-term flicker indicator is 2 hours.

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9.4 Test Results

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10. Immunity Test Of General The Performance Criteria

Product Standard EN 55035: 2017+A1:2020 clause 8

The equipment shall continue to operate as intended without operator
intervention. No degradation of performance, loss of function or change of
operating state is allowed below a performance level specified by the
manufacturer when the equipment is used as intended. The performance level
CRITERION A may be replaced by a permissible loss of performance. If the minimum
performance level or the permissible performance loss is not specified by the
manufacturer, then either of these may be derived from the product
description and documentation, and by what the user may reasonably expect
from the equipment if used as intended.
During the application of the disturbance, degradation of performance is
allowed. However, no unintended change of actual operating state or stored
data is allowed to persist after the test.

After the test, the equipment shall continue to operate as intended without
operator intervention; no degradation of performance or loss of function is
allowed, below a performance level specified by the manufacturer, when the
CRITERION B
equipment is used as intended. The performance level may be replaced by a
permissible loss of performance.

If the minimum performance level (or the permissible performance loss), or

recovery time, is not specified by the manufacturer, then either of these may
be derived from the product description and documentation, and by what the
user may reasonably expect from the equipment if used as intended.
Loss of function is allowed, provided the function is self-recoverable, or can be
restored by the operation of the controls by the user in accordance with the
manufacturer’s instructions. A reboot or re-start operation is allowed.
CRITERION C
Information stored in non-volatile memory, or protected by a battery backup,
shall not be lost.

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11. Electrostatic Discharge (ESD)

11.1 Test Specification

Basic standard : IEC 61000-4-2

Test Port : Enclosure port
Discharge Impedance : 330 ohm / 150 pF
Discharge Mode : Single Discharge
Discharge Period : one second between each discharge

11.2 Block Diagram Of Test Setup

For Floor Stand:

11.3 Test Procedure

a. Electrostatic discharges were applied only to those points and surfaces of the Product that are
accessible to users during normal operation.

b. The test was performed with at least ten single discharges on the pre-selected points in the most
sensitive polarity.

c. The time interval between two successive single discharges was at least 1 second.

d. The ESD generator was held perpendicularly to the surface to which the discharge was applied and the
return cable was at least 0.2 meters from the Product.

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e. Contact discharges were applied to the non-insulating coating, with the pointed tip of the generator
penetrating the coating and contacting the conducting substrate.

f. Air discharges were applied with the round discharge tip of the discharge electrode approaching the
Product as fast as possible (without causing mechanical damage) to touch the Product. After each
discharge, the ESD generator was removed from the Product and re-triggered for a new single discharge.
The test was repeated until all discharges were complete.

g. At least ten single discharges (in the most sensitive polarity) were applied to the center of one vertical
edge of the Vertical Coupling Plane in sufficiently different positions that the four faces of the Product were
completely illuminated. The VCP (dimensions 0.5m x 0.5m) was placed vertically to and 0.1 meters from
the Product.

11.4 Test Results

Temperature: 26 ℃ Relative Humidity: 54%

Pressure: 101kPa
Test Mode: Charging/ Working
Test Voltage : AC 230V/50Hz /DC 48V

Min. No. of
Discharge Voltage Discharge per Required Performance
Discharge Position
Method (±kV) polarity Level Criterion
(Each Point)

Conductive Surfaces 4 10 B A

Contact
Indirect Discharge HCP 4 10 B A
Discharge

Indirect Discharge VCP 4 10 B A

Slots, Apertures, and

Air Discharge 8 10 B A
Insulating Surfaces

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12. Continuous RF Electromagnetic Field Disturbances (RS)

12.1 Test Specification

Basic standard : IEC 61000-4-3

Test Port : Enclosure port
Step Size : 1%
Modulation : 1kHz, 80% AM
Dwell Time : 1 second
Polarization : Horizontal & Vertical

12.2 Block Diagram Of Test Setup

Below 1GHz:

12.3 Test Procedure

a. The testing was performed in a fully-anechoic chamber. The transmit antenna was located at a distance
of 3 meters from the Product.
b. The frequency range is swept from 80MHz to 1000MHz, 1800MHz, 2600MHz, 3500MHz, 5000MHz,with
the signal 80% amplitude modulated with a 1 kHz sine wave, and the step size was 1%.
c. The dwell time at each frequency shall not be less than the time necessary for the EUT to be exercised
and to be able to respond, but should not exceed 5 s at each of the frequencies during the scan.
d. The test was performed with the Product exposed to both vertically and horizontally polarized fields on
each of the four sides.
e. For Broadcast reception function: Group 2 not apply in this test.

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12.4 Test Results

Temperature: 26 ℃ Relative Humidity: 54%

Pressure: 101kPa
Test Mode: Charging/ Working
Test Voltage : AC 230V/50Hz /DC 48V

Field Strength Performance

Frequency Position Required Level
(V/m) Criterion
80 - 1000MHz,

1800MHz,
Front, Right,
2600MHz, 3 A A
Back, Left
3500MHz,

5000MHz

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13. Electrical Fast Transients/Burst (EFT)

13.1 Test Specification

Basic standard : IEC 61000-4-4

Test Port : input ac/dc. power port
Impulse Frequency : 5 kHz
Impulse Wave-shape : 5/50 ns
Burst Duration : 15 ms
Burst Period : 300 ms
Test Duration : 2 minutes per polarity

13.2 Block Diagram Of EUT Test Setup

For input ac/dc. power port:

13.3 Test Procedure

a. The Product and support units were located on a non-conductive table above ground reference plane.

b. A 0.5m-long power cord was attached to Product during the test.

