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Atomic Force Micros

This document provides an overview of atomic force microscopy (AFM). It describes AFM as a type of scanning probe microscopy that uses a physical probe to scan a specimen and form images based on surface topography with atomic scale resolution. The basic components of an AFM, including the piezoelectric scanner, cantilever probe, and laser detection system are explained. Contact and non-contact/tapping modes of operation are described. Steps for AFM operation and potential sources of scanning artifacts are also outlined.

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Hitesh sharma
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104 views29 pages

Atomic Force Micros

This document provides an overview of atomic force microscopy (AFM). It describes AFM as a type of scanning probe microscopy that uses a physical probe to scan a specimen and form images based on surface topography with atomic scale resolution. The basic components of an AFM, including the piezoelectric scanner, cantilever probe, and laser detection system are explained. Contact and non-contact/tapping modes of operation are described. Steps for AFM operation and potential sources of scanning artifacts are also outlined.

Uploaded by

Hitesh sharma
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PPTX, PDF, TXT or read online on Scribd
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Mr.

Hitesh Kumar Sharma


Technical Assistant
Materials Research Centre
MNIT Jaipur
Hitesh.mrc@mnit.ac.in
WHAT’S AFM

• Atomic Force Microscopy (AFM) is one


of the elite tool for imaging, measuring,
and manipulating matter at nanoscale.

•This is a type of Scanning Probe


Microscopy (SPM) which forms an
images or topographical information
using a physical probe that scans the
specimen.

•Offers high resolution mapping of


surface topography with resolution
down to atomic scale.
HOW DOES AFM WORK?
Basic Components of AFM and Their
Functions
Microscope

Cantilever
Holder & tip

Piezo Electric
Scanner

Base stage &


Electronic Assembly
Vibration free table
The Piezoelectric Scanner
 A piezoelectric scanner is used as a very precise positioning stage to move the probe over
the sample. The electronic assembly drives the scanner in raster pattern.
 Piezoelectric scanners for AFM are generally fabricated from lead zirconium titanate (PZT)
with different dopants added to create specific materials properties.
 These are polycrystalline solid which are made by pressing together a powder, and then
sintering the material.
The AFM Probe
• The probe is very prime component of AFM. The most common probes in
AFM are the cantilevers which are highly suited to measure the
topography of a specimen.
• These cantilever probes are fabricated from silicon or silicon nitride using
photolithographic technique (using Bulk micromachining process).
• V-shaped cantilevers are mostly desired because of low mechanical
resistance to vertical deflections.
Working regime of AFM
Contact mode regime
• In the contact regime, the cantilever is held less
than a few angstroms from the sample surface and
an AFM tip makes a soft physical contact with the
sample surface. The inter-atomic force between
the cantilever and the sample is repulsive.
•The tip is attached to the cantilever with low
spring constant.
Working regime of AFM
Non- Contact/Tapping mode:
• In the non-contact regime, the cantilever is held on the order of tens to
hundreds of angstroms from the sample surface, and the interatomic
force between the cantilever and sample is attractive (largely a result of
the long-range van der Waals interactions).
• NC-AFM is one of the vibrating cantilever techniques in which AFM
cantilever is vibrated near the specimen surface.
• The total force between the tip and sample in non-contact regime is very
low. This low force is an advantage to study the soft or elastic materials
sample.
• The cantilever is vibrated near its resonance frequency (typically 100 to
400 KHz) with an amplitude of few of ten to hundred of angstroms.
Working regime of AFM
Detector
Laser Piezoelectric material
drives oscillations

Detector Z

Tip Cantilever

Contact Mode
The surface acts to damp the resonance

Non-contact Mode
Mode of operation
• In constant-height mode, the spatial variation of the cantilever deflection
can be used directly to generate the topographic data set because the
height of the scanner is fixed as it scans.
• In constant-force mode, the deflection of the cantilever can be used as
input to a feedback circuit that moves the scanner up and down in z,
responding to the topography by keeping the cantilever deflection
constant. In this case, the image is generated from the scanner’s motion.
With the cantilever deflection held constant, the total force applied to the
sample is constant.
• In constant-force mode, the speed of scanning is limited by the response
time of the feedback circuit, but the total force exerted on the sample by
the tip is well controlled. Constant-force mode is generally preferred for
most applications.
Laser sensing both twisting and tilting of cantilever
Laser Sensing
AFM operation steps

Clean the sample holder

Fix the sample on


sample holder

Fit the cantilever probe


in cantilever holder

Focus the microscope


and align the laser with
probe
Set initially the
Set the input parameters and
horizontal and vertical
engage the cantilever tip to
deflection position to
sample surface for scanning
zero
Initial screen after opening software
Setup
Check Parameters
Engaging the tip to sample surface
Capturing the image
Results

2D-Image
3D-Image
Results (Roughness)
Results (Size estimation)
Errors in image due to scanner
(Scanner intrinsic non linearity)

Ideally, the intrinsic nonlinearity is the ratio Δy/y of the maximum


deviation Δy from the linear behaviour to the ideal linear
extension y at that voltage. It is in the range 2-25%.
Creeping of scanner

• When an abrupt change in voltage is


applied, the piezoelectric reacts in two
steps: the first step takes place in less than
a millisecond, the second on much longer
time scale. The second step ΔXc is known
as Creep.
• Creep is the ratio of second dimensional
change to first: ΔXc/ ΔX.
Scanner aging

The aging rate is the change in strain


coefficient per decade of time. The
piezoelectric strain coefficient, changes
exponentially with time: increases with
regular use, decreases with no use.
Scanning artifacts

• If feedback is not good.


• Electrical noise (the periodical noise added to the internal signal).
• Environmental vibration (particular when the frequency is close to that of
the tip oscillation).
• Unknown tip-sample interaction (slowing down the scanning speed)
Possible way to remove scanning artifcats

• Repeat the scan to ensure that it looks the same.


• Change the scan direction to 90 degree and try to take a new image.
• Change the scan size and take an image to ensure that the features scale
properly.
• Rotate the sample and take an image to identify tip imaging
• Change the scan speed and take another new image.
Thanks

Q&A...

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