ATOMIC FORCE

MICROSCOPY
PRESENTED TO : DR RIZWAN RAZA
PRESENTED BY: Aiman(SP19-BPH-025)
AHMER ALI (SP19-BPH-026)
 WHAT,S AFM?
 The AFM was invented by IBM scientist Gerd
Binning in 1982,  a development that earned him
the 1986 Nobel Prize for Physics.

 Atomic force microscopy(AFM) is one of the

foremost tools for imaging, measuring and
manipulating matter at the Nano scale.

 A type of scanning probe microscopy(SPM).

 SPM: Forms images of surfaces using a physical

probe that scans the specimen.
WHAT,S AFM?
 High-resolution mapping of surface
topography, by far the biggest application of
the AFM.
 Offers image resolution down to the atomic
scale.
 Scanning Tunneling microscope(STM, the
predecessor of AFM) is also a type of SPM.
 CONSTRUCTION:
CANTILEVER:
 The main component of AFM, is cantilever with a
sharp tip at the end.
Tip:
 The tip radius of curvature is very small, on the
order of nanometers to ensure accuracy, and is
composed of typically silicon or silicon nitride.
 CONSTRUCTION:
PLATFORM:
 The sample under
investigation is placed
on the platform.
Piezoelectric Tube(xyz
scanner):
 The platform containing
sample is mounted on the
piezoelectric tube which
can move sample in x,y,z
direction.
CONSTRUCTION
Laser:
 It helps in cantilever deflection
measurements ,laser is reflected from back
of cantilever due to deflection in cantilever
while scanning the sample.
Photo detector:
 It consists of several photodiodes which
converts laser light into electric current
which helps in imaging sample surface.
HOW DOES AFM WORK?
HOW DOES AFM WORK?
 Let’s Review
Hooke’s law
Hooke’s law: The
force F needed to
extend or compress
a spring by some
distance x is
proportional to that
distance. Formula:
F=-kx
PRINCIPLE:
 AFM works on the principle that a fine sharp
tip of the order of nanometer attached to
cantilever when brought into close to a
sample surface, the Vander walls forces
between tip and sample produces a
deflection of the cantilever according to
Hooke’s law.
 The deflection is measured by laser spot
reflected from the top of cantilever into
photo detector.
ATOMIC FORCE MICROSCOPY!
 In atomic scale it is not spring-mass system
anymore. (contact force, van der Waals
force, capillary force, chemical bonding,
electrostatic force, magnetic force, etc.)
 So when the tip approaches the surface it
can “feel” these forces and the deflection is
measured to be converted into image
information.
 That’s why it is called atomic force
microscopy!
DIFFERENT IMAGING MODE
 Static mode
(contact
mode)dynami
c mode (non-
contact mode
andtapping
mode)
 Static mode:
 Dynamic
mode:
CONTACT MODE

 Mainly used to image hard or solid surfaces.

 In this method, tip is dragged across the
sample means tip comes in contact with
sample surface.
 Attractive forces can be quite strong, cause
the tip displaces the cantilever .
 It helps in evaluation of sample friction.
NON-CONTACT MODE
 The tip of the cantilever does not contact the sample
surface. The tip is kept at a constant height of few
nm above the sample surface.

 This mode is used for imaging soft surfaces like

biological surfaces .

 Vander wall forces between tip and sample surface

helps the scanning software to construct topographic
image of sample surface.
 TAPPING MODE
 Also called “intermittent contact mode AFM”.
 In the tapping mode, the AFM cantilever is
vibrated above the sample surface so that the
tip is in contact with the surface only
intermittently.
 Conducting imaging in the tapping mode helps
reduce shear forces associated with tip
movement. The tapping mode is the most
commonly used for imaging.
 Lessens the damage done to the surface and the
tip.
ADVANTAGES
 Three-dimensional surface profile.
 Do not require any special treatments (such as
metal/carbon coatings) that would irreversibly change or
damage the sample. Does not typically suffer from
charging artifacts in the final image.
 Can work perfectly well in ambient air or even a liquid
environment.
 Higher resolution than SEM, comparable in resolution to
STM and TEM.
 It can image non-conducting surfaces like glass, polymer
etc.
 Can be combined with a variety of optical microscopy
techniques.
DISADVANTAGES
 Single scan image size.

 The scanning speed of an AFM is also a limitation. It

can take several minutes for a typical scan.

 Can be affected by nonlinearity, hysteresis, and creep

of the piezoelectric material .
THANK YOU!