13.4 Test Results

Temperature: 26 ℃ Relative Humidity: 54%

Pressure: 101kPa
Test Mode: Charging
Test Voltage : AC 230V/50Hz

Voltage Performance
Coupling Polarity Required Level
(kV) Criterion

AC MainsL-N 1.0 ± B A

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14. Surges Immunity Test

14.1 Test Specification

Basic standard : IEC 61000-4-5

Test Port : input ac/dc. power port
Wave-Shape : Open Circuit Voltage - 1.2 / 50 us
Short Circuit Current - 8 / 20 us
Pulse Repetition Rate : 1 pulse / min.
Phase Angle : 0°/ 90°/ 180°/ 270°
Test Events : 5 pulses (positive & negative) for each polarity

14.2 Block Diagram Of EUT Test Setup

14.3 Test Procedure

a. The surge is to be applied to the Product power supply terminals via the capacitive coupling network.
Decoupling networks are required in order to avoid possible adverse effects on equipment not under test
that may be powered by the same lines, and to provide sufficient decoupling impedance to the surge wave.

b. The power cord between the Product and the coupling/decoupling networks shall be 2 meters in length
(or shorter). Interconnection line between the Product and the coupling/decoupling networks shall be 2
meters in length (or shorter).

14.4 Test Result

Temperature: 26 ℃ Relative Humidity: 54%

Pressure: 101kPa
Test Mode: Charging
Test Voltage : AC 230V/50Hz

Performance
Coupling Line Voltage (kV) Phase Angle Required Level
Criterion
+1 90°
L-N B A
-1 270°

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15. Continuous Induced RF Disturbances (CS)

15.1 Test Specification

Basic standard : IEC 61000-4-6

Test Port : input ac/dc. power port
Step Size : 1%
Modulation : 1kHz, 80% AM
Dwell Time : 1 second

15.2 Block Diagram Of EUT Test Setup

For input ac/ac. power port:

15.3 Test Procedure

For input ac/dc. power port:

a. The Product and support units were located at a ground reference plane with the interposition of a 0.1 m
thickness insulating support and the CDN was located on GRP directly.
b. The frequency range is swept from 150 kHz to 10MHz, 10MHz to 30MHz, 30MHz to 80MHz with the
signal 80% amplitude modulated with a 1 kHz sine wave, and the step size was 1% of fundamental.
c. The dwell time at each frequency shall be not less than the time necessary for the Product to be able to
respond.

15.4 Test Result

Temperature: 26 ℃ Relative Humidity: 54%
Pressure: 101kPa
Test Mode: Charging
Test Voltage : AC 230V/50Hz

Voltage Level Performance

Inject Line Frequency (MHz) Required Level
(V r.m.s.) Criterion
0.15 - 10 3 A A
a.c. port 10 to 30 3 to 1 A A
30 to 80 1 A A

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16. Voltage Dips And Interruptions (DIPS)

16.1 Test Specification

Basic standard : IEC 61000-4-11

Test Port : input ac. power port
Phase Angle : 0°, 180°
Test cycle : 3 times

16.2 Block Diagram Of EUT Test Setup

16.3 Test Procedure

a. The Product and support units were located on a non-conductive table above ground floor.
b. Set the parameter of tests and then perform the test software of test simulator.
c. Conditions changes to occur at 0 degree crossover point of the voltage waveform.

16.4 Test Result

Temperature: 26 ℃ Relative Humidity: 54%

Pressure: 101kPa
Test Mode: Charging
Test Voltage : AC 230V/50Hz

Voltage dips in % Performance

Test Level % UT Duration ( ms) Required Level
UT Criterion
<5 ≥95 10 B B*
70 30 500 C B*
Voltage Interruptions:
<5 ≥95 5000 C C*
Note*:
B: The EUT Unable to working during testing, and it end of the test can be restored automatically
C: The EUT Unable to working during testing, and it need manually connect after test.
Remark: T (s) = 1 / f (Hz);

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17. EUT Photographs

EUT Photo 1

EUT Photo 2

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EUT Photo 3

EUT Photo 4

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EUT Photo 5

EUT Photo 6

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EUT Photo 7

EUT Photo 8

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18. EUT Test Setup Photographs

Conducted Emissions

Radiated emissions

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H/F

ESD

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RS

EFT & Dips & Surge

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CS

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STATEMENT

1. The equipment lists are traceable to the national reference standards.

2. The test report can not be partially copied unless prior written approval is issued from our lab.

3. The test report is invalid without the "special seal for inspection and testing".

4. The test report is invalid without the signature of the approver.

5. The test process and test result is only related to the Unit Under Test.

6. Sample information is provided by the client and the laboratory is not responsible for its
authenticity.

7. The quality system of our laboratory is in accordance with ISO/IEC17025.

8. If there is any objection to this test report, the client should inform issuing laboratory within 15
days from the date of receiving test report.

Address:
1-2/F., Building B, Pengzhou Industrial Park, No.158, Fuyuan 1st Road, Zhancheng, Fuhai
Subdistrict, Bao'an District, Shenzhen, Guangdong, China

TEL：400-788-9558

P. C.: 518103

FAX：0755-33229357

Website：http://www.chnbctc.com

E-Mail：bctc@bctc-lab.com.cn

※※※※※ END ※※※※※

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