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Limitation of Simple Microscope

The document discusses the limitations of simple microscopes, which include low magnification and resolution, and the need for thin specimens. It explains the principles of electron microscopes, particularly the scanning electron microscope (SEM), which provides high-resolution 3D images using a high-energy electron beam. Additionally, it describes the dissecting microscope, its uses in various fields, and its limitations such as low magnification and high cost.

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82 views6 pages

Limitation of Simple Microscope

The document discusses the limitations of simple microscopes, which include low magnification and resolution, and the need for thin specimens. It explains the principles of electron microscopes, particularly the scanning electron microscope (SEM), which provides high-resolution 3D images using a high-energy electron beam. Additionally, it describes the dissecting microscope, its uses in various fields, and its limitations such as low magnification and high cost.

Uploaded by

mrvilakati1
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as DOCX, PDF, TXT or read online on Scribd
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Limitation of Simple Microscope

 Have very low magnification; upto 10X


 Mirror for illumination and lack of mechanical stage
 Require thin stained specimen for clear vision
 Very low resolution and image contrast
Electron Microscope Principle
An electron microscope uses accelerated electrons with a
wavelength of about 100,000 times shorter than visible
light to illuminate specimens and produce images. The electron
gun, usually a heated tungsten or field emission filament, is used
to generate a stream of high voltage (100 – 1000 kV) electrons.
These electrons are accelerated using an anode plate in a
vacuum system and focused on the specimen using aperture
(opening to the stage) and electromagnetic lenses.
The electron beam passes through the specimen and interacts
with sample components. Upon striking the specimen, the
electrons are scattered. The degree of scattering depends on the
refractive index or thickness of the specimen.
The scattered electrons from the sample are collected and passed
through objective and ocular electromagnetic lenses. These
scattered beams are detected and transformed into highly
magnified images by the magnetic lenses.
Scanning Electron Microscope (SEM) is a type of electron
microscope that scans a specimen with a high-energy beam of
electrons in a raster scanning pattern and develops a highly
magnified 3-D image of the specimen.
The SEM uses emitted, backscattered, and diffracted electrons for
developing images reflecting the characteristic morphological
features of the specimen. Although it has less magnification
power than TEM, the image will be of higher resolution and
sharper.
SEM contains some additional detector instruments like back-
scattered electron detectors, secondary electron detectors, and X-
ray detectors.
Dissecting Microscope or Stereo Microscopeis a type of light
microscope that uses lights reflected from the surface of a
specimen to produce an image of low magnification. It is primarily
used during dissecting and viewing dissected specimens, hence
called dissecting microscope. This microscope can view 3-D
objects, unlike other light microscopes that view slide-fixed
objects.
Uses of Dissecting Microscope or Stereo
Microscope
 They are used in dissecting and micro-surgery procedure
 Examining archaeological artefacts and geological samples
 Used in nano electric appliance manufacture and repairing like
watches, microchips, mobile phones, circuit boards, etc.
Limitations of Dissecting Microscope or
Stereo Microscope
 Has limited use
 Low magnification
 Costly system

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